Conferences related to X-ray diffraction

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2021 IEEE Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology


2020 Joint Conference of the IEEE International Frequency Control Symposium and International Symposium on Applications of Ferroelectrics (IFCS-ISAF)

Ferroelectric materials and applications


2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

All areas of ionizing radiation detection - detectors, signal processing, analysis of results, PET development, PET results, medical imaging using ionizing radiation


2020 IEEE International Magnetic Conference (INTERMAG)

INTERMAG is the premier conference on all aspects of applied magnetism and provides a range of oral and poster presentations, invited talks and symposia, a tutorial session, and exhibits reviewing the latest developments in magnetism.


2019 IEEE SENSORS

The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2002 IEEE Sensors

  • 2003 IEEE Sensors

  • 2004 IEEE Sensors

  • 2005 IEEE Sensors

  • 2006 IEEE Sensors

  • 2007 IEEE Sensors

    IEEE SENSORS 2007 solicits original and state-of-the-art contributions to sensors and related topics, covering from theory to application, from device to system, from modeling to implementation, and from macro to micro/nano in scale.

  • 2008 IEEE Sensors

    IEEE SENSORS 2008 solicits original and state-of-the-art contributions to sensors and related topics, covering from theory to application, from device to system, from modeling to implementation, and from macro to micro/nano in scale. Topics of interest include,but are not limitid to: Phenomena, Modeling, and Evaluation (Novel Sensing Principles, Theory and Modeling, Sensors Characterization, Evaluation and Testing, Data Handling and Mining) Chemical and Gas Sensors (Materials, Devices, Electronics N

  • 2009 IEEE Sensors

    IEEE Sensors Conference 2009 is intended to provide a common forum for researchers, scientists, engineers and practitioners throughout the world to present their latest research findings, ideas, developments and applications in the area of sensors and sensing technology. IEEE Sensors Conference 2009 will include keynote addresses by eminent scientists as well as special, regular and poster sessions.

  • 2010 IEEE Sensors

    The IEEE SENSORS 2010 Conference is a forum for state-of-the-art presentations on sensors and related topics covering from theory to application, device to system, modeling to implementation and from macro/nano to scale.

  • 2011 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors. IEEE SENSORS 2011 will include keynote addresses by eminen

  • 2012 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2013 IEEE Sensors

    The IEEE SENSORS Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2014 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, andexchange of state -of-the art information including the latest research and development in sensors andtheir related fields. It brings together researchers, developers, and practitioners from diverse fieldsincluding international scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.

  • 2015 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fieldsincluding international scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.

  • 2016 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2017 IEEE SENSORS

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their relatedfields. It brings together researchers, developers, and practitioners from diverse fields includinginternational scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.

  • 2018 IEEE SENSORS

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their relatedfields. It brings together researchers, developers, and practitioners from diverse fields includinginternational scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.



Periodicals related to X-ray diffraction

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Dielectrics and Electrical Insulation, IEEE Transactions on

Electrical insulation common to the design and construction of components and equipment for use in electric and electronic circuits and distribution systems at all frequencies.


Display Technology, Journal of

This publication covers the theory, design, fabrication, manufacturing and application of information displays and aspects of display technology that emphasize the progress in device engineering, device design, materials, electronics, physics and reliabilityaspects of displays and the application of displays.


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.



Most published Xplore authors for X-ray diffraction

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Xplore Articles related to X-ray diffraction

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X-ray diffraction with sub-picosecond time resolution

InternationalQuantum Electronics Conference, 2004. (IQEC)., 2004

The paper reports on the study of femtosecond laser-induced structural phase transitions in solids using pump-probe time-resolved X-ray diffraction. This time-resolved technique provides an extraordinary, dynamic view of the atomic structure


Nondestructive detection of intermetallics in solder joints by high energy X-ray diffraction

2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220), 2001

X-ray diffraction permits direct and unequivocal identification of crystallographic phases, although conventional low-energy beams penetrate to a depth of only several micrometers. A high-energy X-ray beam (up to 320 keV) easily penetrates through a circuit board and the attached devices, permitting the identification of any intermetallic layers in the interior. Because the diffraction intensity is proportional to the concentration, this ...


Characterization of nanostructured dendritic silver bismuth sulfide produced by solvothermal reactions

2010 3rd International Nanoelectronics Conference (INEC), 2010

Nanoparticles and nanostructured dendritic silver bismuth sulfide were successfully produced from silver acetate, bismuth nitrate, and thiosemicarbarzide in ethylene glycol by 140-200°C solvothermal reactions for 24-72 h. The phase was detected using X-ray diffraction (XRD) and selected area electron diffraction (SAED). Their SAED patterns were also in accordance with those of the simulations. Scanning and transmission electron microscopies (SEM and ...


