Conferences related to Field Failure

Back to Top

2020 IEEE International Conference on Plasma Science (ICOPS)

IEEE International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society.


2020 IEEE/PES Transmission and Distribution Conference and Exposition (T&D)

Bi-Annual IEEE PES T&D conference. Largest T&D conference in North America.


2019 41st Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)

The conference program will consist of plenary lectures, symposia, workshops andinvitedsessions of the latest significant findings and developments in all the major fields ofbiomedical engineering.Submitted papers will be peer reviewed. Accepted high quality paperswill be presented in oral and postersessions, will appear in the Conference Proceedings and willbe indexed in PubMed/MEDLINE & IEEE Xplore


2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)

Promote the exchange of ideas between academia and industry in the field of computer and networks dependability


2019 IEEE 17th International Conference on Industrial Informatics (INDIN)

Industrial information technologies


More Conferences

Periodicals related to Field Failure

Back to Top

Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Communications Letters, IEEE

Covers topics in the scope of IEEE Transactions on Communications but in the form of very brief publication (maximum of 6column lengths, including all diagrams and tables.)


More Periodicals

Most published Xplore authors for Field Failure

Back to Top

Xplore Articles related to Field Failure

Back to Top

An analysis of field failure of passive and active components, including connectors

Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts, 1988

Summary form only given, as follows. The author briefly describes current work on establishing and running an organization for the collection and analysis of field-failure data on passive and active components in electronic equipment. The data collection is described and the essential features are noted of the data format that is being used. Data have now been collected from all ...


IEEE Recommended Practice for Reporting Field Failure Data for Power Circuit Breakers

IEEE Std 1325-1996, 1996

A format is presented that provides a concise and meaningful method for recording pertinent information on power circuit breaker field failures. It is recommended that this format be utilized in record keeping and directing corrective action to improve field reliability of power circuit breakers.


Field failure analysis of medium voltage XLPE-insulated power cables

IEEE International Symposium on Electrical Insulation, 1990

The following questions are addressed through statistical analysis of field failure data collected over the last 15 ye1rs (a975-90): (a) What is the life expectancy of cross-linked polyethylene (XLPE) cables? (b) What is the cause of the failure? (c) What is the remaining life of the installed cable circuits? (d) What criteria should one use to judge whether cable replacement ...


Flash Memory Field Failure Mechanisms

2006 IEEE International Reliability Physics Symposium Proceedings, 2006

This paper presents a study of flash memory field failures encountered in mobile phone applications. Failure analyses carried out by the flash memory manufacturers have been surveyed, and the failure root causes have been classified. Failure mechanism distributions are presented. Failures related to the manufacturing process defects are the dominant ones in the analyzed failure cases. Defect control and screening ...


Asynchronous operation of synchronous generators under field failure

2014 First International Conference on Automation, Control, Energy and Systems (ACES), 2014

A synchronous generator is forced to asynchronous operation under sudden field failure. Under such fault condition, the general practice is to switch off the faulted machine by the action of an off-set type mho-relay after an appropriate time delay to allow for recoverable swings. This practice is good enough for salient pole hydro-alternators for which both the reactive power burden ...


More Xplore Articles

Educational Resources on Field Failure

Back to Top

IEEE.tv Videos

Flood or Hurricane Protection?: The New Orleans Levee System and Hurricane Katrina
Awareness and Prevention of Electrical Accidents (in Telugu with English subtitles)
Rajiv V. Joshi - 2018 Daniel E. Noble Award for Emerging Technologies at IEEE ISSCC
Citing Sources Appropriately
Lesson Learned in field Robotics from Disasters
ASC-2014 10 Years beyond the 50th Anniversary of High Field Superconductivity: 2 of 9 - Hem Kanithi
ASC-2014 10 Years beyond the 50th Anniversary of High Field Superconductivity: 7 of 9 - Venkat Selvamanickam
ASC-2014 10 Years beyond the 50th Anniversary of High Field Superconductivity: 4 of 9 - IldarAbdyukhanov
IMS 2012 Special Sessions: A Retrospective of Field Theory in Microwave Engineering - Magdalena Salazar Palma
ASC-2014 10 Years beyond the 50th Anniversary of High Field Superconductivity: 6 of 9 - LucaBottura
ASC-2014 10 Years beyond the 50th Anniversary of High Field Superconductivity: 3 of 9 - Jeff Parrell
Research, Development and Field Test of Robotic Observation Systems for Active Volcanic Areas in Japan
ASC-2014 10 Years beyond the 50th Anniversary of High Field Superconductivity: 9 of 9 - Marina Putti
ASC-2014 10 Years beyond the 50th Anniversary of High Field Superconductivity: 1 of 9 David Larbalestier
IMS 2012 Special Sessions: A Retrospective of Field Theory in Microwave Engineering - Constantine A. Balanis
ASC-2014 10 Years beyond the 50th Anniversary of High Field Superconductivity: 8 of 9 - Takanobu Kiss
ASC-2014 10 Years beyond the 50th Anniversary of High Field Superconductivity: 5 of 9 - Manfred Thoener
IMS 2012 Special Sessions: A Retrospective of Field Theory in Microwave Engineering - David M. Pozar
Learning to Dribble on a Real Robot by Success and Failure
Defense Department's Crusher Field Demonstration

