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Test pattern generators

Top Conferences on Test pattern generators

2022 IEEE International Test Conference (ITC)

2023 IEEE International Symposium on Circuits and Systems (ISCAS)

2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

2021 IEEE European Test Symposium (ETS)

2021 IEEE Pulsed Power Conference (PPC)

2021 Joint 10th International Conference on Informatics, Electronics & Vision (ICIEV) and 2021 5th International Conference on Imaging, Vision & Pattern Recognition (icIVPR)

2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)

2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

2021 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

2020 IEEE International Conference on Robotics and Automation (ICRA)

2020 IEEE Power & Energy Society General Meeting (PESGM)

2020 IEEE 29th Asian Test Symposium (ATS)

2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)

2019 20th International Symposium on Quality Electronic Design (ISQED)

2019 IEEE Industry Applications Society Annual Meeting

2019 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)

2019 IEEE 37th VLSI Test Symposium (VTS)

2018 17th International Conference on Information Technology Based Higher Education and Training (ITHET)

2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)

2018 IEEE 29th Annual International Symposium on Personal, Indoor and Mobile Radio Communications (PIMRC)

2018 IEEE International Conference on Computational Intelligence and Computing Research (ICCIC)

2018 53rd International Universities Power Engineering Conference (UPEC)

2018 IEEE Canadian Conference on Electrical & Computer Engineering (CCECE)

2018 IEEE International Parallel and Distributed Processing Symposium (IPDPS)

2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

2017 Symposium on Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP)

2017 International Mixed Signals Testing Workshop (IMSTW)

2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

2017 MIXDES - 24th International Conference "Mixed Design of Integrated Circuits and Systems"

2017 IEEE Pacific Rim Conference on Communications, Computers and Signal Processing (PACRIM)

2017 IEEE International Conference on Computational Science and Engineering (CSE) and IEEE International Conference on Embedded and Ubiquitous Computing (EUC)

2017 IEEE International Conference on Robotics and Biomimetics (ROBIO)

2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

TENCON 2017 - 2017 IEEE Region 10 Conference

2017 IEEE International Conference on Computer and Information Technology (CIT)

2017 IEEE International High Level Design Validation and Test Workshop (HLDVT)

2017 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC)

2016 IEEE International Conference on Semiconductor Electronics (ICSE)

2014 14th International Conference on Quality Software (QSIC)

2013 IEEE 22nd North Atlantic Test Workshop (NATW)

2013 3rd International Conference on Consumer Electronics, Communications and Networks (CECNet)

2012 IEEE Electronics, Robotics and Automotive Mechanics Conference (CERMA)

2012 3rd International Conference on Mechanic Automation and Control Engineering (MACE)

2011 Academic International Symposium on Optoelectronics and Microelectronics Technology (AISOMT)

2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)

2010 2nd International Conference on Software Technology and Engineering (ICSTE 2010)

2010 3rd International Symposium on Knowledge Acquisition and Modeling (KAM)

2007 IST Mobile & Wireless Communications Summit

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Xplore Articles related to Test pattern generators

A modular design and test approach for a family of VLSI MPUs

Advanced synchronous scan test methodology for multi clock domain ASICs

Practical Aspects of Delay Testing for Nanometer Chips

Design of built-in test generator circuits using width compression

Advanced automatic test pattern generation and redundancy identification techniques

Partial scan using multi-hop state reachability analysis

Quality Driven Manufacturing and SOC Designs

Design and synthesis of low power weighted random pattern generator considering peak power reduction

Advanced automatic test pattern generation techniques for path delay faults

Experimental Results of Transition Fault Simulation with DC Scan Tests

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Periodicals related to Test pattern generators

Antennas and Propagation, IEEE Transactions on

Applied Superconductivity, IEEE Transactions on

Biomedical Circuits and Systems, IEEE Transactions on

Biomedical Engineering, IEEE Transactions on

Communications Magazine, IEEE

Computer

Computer Graphics and Applications, IEEE

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Computers, IEEE Transactions on

Control Systems Technology, IEEE Transactions on

Design & Test of Computers, IEEE

Education, IEEE Transactions on

Electron Devices, IEEE Transactions on

Industrial Electronics, IEEE Transactions on

Industry Applications, IEEE Transactions on

Information Theory, IEEE Transactions on

Instrumentation and Measurement, IEEE Transactions on

Magnetics, IEEE Transactions on

Mechatronics, IEEE/ASME Transactions on

Micro, IEEE

Neural Networks, IEEE Transactions on

Pattern Analysis and Machine Intelligence, IEEE Transactions on

Proceedings of the IEEE

Semiconductor Manufacturing, IEEE Transactions on

Software Engineering, IEEE Transactions on

Solid-State Circuits, IEEE Journal of

Vehicular Technology, IEEE Transactions on

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

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E-books related to Test pattern generators

Model‐based Predictive Control for Damping Electromechanical Oscillations in Power Systems

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Standards related to Test pattern generators

IEEE Standard for Digital Test Interchange Format (DTIF)

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Top Organizations on Test pattern generators

Antennas & Propagation

Circuits & Systems

Communications

Components, Packaging & Manufacturing Tech

Computational Intelligence

Computer

Control Systems

Education

Electron Devices

Electronic Design Automation, Council on

Engineering in Medicine & Biology

Industrial Electronics

Industry Applications

Information Theory

Instrumentation & Measurement

Magnetics

Reliability

Robotics & Automation

Solid State Circuits

Technical Activities Board

Vehicular Technology

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Most published Xplore authors for Test pattern generators

I. Hamzaoglu

J.H. Patel

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Test pattern generators

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Top Conferences on Test pattern generators

Xplore Articles related to Test pattern generators

Periodicals related to Test pattern generators

E-books related to Test pattern generators

Standards related to Test pattern generators

Top Organizations on Test pattern generators

Most published Xplore authors for Test pattern generators