Conferences related to Early Life

Back to Top

2021 IEEE Pulsed Power Conference (PPC)

The Pulsed Power Conference is held on a biannual basis and serves as the principal forum forthe exchange of information on pulsed power technology and engineering.


2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)

The conference program will consist of plenary lectures, symposia, workshops and invitedsessions of the latest significant findings and developments in all the major fields of biomedical engineering.Submitted papers will be peer reviewed. Accepted high quality papers will be presented in oral and postersessions, will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE


2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2019 56th ACM/ESDA/IEEE Design Automation Conference (DAC)

    EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)


2020 IEEE 18th International Conference on Industrial Informatics (INDIN)

INDIN focuses on recent developments, deployments, technology trends, and research results in Industrial Informatics-related fields from both industry and academia


2020 IEEE 21st International Conference on Vacuum Electronics (IVEC)

Technical presentations will range from the fundamental physics of electron emission and modulated electron beams to the design and operation of devices at UHF to THz frequencies, theory and computational tool development, active and passive components, systems, and supporting technologies.System developers will find that IVEC provides a unique snapshot of the current state-of-the-art in vacuum electron devices. These devices continue to provide unmatched power and performance for advanced electromagnetic systems, particularly in the challenging frequency regimes of millimeter-wave and THz electronics.Plenary talks will provide insights into the history, the broad spectrum of fundamental physics, the scientific issues, and the technological applications driving the current directions in vacuum electronics research.


More Conferences

Periodicals related to Early Life

Back to Top

Biomedical Engineering, IEEE Reviews in

The IEEE Reviews in Biomedical Engineering will review the state-of-the-art and trends in the emerging field of biomedical engineering. This includes scholarly works, ranging from historic and modern development in biomedical engineering to the life sciences and medicine enabled by technologies covered by the various IEEE societies.


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Components and Packaging Technologies, IEEE Transactions on

Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.


Computer

Computer, the flagship publication of the IEEE Computer Society, publishes peer-reviewed technical content that covers all aspects of computer science, computer engineering, technology, and applications. Computer is a resource that practitioners, researchers, and managers can rely on to provide timely information about current research developments, trends, best practices, and changes in the profession.


Computers, IEEE Transactions on

Design and analysis of algorithms, computer systems, and digital networks; methods for specifying, measuring, and modeling the performance of computers and computer systems; design of computer components, such as arithmetic units, data storage devices, and interface devices; design of reliable and testable digital devices and systems; computer networks and distributed computer systems; new computer organizations and architectures; applications of VLSI ...


More Periodicals

Most published Xplore authors for Early Life

Back to Top

Xplore Articles related to Early Life

Back to Top

Sequential sampling plans for early-life reliability assessment

Annual Reliability and Maintainability Symposium, 1997

This paper proposes a method for demonstrating early life reliability by combining environmental stress screening strength models and Wald's sequential test for equipment whose early life reliability is described by a Weibull distribution of time to failure. The proposed method uses screening strength models to transform an environmental stress test (e.g. temperature cycling/random vibration) to an equivalent constant heat test. ...


A test methodology to monitor and predict early life reliability failure mechanisms

26th Annual Proceedings Reliability Physics Symposium 1988, 1988

A description is given of a test methodology called operational life testing (OLT), which has been implemented to monitor and quantify the early-life reliability of selected semiconductor technologies and identify early-life failure mechanisms. This monitor measures the effectiveness of screens and tests used to remove device infant-mortality failure modes. In addition, the early-life reliability monitor complements the data derived from ...


Observations on Component Infant Mortality and Burn-In Effectiveness

IEEE Transactions on Components and Packaging Technologies, 2008

The following concepts are discussed: burn-in effectiveness, component failure distributions, early life distribution, early life failures, infant mortality.


Low-cost gate-oxide early-life failure detection in robust systems

2010 Symposium on VLSI Circuits, 2010

We present a new low-cost technique for detecting gate-oxide early-life failures (ELF) to overcome reliability challenges in robust systems without requiring expensive concurrent error detection. Our approach is enabled by an on-chip clock control technique, applied during periodic on-line self-test and diagnostics, to detect delay shifts over time before functional failures occur. Using 90 nm test chips, we demonstrate the ...


