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Device Wearout
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Top Conferences on Device Wearout
2022 IEEE 19th Annual Workshop on Microelectronics and Electron Devices (WMED)
2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)
2022 IEEE International Symposium on Medical Measurements and Applications (MeMeA)
2021 IEEE/ACM International Conference On Computer Aided Design (ICCAD)
2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)
2017 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS)
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Standards related to Device Wearout
IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413
IEEE Standard Methodology for Reliability Predictions and Assessment for Electronic Systems Equipment
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