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10,514 resources related to
Device Reliability
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Top Conferences on Device Reliability
2023 IEEE/MTT-S International Microwave Symposium - IMS 2023
2023 International Electron Devices Meeting (IEDM)
2023 IEEE Applied Power Electronics Conference and Exposition (APEC)
2022 IEEE International Reliability Physics Symposium (IRPS)
ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC)
2022 IEEE 19th Annual Workshop on Microelectronics and Electron Devices (WMED)
2022 IEEE 17th International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)
2021 27th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
2021 IEEE 71st Electronic Components and Technology Conference (ECTC)
2021 23rd European Microelectronics and Packaging Conference & Exhibition (EMPC)
2021 IEEE International Integrated Reliability Workshop (IIRW)
IEEE EUROCON 2021 - 19th International Conference on Smart Technologies
2021 International Conference on IC Design and Technology (ICICDT)
2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)
2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)
2019 IEEE 15th International Conference on Automation Science and Engineering (CASE)
2019 IEEE AUTOTESTCON
2019 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering
2018 IEEE 29th Annual International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC)
2018 XXIII International Conference on Electrical Machines (ICEM)
2018 IEEE International Symposium on Circuits and Systems (ISCAS)
2018 15th IEEE Annual Consumer Communications & Networking Conference (CCNC)
2018 IEEE Technology Time Machine (TTM)
2018 IEEE International Conference on Power Electronics, Drives and Energy Systems (PEDES)
2018 7th Electronic System-Integration Technology Conference (ESTC)
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
2018 International Symposium on Consumer Technologies (ISCT)
2018 25th International Workshop on Active-Matrix Flatpanel Displays and Devices (AM-FPD)
2018 12th Spanish Conference on Electron Devices (CDE)
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
2018 12th International Conference on Reliability, Maintainability, and Safety (ICRMS)
2017 7th International Conference on Power Electronics Systems and Applications - Smart Mobility, Power Transfer & Security (PESA)
2017 IEEE 18th International Symposium on High Assurance Systems Engineering (HASE)
2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP)
2017 70th Annual Conference for Protective Relay Engineers (CPRE)
2017 18th International Conference on Electronic Packaging Technology (ICEPT)
2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation
2017 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)
2017 14th International Multi-Conference on Systems, Signals & Devices (SSD)
2017 International Conference on Optimization of Electrical and Electronic Equipment (OPTIM) & 2017 Intl Aegean Conference on Electrical Machines and Power Electronics (ACEMP)
2017 12th European Microwave Integrated Circuits Conference (EuMIC)
2017 IEEE 19th International Conference on High Performance Computing and Communications; IEEE 15th International Conference on Smart City; IEEE 3rd International Conference on Data Science and Systems (HPCC/SmartCity/DSS)
2017 IEEE 12th International Conference on ASIC (ASICON)
2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM
2017 IEEE International Telecommunications Energy Conference (INTELEC)
2017 29th International Conference on Microelectronics (ICM)
2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation andExperiments in Microelectronics and Microsystems (EuroSimE)
2017 20th International Conference on Electrical Machines and Systems (ICEMS)
2016 12th International Conference on Innovations in Information Technology (IIT)
2016 12th International Conference on the Design of Reliable Communication Networks (DRCN)
2016 17th International Telecommunications Network Strategy and Planning Symposium (Networks)
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
2015 International Conference on Electrical Systems for Aircraft, Railway, Ship Propulsion and Road Vehicles (ESARS)
2015 International Workshop on Computational Electronics (IWCE)
2015 Second International Conference on Education Technologies and Computers (ICETC)
2015 IEEE Symposium on Product Compliance Engineering (ISPCE)
2014 IEEE Sensors
2012 6th International Conference on Software Security and Reliability (SERE)
2012 21st Asian Test Symposium (ATS)
2012 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2012
2012 IIAI International Conference on Advanced Applied Informatics (IIAIAAI)
2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)
2011 International Symposium on Integrated Circuits (ISIC)
IECON 2011 - 37th Annual Conference of IEEE Industrial Electronics
2011 6th International Conference on Pervasive Computing and Applications (ICPCA)
2010 4th International Conference on Intelligent Information Technology Application (IITA)
2009 Annual Reliability and Maintainability Symposium (RAMS)
2006 IEEE Ultrasonics Symposium
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Top Videos on Device Reliability
Overview and Challenges of Silicon Photonics Device Reliability
Pt. 2: More Moore: Scaling of CMOS - An Chen - Industry Panel 2, IEEE Globecom, 2019
Strain and Surface Warping Detection of Interconnect Microstructures via Laser Diffraction
Reliability Outlook and Challenges for Monolithic SiPh Applications in Foundary Viewpoint
Thermal and Failure Analysis of Advanced Microelectronic Devices
Micro Pillar Support Structure for Mechanical Reliability of Silicon Ultra-Thin Vapor Chambers
Submicron Nanosecond Thermoreflectance Imaging for Thermal and Failure Analysis
Electromigration Failure of Solder Interconnects under Non-DC Conditions
