Conferences related to System Testing

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2021 IEEE Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology


2020 IEEE 70th Electronic Components and Technology Conference (ECTC)

ECTC is the premier international conference sponsored by the IEEE Components, Packaging and Manufacturing Society. ECTC paper comprise a wide spectrum of topics, including 3D packaging, electronic components, materials, assembly, interconnections, device and system packaging, optoelectronics, reliability, and simulation.


2020 IEEE Applied Power Electronics Conference and Exposition (APEC)

APEC focuses on the practical and applied aspects of the power electronics business. Not just a power designer’s conference, APEC has something of interest for anyone involved in power electronics including:- Equipment OEMs that use power supplies and converters in their equipment- Designers of power supplies, dc-dc converters, motor drives, uninterruptable power supplies, inverters and any other power electronic circuits, equipments and systems- Manufacturers and suppliers of components and assemblies used in power electronics- Manufacturing, quality and test engineers involved with power electronics equipment- Marketing, sales and anyone involved in the business of power electronic- Compliance engineers testing and qualifying power electronics equipment or equipment that uses power electronics


2020 IEEE/MTT-S International Microwave Symposium (IMS)

The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2036 IEEE/MTT-S International Microwave Symposium - IMS 2036

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2031 IEEE/MTT-S International Microwave Symposium - IMS 2031

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2029 IEEE/MTT-S International Microwave Symposium - IMS 2029

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2026 IEEE/MTT-S International Microwave Symposium - IMS 2026

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2025 IEEE/MTT-S International Microwave Symposium - IMS 2025

    The IEEE International Microwave Symposium (IMS) is the world s foremost conferencecovering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies;encompassing everything from basic technologies to components to systems including thelatest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulationand more. The IMS includes technical and interactive sessions, exhibits, student competitions,panels, workshops, tutorials, and networking events.

  • 2024 IEEE/MTT-S International Microwave Symposium - IMS 2024

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2021 IEEE/MTT-S International Microwave Symposium - IMS 2021

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019

    Comprehensive symposium on microwave theory and techniques including active and passive circuit components, theory and microwave systems.

  • 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018

    Microwave theory and techniques, RF/microwave/millimeter-wave/terahertz circuit design and fabrication technology, radio/wireless communication.

  • 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2016 IEEE/MTT-S International Microwave Symposium - IMS 2016

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2015 IEEE/MTT-S International Microwave Symposium - MTT 2015

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics. The IMS includes technical sessions, both oral and interactive, worksh

  • 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014

    IMS2014 will cover developments in microwave technology from nano devices to system applications. Technical paper sessions, interactive forums, plenary and panel sessions, workshops, short courses, industrial exhibits, and a wide array of other technical activities will be offered.

  • 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter -wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010

    Reports of research and development at the state-of-the-art of the theory and techniques related to the technology and applications of devices, components, circuits, modules and systems in the RF, microwave, millimeter-wave, submillimeter-wave and Terahertz ranges of the electromagnetic spectrum.

  • 2009 IEEE/MTT-S International Microwave Symposium - MTT 2009

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2008 IEEE/MTT-S International Microwave Symposium - MTT 2008

  • 2007 IEEE/MTT-S International Microwave Symposium - MTT 2007

  • 2006 IEEE/MTT-S International Microwave Symposium - MTT 2006

  • 2005 IEEE/MTT-S International Microwave Symposium - MTT 2005

  • 2004 IEEE/MTT-S International Microwave Symposium - MTT 2004

  • 2003 IEEE/MTT-S International Microwave Symposium - MTT 2003

  • 2002 IEEE/MTT-S International Microwave Symposium - MTT 2002

  • 2001 IEEE/MTT-S International Microwave Symposium - MTT 2001

  • 2000 IEEE/MTT-S International Microwave Symposium - MTT 2000

  • 1999 IEEE/MTT-S International Microwave Symposium - MTT '99

  • 1998 IEEE/MTT-S International Microwave Symposium - MTT '98

  • 1997 IEEE/MTT-S International Microwave Symposium - MTT '97

  • 1996 IEEE/MTT-S International Microwave Symposium - MTT '96


IECON 2020 - 46th Annual Conference of the IEEE Industrial Electronics Society

IECON is focusing on industrial and manufacturing theory and applications of electronics, controls, communications, instrumentation and computational intelligence.


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Periodicals related to System Testing

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Biomedical Circuits and Systems, IEEE Transactions on

The Transactions on Biomedical Circuits and Systems addresses areas at the crossroads of Circuits and Systems and Life Sciences. The main emphasis is on microelectronic issues in a wide range of applications found in life sciences, physical sciences and engineering. The primary goal of the journal is to bridge the unique scientific and technical activities of the Circuits and Systems ...


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Circuits and Systems for Video Technology, IEEE Transactions on

Video A/D and D/A, display technology, image analysis and processing, video signal characterization and representation, video compression techniques and signal processing, multidimensional filters and transforms, analog video signal processing, neural networks for video applications, nonlinear video signal processing, video storage and retrieval, computer vision, packet video, high-speed real-time circuits, VLSI architecture and implementation for video technology, multiprocessor systems--hardware and software-- ...


