Built-in self-test

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A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. (Wikipedia.org)






Conferences related to Built-in self-test

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2020 IEEE International Conference on Consumer Electronics (ICCE)

The International Conference on Consumer Electronics (ICCE) is soliciting technical papersfor oral and poster presentation at ICCE 2018. ICCE has a strong conference history coupledwith a tradition of attracting leading authors and delegates from around the world.Papers reporting new developments in all areas of consumer electronics are invited. Topics around the major theme will be the content ofspecial sessions and tutorials.


2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science andtechnology research development and applications. The list of program topics includes but isnot limited to: Measurement Science & Education, Measurement Systems, Measurement DataAcquisition, Measurements of Physical Quantities, and Measurement Applications.


2020 IEEE International Solid- State Circuits Conference - (ISSCC)

ISSCC is the foremost global forum for solid-state circuits and systems-on-a-chip. The Conference offers 5 days of technical papers and educational events related to integrated circuits, including analog, digital, data converters, memory, RF, communications, imagers, medical and MEMS ICs.


2020 IEEE International Symposium on Circuits and Systems (ISCAS)

The International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems (CAS) Society and the world’s premier networking and exchange forum for researchers in the highly active fields of theory, design and implementation of circuits and systems. ISCAS2020 focuses on the deployment of CASS knowledge towards Society Grand Challenges and highlights the strong foundation in methodology and the integration of multidisciplinary approaches which are the distinctive features of CAS contributions. The worldwide CAS community is exploiting such CASS knowledge to change the way in which devices and circuits are understood, optimized, and leveraged in a variety of systems and applications.


2020 IEEE International Test Conference (ITC)

International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards, and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis, and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2019 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems – covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers

  • 2018 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification and validation, test (DFT, ATPG, and BIST), diagnosis, failure analysis and back to process, yield, reliability and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2017 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2016 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world's premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2015 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek

  • 2014 IEEE International Test Conference (ITC)

    ITC is the world's premier conference dedicated to electronic test technology, covering the complete cycle from design verification, test, diagnosis, failure analysis back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges have been addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2013 IEEE International Test Conference (ITC)

    International Test Conference is the world

  • 2012 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, des

  • 2011 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers.

  • 2010 IEEE International Test Conference (ITC)

    ITC is the world's premier conference dedicated to electronic test technology, covering the complete cycle from design verification,test, diagnosis, failure analysis back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges have been addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2009 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm) events, is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers,

  • 2008 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm), is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

  • 2007 IEEE International Test Conference (ITC)

  • 2006 IEEE International Test Conference (ITC)

  • 2005 IEEE International Test Conference (ITC)

  • 2004 IEEE International Test Conference (ITC)

  • 2003 IEEE International Test Conference (ITC)

  • 2002 IEEE International Test Conference (ITC)

  • 2001 IEEE International Test Conference (ITC)

  • 2000 IEEE International Test Conference (ITC)

  • 1999 IEEE International Test Conference (ITC)

  • 1998 IEEE International Test Conference (ITC)

  • 1997 IEEE International Test Conference (ITC)

  • 1996 IEEE International Test Conference (ITC)


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Periodicals related to Built-in self-test

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Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Circuits and Systems I: Regular Papers, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Computer

Computer, the flagship publication of the IEEE Computer Society, publishes peer-reviewed technical content that covers all aspects of computer science, computer engineering, technology, and applications. Computer is a resource that practitioners, researchers, and managers can rely on to provide timely information about current research developments, trends, best practices, and changes in the profession.


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Most published Xplore authors for Built-in self-test

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Xplore Articles related to Built-in self-test

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Correction to "A minimum universal test set for self-test of EXOR-sum-of-products circuits"

IEEE Transactions on Computers, 2000

None


A 1200b/s QPSK duplex MODEM

1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1984

A quadrature phase-shift key MODEM IC will be discussed. The die (55.7K sq mil) contains all of the modulation, demodulation, filtering and data buffering functions for Bell 212 and CCITT V.2 compatibility.


A 6K gate array with self-test and maintenance

1987 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1987

A gate array fabricated in a 1.25μm double metal technology will be discussed. A built in self-test and maintenance circuit occupies 8% of the 308×314mil die. An on-chip supply voltage translation circuit is also included.


Technology '89 instrumentation

IEEE Spectrum, 1989

Developments in IEEE standards for instrumentation during 1988 are highlighted. Other areas of heightened activity last year are: automated testing, using instrument cards that plug into a personal computer; designing for VLSI testability; and microprocessors integrated onto chips.<<ETX>>


Practical limits of IC testers

1986 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1986

As analog and digital integrated circuits achieve higher levels of integration, testing and test time become a more serious production problem. To keep testing under control, manufacturers are relying on several methods to obtain an acceptable quality level for ICs. These include tighter process control, high temperature testing, limited pattern tests, special circuits for test, and wafer rejection criteria. The ...


