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Test pattern generators
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Top Conferences on Test pattern generators
2023 IEEE International Symposium on Circuits and Systems (ISCAS)
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
2021 IEEE European Test Symposium (ETS)
2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)
2021 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)
2020 IEEE International Conference on Robotics and Automation (ICRA)
2020 IEEE Power & Energy Society General Meeting (PESGM)
2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)
2019 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)
2019 IEEE 37th VLSI Test Symposium (VTS)
2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
2018 IEEE 29th Annual International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC)
2018 IEEE International Conference on Computational Intelligence and Computing Research (ICCIC)
2018 IEEE Canadian Conference on Electrical & Computer Engineering (CCECE)
2017 International Mixed Signals Testing Workshop (IMSTW)
2017 IEEE Pacific Rim Conference on Communications, Computers and Signal Processing (PACRIM)
2017 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC)
2017 IEEE International Conference on Robotics and Biomimetics (ROBIO)
2017 IEEE International High Level Design Validation and Test Workshop (HLDVT)
2017 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC)
2016 IEEE International Conference on Semiconductor Electronics (ICSE)
2013 IEEE 22nd North Atlantic Test Workshop (NATW)
2012 IEEE Electronics, Robotics and Automotive Mechanics Conference (CERMA)
2012 3rd International Conference on Mechanic Automation and Control Engineering (MACE)
2011 Academic International Symposium on Optoelectronics and Microelectronics Technology (AISOMT)
2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)
2010 3rd International Symposium on Knowledge Acquisition and Modeling (KAM)
2007 IST Mobile & Wireless Communications Summit
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Pattern Analysis and Machine Intelligence, IEEE Transactions on
Software Engineering, IEEE Transactions on
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