4,762 resources related to
Automatic Test Equipment
Top Conferences on Automatic Test Equipment
2023 IEEE International Symposium on Circuits and Systems (ISCAS)
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
2026 IEEE AUTOTESTCON
2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)
2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)
2019 IEEE 37th VLSI Test Symposium (VTS)
2019 IEEE 17th International Conference on Industrial Informatics (INDIN)
2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)
2018 12th International Conference on Reliability, Maintainability, and Safety (ICRMS)
2017 IEEE 16th International Conference on Cognitive Informatics & Cognitive Computing (ICCI*CC)
2017 International Mixed Signals Testing Workshop (IMSTW)
2017 IEEE 26th International Conference on Enabling Technologies: Infrastructure for Collaborative Enterprises (WETICE)
2017 23rd Asia-Pacific Conference on Communications (APCC)
2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM
2017 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC)
2017 IEEE 26th Asian Test Symposium (ATS)
2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)
2016 12th World Congress on Intelligent Control and Automation (WCICA)
2013 9th International Conference on Wireless Communications, Networking and Mobile Computing (WiCOM)
2013 International Conference on Communications, Circuits and Systems (ICCCAS)
2012 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM)
2012 3rd International Conference on Mechanic Automation and Control Engineering (MACE)
2012 IEEE Electronics, Robotics and Automotive Mechanics Conference (CERMA)
2012 Second International Conference on Electric Information and Control Engineering (ICEICE)
2012 13th Latin American Test Workshop - LATW
2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)
2010 3rd International Symposium on Knowledge Acquisition and Modeling (KAM)
2010 IEEE/PES Transmission & Distribution Conference & Exposition (T&D)
2010 2nd International Conference on Industrial and Information Systems (IIS 2010)
2010 International Conference on Logistics Engineering and Intelligent Transportation Systems (LEITS)
2010 2nd International Conference on Industrial Mechatronics and Automation (ICIMA 2010)
2009 1st International Conference on Sustainable Power Generation and Supply (SUPERGEN)
2009 International Conference on Test and Measurement (ICTM)
2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD)
2009 3rd International Conference on Genetic and Evolutionary Computing (WGEC)
2009 IEEE International Conference on Systems, Man and Cybernetics - SMC
2009 IEEE International Conference on Electro/Information Technology (eit2009)
2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009)
2008 IEEE International High Level Design Validation and Test Workshop (HLDVT)
2007 IEEE Workshop on Automatic Identification Advanced Technologies (Auto ID)
2006 First International Symposium on Environment Identities and Mediterranean Area (ISEIM)
OCEANS 2006
MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference
2005 18th International Conference on VLSI Design: concurrently with the 4th International Conference on Embedded Systems Design
TRANSDUCERS 2005 - 2005 International Solid-State Sensors and Actuators Conference
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Xplore Articles related to Automatic Test Equipment
Periodicals related to Automatic Test Equipment
Consumer Electronics, IEEE Transactions on
Education, IEEE Transactions on
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Selected Areas in Communications, IEEE Journal on
Selected Topics in Quantum Electronics, IEEE Journal of
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E-books related to Automatic Test Equipment
Standards related to Automatic Test Equipment
IEEE Guide for Digital Test Interchange Format (DTIF) Application
IEEE Guide for the Use of IEEE Std 1641, Standard for Signal and Test Definition
IEEE Guide to the Use of the ATLAS Specification
IEEE Standard for Digital Test Interchange Format (DTIF)
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for DC Level Specification
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Semiconductor Design Environments
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
IEEE Standard for Signal and Test Definition
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data---Core Test Language (CTL)
IEEE StandardTest Interface Language (STIL) for DigitalTest Vector Data
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Unit Under Test(UUT) Description Information
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
IEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450™-1999) for DC Level Specification
Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Test Flow Specification
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Standard for Signal and Test Definition
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