1,352 resources related to

Semiconductor Device Reliability

Top Conferences on Semiconductor Device Reliability

2022 IEEE International Conference on Plasma Science (ICOPS)

2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

2022 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)

2022 IEEE International Electron Devices Meeting (IEDM)

2022 IEEE Applied Power Electronics Conference and Exposition (APEC)

2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD)

2021 22nd International Conference on Electronic Packaging Technology (ICEPT)

2021 Device Research Conference (DRC)

2021 IEEE International Reliability Physics Symposium (IRPS)

2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)

2021 International Conference on IC Design and Technology (ICICDT)

ESSDERC 2020 - IEEE 50th European Solid-State Device Research Conference (ESSDERC)

2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)

2020 IEEE International Integrated Reliability Workshop (IIRW)

2019 Annual Reliability and Maintainability Symposium (RAMS)

2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC)

2019 IEEE Workshop on Microelectronics and Electron Devices (WMED)

2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)

2015 International Workshop on Computational Electronics (IWCE)

2011 International Semiconductor Device Research Symposium (ISDRS)

2009 International Workshop on the Physics of Semiconductor Devices (IWPSD)

2009 IEEE International Conference on Portable Information Devices (PORTABLE)

2007 Power Conversion Conference - Nagoya (PCC)

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Xplore Articles related to Semiconductor Device Reliability

Assembly Level Reliability

A new "mixed-mode" reliability degradation mechanism in advanced Si and SiGe bipolar transistors

Consistency Of Similarly Designed Wafer Level Reliability test Structures Produced In Multiple Fabrication Areas

Practical application of a wafer level reliability qualification

"Static Or Dynamic", The Selection Process For A Memory System

On comparing functional fault coverage and defect coverage for memory testing

Failure Reporting, Analysis And Corrective Action System In The US Semiconductor Manufacturing Equipment Industry: A Continuous Improvement Process

400 MHz-A Challenge for the Hybrid Amplifier

Studies on the Possibilities of In-Line Die Attach Characterization of Semiconductor Devices

Finite element simulation of the temperature cycling tests

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E-books related to Semiconductor Device Reliability

Transient Electro-Thermal Modeling of Bipolar Power Semiconductor Devices

Assessment of Reliability Concerns for WideTemperature Operation of Semiconductor Devices and Circuits

Design and the Reliability Factor

Reliability and NVSM Reliability

Appendix E: Reliability and Product Qualification

About the Editor

Reliability and Failure Analysis

Wafer-Level Testing and Test During Burn-In for Integrated Circuits

Introduction

Adaptive Patterning and M‐Series for High Density Integration

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Courses related to Semiconductor Device Reliability

Transportation Electrification: Power Semiconductors Used in Electric Drive Trains

Tunable Semiconductor Lasers

Silicon-Germanium (SiGe) IC Devices and Technology

High Level Thermal Estimation Flow

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Most published Xplore authors for Semiconductor Device Reliability

Wenchao Tian

Chuqiao Wang

Zhanghan Zhao

Xuegui Feng

Zhengguo Wen

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Semiconductor Device Reliability

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Top Conferences on Semiconductor Device Reliability

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Xplore Articles related to Semiconductor Device Reliability

E-books related to Semiconductor Device Reliability

Courses related to Semiconductor Device Reliability

Most published Xplore authors for Semiconductor Device Reliability