33,070 resources related to

Failure Analysis

Top Conferences on Failure Analysis

2021 IEEE 30th Asian Test Symposium (ATS)

2021 IEEE International Electron Devices Meeting (IEDM)

2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2023 Annual International Conference of the IEEE Engineering in Medicine & Biology Conference (EMBC)

2020 Optical Fiber Communications Conference and Exhibition (OFC)

2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)

2020 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)

2019 IEEE International Electric Machines & Drives Conference (IEMDC)

2019 49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks (DSN)

2019 IEEE Energy Conversion Congress and Exposition (ECCE)

2019 IEEE 69th Electronic Components and Technology Conference (ECTC)

2019 IEEE International Reliability Physics Symposium (IRPS)

2018 15th IEEE Annual Consumer Communications & Networking Conference (CCNC)

2018 IEEE 29th Annual International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC)

2018 IEEE-IAS/PCA Cement Industry Conference (IAS/PCA)

2018 10th International Conference on Computational Intelligence and Communication Networks (CICN)

2018 17th International Conference on Information Technology Based Higher Education and Training (ITHET)

2018 IEEE PES Asia-Pacific Power and Energy Engineering Conference (APPEEC)

2018 IEEE 42nd Annual Computer Software and Applications Conference (COMPSAC)

2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

2018 IEEE International Conference on Intelligent Transportation Systems (ITSC)

2018 IEEE 32nd International Conference on Advanced Information Networking and Applications (AINA)

2018 IEEE International Conference on Cluster Computing (CLUSTER)

2018 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe)

2018 Wireless Days (WD)

2018 IEEE International Conference on Information Reuse and Integration (IRI)

2017 Annual Reliability and Maintainability Symposium (RAMS)

2017 36th Chinese Control Conference (CCC)

2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

2017 XXVI International Conference on Information, Communication and Automation Technologies (ICAT)

2017 IEEE 37th International Conference on Distributed Computing Systems (ICDCS)

2017 Asia Communications and Photonics Conference (ACP)

2017 Joint International Symposium on e-Manufacturing and Design Collaboration (eMDC) & Semiconductor Manufacturing (ISSM)

2017 IEEE 19th Electronics Packaging Technology Conference (EPTC)

2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation

TENCON 2017 - 2017 IEEE Region 10 Conference

2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

2017 IEEE 25th International Conference on Network Protocols (ICNP)

2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP)

2017 70th Annual Conference for Protective Relay Engineers (CPRE)

2017 18th International Conference on Electronic Packaging Technology (ICEPT)

2017 29th International Conference on Microelectronics (ICM)

2016 12th International Conference on the Design of Reliable Communication Networks (DRCN)

2016 Sixth International Conference on Instrumentation & Measurement, Computer, Communication and Control (IMCCC)

2016 IEEE International Conference on Semiconductor Electronics (ICSE)

2014 International Radar Conference (Radar)

2013 Fifth International Conference on Measuring Technology and Mechatronics Automation (ICMTMA)

2013 IEEE 15th International Symposium and Exhibition onAdvanced Packaging Materials (APM)

2013 Workshop on Accelerated Stress Testing & Reliability (ASTR)

2013 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

2013 International Conference on Mechatronic Sciences, Electric Engineering and Computer (MEC)

2013 IEEE 11th International Conference on Electronic Measurement & Instruments (ICEMI)

2013 IEEE Aerospace Conference

2013 IEEE International 3D Systems Integration Conference (3DIC)

2013 IEEE/AIAA 32nd Digital Avionics Systems Conference (DASC)

2013 IEEE International Conference on Microelectronic Test Structures (ICMTS)

2013 IEEE International Integrated Reliability Workshop (IIRW)

2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)

2012 6th International Conference on Software Security and Reliability (SERE)

2012 International Conference on Management and Service Science (MASS 2012)

2012 7th International Conference on System of Systems Engineering (SoSE)

2012 Spring Congress on Engineering and Technology (S-CET)

2012 IEEE Conference on Prognostics and Health Management (PHM)

2012 Prognostics and System Health Management Conference (PHM-2012 Beijing)

2012 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)

2012 3rd International Conference on Mechanic Automation and Control Engineering (MACE)

