6,747 resources related to

Logic testing

Top Conferences on Logic testing

2023 International Electron Devices Meeting (IEDM)

2023 IEEE International Test Conference (ITC)

2022 59th ACM/IEEE Design Automation Conference (DAC)

2022 IEEE Conference on Software Testing, Verification and Validation (ICST)

2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID)

2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)

2021 IEEE 30th Asian Test Symposium (ATS)

2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

2019 IEEE European Test Symposium (ETS)

2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)

2019 IEEE International Reliability Physics Symposium (IRPS)

2019 IEEE Milan PowerTech

2019 IEEE 37th VLSI Test Symposium (VTS)

2018 26th Signal Processing and Communications Applications Conference (SIU)

2018 IEEE Aerospace Conference

2018 International Semiconductor Conference (CAS)

2018 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE)

2018 XXIII International Conference on Electrical Machines (ICEM)

2018 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)

2018 IEEE International Symposium on Circuits and Systems (ISCAS)

2018 IEEE PES Asia-Pacific Power and Energy Engineering Conference (APPEEC)

2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)

2018 IEEE 29th Annual International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC)

2018 European Conference on Optical Communication (ECOC)

2018 IEEE 42nd Annual Computer Software and Applications Conference (COMPSAC)

2018 IEEE 23rd Pacific Rim International Symposium on Dependable Computing (PRDC)

2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)

2017 27th International Conference on Field Programmable Logic and Applications (FPL)

2017 70th Annual Conference for Protective Relay Engineers (CPRE)

2017 32nd Annual ACM/IEEE Symposium on Logic in Computer Science (LICS)

TENCON 2017 - 2017 IEEE Region 10 Conference

2017 17th International Conference on Control, Automation and Systems (ICCAS)

2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

2017 IEEE 12th International Conference on ASIC (ASICON)

2017 North American Power Symposium (NAPS)

2017 13th International Conference on Emerging Technologies (ICET)

2017 IEEE International Integrated Reliability Workshop (IIRW)

2017 IEEE 30th Conference on Software Engineering Education and Training (CSEE&T)

2017 International Conference on ReConFigurable Computing and FPGAs (ReConFig)

2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)

2017 IEEE International High Level Design Validation and Test Workshop (HLDVT)

2017 13th IEEE International Conference on Electronic Measurement & Instruments (ICEMI)

2016 IEEE International Conference on Semiconductor Electronics (ICSE)

2016 11th International Design & Test Symposium (IDT)

2016 IEEE 37th International Electronics Manufacturing Technology (IEMT) & 18th Electronics Materials and Packaging (EMAP) Conference

2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

2015 6th International Conferenceon Computers and Devices for Communication (CODEC)

2012 6th International Conference on Bioinformatics and Biomedical Engineering (iCBBE)

2012 International Conference on Computer Science and Service System (CSSS)

2012 13th International Workshop on Microprocessor Test and Verification (MTV)

2012 IEEE International Workshop on Defect and Adaptive Test Analysis (DATA)

2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)

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Xplore Articles related to Logic testing

A Zinc Oxide Varistor Protective System for Series Capacitors

Contents

Why We Need Design-for-testability

Design methodologies for VLSI

An ECL field programmable logic array

Buried injector logic: Second generation I2L performance

Monolithic modular digital filters

Differences Between Commercial and Military Testing

Stress testing FET gates without the use of test patterns

A microprocessor development system for ROV CUDA

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Periodicals related to Logic testing

Applied Superconductivity, IEEE Transactions on

Biomedical Engineering, IEEE Transactions on

Circuits and Systems I: Regular Papers, IEEE Transactions on

Circuits and Systems II: Express Briefs, IEEE Transactions on

Communications, IEEE Transactions on

Computer

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Computers, IEEE Transactions on

Design & Test of Computers, IEEE

Device and Materials Reliability, IEEE Transactions on

Electron Device Letters, IEEE

Electron Devices, IEEE Transactions on

Fuzzy Systems, IEEE Transactions on

Industrial Electronics, IEEE Transactions on

Industrial Informatics, IEEE Transactions on

Industry Applications, IEEE Transactions on

Instrumentation & Measurement Magazine, IEEE

Instrumentation and Measurement, IEEE Transactions on

Micro, IEEE

Network and Service Management, IEEE Transactions on

Nuclear Science, IEEE Transactions on

Reliability, IEEE Transactions on

Selected Areas in Communications, IEEE Journal on

Selected Topics in Quantum Electronics, IEEE Journal of

Semiconductor Manufacturing, IEEE Transactions on

Solid-State Circuits, IEEE Journal of

Systems, Man, and Cybernetics, Part B, IEEE Transactions on

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

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E-books related to Logic testing

Logic Testing

Design for Testability

Introduction to Logic Testing

Design to Minimize the Cost of Test Application

Bibliography

Index

Front Matter

Scan Design for Sequential Logic Circuits

The Complexity of Testing

Design for Built-In-Self-Testing

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Courses related to Logic testing

Effects of Reliability Mech. On VLSI Circuit Functionality (Archived)

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Standards related to Logic testing

IEEE Guide for the Application of Faulted Circuit Indicators for 200 / 600 A, Three-phase Underground Distribution

IEEE Standard for Digital Test Interchange Format (DTIF)

IEEE Standard for the Functional Verification Language e

Standard Surge Withstand Capability (SWC) Tests for Relays and Relay Systems Associated with Electric Power Apparatus

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Top Organizations on Logic testing

Circuits & Systems

Communications

Components, Packaging & Manufacturing Tech

Computational Intelligence

Computer

Electron Devices

Electronic Design Automation, Council on

Engineering in Medicine & Biology

Industrial Electronics

Industry Applications

Instrumentation & Measurement

Nuclear & Plasma Science

Photonics

Power & Energy

Reliability

Robotics & Automation

Solid State Circuits

Standards Board

Systems, Man & Cybernetics

Technical Activities Board

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Most published Xplore authors for Logic testing

J.S. Davis

D.C. Keezer

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Logic testing

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Top Conferences on Logic testing

Top Videos on Logic testing

Xplore Articles related to Logic testing

Periodicals related to Logic testing

E-books related to Logic testing

Courses related to Logic testing

Standards related to Logic testing

Top Organizations on Logic testing

Most published Xplore authors for Logic testing