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Automatic Testing
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Top Conferences on Automatic Testing
2026 IEEE AUTOTESTCON
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
ICASSP 2022 - 2022 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)
2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)
2020 IEEE Power & Energy Society General Meeting (PESGM)
2019 IEEE European Test Symposium (ETS)
2019 IEEE International Symposium on Information Theory (ISIT)
2019 IEEE International Professional Communication Conference (ProComm)
2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)
2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)
2018 IEEE 29th Annual International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC)
2018 IEEE 36th VLSI Test Symposium (VTS)
2018 UKACC 12th International Conference on Control (CONTROL)
2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)
2018 IEEE PES Transmission & Distribution Conference and Exhibition - Latin America (T&D-LA)
2018 IEEE 27th Asian Test Symposium (ATS)
2017 Fourth International Conference on Image Information Processing (ICIIP)
2017 IEEE 28th International Symposium on Software Reliability Engineering (ISSRE)
2017 13th International Conference on Natural Computation, Fuzzy Systems and Knowledge Discovery (ICNC-FSKD)
2016 IEEE International Conference on Semiconductor Electronics (ICSE)
2016 12th International Conference on Innovations in Information Technology (IIT)
2016 International Conference on Audio, Language and Image Processing (ICALIP)
2016 IEEE Conference on Computer Aided Control System Design (CACSD)
2015 IEEE 9th International Symposium on Intelligent Signal Processing (WISP)
2015 8th International Conference on Biomedical Engineering and Informatics (BMEI)
2014 6th European Embedded Design in Education and Research Conference (EDERC)
2013 IEEE/AIAA 32nd Digital Avionics Systems Conference (DASC)
2013 International Conference on Communications, Circuits and Systems (ICCCAS)
2012 IEEE International Conference on Data Engineering (ICDE 2012)
2012 2nd International eConference on Computer and Knowledge Engineering (ICCKE)
2012 20th Mediterranean Conference on Control & Automation (MED 2012)
2012 4th International Workshop on Search-driven Development: Users, Infrastructure, Tools, and Evaluation (SUITE)
2012 IEEE International Conference on Virtual Environments, Human-Computer Interfaces and Measurement Systems (VECIMS)
2011 IEEE International Symposium on Robotic and Sensors Environments (ROSE)
2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)
2011 33rd Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC)
2011 IEEE Asia-Pacific Services Computing Conference (APSCC)
2010 3rd International Symposium on Knowledge Acquisition and Modeling (KAM)
2010 International Conference on Biomedical Engineering and Computer Science (ICBECS)
2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2010 International Conference on Intelligent Computation Technology and Automation (ICICTA)
2009 IEEE Radar Conference
2009 Fourth International Conference on Innovative Computing, Information and Control (ICICIC)
2009 41st Southeastern Symposium on System Theory (SSST 2009)
2009 IEEE International High Level Design Validation and Test Workshop (HLDVT)
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD)
2009 1st International Conference on Sustainable Power Generation and Supply (SUPERGEN)
2009 IEEE International Conference on Electro/Information Technology (eit2009)
2009 62nd Annual Conference for Protective Relay Engineers
2007 International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
2007 IEEE Workshop on Automatic Identification Advanced Technologies (Auto ID)
2007 IEEE International Conference on Networking, Sensing and Control (ICNSC)
2006 IEEE 14th International Conference on Fuzzy Systems
2006 19th International Conference on VLSI Design: concurrently with the 5th International Conference on Embedded Systems Design
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Periodicals related to Automatic Testing
Broadcasting, IEEE Transactions on
Education, IEEE Transactions on
Networking, IEEE/ACM Transactions on
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Selected Areas in Communications, IEEE Journal on
Software Engineering, IEEE Transactions on
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E-books related to Automatic Testing
Standards related to Automatic Testing
IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Semiconductor Design Environments
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE Standard for Signal and Test Definition
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data---Core Test Language (CTL)
IEEE StandardTest Interface Language (STIL) for DigitalTest Vector Data
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Unit Under Test(UUT) Description Information
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
IEEE Trial-Use Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language(XML)
IEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450™-1999) for DC Level Specification
Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Test Flow Specification
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Standard for Signal and Test Definition
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