68 resources related to

Hi K Metal Gate

Top Conferences on Hi K Metal Gate

2022 IEEE Custom Integrated Circuits Conference (CICC)

2022 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)

2022 IEEE International Solid- State Circuits Conference (ISSCC)

2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

2022 IEEE International Electron Devices Meeting (IEDM)

2021 Silicon Nanoelectronics Workshop (SNW)

2021 Symposium on VLSI Technology

2021 International Conference on IC Design and Technology (ICICDT)

2021 Symposium on VLSI Circuits

2021 IEEE Asian Solid-State Circuits Conference (A-SSCC)

2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD)

2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

2017 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)

2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)

2015 IEEE International Reliability Physics Symposium (IRPS)

2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2013 IEEE International Integrated Reliability Workshop (IIRW)

2012 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2012

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Xplore Articles related to Hi K Metal Gate

High performance Hi-K + metal gate strain enhanced transistors on (110) silicon

Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications

A sub 2W low power IA Processor for Mobile Internet Devices in 45nm Hi-K metal gate CMOS

Optical Scatterometry Modeling of 5 nm Logic Metal Gate Structures

Chemical mechanical polish: The enabling technology

A Sub-1W to 2W Low-Power IA Processor for Mobile Internet Devices and Ultra- Mobile PCs in 45nm Hi-Κ Metal Gate CMOS

The Xeon® Processor E5-2600 v3: a 22 nm 18-Core Product Family

A 22 nm 15-Core Enterprise Xeon® Processor Family

Session 27: CMOS devices and technology - advanced CMOS logic and SoC platforms

Session 16: Process technology - Ge-Channel CMOS and advanced gate stacks

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Periodicals related to Hi K Metal Gate

Applied Superconductivity, IEEE Transactions on

Biomedical Circuits and Systems, IEEE Transactions on

Circuits and Systems II: Express Briefs, IEEE Transactions on

Device and Materials Reliability, IEEE Transactions on

Display Technology, Journal of

Electron Device Letters, IEEE

Electron Devices, IEEE Transactions on

Geoscience and Remote Sensing, IEEE Transactions on

Instrumentation and Measurement, IEEE Transactions on

Lightwave Technology, Journal of

Microelectromechanical Systems, Journal of

Photonics Technology Letters, IEEE

Semiconductor Manufacturing, IEEE Transactions on

Solid-State Circuits, IEEE Journal of

Spectrum, IEEE

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

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Top Organizations on Hi K Metal Gate

Aerospace & Electronics Systems

Circuits & Systems

Communications

Components, Packaging & Manufacturing Tech

Electron Devices

Engineering in Medicine & Biology

Geoscience & Remote Sensing

Instrumentation & Measurement

Member and Geographic Activities

Microwave Theory & Techniques

Photonics

Reliability

Solid State Circuits

Technical Activities Board

Ultrasonics, Ferroelectrics & Frequency Control

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Most published Xplore authors for Hi K Metal Gate

Y. Akasaka

K. Shiraishi

N. Umezawa

O. Ogawa

T. Kasuya

T. Chikyow

F. Ootsuka

Y. Nara

K. Nakamura

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Hi K Metal Gate

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Top Conferences on Hi K Metal Gate

Xplore Articles related to Hi K Metal Gate

Periodicals related to Hi K Metal Gate

Top Organizations on Hi K Metal Gate

Most published Xplore authors for Hi K Metal Gate