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Semiconductor device testing
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Top Conferences on Semiconductor device testing
2021 IEEE International Reliability Physics Symposium (IRPS)
2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
2021 IEEE 71st Electronic Components and Technology Conference (ECTC)
2021 44th International Spring Seminar on Electronics Technology (ISSE)
2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)
2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
2020 19th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
2018 IEEE Custom Integrated Circuits Conference (CICC)
2018 IEEE 19th Workshop on Control and Modeling for Power Electronics (COMPEL)
2018 IEEE Biomedical Circuits and Systems Conference (BioCAS)
2018 IEEE AUTOTESTCON
2018 IEEE 36th VLSI Test Symposium (VTS)
2018 IEEE International Semiconductor Laser Conference (ISLC)
2017 International Conference on Electron Devices and Solid-State Circuits (EDSSC)
2017 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation andExperiments in Microelectronics and Microsystems (EuroSimE)
2017 IEEE International High Level Design Validation and Test Workshop (HLDVT)
2016 3rd International Conference on Electronic Design (ICED)
2016 IEEE International Symposium on Assembly and Manufacturing (ISAM)
2016 IEEE International Conference on Semiconductor Electronics (ICSE)
2013 19th IEEE International Conference on Networks (ICON)
2012 IEEE Electronics, Robotics and Automotive Mechanics Conference (CERMA)
2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)
2009 IEEE International Workshop on Memory Technology, Design and Testing (MTDT)
2007 IEEE International Workshop on Current and Defect Based Testing (DBT)
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Periodicals related to Semiconductor device testing
Power Electronics, IEEE Transactions on
Selected Topics in Quantum Electronics, IEEE Journal of
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