693 resources related to

Single Event Upsets

Top Conferences on Single Event Upsets

2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

2023 IEEE International Symposium on Circuits and Systems (ISCAS)

2021 IEEE International Reliability Physics Symposium (IRPS)

2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

2020 IEEE International Integrated Reliability Workshop (IIRW)

2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)

2019 20th International Symposium on Quality Electronic Design (ISQED)

2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES)

2018 International Conference on IC Design & Technology (ICICDT)

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)

2010 International Conference on E-Product E-Service and E-Entertainment (ICEEE 2010)

2007 IEEE Region 5 Technical, Professional and Student Development Workshop (TPS)

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Xplore Articles related to Single Event Upsets

SEE Measurements and Simulations Using Mono-Energetic GeV-Energy Hadron Beams

Single event transients of scan flip-flop and an SET-immune redundant delay filter (RDF)

Phase Noise and Jitter Measurements in SEU-Hardened CMOS Phase Locked Loop Design

Study of a delayed single-event effect in the Muller C-element

Mitigating Multi-Bit-Upset With Well-Slits in 28 nm Multi-Bit-Latch

Simulation of Proton Induced SET in Linear Devices and Assessment of Sensitive Thicknesses

Handling Soft Error in Embedded Software for Networking System

Detecting **Single Event Upsets** in Embedded Software

Single-Event Upsets Characterization & Evaluation of Xilinx UltraScale™ Soft Error Mitigation (SEM IP) Tool

Development of a radiation-hardened standard cell library for 65nm CMOS technology

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E-books related to Single Event Upsets

Neutron Induced Upset

Upset Rates in Neutral Particle Beam (NPB) Environments

Appendix C: Quick Estimates of Upset Rates Using the Figure of Merit

Upsets Produced by Heavy Ion Nuclear Reactions

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Most published Xplore authors for Single Event Upsets

R. Giordano

A. Aloisio

S. Massarotti

G. Tortone

Y.-T. Lai

S. Korpar

R. Pestotnik

L. Šantelj

A. Lozar

M. Shoji

S. Nishida

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Single Event Upsets

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Top Conferences on Single Event Upsets

Xplore Articles related to Single Event Upsets

E-books related to Single Event Upsets

Most published Xplore authors for Single Event Upsets