648 resources related to

Oxide Reliability

Top Conferences on Oxide Reliability

2022 59th ACM/IEEE Design Automation Conference (DAC)

2022 IEEE International Electron Devices Meeting (IEDM)

2022 IEEE International Memory Workshop (IMW)

2022 IEEE International Interconnect Technology Conference (IITC)

2021 IEEE 21st International Conference on Nanotechnology (NANO)

2021 IEEE International Reliability Physics Symposium (IRPS)

2021 IEEE 71st Electronic Components and Technology Conference (ECTC)

2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

2020 IEEE Student Conference on Research and Development (SCOReD)

2020 IEEE International Integrated Reliability Workshop (IIRW)

2020 32nd International Conference on Microelectronics (ICM)

2019 20th International Symposium on Quality Electronic Design (ISQED)

2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

2018 IEEE Custom Integrated Circuits Conference (CICC)

2018 IEEE Aerospace Conference

2018 IEEE International Symposium on Circuits and Systems (ISCAS)

2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

2018 18th International Workshop on Junction Technology (IWJT)

2018 19th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM)

2018 25th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)

2018 IEEE 36th VLSI Test Symposium (VTS)

2018 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)

2018 IEEE International Students' Conference on Electrical, Electronics and Computer Science (SCEECS)

2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

2018 International Conference on IC Design & Technology (ICICDT)

2018 International Conference on Power System Technology (POWERCON)

2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)

2016 IEEE 37th International Electronics Manufacturing Technology (IEMT) & 18th Electronics Materials and Packaging (EMAP) Conference

2014 IEEE 45th Semiconductor Interface Specialists Conference (SISC)

2013 International Semiconductor Conference Dresden - Grenoble (ISCDG)

2012 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2012

2011 IEEE PES Conference on Innovative Smart Grid Technologies - Middle East (ISGT Middle East)

2011 International Semiconductor Device Research Symposium (ISDRS)

2009 IEEE International Workshop on Memory Technology, Design and Testing (MTDT)

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Xplore Articles related to Oxide Reliability

Gate **oxide reliability** improvement for CMOS and MEMS monolithic integration

A new degradation mechanism of gate **oxide reliability** due to "extrinsic" responses of Qbd along rough "bird's-beak" frontline

Gate **Oxide Reliability** of 1.2 kV and 6.5 kV SiC MOSFETs under Stair-Shaped Increase of Positive and Negative Gate Bias

Calculating the error in long term **oxide reliability** estimates

Impact of MOSFET Gate-**Oxide Reliability** on CMOS Operational Amplifier in a 130-nm Low-Voltage Process

A unified gate **oxide reliability** model

Gate **Oxide Reliability** Studies of Commercial 1.2 kV 4H-SiC Power MOSFETs

Impacts of Area-Dependent Defects on the Yield and Gate **Oxide Reliability** of SiC Power MOSFETs

Effect of electronic corrections on the thickness dependence of thin **oxide reliability**

Modeling and Analysis of Electro-Thermal Impact of Crosstalk Induced Gate **Oxide Reliability** in Pristine and Intercalation Doped MLGNR Interconnects

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Periodicals related to Oxide Reliability

Applied Superconductivity, IEEE Transactions on

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Device and Materials Reliability, IEEE Transactions on

Display Technology, Journal of

Electron Device Letters, IEEE

Electron Devices, IEEE Transactions on

Microelectromechanical Systems, Journal of

Microwave Theory and Techniques, IEEE Transactions on

Nanotechnology, IEEE Transactions on

Nuclear Science, IEEE Transactions on

Plasma Science, IEEE Transactions on

Potentials, IEEE

Power and Energy Magazine, IEEE

Power Delivery, IEEE Transactions on

Power Systems, IEEE Transactions on

Proceedings of the IEEE

Quantum Electronics, IEEE Journal of

Reliability, IEEE Transactions on

Semiconductor Manufacturing, IEEE Transactions on

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

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E-books related to Oxide Reliability

Dielectric Breakdown of Gate Oxides: Physics and Experiments

Hf-Based High-k Dielectrics: Process Development, Performance Characterization, and Reliability

Resistive Random Access Memory (RRAM)

Appendix A: VCSELs Design Engineering

Insertion and Extraction Forces

Major Driving Forces and Growth Mechanisms for Tin Whiskers

MRAM Applications and Production

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Top Organizations on Oxide Reliability

Circuits & Systems

Communications

Components, Packaging & Manufacturing Tech

Computer

Electron Devices

Electronic Design Automation, Council on

Industrial Electronics

Microwave Theory & Techniques

Nanotechnology Council

Nuclear & Plasma Science

Photonics

Power & Energy

Reliability

Robotics & Automation

Solid State Circuits

Technical Activities Board

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Most published Xplore authors for Oxide Reliability

S. Novak

C. Parker

D. Becher

M. Liu

M. Agostinelli

M. Chahal

P. Packan

P. Nayak

S. Ramey

S. Natarajan

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Oxide Reliability

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Top Conferences on Oxide Reliability

Xplore Articles related to Oxide Reliability

Periodicals related to Oxide Reliability

E-books related to Oxide Reliability

Top Organizations on Oxide Reliability

Most published Xplore authors for Oxide Reliability