2,426 resources related to
Automatic test pattern generation
Top Conferences on Automatic test pattern generation
2026 IEEE AUTOTESTCON
2023 IEEE International Symposium on Circuits and Systems (ISCAS)
2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
2022 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)
2022 IEEE 40th VLSI Test Symposium (VTS)
2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)
2021 IEEE 22nd Latin American Test Symposium (LATS)
2021 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS)
2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC)
2019 34th IEEE/ACM International Conference on Automated Software Engineering (ASE)
2019 41st Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)
2019 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS)
2018 13th IEEE International Conference on Automatic Face & Gesture Recognition (FG 2018)
2018 IEEE/ACIS 17th International Conference on Computer and Information Science (ICIS)
2018 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)
2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)
2018 24th International Conference on Pattern Recognition (ICPR)
2018 31st International Conference on VLSI Design and 2018 17th International Conference on Embedded Systems (VLSID)
2017 IEEE Region 5 Meeting
2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
2017 IEEE International High Level Design Validation and Test Workshop (HLDVT)
2016 IEEE International Conference on Semiconductor Electronics (ICSE)
2016 3rd International Conference on Electronic Design (ICED)
2015 10th International Conference on Testbeds and Research Infrastructure for the Development of Communities and Networks (TridentCom)
2012 IEEE 23rd International Symposium on Software Reliability Engineering (ISSRE)
2011 2nd International Conference on Artificial Intelligence, Management Science and Electronic Commerce (AIMSEC)
2011 IEEE 6th International Workshop on Electronic Design, Test and Application (DELTA)
2010 International Conference on Biomedical Engineering and Computer Science (ICBECS)
2010 2nd International Conference on Information Engineering and Computer Science (ICIECS)
2010 10th Russian-Chinese Symposium on Laser Physics and Laser Technologies (RCSLPLT) & 2010 Academic Symposium on Optoelectronics Technology (ASOT)
2010 3rd International Conference on Computational Intelligence and Industrial Application (PACIIA)
2009 3rd International Conference on Genetic and Evolutionary Computing (WGEC)
2009 2nd Microsystems and Nanoelectronics Research Conference (MNRC 2009)
2008 IEEE International Conference on IC Design & Technology (ICICDT)
2007 5th IEEE International Conference on Industrial Informatics (INDIN)
2006 7th International Conference on Information Technology Based Higher Education and Training (ITHET)
More links
Xplore Articles related to Automatic test pattern generation
Periodicals related to Automatic test pattern generation
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Software Engineering, IEEE Transactions on
More links
E-books related to Automatic test pattern generation
Top Organizations on Automatic test pattern generation
Most published Xplore authors for Automatic test pattern generation
D.M. Wu
More links