10,514 resources related to

Device Reliability

Top Conferences on Device Reliability

2022 IEEE International Reliability Physics Symposium (IRPS)

ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)

2022 IEEE 19th Annual Workshop on Microelectronics and Electron Devices (WMED)

2022 IEEE/MTT-S International Microwave Symposium - IMS 2022

2022 IEEE International Electron Devices Meeting (IEDM)

2022 IEEE 17th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)

2022 IEEE Applied Power Electronics Conference and Exposition (APEC)

2021 27th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)

2021 IEEE 71st Electronic Components and Technology Conference (ECTC)

2021 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC)

2021 IEEE International Integrated Reliability Workshop (IIRW)

IEEE EUROCON 2021 - 19th International Conference on Smart Technologies

2021 International Conference on IC Design and Technology (ICICDT)

2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)

2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)

2019 IEEE 15th International Conference on Automation Science and Engineering (CASE)

2019 IEEE AUTOTESTCON

2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering

2018 IEEE 29th Annual International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC)

2018 XXIII International Conference on Electrical Machines (ICEM)

2018 IEEE International Symposium on Circuits and Systems (ISCAS)

2018 15th IEEE Annual Consumer Communications & Networking Conference (CCNC)

2018 IEEE Technology Time Machine (TTM)

2018 IEEE International Conference on Power Electronics, Drives and Energy Systems (PEDES)

2018 7th Electronic System-Integration Technology Conference (ESTC)

2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2018 International Symposium on Consumer Technologies (ISCT)

2018 25th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)

2018 12th Spanish Conference on Electron Devices (CDE)

2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

2018 12th International Conference on Reliability, Maintainability, and Safety (ICRMS)

2017 7th International Conference on Power Electronics Systems and Applications - Smart Mobility, Power Transfer & Security (PESA)

2017 IEEE 18th International Symposium on High Assurance Systems Engineering (HASE)

2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP)

2017 70th Annual Conference for Protective Relay Engineers (CPRE)

2017 18th International Conference on Electronic Packaging Technology (ICEPT)

2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation

2017 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)

2017 14th International Multi-Conference on Systems, Signals & Devices (SSD)

2017 International Conference on Optimization of Electrical and Electronic Equipment (OPTIM) & 2017 Intl Aegean Conference on Electrical Machines and Power Electronics (ACEMP)

2017 12th European Microwave Integrated Circuits Conference (EuMIC)

2017 IEEE 19th International Conference on High Performance Computing and Communications; IEEE 15th International Conference on Smart City; IEEE 3rd International Conference on Data Science and Systems (HPCC/SmartCity/DSS)

2017 IEEE 12th International Conference on ASIC (ASICON)

2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM

2017 IEEE International Telecommunications Energy Conference (INTELEC)

2017 29th International Conference on Microelectronics (ICM)

2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation andExperiments in Microelectronics and Microsystems (EuroSimE)

2017 20th International Conference on Electrical Machines and Systems (ICEMS)

2016 12th International Conference on Innovations in Information Technology (IIT)

2016 12th International Conference on the Design of Reliable Communication Networks (DRCN)

2016 17th International Telecommunications Network Strategy and Planning Symposium (Networks)

2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

2015 International Conference on Electrical Systems for Aircraft, Railway, Ship Propulsion and Road Vehicles (ESARS)

2015 International Workshop on Computational Electronics (IWCE)

2015 Second International Conference on Education Technologies and Computers (ICETC)

2015 IEEE Symposium on Product Compliance Engineering (ISPCE)

2014 IEEE Sensors

2012 6th International Conference on Software Security and Reliability (SERE)

2012 21st Asian Test Symposium (ATS)

2012 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2012

2012 IIAI International Conference on Advanced Applied Informatics (IIAIAAI)

2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)

2011 International Symposium on Integrated Circuits (ISIC)

IECON 2011 - 37th Annual Conference of IEEE Industrial Electronics

2011 6th International Conference on Pervasive Computing and Applications (ICPCA)

2010 4th International Conference on Intelligent Information Technology Application (IITA)

2009 Annual Reliability and Maintainability Symposium (RAMS)

2006 IEEE Ultrasonics Symposium

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Xplore Articles related to Device Reliability

Improved PBTI Reliability in Junction-Less FET Fabricated at Low Thermal Budget for 3-D Sequential Integration

Advanced X-ray diffraction metrology as a means of improving semiconductor **device reliability**

Pattern density effect of trench isolation-induced mechanical stress on **device reliability** in sub-0.1/spl mu/m technology

