46 resources related to

Yield-enhancement Redundancy

Top Conferences on Yield-enhancement Redundancy

2022 59th ACM/IEEE Design Automation Conference (DAC)

2022 IEEE International Test Conference (ITC)

2021 IEEE European Test Symposium (ETS)

2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

2021 26th Asia and South Pacific Design Automation Conference (ASP-DAC)

2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

2021 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED)

2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)

2020 IEEE 29th Asian Test Symposium (ATS)

2020 27th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

2020 IEEE/ACM International Conference On Computer Aided Design (ICCAD)

2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME)

2017 IEEE 35th International Conference on Computer Design (ICCD)

2017 27th International Conference on Field Programmable Logic and Applications (FPL)

2015 7th International Conference on Emerging Trends in Engineering & Technology (ICETET)

2013 3rd International Conference on Consumer Electronics, Communications and Networks (CECNet)

2009 First International Conference on Advances in System Testing and Validation Lifecycle (VALID 2009)

2009 IEEE International Workshop on Memory Technology, Design and Testing (MTDT)

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Xplore Articles related to Yield-enhancement Redundancy

New method of extraction of systematic failure component

State-of-the-art of the wafer scale ELSA project

Trading off area, yield and performance via hybrid redundancy in multi-core architectures

Memory Die Clustering and Matching for Optimal Voltage Window in Semiconductor

A self-correcting active pixel camera

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Periodicals related to Yield-enhancement Redundancy

Circuits and Systems II: Express Briefs, IEEE Transactions on

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Computers, IEEE Transactions on

Dependable and Secure Computing, IEEE Transactions on

Design & Test of Computers, IEEE

Electron Devices, IEEE Transactions on

Instrumentation and Measurement, IEEE Transactions on

Magnetics, IEEE Transactions on

Proceedings of the IEEE

Reliability, IEEE Transactions on

Semiconductor Manufacturing, IEEE Transactions on

Solid-State Circuits, IEEE Journal of

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

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Top Organizations on Yield-enhancement Redundancy

Circuits & Systems

Components, Packaging & Manufacturing Tech

Computer

Electron Devices

Electronic Design Automation, Council on

Instrumentation & Measurement

Magnetics

Reliability

Solid State Circuits

Technical Activities Board

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Most published Xplore authors for Yield-enhancement Redundancy

Changwook Lee

Wooheon Kang

Donkoo Cho

Sungho Kang

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Yield-enhancement Redundancy

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Top Conferences on Yield-enhancement Redundancy

Xplore Articles related to Yield-enhancement Redundancy

Periodicals related to Yield-enhancement Redundancy

Top Organizations on Yield-enhancement Redundancy

Most published Xplore authors for Yield-enhancement Redundancy