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Most published Xplore authors for System Testing

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Xplore Articles related to System Testing

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Knowledge management approach in mobile software system testing

2007 IEEE International Conference on Industrial Engineering and Engineering Management, 2007

Software testing is the last phase in the software development life cycle (SDLC) which aims to test and capture any defects before the software is being deployed. System test is more concentrated on black box testing whereby the functionality and integration between software, hardware and computer system is tested. Motorola Global Software Group Malaysia, Penang (GSG Penang) is the core ...


Implementation of system testing automatization on computer aided systems for hardware and software

2015 IEEE AUTOTESTCON, 2015

In today's technology, systems, consisting of many modules/units, are getting more complex day by day. Therefore, system testing becomes one of the biggest challenges moved by companies with the purpose to enhance final product quality due to market competition, customer demands, cost-cutting strategies, and restricted response time. System testing is considered to be a crucial step in quality management process ...


Proposal of System Testing Integration into Safety Critical System Design Process Supported by SysML

2014 European Modelling Symposium, 2014

This paper focuses on system testing in designing and developing the process of safety critical systems. The proposal aims at identifying the requirements for system testing of safety critical systems and connects them with system model defined in the SysML language. The design and development process is based on analysis of standards and guidelines carried out in our previous work ...


Fault Localization during System Testing

2015 IEEE 23rd International Conference on Program Comprehension, 2015

Functional testing of business applications in the enterprise is carried out by independent test teams. Test scripts are generated manually or automatically from requirements, treating the IT systems as a black box. For every release, when test scripts fail to execute, the test teams need to ascertain the cause of failure, which could be due to mismatch between the requirements ...


System Testing Aided by Structured Analysis: A Practical Experience

IEEE Transactions on Software Engineering, 1985

This paper deals with the use of Structured Analysis just prior to system acceptance testing. Specifically, the drawing of data flow diagrams (DFD) was done after integration testing. The DFD's provided a picture of the logical flow through the integrated system for thorough system acceptance testing. System test sets, were derived from the flows in the DFD's. System test repeatability ...


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Educational Resources on System Testing

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IEEE-USA E-Books

  • Knowledge management approach in mobile software system testing

    Software testing is the last phase in the software development life cycle (SDLC) which aims to test and capture any defects before the software is being deployed. System test is more concentrated on black box testing whereby the functionality and integration between software, hardware and computer system is tested. Motorola Global Software Group Malaysia, Penang (GSG Penang) is the core test team for iDENtrade phone software system testing. The main activity of iDENtrade phone software system test is to conduct phone software functionality test, mobile data (such as GPS and circuit data call) test as well as software stress test through the iDENtrade network simulation in Penang. This paper discusses the proposal of implementing test knowledge management framework in iDENtrade phone software system testing and how the knowledge management approach can benefit the testing team in terms of cost and productivity.

  • Implementation of system testing automatization on computer aided systems for hardware and software

    In today's technology, systems, consisting of many modules/units, are getting more complex day by day. Therefore, system testing becomes one of the biggest challenges moved by companies with the purpose to enhance final product quality due to market competition, customer demands, cost-cutting strategies, and restricted response time. System testing is considered to be a crucial step in quality management process that enables testers to verify and validate the application architecture as well as the requirements. System testing strategy can be manual or automated. With a manual strategy, the more traditional approach; testers prepare test suites that they think will best exercise the program. An automated testing strategy tries to remove the tediousness of the process by relying on a software tool that generates test cases. For its many advantages, automated testing strategy is more reliable; therefore, the idea of designing and developing a generic automatized test setup arised. In this paper, it will be mentioned that design and development of a generic test setup to automatize not only hardware testing facilities, but also software testing facilities for computer aided systems, composed of many platform interfaces. Need of stimulated based environments arised, because of high testing costs. Thanks to this test setup involving simulated environments, automated testing becomes more efficient, economical and tenacious. Regarding the computer based systems, general study by the mentioned system test setup with stimulated environment, followings are executed: Containing hardware interface alternatives; Enabling test many interfaces (software and hardware); Running system tests in accordance with standard communication protocols; Using data entered from user interface in message transmit/receive scenarios; Recording occurred scenarios during testing; Reporting planned and occurred scenarios In addition, this modular automatized test setup can be used and modified for similar computer aided system's testing facilities. As a result, with the help of this modular automatized test setup, the followings are aimed to achieve; Minimized failures based on human error during testing facilities; Detected more failures in early stages; Running testing steps 7x24 continuously; Re- iterating test scenarios frequently; Increased efficiency by reducing test duration and resources.

  • Proposal of System Testing Integration into Safety Critical System Design Process Supported by SysML

    This paper focuses on system testing in designing and developing the process of safety critical systems. The proposal aims at identifying the requirements for system testing of safety critical systems and connects them with system model defined in the SysML language. The design and development process is based on analysis of standards and guidelines carried out in our previous work that focused on system testing process in terms of execution. The proposed model is captured using appropriate SysML diagrams.

