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Semiconductor device breakdown

Top Conferences on Semiconductor device breakdown

2021 16th European Microwave Integrated Circuits Conference (EuMIC)

2022 IEEE/MTT-S International Microwave Symposium - IMS 2022

2022 IEEE International Electron Devices Meeting (IEDM)

2021 International Semiconductor Conference (CAS)

2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD)

2021 22nd International Conference on Electronic Packaging Technology (ICEPT)

2021 IEEE International Reliability Physics Symposium (IRPS)

2021 Annual Reliability and Maintainability Symposium (RAMS)

2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials (EDM)

2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)

2021 IEEE 48th Photovoltaic Specialists Conference (PVSC)

2021 IEEE 16th Nanotechnology Materials and Devices Conference (NMDC)

2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)

2020 IEEE International Integrated Reliability Workshop (IIRW)

2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)

2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

2018 IEEE/ACIS 17th International Conference on Computer and Information Science (ICIS)

2018 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD)

2018 IEEE International Conference on Semiconductor Electronics (ICSE)

2018 12th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)

2018 IEEE Symposium on VLSI Technology

2018 12th Spanish Conference on Electron Devices (CDE)

2018 International Conference on IC Design & Technology (ICICDT)

2017 23rd International Workshop on Thermal Investigations of ICs and Systems (THERMINIC)

2017 75th Device Research Conference (DRC)

2017 International Siberian Conference on Control and Communications (SIBCON)

ESSCIRC 2017 - 43rd IEEE European Solid State Circuits Conference (ESSCIRC)

ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)

2017 IEEE 12th International Conference on ASIC (ASICON)

2017 International Caribbean Conference on Devices, Circuits and Systems (ICCDCS)

2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM

2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

2015 6th Asia Symposium on Quality Electronic Design (ASQED)

2013 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering (QR2MSE)

2011 International Semiconductor Device Research Symposium (ISDRS)

2009 Reliability of Compound Semiconductors Workshop (ROCS)

2008 IEEE Power Electronics Specialists Conference - PESC 2008

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Xplore Articles related to Semiconductor device breakdown

Evaluation for fab performance using CPO

Thermal instability of low voltage power-MOSFETs

High-voltage lateral RESURF MOSFETs on 4H-SiC

Non-linearity and randomness in a semiconductor wafer fab

Fast Prediction Of Gate Oxide Reliability - Application Of The Cumulative Damage Principle For Transforming V-Ramp Breakdown Distributions Into TDDB Failure Distributions

Physical random number generator based on MOS structure after soft breakdown

Consequences of internal short-circuits in very high power converters

Local avalanche breakdowns in semiconductor GaAsP diodes

Queueing Generalized Stochastic Colored Timed Petri Nets-based Approach to Modeling for Semiconductor Wafer Fabrication

Investigation of efficient termination structure for improved breakdown properties of semiconductor radiation detectors

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Periodicals related to Semiconductor device breakdown

Components and Packaging Technologies, IEEE Transactions on

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Device and Materials Reliability, IEEE Transactions on

Dielectrics and Electrical Insulation, IEEE Transactions on

Electron Device Letters, IEEE

Electron Devices, IEEE Transactions on

Instrumentation and Measurement, IEEE Transactions on

Microwave Theory and Techniques, IEEE Transactions on

Nanotechnology, IEEE Transactions on

Nuclear Science, IEEE Transactions on

Photonics Technology Letters, IEEE

Power Electronics, IEEE Transactions on

Proceedings of the IEEE

Quantum Electronics, IEEE Journal of

Semiconductor Manufacturing, IEEE Transactions on

Solid-State Circuits, IEEE Journal of

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E-books related to Semiconductor device breakdown

Overview of Tunnel Field‐Effect Transistor

Bulk MOSFET

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Courses related to Semiconductor device breakdown

High Level Thermal Estimation Flow

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Top Organizations on Semiconductor device breakdown

Circuits & Systems

Components, Packaging & Manufacturing Tech

Computer

Dielectrics & Electrical Insulation

Electron Devices

Electronic Design Automation, Council on

Instrumentation & Measurement

Member and Geographic Activities

Microwave Theory & Techniques

Nanotechnology Council

Nuclear & Plasma Science

Photonics

Power Electronics

Reliability

Solid State Circuits

Technical Activities Board

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Semiconductor device breakdown

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Top Conferences on Semiconductor device breakdown

Xplore Articles related to Semiconductor device breakdown

Periodicals related to Semiconductor device breakdown

E-books related to Semiconductor device breakdown

Courses related to Semiconductor device breakdown

Top Organizations on Semiconductor device breakdown