Early-Life Cycle Reuse Approach for Component-Based Software of Autonomous Mobile Robot System

2008 Ninth ACIS International Conference on Software Engineering, Artificial Intelligence, Networking, and Parallel/Distributed Computing, 2008

Applying software reuse to many embedded realtime systems, such as autonomous mobile robot system poses significant challenges to industrial software processes due to the resource-constrained and realtime requirements of the systems. An approach for early life-cycle systematic reuse for component-based software engineering (ELCRA) of autonomous mobile robot software is developed. The approach allows reuse at the early stage of software ...


More Xplore Articles

Educational Resources on Early Life

Back to Top

IEEE-USA E-Books

  • Sequential sampling plans for early-life reliability assessment

    This paper proposes a method for demonstrating early life reliability by combining environmental stress screening strength models and Wald's sequential test for equipment whose early life reliability is described by a Weibull distribution of time to failure. The proposed method uses screening strength models to transform an environmental stress test (e.g. temperature cycling/random vibration) to an equivalent constant heat test. This transformation gives an equivalent number of field operating hours which can then be used together with the Weibull model of early-life reliability to compute the accept and reject boundaries of Wald's sequential test plan. This method helps an equipment supplier decide whether a product meets a customer's requirement of early-life reliability.

  • A test methodology to monitor and predict early life reliability failure mechanisms

    A description is given of a test methodology called operational life testing (OLT), which has been implemented to monitor and quantify the early-life reliability of selected semiconductor technologies and identify early-life failure mechanisms. This monitor measures the effectiveness of screens and tests used to remove device infant-mortality failure modes. In addition, the early-life reliability monitor complements the data derived from highly accelerated long-term reliability tests since it highlights specific failure modes which are not predominant in highly accelerated long-term reliability tests. Information gained from the monitor can be used to implement tests and screens designed to eliminate certain failure modes in a more timely manner than accumulating and analyzing field return data.<<ETX>>

  • Observations on Component Infant Mortality and Burn-In Effectiveness

    The following concepts are discussed: burn-in effectiveness, component failure distributions, early life distribution, early life failures, infant mortality.

  • Low-cost gate-oxide early-life failure detection in robust systems

    We present a new low-cost technique for detecting gate-oxide early-life failures (ELF) to overcome reliability challenges in robust systems without requiring expensive concurrent error detection. Our approach is enabled by an on-chip clock control technique, applied during periodic on-line self-test and diagnostics, to detect delay shifts over time before functional failures occur. Using 90 nm test chips, we demonstrate the following key results: 1. A gate-oxide ELF transistor inside a combinational logic circuit results in delay shifts over time before functional failures appear. 2. The delay shifts can be successfully detected during on-line self-test and diagnostics using our on-chip clock control technique.

  • Early-Life Cycle Reuse Approach for Component-Based Software of Autonomous Mobile Robot System

    Applying software reuse to many embedded realtime systems, such as autonomous mobile robot system poses significant challenges to industrial software processes due to the resource-constrained and realtime requirements of the systems. An approach for early life-cycle systematic reuse for component-based software engineering (ELCRA) of autonomous mobile robot software is developed. The approach allows reuse at the early stage of software development process by integrating analysis patterns, component model, and component-oriented programming framework. The results of applying the approach in developing software for real robots show that the strategies and processes proposed in the approach can fulfill requirements for self-contained, platform-independent and real-time predictable mobile robot.