IFEC 2011-International Future Energy Challenge 2011
Cryogenics for Applied Superconductivity - ASC-2014 Plenary series - 11 of 13 - Friday 2014/8/15
Advanced Methodology for Assessing CPI-Induced Stress Effects on Chip Performance and Reliability
Advanced Packaging In Hyperscale Data Center Applications
A Study of Thermal Analysis Modeling Method for Press-pack IGBT Modules Considering Contact Surface Damage
IEEE Future Networks: Networked Electricity
AI-Enabled Systems in Medical Imaging: USFDA Research and Regulatory Pathways
Low Melting Temperature Solder Interconnect Thermo-mechanical Performance, Stability, and Degradation Mechanism
The Origins of Silicon Valley: Characteristics of a Startup Environment
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Xplore Articles related to Device Reliability
Improved PBTI Reliability in Junction-Less FET Fabricated at Low Thermal Budget for 3-D Sequential Integration
Advanced X-ray diffraction metrology as a means of improving semiconductor **device reliability**
Pattern density effect of trench isolation-induced mechanical stress on **device reliability** in sub-0.1/spl mu/m technology
Effect of Photo Misalignment on N-LDMOS Hot Carrier **Device Reliability**
**Device reliability** performance awareness: Impact of RWA on EDFA failure reparation cost in optical networks
New Methodology for the Characterization of EEPROM Extrinsic Behaviors
Impact of junction temperature on microelectronic **device reliability** and considerations for space applications
Gate metal engineered heterojunction DG-TFETs for superior analog performance and enhanced **device reliability**
Sleep-Mode/Traffic Grooming Versus **Device Reliability** Overview
Online Junction Temperature Measurement Method of SiC MOS Devices Using Multiple Electrical Parameters at Transient Surge Current
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Periodicals related to Device Reliability
Advanced Packaging, IEEE Transactions on
Aerospace and Electronic Systems Magazine, IEEE
Applied Superconductivity, IEEE Transactions on
Circuits and Systems II: Express Briefs, IEEE Transactions on
Communications Magazine, IEEE
Communications Surveys & Tutorials, IEEE
Components and Packaging Technologies, IEEE Transactions on
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Computers, IEEE Transactions on
Consumer Electronics, IEEE Transactions on
Device and Materials Reliability, IEEE Transactions on
Dielectrics and Electrical Insulation, IEEE Transactions on
Display Technology, Journal of
Electron Device Letters, IEEE
Electron Devices, IEEE Transactions on
Geoscience and Remote Sensing, IEEE Transactions on
Instrumentation and Measurement, IEEE Transactions on
Internet Computing, IEEE
Lightwave Technology, Journal of
Magnetics, IEEE Transactions on
Micro, IEEE
Microelectromechanical Systems, Journal of
Microwave Theory and Techniques, IEEE Transactions on
Nuclear Science, IEEE Transactions on
Photonics Technology Letters, IEEE
Plasma Science, IEEE Transactions on
Power Delivery, IEEE Transactions on
Power Electronics, IEEE Transactions on
Proceedings of the IEEE
Reliability, IEEE Transactions on
Security & Privacy, IEEE
Selected Areas in Communications, IEEE Journal on
Semiconductor Manufacturing, IEEE Transactions on
Sensors Journal, IEEE
Smart Grid, IEEE Transactions on
Solid-State Circuits, IEEE Journal of
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Wireless Communications, IEEE
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E-books related to Device Reliability
Spin‐Torque‐Transfer (STT) MRAM Engineering
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Courses related to Device Reliability
Effects of Reliability Mech. On VLSI Circuit Functionality (Archived)
Silicon-Germanium (SiGe) IC Devices and Technology
Transportation Electrification: Power Semiconductors Used in Electric Drive Trains
Non-linear control techniques in photovoltaic and fuel cell power processing systems
High Level Thermal Estimation Flow
Tunable Semiconductor Lasers
Grid Modernization: Smart Distribution Systems
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Standards related to Device Reliability
Guide for Developing and Assessing Reliability Predictions Based on IEEE Standard 1413
IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413
IEEE Standard for Organizational Reliability Capability
IEEE Standard Methodology for Reliability Predictions and Assessment for Electronic Systems Equipment
IEEE Standard Reliability Program for the Development and Production of Electronic Systems and Equipment
Reliability Program for the Development and Production of Electronic Products
Standard Framework for Reliability Prediction of Hardware
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Top Organizations on Device Reliability
Aerospace & Electronics Systems
Circuits & Systems
Communications
Components, Packaging & Manufacturing Tech
Computational Intelligence
Computer
Consumer Technology Society
Control Systems
Dielectrics & Electrical Insulation
Electromagnetic Compatibility
Electron Devices
Electronic Design Automation, Council on
Geoscience & Remote Sensing
Industrial Electronics
Industry Applications
Instrumentation & Measurement
Magnetics
Member and Geographic Activities
Microwave Theory & Techniques
Nuclear & Plasma Science
Photonics
Power & Energy
Power Electronics
Product Safety Engineering
Reliability
Robotics & Automation
Sensors Council
Signal Processing
Solid State Circuits
Technical Activities Board
Ultrasonics, Ferroelectrics & Frequency Control
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Most published Xplore authors for Device Reliability
Changze Liu
Hyun-Chul Sagong
Hyejin Kim
Seungjin Choo
Hyunwoo Lee
Yoohwan Kim
Hyunjin Kim
Bisung Jo
Minjung Jin
Jinjoo Kim
Sangsu Ha
Sangwoo Pae
Jongwoo Park
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