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1,352 resources related to
Semiconductor Device Reliability
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Related topics
Semiconductor device measurement
Electrostatic Discharge Protection
Semiconductor device breakdown
Top Conferences on Semiconductor Device Reliability
2023 IEEE International Conference on Plasma Science (ICOPS)
2023 International Electron Devices Meeting (IEDM)
2023 IEEE Applied Power Electronics Conference and Exposition (APEC)
2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)
2022 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)
2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD)
2021 22nd International Conference on Electronic Packaging Technology (ICEPT)
2021 Device Research Conference (DRC)
2021 IEEE International Reliability Physics Symposium (IRPS)
2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)
2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
2021 International Conference on IC Design and Technology (ICICDT)
ESSDERC 2020 - IEEE 50th European Solid-State Device Research Conference (ESSDERC)
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)
2020 IEEE International Integrated Reliability Workshop (IIRW)
2019 Annual Reliability and Maintainability Symposium (RAMS)
2019 22nd European Microelectronics and Packaging Conference & Exhibition (EMPC)
2019 IEEE Workshop on Microelectronics and Electron Devices (WMED)
2018 24rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)
2015 International Workshop on Computational Electronics (IWCE)
2011 International Semiconductor Device Research Symposium (ISDRS)
2009 International Workshop on the Physics of Semiconductor Devices (IWPSD)
2009 IEEE International Conference on Portable Information Devices (PORTABLE)
2007 Power Conversion Conference - Nagoya (PCC)
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Top Videos on Semiconductor Device Reliability
Reliability Outlook and Challenges for Monolithic SiPh Applications in Foundary Viewpoint
Advanced Methodology for Assessing CPI-Induced Stress Effects on Chip Performance and Reliability
A Study of Thermal Analysis Modeling Method for Press-pack IGBT Modules Considering Contact Surface Damage
The Origins of Silicon Valley: Characteristics of a Startup Environment
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Xplore Articles related to Semiconductor Device Reliability
Assembly Level Reliability
A new "mixed-mode" reliability degradation mechanism in advanced Si and SiGe bipolar transistors
Consistency Of Similarly Designed Wafer Level Reliability test Structures Produced In Multiple Fabrication Areas
Practical application of a wafer level reliability qualification
"Static Or Dynamic", The Selection Process For A Memory System
On comparing functional fault coverage and defect coverage for memory testing
Failure Reporting, Analysis And Corrective Action System In The US Semiconductor Manufacturing Equipment Industry: A Continuous Improvement Process
400 MHz-A Challenge for the Hybrid Amplifier
Studies on the Possibilities of In-Line Die Attach Characterization of Semiconductor Devices
Finite element simulation of the temperature cycling tests
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E-books related to Semiconductor Device Reliability
Transient Electro-Thermal Modeling of Bipolar Power Semiconductor Devices
Assessment of Reliability Concerns for WideTemperature Operation of Semiconductor Devices and Circuits
Design and the Reliability Factor
Reliability and NVSM Reliability
Appendix E: Reliability and Product Qualification
About the Editor
Reliability and Failure Analysis
Wafer-Level Testing and Test During Burn-In for Integrated Circuits
Introduction
Adaptive Patterning and M‐Series for High Density Integration
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Courses related to Semiconductor Device Reliability
Transportation Electrification: Power Semiconductors Used in Electric Drive Trains
Tunable Semiconductor Lasers
Silicon-Germanium (SiGe) IC Devices and Technology
High Level Thermal Estimation Flow
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Most published Xplore authors for Semiconductor Device Reliability
Wenchao Tian
Chuqiao Wang
Zhanghan Zhao
Xuegui Feng
Zhengguo Wen
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