2,426 resources related to

Automatic test pattern generation

Top Conferences on Automatic test pattern generation

2022 IEEE European Test Symposium (ETS)

2022 10th International Conference on Emerging Trends in Engineering and Technology - Signal and Information Processing (ICETET-SIP-22)

2022 IEEE International Symposium on Circuits and Systems (ISCAS)

2022 23rd International Symposium on Quality Electronic Design (ISQED)

2022 59th ACM/IEEE Design Automation Conference (DAC)

2022 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)

2022 IEEE 40th VLSI Test Symposium (VTS)

2022 IEEE International Test Conference (ITC)

2023 Annual International Conference of the IEEE Engineering in Medicine & Biology Conference (EMBC)

2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

2026 IEEE AUTOTESTCON

2021 IEEE/ACM 43rd International Conference on Software Engineering (ICSE)

2021 IEEE East-West Design & Test Symposium (EWDTS)

2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)

2021 IEEE 30th Asian Test Symposium (ATS)

2021 Design, Automation & Test in Europe Conference & Exhibition (DATE)

2021 IEEE 22nd Latin American Test Symposium (LATS)

2021 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)

2021 IEEE 15th International Conference on Electronic Measurement & Instruments (ICEMI)

2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC)

2019 34th IEEE/ACM International Conference on Automated Software Engineering (ASE)

2019 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)

2018 13th IEEE International Conference on Automatic Face & Gesture Recognition (FG 2018)

2018 IEEE/ACIS 17th International Conference on Computer and Information Science (ICIS)

2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)

2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)

2018 24th International Conference on Pattern Recognition (ICPR)

2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID)

2018 10th International Conference on Communications, Circuits and Systems (ICCCAS)

2017 International SoC Design Conference (ISOCC)

2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

2017 IEEE 30th Computer Security Foundations Symposium (CSF)

2017 IEEE Region 5 Meeting

2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)

2017 MIXDES - 24th International Conference "Mixed Design of Integrated Circuits and Systems"

2017 IEEE International Conference on Computer and Information Technology (CIT)

2017 IEEE International High Level Design Validation and Test Workshop (HLDVT)

2016 IEEE International Conference on Semiconductor Electronics (ICSE)

2016 11th International Design & Test Symposium (IDT)

2016 3rd International Conference on Electronic Design (ICED)

2015 10th International Conference on Testbeds and Research Infrastructure for the Development of Communities and Networks (TridentCom)

2015 6th Asia Symposium on Quality Electronic Design (ASQED)

2014 14th International Conference on Quality Software (QSIC)

2014 IEEE Symposium on Computational Intelligence in Dynamic and Uncertain Environments (CIDUE)

2012 International Symposium on Communications and Information Technologies (ISCIT)

2012 IEEE 23rd International Symposium on Software Reliability Engineering (ISSRE)

2012 Federated Conference on Computer Science and Information Systems (FedCSIS)

2012 International Conference on Computer Science and Service System (CSSS)

2012 13th International Workshop on Microprocessor Test and Verification (MTV)

2011 Tenth International Conference on Machine Learning and Applications (ICMLA)

2011 2nd International Conference on Artificial Intelligence, Management Science and Electronic Commerce (AIMSEC)

2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)

2010 International Conference on Biomedical Engineering and Computer Science (ICBECS)

2010 2nd International Conference on Information Engineering and Computer Science (ICIECS)

ICASSP 2010 - 2010 IEEE International Conference on Acoustics, Speech and Signal Processing

2010 IEEE 16th Pacific Rim International Symposium on Dependable Computing (PRDC)

2010 10th Russian-Chinese Symposium on Laser Physics and Laser Technologies (RCSLPLT) & 2010 Academic Symposium on Optoelectronics Technology (ASOT)

2010 3rd International Conference on Computational Intelligence and Industrial Application (PACIIA)

2009 IEEE Wireless Communications & Networking Conference (WCNC)

2009 3rd International Conference on Genetic and Evolutionary Computing (WGEC)

2009 2nd Microsystems and Nanoelectronics Research Conference (MNRC 2009)

2009 IEEE 10th Annual Wireless and Microwave Technology Conference: An IEEE Industry/ Government/Education Conf. (WAMICON)

2008 IEEE International Conference on IC Design & Technology (ICICDT)

2007 5th IEEE International Conference on Industrial Informatics (INDIN)

2006 SICE-ICASE International Joint Conference (SICE-ICCAS 2006)

2006 7th International Conference on Information Technology Based Higher Education and Training (ITHET)

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Xplore Articles related to Automatic test pattern generation

Scaling deeper to submicron: on-line testing to the rescue

TESTCHIP: A Chip for Weighted Random Pattern Generation, Evaluation, and Test Control

A study of the optimization of DC parametric tests

Advanced synchronous scan test methodology for multi clock domain ASICs

Practical Aspects of Delay Testing for Nanometer Chips

Design of built-in test generator circuits using width compression

Advanced **automatic test pattern generation** and redundancy identification techniques

Partial scan using multi-hop state reachability analysis

Quality Driven Manufacturing and SOC Designs

Design and synthesis of low power weighted random pattern generator considering peak power reduction

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Periodicals related to Automatic test pattern generation

Computer

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Computers, IEEE Transactions on

Design & Test of Computers, IEEE

Instrumentation and Measurement, IEEE Transactions on

Latin America Transactions, IEEE (Revista IEEE America Latina)

Magnetics, IEEE Transactions on

Medical Imaging, IEEE Transactions on

Neural Networks, IEEE Transactions on

Nuclear Science, IEEE Transactions on

Pattern Analysis and Machine Intelligence, IEEE Transactions on

Power Systems, IEEE Transactions on

Semiconductor Manufacturing, IEEE Transactions on

Software Engineering, IEEE Transactions on

Solid-State Circuits, IEEE Journal of

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on

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E-books related to Automatic test pattern generation

Modeling Digital Switching Circuits with Linear Algebra

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Top Organizations on Automatic test pattern generation

Circuits & Systems

Communications

Components, Packaging & Manufacturing Tech

Computational Intelligence

Computer

Control Systems

Education

Electron Devices

Electronic Design Automation, Council on

Engineering in Medicine & Biology

Industrial Electronics

Instrumentation & Measurement

Magnetics

Member and Geographic Activities

Microwave Theory & Techniques

Nuclear & Plasma Science

Power & Energy

Reliability

Robotics & Automation

Signal Processing

Solid State Circuits

Systems, Man & Cybernetics

Technical Activities Board

Ultrasonics, Ferroelectrics & Frequency Control

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Most published Xplore authors for Automatic test pattern generation

D.M. Wu

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Automatic test pattern generation

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Top Conferences on Automatic test pattern generation

Xplore Articles related to Automatic test pattern generation

Periodicals related to Automatic test pattern generation

E-books related to Automatic test pattern generation

Top Organizations on Automatic test pattern generation

Most published Xplore authors for Automatic test pattern generation