2012 IEEE 6th International Conference on Management of Innovation & Technology (ICMIT 2012)

2012 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2012

2012 8th Euro-NF Conference on Next Generation Internet (NGI)

2012 Eighth International Conference on Computational Intelligence and Security (CIS)

2012 IEEE 19th International Conference on Industrial Engineering and Engineering Management (IE&EM 2012)

2012 IEEE International Test Conference (ITC)

2012 IEEE/ASME 8th International Conference on Mechatronic and Embedded Systems and Applications (MESA)

2012 IEEE 14th International Symposium on High-Assurance Systems Engineering (HASE)

2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)

2011 5th International Electrostatic Discharge Workshop (IEW)

2011 Fifth International Conference on Communication System Software and Middleware (COMSWARE)

2010 eChallenges

2010 International Waveform Diversity and Design Conference (WDD)

2010 2nd International Workshop on Database Technology and Applications (DBTA)

2010 International Conference on Science and Social Research (CSSR)

2010 International Conference on Computer Application and System Modeling (ICCASM 2010)

2010 IEEE 21st International Symposium on Software Reliability Engineering (ISSRE)

2010 2nd International Symposium on Data, Privacy & E-Commerce (ISDPE 2010)

2009 Reliability of Compound Semiconductors Workshop (ROCS)

2009 15th IFAC Symposium on System Identification (SYSID 2009)

2009 3rd International Electrostatic Discharge Workshop (IEW)

2009 1st International Conference on Sustainable Power Generation and Supply (SUPERGEN)

2009 IEEE International Conference on Electro/Information Technology (eit2009)

2008 IEEE International Symposium on Knowledge Acquisition and Modeling Workshop (KAM 2008 Workshop)

2008 Advanced Materials & Failure Analysis Workshop (AMFA 2008)

2008 3rd International Conference on Information & Communication Technologies: from Theory to Applications (ICTTA)

2008 2nd International Electrostatic Discharge Workshop (IEW)

2007 International Symposium on High Density Design Packaging and Microsystem Integration (HDP)

2007 International Electrostatic Discharge Workshop (IEW)

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Xplore Articles related to Failure Analysis

Study on the high via resistance by TEM **failure analysis**

Logic **failure analysis** 65/45nm device using RCI & nano scale probe

**Failure Analysis** Case Studies on Wafer Edge Failure due to Process Uniformity Issue

**Failure analysis** on MEMS resonator device in wafer fabrication

**Failure analysis** methodology on center patch issue due to salicidation in wafer fab

**Failure analysis** methodology for the localization of thin and ultra-thin metal barrier residue

**Failure analysis** based on dummy TIVA spot

Application of FIB Circuit Edit and Electrical Characterization in **Failure Analysis** for Invisible Defect Issues

Case study of embedded memory **failure analysis** for dislocation issue

Understanding Protective Overcoat Damages: **Failure Analysis** to the Next Level

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Periodicals related to Failure Analysis

Advanced Packaging, IEEE Transactions on

Automatic Control, IEEE Transactions on

Automation Science and Engineering, IEEE Transactions on

Biomedical Engineering, IEEE Transactions on

Circuits and Systems Magazine, IEEE

Communications Magazine, IEEE

Communications Surveys & Tutorials, IEEE

Components and Packaging Technologies, IEEE Transactions on

Computer

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Computers, IEEE Transactions on

Control Systems Technology, IEEE Transactions on

Device and Materials Reliability, IEEE Transactions on

Dielectrics and Electrical Insulation, IEEE Transactions on

Display Technology, Journal of

Electron Device Letters, IEEE

Electron Devices, IEEE Transactions on

Electronics Packaging Manufacturing, IEEE Transactions on

Engineering Management, IEEE Transactions on

Image Processing, IEEE Transactions on

Industrial Electronics, IEEE Transactions on

Industry Applications, IEEE Transactions on

Instrumentation and Measurement, IEEE Transactions on

Intelligent Transportation Systems, IEEE Transactions on

Latin America Transactions, IEEE (Revista IEEE America Latina)