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Educational Resources on Built-in self-test

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IEEE.tv Videos

Self-Driving Buses: Minnesota Pilot Project - IEEE Region 4 Presentation
Local Activity, Memristor, and 137 - Leon Chua: 2016 International Conference on Rebooting Computing
Robot Ethics in the Era of Self-Driving Automobiles
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Computer: Alan Turing at Bletchley Park
GHTC 2012 - Robert Freling Keynote
Research, Development and Field Test of Robotic Observation Systems for Active Volcanic Areas in Japan
Micro-Apps 2013: Environment Simulation for Counter-IED Jammer Test
Practical Steps Towards Self-Driving Networks - Kireeti Kompella - IEEE Sarnoff Symposium, 2019
CES 2009: World's First 3-D Webcam
5G Wireless A Measurement and Metrology Perspective: MicroApps 2015 - Keysight Technologies
CES 2008: Eye-Fi Card for Wireless Photo Uploads
Micro-Apps 2013: Creating and Analyzing Multi-Emitter Environment Test Signals with COTS Equipment
Autonomous Driving & Driverless Cars - Grant Imahara and Paul Godsmark from CAVCOE
Micro-Apps 2013: Power Added Efficiency (PAE) Analysis with 8990B Peak Power Analyzer
Robotics History: Narratives and Networks Oral Histories: Chuck Thorpe
Raspberry Pi High Speed SerDes Characterization Platform
MicroApps: Implications of Emerging Technologies on Power Amplifer Manufacturing Test Speed (Agilent Technologies)
Norha Villegas: The Role of Models at Runtime in Smart Cyber Physical Systems: WF IoT 2016
Who Should the Car Hit? Javier Gozalvez - Ignite: Sections Congress 2017

IEEE-USA E-Books

  • Correction to "A minimum universal test set for self-test of EXOR-sum-of-products circuits"

    None

  • A 1200b/s QPSK duplex MODEM

    A quadrature phase-shift key MODEM IC will be discussed. The die (55.7K sq mil) contains all of the modulation, demodulation, filtering and data buffering functions for Bell 212 and CCITT V.2 compatibility.

  • A 6K gate array with self-test and maintenance

    A gate array fabricated in a 1.25&#956;m double metal technology will be discussed. A built in self-test and maintenance circuit occupies 8% of the 308&#215;314mil die. An on-chip supply voltage translation circuit is also included.

  • Technology '89 instrumentation

    Developments in IEEE standards for instrumentation during 1988 are highlighted. Other areas of heightened activity last year are: automated testing, using instrument cards that plug into a personal computer; designing for VLSI testability; and microprocessors integrated onto chips.<<ETX>>

  • Practical limits of IC testers

    As analog and digital integrated circuits achieve higher levels of integration, testing and test time become a more serious production problem. To keep testing under control, manufacturers are relying on several methods to obtain an acceptable quality level for ICs. These include tighter process control, high temperature testing, limited pattern tests, special circuits for test, and wafer rejection criteria. The panel will provide integrated circuit producer's viewpoints on testing to meet quality level targets, and user's perspective on how well they are doing.

  • Can Testing Keep Up With Near-gigahertz Digital Circuits?

    None

  • Self-testing VLSI

    A library of self-testing LSI cells for both on-line and off-line testing will be described, citing a 16×16b array multiplier with 9300 CMOS transistors as an example.

  • Panel: Microprocessor Testing: Which Technique Is Best?

    Microprocessors, in some sense, symbolize the universe in design techniques. Virtually all general and special test techniques are applicable to some section of a microprocessor. What are some of the key companies doing for microprocessor testing today? Is there really a difference between verification and testing of a microprocessor? How much of testing can we afford to do? How do the various fault models really stack up against actual failures? What is an adequate coverage number? How effective are built-in self-test (BIST) techniques? Can we really tolerate the performance hit from BIST techniques? Is there a convergence of ideas on how to do BIST? What are the major companies doing for fault simulation, test pattern generation? Is tester performance keeping up with the advances in design? How severe is the pin count problem of the testers? What are the future challenges?

  • Processor chip design on submicron ASICs

    The processor chip set of the Low End ES/9000 is implemented on five CMOS VLSI Chips containing 2.8 Million transistors with an effective channel length of 0.5 mu m. The chips are packaged on multi-chip and single-chip modules. The worst case operating frequency is 35 MHz. The experience gained during the design of this processor is used to extrapolate into submicron technology down to 0.25 mu m. The result is the expectation of a tremendous density and performance increase within the next decade.<<ETX>>

  • A noise generator for analog-to-digital converter testing

    This paper describes the implementation of a white noise generator to be used as the input signal of a new method for testing analog-to-digital converters in order to detect and to evaluate integral and differential nonlinearity errors. The main goal of this method is to avoid the comparison of the analog- to-digital output with a known and very precise reference input. The proposed white noise generator is easily implemented, and can reduce the complexity of generating other excitation signals. The proposed innovative method uses noise as the excitation signal. The use of this kind of signal avoids concerns about the inherent noise present in all electronic systems. The testing technique is based on the analysis of the spectral response of the ADC output. This paper covers the generation of the excitation signal, and simulation and practical results are presented to prove the efficiency of the method.



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