IEEE-USA E-Books

  • An analysis of field failure of passive and active components, including connectors

    Summary form only given, as follows. The author briefly describes current work on establishing and running an organization for the collection and analysis of field-failure data on passive and active components in electronic equipment. The data collection is described and the essential features are noted of the data format that is being used. Data have now been collected from all the sources for nearly two years, and the results obtained are presented. Statistical analysis covering three major areas is discussed. They are: the establishment of a field-failure hierarchy showing which components caused the most problems in equipment; analysis of the effect of specific aspects of the component usage on the failure rates observed; and detailed examination of the data supplied to determine possible failure of components due to faults in circuit design. Connectors are also discussed where appropriate.<<ETX>>

  • IEEE Recommended Practice for Reporting Field Failure Data for Power Circuit Breakers

    A format is presented that provides a concise and meaningful method for recording pertinent information on power circuit breaker field failures. It is recommended that this format be utilized in record keeping and directing corrective action to improve field reliability of power circuit breakers.

  • Field failure analysis of medium voltage XLPE-insulated power cables

    The following questions are addressed through statistical analysis of field failure data collected over the last 15 ye1rs (a975-90): (a) What is the life expectancy of cross-linked polyethylene (XLPE) cables? (b) What is the cause of the failure? (c) What is the remaining life of the installed cable circuits? (d) What criteria should one use to judge whether cable replacement is required? Weibull statistics were used to establish the lifetime expected of cables of a particular vintage, design, and voltage class. Cable history, postfailure electrical testing, and microscopic evaluation of the insulation were the parameters studied. The 63% probability lifetimes of 5-, 15-, and 25/28-kV cables of the 1970 vintage are, respectively, 5, 12, and 13 years. The corresponding tree growth rates in the 5-, 15- and 25/28-kV cables are, respectively, 42, 44, and 24% of the insulation wall. The tree growth rate in the jacketed 15-kV cable is 11% of the insulation wall versus 50% for the unjacketed cable. Distribution cables containing water trees with approximately 20% penetration through the insulation wall are likely to show a high incidence of failure.<<ETX>>

  • Flash Memory Field Failure Mechanisms

    This paper presents a study of flash memory field failures encountered in mobile phone applications. Failure analyses carried out by the flash memory manufacturers have been surveyed, and the failure root causes have been classified. Failure mechanism distributions are presented. Failures related to the manufacturing process defects are the dominant ones in the analyzed failure cases. Defect control and screening are key factors to field EFR (early failure rate) control, monitoring and improvement

  • Asynchronous operation of synchronous generators under field failure

    A synchronous generator is forced to asynchronous operation under sudden field failure. Under such fault condition, the general practice is to switch off the faulted machine by the action of an off-set type mho-relay after an appropriate time delay to allow for recoverable swings. This practice is good enough for salient pole hydro-alternators for which both the reactive power burden and the pulsating power component are relatively large. But these quantities are not prohibitively high for a cylindrical pole turbo-alternator. Sustained operation under field failure may be continued for limited time for them without any risk of thermal injury, provided the reactive power requirement of the alternator can be met by the system, keeping the voltage profile within acceptable limits. In this paper, the performance variables under sudden field failure for both salient and non-salient pole generators have been computed by specially constructed programs and presented in tabular form. Taking the example of a 210 MW set of BHEL, it has been established that sustained operation of a cylindrical pole generator is not harmful, particularly when the field circuit is disconnected from the source and closed through a properly chosen value of discharge resistance.