Effect of Photo Misalignment on N-LDMOS Hot Carrier **Device Reliability**

**Device reliability** performance awareness: Impact of RWA on EDFA failure reparation cost in optical networks

New Methodology for the Characterization of EEPROM Extrinsic Behaviors

Impact of junction temperature on microelectronic **device reliability** and considerations for space applications

Gate metal engineered heterojunction DG-TFETs for superior analog performance and enhanced **device reliability**

Sleep-Mode/Traffic Grooming Versus **Device Reliability** Overview

Online Junction Temperature Measurement Method of SiC MOS Devices Using Multiple Electrical Parameters at Transient Surge Current

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Periodicals related to Device Reliability

Advanced Packaging, IEEE Transactions on

Aerospace and Electronic Systems Magazine, IEEE

Applied Superconductivity, IEEE Transactions on

Circuits and Systems II: Express Briefs, IEEE Transactions on

Communications Magazine, IEEE

Communications Surveys & Tutorials, IEEE

Components and Packaging Technologies, IEEE Transactions on

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Computers, IEEE Transactions on

Consumer Electronics, IEEE Transactions on

Device and Materials Reliability, IEEE Transactions on

Dielectrics and Electrical Insulation, IEEE Transactions on

Display Technology, Journal of

Electron Device Letters, IEEE

Electron Devices, IEEE Transactions on

Geoscience and Remote Sensing, IEEE Transactions on

Instrumentation and Measurement, IEEE Transactions on

Internet Computing, IEEE

Lightwave Technology, Journal of

Magnetics, IEEE Transactions on

Micro, IEEE

Microelectromechanical Systems, Journal of

Microwave Theory and Techniques, IEEE Transactions on

Nuclear Science, IEEE Transactions on

Photonics Technology Letters, IEEE

Plasma Science, IEEE Transactions on

Power Delivery, IEEE Transactions on

Power Electronics, IEEE Transactions on

Proceedings of the IEEE

Reliability, IEEE Transactions on

Security & Privacy, IEEE

Selected Areas in Communications, IEEE Journal on

Semiconductor Manufacturing, IEEE Transactions on

Sensors Journal, IEEE

Smart Grid, IEEE Transactions on

Solid-State Circuits, IEEE Journal of

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

Wireless Communications, IEEE

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E-books related to Device Reliability

Spin‐Torque‐Transfer (STT) MRAM Engineering

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Courses related to Device Reliability

Effects of Reliability Mech. On VLSI Circuit Functionality (Archived)

Silicon-Germanium (SiGe) IC Devices and Technology

Transportation Electrification: Power Semiconductors Used in Electric Drive Trains

Non-linear control techniques in photovoltaic and fuel cell power processing systems

High Level Thermal Estimation Flow

Tunable Semiconductor Lasers

Grid Modernization: Smart Distribution Systems

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Standards related to Device Reliability

Guide for Developing and Assessing Reliability Predictions Based on IEEE Standard 1413

IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413

IEEE Standard for Organizational Reliability Capability

IEEE Standard Methodology for Reliability Predictions and Assessment for Electronic Systems Equipment

IEEE Standard Reliability Program for the Development and Production of Electronic Systems and Equipment

Reliability Program for the Development and Production of Electronic Products

Standard Framework for Reliability Prediction of Hardware

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Top Organizations on Device Reliability

Aerospace & Electronics Systems

Circuits & Systems

Communications

Components, Packaging & Manufacturing Tech

Computational Intelligence

Computer

Consumer Technology Society

Control Systems

Dielectrics & Electrical Insulation

Electromagnetic Compatibility

Electron Devices

Electronic Design Automation, Council on

Geoscience & Remote Sensing

Industrial Electronics

Industry Applications

Instrumentation & Measurement

Magnetics

Member and Geographic Activities

Microwave Theory & Techniques

Nuclear & Plasma Science

Photonics

Power & Energy

Power Electronics

Product Safety Engineering

Reliability

Robotics & Automation

Sensors Council

Signal Processing

Solid State Circuits

Technical Activities Board

Ultrasonics, Ferroelectrics & Frequency Control

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Most published Xplore authors for Device Reliability

Changze Liu

Hyun-Chul Sagong

Hyejin Kim

Seungjin Choo

Hyunwoo Lee

Yoohwan Kim

Hyunjin Kim

Bisung Jo

Minjung Jin

Jinjoo Kim

Sangsu Ha

Sangwoo Pae

Jongwoo Park

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Device Reliability

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Top Conferences on Device Reliability

Top Videos on Device Reliability

Xplore Articles related to Device Reliability

Periodicals related to Device Reliability

E-books related to Device Reliability

Courses related to Device Reliability

Standards related to Device Reliability

Top Organizations on Device Reliability

Most published Xplore authors for Device Reliability