Magnetics, IEEE Transactions on

Mechatronics, IEEE/ASME Transactions on

Microelectromechanical Systems, Journal of

Network, IEEE

Neural Systems and Rehabilitation Engineering, IEEE Transactions on

Nuclear Science, IEEE Transactions on

Parallel and Distributed Systems, IEEE Transactions on

Pattern Analysis and Machine Intelligence, IEEE Transactions on

Plasma Science, IEEE Transactions on

Power Delivery, IEEE Transactions on

Power Electronics, IEEE Transactions on

Power Systems, IEEE Transactions on

Reliability, IEEE Transactions on

Selected Areas in Communications, IEEE Journal on

Semiconductor Manufacturing, IEEE Transactions on

Sensors Journal, IEEE

Signal Processing, IEEE Transactions on

Smart Grid, IEEE Transactions on

Software Engineering, IEEE Transactions on

Systems Journal, IEEE

Ultrasonics, Ferroelectrics and Frequency Control, IEEE Transactions on

Vehicular Technology, IEEE Transactions on

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

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E-books related to Failure Analysis

Design and Failure Analysis of Composites: Static Loading

Design and Failure Analysis of Composites: Blast Loading

Design and Failure Analysis of Composites: Dynamic and Impact Loading

CAE Design and Failure Analysis of Automotive Composites

A Model-Driven Approach for Dependent Failure Analysis in Consideration of Multicore Processors Using Modified EAST-ADL

ElectromigrationInduced Failure Analysis

Chapter 14 Pump Failure Analysis and Troubleshooting

About the Editors

Introduction

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Courses related to Failure Analysis

Introduction to Developing Embedded Systems

Troubleshooting a Fiber Optic Link - Troubleshooting Components and Spans

Planning and Performing Failure Mode and Effects Analysis on Software

Power Electronics System Thermal Design: Thermal Runaway

Software Safety for Aerospace Applications

Troubleshooting a Fiber Optic Link - Testing and Troubleshooting Links

High Level Thermal Estimation Flow

Effects of Reliability Mech. On VLSI Circuit Functionality (Archived)

Design for Six Sigma

Concepts and Models for Repairable Systems Reliability

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Standards related to Failure Analysis

IEEE Application Guide for Distributed Digital Control and Monitoring for Power Plants

IEEE Guide for Diagnostics and Failure Investigation of Power Circuit Breakers

IEEE Guide for Failure Investigation, Documentation, and Analysis for Power Transformers and Shunt Reactors

IEEE Guide for Induction Machinery Maintenance Testing and Failure Analysis

IEEE Guide for Investigating and Analyzing Power Cable, Joint, and Termination Failures on Systems Rated 5 kV Through 46 kV

IEEE Guide for Selecting and Using Reliability Predictions Based on IEEE 1413

IEEE Standard for Organizational Reliability Capability

IEEE Standard Methodology for Reliability Predictions and Assessment for Electronic Systems Equipment

IEEE Standard Reliability Program for the Development and Production of Electronic Systems and Equipment

Reliability Program for the Development and Production of Electronic Products

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Top Organizations on Failure Analysis

Aerospace & Electronics Systems

Circuits & Systems

Communications

Components, Packaging & Manufacturing Tech

Computational Intelligence

Computer

Control Systems

Dielectrics & Electrical Insulation

Electromagnetic Compatibility

Electron Devices

Electronic Design Automation, Council on

Engineering in Medicine & Biology

Industrial Electronics

Industry Applications

Instrumentation & Measurement

Intelligent Transportation Systems

Magnetics

Member and Geographic Activities

Nuclear & Plasma Science

Photonics

Power & Energy

Power Electronics

Reliability

Robotics & Automation

Sensors Council

Signal Processing

Solid State Circuits

Systems Council

Systems, Man & Cybernetics

Technical Activities Board

Technology Management Council

Ultrasonics, Ferroelectrics & Frequency Control

Vehicular Technology

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Most published Xplore authors for Failure Analysis

S.J. Cho

T.E. Kim

J.K. Hong

J.T. Hong

H.S. Kim

Y.W. Han

S.D. Kwon

Y.S. Oh

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Failure Analysis

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Xplore Articles related to Failure Analysis

Periodicals related to Failure Analysis

E-books related to Failure Analysis

Courses related to Failure Analysis

Standards related to Failure Analysis

Top Organizations on Failure Analysis

Most published Xplore authors for Failure Analysis