  • mHealth for Mother and Child Health Nutrition - A Review and Proposed Design for Indonesia Focus on Early Life Nutrition in Indonesia

    Information and communication technologies (ICTs), such as computer, mobile phone, and internet, are emerged as an accelerator in the health sector development. They can play a critical role in pursuing outcome for most vulnerable groups, such as pregnant woman and children in developing countries. In this paper, we review the use of m-Health to improve mother and child health. We use the result of this review to propose a design for a set of m-Health applications focused on the improvement of mother and child nutrition in Indonesia. Our analysis of existing applications includes both a literature review and an empirical search of publicly available mobile apps from Google Search, Google Play, and Apple Store. From the review, we found that there exist several mobile and or e-Health systems focusing in improving early life nutrition delivery, both state and privately made. In Indonesia specifically, the Minister of Health has launched a mobile app for early life to work in conjunction an established monitoring book of mother and child health “Buku Kesehatan Ibu dan Anak”. However, the download rate of this app remains low. This result produced important information that can be further learned, so we could set and deliver a successful humanitarian technology implementation in improving early life nutrition care in Indonesia.

  • Notice of Retraction: Butachlor Disrupts Thyroid Hormones on Early Life Stage of Zebrafish (Danio rerio)

    Butachlor, as a chloracetamide herbicide, is widely used in China. In the present study, zebrafish (Danio rerio) embryos were exposed to different concentrations of butachlor (0, 25, 50, 100 μg L-1) for 30 d, to determine the effects on the hypothalamo-pituitary-thyroid axes. Seven different endpoints were examined: whole-body T4 and T3, TRH and TSH contents, body growth (weight and fork length) and condition factor. The results indicated that butachlor did not affect the mortality, mean length and the contents of TRH and TSH in juveniles, while significantly increased the mean weight, condition factor and the contents of T4 and T3, suggesting that butachlor might be a thyroid disrupter.

  • Extending integrated-circuit yield-models to estimate early-life reliability

    The integrated yield-reliability model for integrated circuits allows one to estimate the yield, following both wafer probe and burn-in testing. The model is based on the long observed clustering of defects and the experimentally verified relation between defects causing wafer probe failures, and defects causing infant mortality failures. The 2-parameter negative binomial distribution is used to describe the distribution of defects over a semiconductor wafer. The clustering parameter /spl alpha/, while known to play a key role in accurately determining wafer probe yields, is shown, for the first time, to play a similar role in determining burn-in fall-out. Numerical results indicate that the number of infant mortality failures predicted by the clustering model can differ appreciably from calculations that ignore clustering. This is particularly apparent when wafer probe yields are low, and clustering is high.

  • A new method of hard disk drive MTTF projection using data from an early life test

    Traditionally, the exponential and the Weibull distribution approaches have been mainly used in the hard disk drive (HDD) industry to evaluate mean time to failure (MTTF) from a life test in which only early failures may be observed. This paper proposes an approach for projecting disk drive field MTTF using a two-phase bathtub curve failure rate function. Based on this 2-phase bathtub curve failure rate function, the MTTF expression is derived and turns out to be a weighted sum of the mean lives of the early failure and useful life distributions. Numerical simulations indicate that the proposed method is superior than the traditional ones.

  • Redundancy implications for early-life reliability: experimental verification of an integrated yield-reliability model

    This paper validates an integrated yield-reliability model for redundant memory using yield and stress test data from a 36 Mbit SRAM memory chip and an 8 Mbit embedded DRAM chip. In both cases, those chips determined functional following wafer test and repair were subjected to voltage stress and burn-in. It is shown that the yield-reliability model can accurately model not only the fraction of die with 0, 1, 2, ... repairs, but also predict the number of stress test failures for a die with a given number of repairs. Because defects in integrated circuits tend to cluster, it has been suspected that repaired die have a greater chance of containing early-life reliability defects than die with no repairs. Repaired die should therefore be more likely to fail stress tests than die with no repairs. This work presents the first experimental validation of these statements. In particular, experimental results indicate that, as predicted by the yield-reliability model, the stress test failure probability is linearly related to the number of repairs; the slope of this line is intimately related to the degree to which defects cluster over the wafer. Model predictions are in excellent agreement with observed data.



Standards related to Early Life

Back to Top

No standards are currently tagged "Early Life"


Jobs related to Early Life

Back to Top