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Circuit testing
Top Conferences on Circuit testing
2022 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
2022 IEEE/PES Transmission and Distribution Conference and Exposition (T&D)
2021 IEEE International Reliability Physics Symposium (IRPS)
2021 IEEE International Conference on Plasma Science (ICOPS)
2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)
2020 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM)
2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
2019 IEEE International Electric Machines & Drives Conference (IEMDC)
2019 IEEE International Conference on Industrial Technology (ICIT)
2019 IEEE Energy Conversion Congress and Exposition (ECCE)
2019 IEEE 37th VLSI Test Symposium (VTS)
2018 IEEE Custom Integrated Circuits Conference (CICC)
2018 IEEE International Conference on Power Electronics, Drives and Energy Systems (PEDES)
2018 IEEE 27th Asian Test Symposium (ATS)
2018 IEEE PES Transmission & Distribution Conference and Exhibition - Latin America (T&D-LA)
2017 IEEE Regional Symposium on Micro and Nanoelectronics (RSM)
2017 15th IEEE International New Circuits and Systems Conference (NEWCAS)
2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC)
2016 IEEE International Conference on Semiconductor Electronics (ICSE)
2012 28th International Conference on Microelectronics (MIEL 2012)
2012 IEEE International Conference on Power System Technology - (POWERCON 2012)
2011 Third Pacific-Asia Conference on Circuits, Communications and System (PACCS)
2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)
2011 IEEE International Conference on Intelligent Computing and Intelligent Systems (ICIS 2011)
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD)
2009 Reliability of Compound Semiconductors Workshop (ROCS)
2007 IEEE Workshop on Automatic Identification Advanced Technologies (Auto ID)
2007 26th International Conference on Thermoelectrics (ICT 2007)
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