  • Are components still the major problem: a review of electronic system and device field failure returns

    A collection of electronic system and device (component) failure data from various sources over the last 20 years (1972-1992) is presented. Categories of failures are illustrated by means of pie charts. Issues of data collection and confusions in the definitions of failure mechanisms, failure sites, and stages of failure occurrence (design, manufacturing, testing) are discussed. The most recent data are then evaluated, the contribution of the inherent component failures to the system failures is analyzed, and conclusions of significance to the industry are discussed.<<ETX>>

  • A paperless system of reporting and analyzing field failure data for IFTE ATS

    Data collection from complex systems is typically inefficient and inaccurate since it requires a certain degree of operator interaction. Sample Data Collection (SDC) is a well known method of collecting data in some government agencies. This can be a very cumbersome method requiring many man-hours and much dedication of the data collectors in filling out surveys. The US Army has developed a tool for its Integrated Family of Test Equipment (IFTE) which will replace this time and personnel intensive method with a real-time automated process which shall yield considerable cost savings and increase the accuracy of what is reported. Coupled with this reporting scheme are automated analyses, which are currently under development to satisfy the needs of the owners of the equipment under test. Benefits of this automation are numerous. Determining more accurate spares requirements, demonstrating/validating reliability, availability, and maintainability (RAM) values, and many more to be discussed. This automated approach is designed for the US Army's IFTE Automated Test Systems (ATS) which diagnoses and repairs its electronic military systems including, but not limited to, complex avionics, communications, combat, tracked vehicles, and missiles. There are no special requirements for computer equipment, as a 486 generation processor based personal computer is used currently with commercial software tools. This paper details the way the test data is automatically logged into electronic format, the system in place to collect this data, and possible ways to benefit from this technology using automated analyses-all paperless.

  • Steady-state availability estimation using field failure data

    This paper introduces a novel technique for computing confidence limits associated with steady-state availability estimation using field failure data. The proposed cumulative downtime distribution (CDD) method implements a simple, though powerful, availability inference procedure based on the statistical properties of the distribution of sample means of the cumulative system outage time. Another advantage of this new approach over more traditional estimation methods is that it makes no assumptions regarding the lifetime or time to repair distributions of the system under observation. A simulation model was developed to compare the coverage probability of the confidence limits computed using the CDD method and the more traditional two- state equivalent (TSE) method. Simulation runs are used to support that confidence intervals determined with the CDD method seem to be exact. On the other hand, confidence intervals determined using the TSE method seem to be only approximated. Additionally, the CDD method was shown to provide an excellent framework for the application of other statistical inference procedures such as hypothesis testing. Our future research intends to verify the quality of the CDD method using more complex system models and more exhaustive simulation experiments. We also want to verify the algorithm behavior applied to deployed systems with different maturity levels.

  • The DESC field failure evaluation program "a cradle to grave approach"

    This paper describes the Defense Electronics Supply Center's field failure evaluation program and the results achieved. The primary objective of the program is to take positive corrective action steps to assure that quality electronics parts are used in DoD weapon systems. The corrective action steps start with the validation of field failures through lab testing. Lab testing is vital in developing quantitative data and determining whether a failure is user induced or supplier related. This can be accomplished with a full compliment of testing capabilities which include electrical, physical and environmental analysis. The process flow of field failures is described from their inception to final corrective action. To illustrate this, four case studies are presented in which Lab testing and coordination with the supplier has resulted in positive corrective action thus improving the quality and reliability of the electronic components in DoD Weapon Systems.<<ETX>>

  • Sensitivity of field failure intensity to operational profile errors

    Sensitivity of field failure intensity estimates to operational profile occurrence probability errors is investigated. This is an important issue in software reliability engineering, because these estimates enter into many development decisions. Sensitivity was computed for 59,200 sets of conditions, spread over a wide range. For 99.4% of these points, the failure intensity was very robust with respect to occurrence probability errors, the error in failure intensity being more than a factor of 5 smaller than the occurrence probability error. Thus projects do not have to spend extra effort to obtain high precision in measuring the operational profile, nor do they need to worry about moderate changes in system usage with time.<<ETX>>



Standards related to Field Failure

Back to Top

Guide for Developing and Assessing Reliability Predictions Based on IEEE Standard 1413

The scope of this document is to provide guidance for conducting and assessing reliability predictions (techniques and methods) for electronic products and systems.


Guide for Transformer Impulse Tests

To aid in the interpretation and application of the impulse testing requirements of the IEEE Standard Test Codes for Transformers.


Guide to Specifications for Gas-Insulated, Electric Power Substation Equipment

This guide covers the technical requirements for the design, fabrication, testing, installation, and in-service performance of gas-insulated substations(GIS). In line with the user functional one-line diagram, the supplier should furnish all components of the GIS such as circuit breakers(CB), disconnect switches(DS), maintenance ground switches (MGS), fast-acting ground switches(FGS), voltage transformers(VT), current transformers(CT), SF6-to-air bushings, SF6-to-cable terminations, surge arresters, all the ...


IEEE Application Guide for Distributed Digital Control and Monitoring for Power Plants


IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413

Processes and methodologies for conducting reliability predictions for electronic systems and equipment.


More Standards

Jobs related to Field Failure

Back to Top