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Design for testability
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Top Conferences on Design for testability
2026 IEEE AUTOTESTCON
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)
2022 IEEE 40th VLSI Test Symposium (VTS)
2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
2021 IEEE 14th International Conference on ASIC (ASICON)
2021 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)
2021 IEEE 32nd International Conference on Microelectronics (MIEL)
2019 Prognostics and System Health Management Conference (PHM-Paris)
2019 IEEE/AIAA 38th Digital Avionics Systems Conference (DASC)
2018 IEEE Custom Integrated Circuits Conference (CICC)
2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)
2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
2018 Condition Monitoring and Diagnosis (CMD)
2018 International Conference on IC Design & Technology (ICICDT)
2018 IEEE 25th International Conference on Software Analysis, Evolution and Reengineering (SANER)
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
2017 International Mixed Signals Testing Workshop (IMSTW)
2017 IEEE Region 5 Meeting
2017 IEEE International High Level Design Validation and Test Workshop (HLDVT)
2016 3rd International Conference on Electronic Design (ICED)
2014 2nd International Conference on Emerging Technology Trends in Electronics, Communication and Networking (ET2ECN)
2013 IEEE 22nd North Atlantic Test Workshop (NATW)
2012 7th International Conference on Computing and Convergence Technology (ICCIT, ICEI and ICACT)
2012 IEEE Electronics, Robotics and Automotive Mechanics Conference (CERMA)
2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)
2011 IEEE 12th International Conference on Computer-Aided Industrial Design & Conceptual Design (CAID & CD)
2010 IEEE International Conference on Communication Control and Computing Technologies (ICCCCT)
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD)
2009 IEEE International Test Synthesis Workshop - ITSW
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