2,944 resources related to

Single Event Upset

Top Conferences on Single Event Upset

2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

2023 IEEE International Symposium on Circuits and Systems (ISCAS)

2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

2021 IEEE International Reliability Physics Symposium (IRPS)

2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)

2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

2020 IEEE International Integrated Reliability Workshop (IIRW)

2019 IEEE 62nd International Midwest Symposium on Circuits and Systems (MWSCAS)

2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)

2019 20th International Symposium on Quality Electronic Design (ISQED)

2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

2018 IEEE European Test Symposium (ETS)

2018 IEEE Aerospace Conference

2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES)

2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

2018 Annual Reliability and Maintainability Symposium (RAMS)

2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

2018 IEEE Canadian Conference on Electrical & Computer Engineering (CCECE)

2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

2018 IEEE International Test Conference (ITC)

2018 International Conference on IC Design & Technology (ICICDT)

2018 IEEE 19th Latin-American Test Symposium (LATS)

2017 IEEE 26th Asian Test Symposium (ATS)

TENCON 2017 - 2017 IEEE Region 10 Conference

2017 NASA/ESA Conference on Adaptive Hardware and Systems (AHS)

2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

2017 International Conference on Field Programmable Technology (ICFPT)

2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

2017 IEEE 35th International Conference on Computer Design (ICCD)

2017 6th International Conference on Space Mission Challenges for Information Technology (SMC-IT)

2016 IEEE International Conference on Semiconductor Electronics (ICSE)

2016 X IEEE Southern Conference on Programmable Logic (SPL)

2016 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

2015 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD)

2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

2012 6th International Conference on Software Security and Reliability (SERE)

2012 23rd European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 2012

2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)

2011 3rd International Conference on Computer Science and its Applications (CSA 2011)

2010 International Conference on E-Product E-Service and E-Entertainment (ICEEE 2010)

2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis (ICTD)

2009 3rd International Electrostatic Discharge Workshop (IEW)

2008 2nd International Electrostatic Discharge Workshop (IEW)

2007 International Electrostatic Discharge Workshop (IEW)

2007 IEEE Region 5 Technical, Professional and Student Development Workshop (TPS)

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Xplore Articles related to Single Event Upset

Use of code error and beat frequency test method to identify **single event upset** sensitive circuits in a 1GHz analog to digital converter

Use of Code Error and Beat Frequency Test Method to Identify **Single Event Upset** Sensitive Circuits in a 1 GHz Analog to Digital Converter

Proton Induced **Single Event Upset** in 6 T SOI SRAMs

**Single Event Upset** Characterization of the Virtex-4 Field Programmable Gate Array Using Proton Irradiation

Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

1.1 Ghz integer N phase lock loop with superior **single event upset** and total dose properties suitable for commercial space applications

Heavy ion linear energy transfer measurements during **single event upset** testing of electronic devices

SEIFF: Soft Error Immune Flip-Flop for Mitigating **Single Event Upset** and Single Event Transient in 10 nm FinFET

PRIVET-A Heavy Ion Induced **Single Event Upset** Rate Simulator in Space Environment

**Single event upset** characteristics of some digital integrated frequency synthesizers

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Periodicals related to Single Event Upset

Circuits and Systems II: Express Briefs, IEEE Transactions on

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Dependable and Secure Computing, IEEE Transactions on

Design & Test of Computers, IEEE

Device and Materials Reliability, IEEE Transactions on

Electron Device Letters, IEEE

Industrial Electronics, IEEE Transactions on

Instrumentation and Measurement, IEEE Transactions on

Magnetics, IEEE Transactions on

Micro, IEEE

Nuclear Science, IEEE Transactions on

Reliability, IEEE Transactions on

Semiconductor Manufacturing, IEEE Transactions on

Software Engineering, IEEE Transactions on

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

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E-books related to Single Event Upset

Neutron Induced Upset

Upset Rates in Neutral Particle Beam (NPB) Environments

Appendix C: Quick Estimates of Upset Rates Using the Figure of Merit

Upsets Produced by Heavy Ion Nuclear Reactions

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Top Organizations on Single Event Upset

Circuits & Systems

Components, Packaging & Manufacturing Tech

Computer

Electron Devices

Electronic Design Automation, Council on

Industrial Electronics

Instrumentation & Measurement

Magnetics

Nuclear & Plasma Science

Reliability

Solid State Circuits

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Most published Xplore authors for Single Event Upset

R. Giordano

A. Aloisio

S. Massarotti

G. Tortone

Y.-T. Lai

S. Korpar

R. Pestotnik

L. Šantelj

A. Lozar

M. Shoji

S. Nishida

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Single Event Upset

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Top Conferences on Single Event Upset

Xplore Articles related to Single Event Upset

Periodicals related to Single Event Upset

E-books related to Single Event Upset

Top Organizations on Single Event Upset

Most published Xplore authors for Single Event Upset