6,936 resources related to

Testability

Top Conferences on Testability

2022 IEEE 40th VLSI Test Symposium (VTS)

2021 34th International Conference on VLSI Design and 2021 20th International Conference on Embedded Systems (VLSID)

2021 IEEE 71st Electronic Components and Technology Conference (ECTC)

2021 IEEE 16th International Conference on the Experience of Designing and Application of CAD Systems (CADSM)

2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2021 IEEE 14th International Conference on ASIC (ASICON)

2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

2021 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

2021 IEEE 15th International Conference on Electronic Measurement & Instruments (ICEMI)

2020 IEEE 29th Asian Test Symposium (ATS)

2019 20th International Symposium on Quality Electronic Design (ISQED)

2019 Prognostics and System Health Management Conference (PHM-Paris)

2019 IEEE AUTOTESTCON

2019 IEEE/AIAA 38th Digital Avionics Systems Conference (DASC)

2019 IEEE 9th Symposium on Computer Applications & Industrial Electronics (ISCAIE)

2018 IEEE European Test Symposium (ETS)

2018 IEEE 61st International Midwest Symposium on Circuits and Systems (MWSCAS)

2018 IEEE International Symposium on Circuits and Systems (ISCAS)

2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)

2018 13th Annual Conference on System of Systems Engineering (SoSE)

2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)

2018 31st IEEE International System-on-Chip Conference (SOCC)

2018 Condition Monitoring and Diagnosis (CMD)

2018 IEEE 42nd Annual Computer Software and Applications Conference (COMPSAC)

2018 IEEE 25th International Conference on Software Analysis, Evolution and Reengineering (SANER)

2018 Ninth International Conference on Intelligent Control and Information Processing (ICICIP)

2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

2018 IEEE International Test Conference (ITC)

2018 International Conference on IC Design & Technology (ICICDT)

2018 12th International Conference on Reliability, Maintainability, and Safety (ICRMS)

2018 10th International Conference on Communications, Circuits and Systems (ICCCAS)

2017 16th International Conference on Information Technology Based Higher Education and Training (ITHET)

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

2017 International Mixed Signals Testing Workshop (IMSTW)

2017 MIXDES - 24th International Conference "Mixed Design of Integrated Circuits and Systems"

2017 IEEE 30th International Conference on Microelectronics (MIEL)

2017 IEEE Region 5 Meeting

2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

2017 Annual Reliability and Maintainability Symposium (RAMS)

2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)

2017 IEEE 6th International Conference on Teaching Assessment, and Learning for Engineering (TALE)

2017 IEEE International High Level Design Validation and Test Workshop (HLDVT)

2017 29th International Conference on Microelectronics (ICM)

2017 IEEE International Conference on Computer and Information Technology (CIT)

2016 IEEE International 3D Systems Integration Conference (3DIC)

2015 IEEE Recent Advances in Intelligent Computational Systems (RAICS)

2013 9th International Conference on Wireless Communications, Networking and Mobile Computing (WiCOM)

2013 IEEE Sixth International Conference on Software Testing, Verification and Validation (ICST)

2012 3rd International Conference on Mechanic Automation and Control Engineering (MACE)

2012 International Conference on Computer Science and Service System (CSSS)

2012 7th International Conference on Computing and Convergence Technology (ICCIT, ICEI and ICACT)

2012 IEEE Conference on Prognostics and Health Management (PHM)

2012 IEEE Electronics, Robotics and Automotive Mechanics Conference (CERMA)

2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)

2011 International Conference on Electrical and Control Engineering (ICECE)

2011 IEEE 12th International Conference on Computer-Aided Industrial Design & Conceptual Design (CAID & CD)

2010 2nd International Conference on Computer Engineering and Technology (ICCET)

2010 International Conference on Computer Application and System Modeling (ICCASM 2010)

2010 IEEE International Conference on Communication Control and Computing Technologies (ICCCCT)

2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD)

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Xplore Articles related to Testability

Design and code time **testability** analysis for object oriented systems

Design for **testability** reuse in synthesis for **testability**

**Testability** aspects of a DSP based image processing system

**Testability** preserving and enhancing transformations for robust delay fault **testability**

The concepts, methods and technics for the electronic **testability** implementation

Bayesian networks based **testability** prediction of electronic equipment

Design for **Testability**

A low overhead design for **testability** and test generation technique for core-based systems-on-a-chip

In Terms of **Testability** on the Design of Fire Extinguishing and Explosion Suppression System of Armored Vehicles

Non-scan design for **testability** for mixed RTL circuits with both data paths and controller via conflict analysis

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Periodicals related to Testability

Aerospace and Electronic Systems Magazine, IEEE

Automatic Control, IEEE Transactions on

Circuits and Systems II: Express Briefs, IEEE Transactions on

Communications Magazine, IEEE

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Computers, IEEE Transactions on

Design & Test of Computers, IEEE

Education, IEEE Transactions on

Electron Devices, IEEE Transactions on

Instrumentation and Measurement, IEEE Transactions on

Microwave and Wireless Components Letters, IEEE

Nanotechnology, IEEE Transactions on

Reliability, IEEE Transactions on

Selected Areas in Communications, IEEE Journal on

Semiconductor Manufacturing, IEEE Transactions on

Software Engineering, IEEE Transactions on

Solid-State Circuits, IEEE Journal of

Spectrum, IEEE

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

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E-books related to Testability

Design for Testability

Logic Testing

Introduction to Design for Testability

An Introduction to Logic Circuit Testing

Bibliography

Index

Front Matter

Design to Minimize the Cost of Test Application

Scan Design for Sequential Logic Circuits

The Complexity of Testing

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Standards related to Testability

IEEE Standard for Testability and Diagnosability Characteristics and Metrics

Systems and software engineering -- Software life cycle processes

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Top Organizations on Testability

Aerospace & Electronics Systems

Circuits & Systems

Communications

Components, Packaging & Manufacturing Tech

Computer

Control Systems

Education

Electron Devices

Electronic Design Automation, Council on

Instrumentation & Measurement

Member and Geographic Activities

Microwave Theory & Techniques

Nanotechnology Council

Reliability

Solid State Circuits

Systems, Man & Cybernetics

Technical Activities Board

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Most published Xplore authors for Testability

P. Bukovjan

M. Marzouki

W. Maroufi

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Testability

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Xplore Articles related to Testability

Periodicals related to Testability

E-books related to Testability

Standards related to Testability

Top Organizations on Testability

Most published Xplore authors for Testability