  • Fault Localization during System Testing

    Functional testing of business applications in the enterprise is carried out by independent test teams. Test scripts are generated manually or automatically from requirements, treating the IT systems as a black box. For every release, when test scripts fail to execute, the test teams need to ascertain the cause of failure, which could be due to mismatch between the requirements and the test models and test scripts, or faults in the test scripts or faults in the source code. The process is cumbersome and time consuming. While several techniques have been developed to localize source code faults, these target testing carried out by the developer. To help test teams localize faults, we propose the novel idea of applying source code based fault localization technique to process models that represent the system functionality. Experimental results show that the techniques when applied to models, were able to localize both test script and source code faults.

  • System Testing Aided by Structured Analysis: A Practical Experience

    This paper deals with the use of Structured Analysis just prior to system acceptance testing. Specifically, the drawing of data flow diagrams (DFD) was done after integration testing. The DFD's provided a picture of the logical flow through the integrated system for thorough system acceptance testing. System test sets, were derived from the flows in the DFD's. System test repeatability was enhanced by the matrix which flowed from the test sets.

  • The process of requirement analysis about military software system testing

    The requirement of software system testing is the prerequisite and basis. This article has been premised on the concept of the requirement of software testing, research on the relationship between the requirement of software testing and the requirement of software system testing, combine the demand of GJB2725A for software testing requirements, and give the definition of requirement for software testing, give an formal method of analyzing the requirement of software system testing, and how to translate the software requirement to the requirement of software system testing, and give an example at last.

  • An Efficient Overlapping Event Generation Method for Symmetric System Testing

    In a time invariant system with finite events, the possible scenarios are defined by the events and the relative delay between the events. System behavior testing with overlapping events requires all non-redundant scenarios to be generated and utilized for testing. In this work, non-redundant set of scenarios are derived for a symmetric system. A method for generating the scenarios efficiently with granularity control is proposed. An example of the method applied for testing of a symmetric multiprocessing (SMP) multi-core system with multiple peripherals is given. We also describe the improvements for symmetric system method over asymmetric system.

  • A Tool-Based Methodology for System Testing of Service-Oriented Systems

    We present a tool environment and its underlying principles for Telling TestStories, an approach to model-driven system testing of service-oriented systems. Telling TestStories is based on tightly integrated platform- independent system and test models. The approach is capable of test-driven development on the model level, and guarantees high quality system and test models by checking consistency and coverage. Additionally, Telling TestStories provides full traceability between the requirements, the system and test models, and the executable services of the system. The tool environment supports these features in an integrated and clear way.

  • A methodology for transforming memory tests for in-system testing of direct mapped cache tags

    While any efficient test developed for off-line testing of memory chips can be easily adapted for in-system testing of single level memory systems, no efficient methodology is known to transform such a test for in-system testing of multilevel memory systems that have one or more levels of cache. The main challenge is in transforming the known test to test the tags of the cache (testing of the data part of the cache is relatively straightforward). In this paper we present a general methodology to transform march tests for in-system testing of tags of direct mapped caches. The transformation has been used to obtain new versions of March B and March X tests. It is shown that the new versions of tests detect the same sets of faults in the cache tags as their original versions detect in memory chips. Finally, it is demonstrated that the proposed version of March B has significantly lower time complexity than previously proposed tests and can be applied without any modification of the memory system hardware.

  • Reusing a System Testing Process Using with a Model

    In this paper, we proposed an approach to permit the development of a testing platform in parallel with application development by accumulating knowledge of a testing platform developed in the past. First, we define a meta-model called the system testing development platform, and describe how to accumulate a testing platform. Then, we show how to find an appropriate testing platform. This helps system architects or application developers get information about testing platforms they are working on. Last, we explain the creation of template testing codes that help application developers concentrate on developing test data.



Standards related to System Testing

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IEEE Guide for Synthetic Fault Testing of AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis


IEEE Recommended Practice for Maintenance of DC Overhead Contact Systems for Transit Systems

This recommended practice provides overhead contact system maintenance practices and procedures including maintenance techniques, site inspection and test procedures, and maintenance tolerances, for heavy rail, light rail, and trolley bus systems.


IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information

The scope of this trial-use standard is the definition of an exchange format, using eXtensible Markup Language (XML), for identifying all of the hardware, software, and documentation that may be used to test and diagnose a UUT on an automatic test system (ATS).


IEEE Standard Requirements for Instrument Transformers

This standard is intended for use as a basis for performance and interchangeability of equipment covered, and to assist in the proper selection of such equipment. Safety precautions are also addressed. This standard covers certain electrical, dimensional, and mechanical characteristics, and takes into consideration certain safety features of current and inductively coupled voltage transformers of types generally used in the ...


IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions

The scope of this trial-use standard is the definition of an exchange format, utilizing eXtensible Markup Language (XML), for exchanging the test description information defining test performance, test conditions, diagnostic requirements, and support equipment to locate, align, and verify the proper operation of a UUT. This is in support of the development of test program sets (TPSs) that will be ...


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