Capability of 70 nm pattern replication in x-ray lithography

Digest of Papers Microprocesses and Nanotechnology 2000. 2000 International Microprocesses and Nanotechnology Conference (IEEE Cat. No.00EX387), 2000

It has been shown that the Proximity X-ray Lithography (PXL) is the most mature technology among Next Generation Lithography (NGL) options at 100 nm node. As the basic resolution of PXL is defined by the Fresnel diffraction, sub-100 nm patterns are resolved if only the Mask-to-Wafer gap is set properly. Resolution of 65 nm L/S patterns with a gap of ...


Synthesis and luminescence characterization of fine gadolinium oxide phosphors for high resolution X-ray imaging

IEEE Symposium Conference Record Nuclear Science 2004., 2004

In this work, fine Gd/sub 2/O/sub 3/:Eu powder was synthesized using a solution-combustion method for high-resolution digital X-ray imaging detectors. The structure of the phosphors was characterized by X-ray diffraction (XRD), high-resolution scanning electron microscopy (HR-SEM). It was possible to obtain fine Gd/sub 2/O/sub 3/:Eu crystallized particles with an average particle size of only 20 nm. The optical properties investigated ...



Educational Resources on X-ray diffraction

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IEEE-USA E-Books

  • X-ray diffraction with sub-picosecond time resolution

    The paper reports on the study of femtosecond laser-induced structural phase transitions in solids using pump-probe time-resolved X-ray diffraction. This time-resolved technique provides an extraordinary, dynamic view of the atomic structure

  • Nondestructive detection of intermetallics in solder joints by high energy X-ray diffraction

    X-ray diffraction permits direct and unequivocal identification of crystallographic phases, although conventional low-energy beams penetrate to a depth of only several micrometers. A high-energy X-ray beam (up to 320 keV) easily penetrates through a circuit board and the attached devices, permitting the identification of any intermetallic layers in the interior. Because the diffraction intensity is proportional to the concentration, this method might also assess the relative concentration of the intermetallics and thus develop some estimate of their effect on the package reliability. However, the combination of conventional X-ray diffraction concepts with a high-energy beam has not been utilized to a full extent yet, and so merits further investigation. We have demonstrated the concept on some simple specimens that we prepared in our laboratory. Through the presentation of this report, we hope to contact other researchers who are studying fracture through these intermetallics. We would like to evaluate our testbed system on a range of actual industrial intermetallic specimens over the next few years.

  • Characterization of nanostructured dendritic silver bismuth sulfide produced by solvothermal reactions

    Nanoparticles and nanostructured dendritic silver bismuth sulfide were successfully produced from silver acetate, bismuth nitrate, and thiosemicarbarzide in ethylene glycol by 140-200°C solvothermal reactions for 24-72 h. The phase was detected using X-ray diffraction (XRD) and selected area electron diffraction (SAED). Their SAED patterns were also in accordance with those of the simulations. Scanning and transmission electron microscopies (SEM and TEM) revealed the nanostructured products. Their photoluminescence (PL) emissions were detected at the same wavelength of 380 and 420 nm, although they were produced under different conditions.

  • Capability of 70 nm pattern replication in x-ray lithography

    It has been shown that the Proximity X-ray Lithography (PXL) is the most mature technology among Next Generation Lithography (NGL) options at 100 nm node. As the basic resolution of PXL is defined by the Fresnel diffraction, sub-100 nm patterns are resolved if only the Mask-to-Wafer gap is set properly. Resolution of 65 nm L/S patterns with a gap of 10 /spl mu/m was demonstrated. Recently, the limit of optical lithography is expected to extend to deep sub-100 nm using the F/sub 2/ laser lithography. However the advantage of PXL to F/sub 2/ at 70 nm node was shown in calculation. In this study some experimental results for 70-nm node pattern replication are shown and discussed.

  • Synthesis and luminescence characterization of fine gadolinium oxide phosphors for high resolution X-ray imaging

    In this work, fine Gd/sub 2/O/sub 3/:Eu powder was synthesized using a solution-combustion method for high-resolution digital X-ray imaging detectors. The structure of the phosphors was characterized by X-ray diffraction (XRD), high-resolution scanning electron microscopy (HR-SEM). It was possible to obtain fine Gd/sub 2/O/sub 3/:Eu crystallized particles with an average particle size of only 20 nm. The optical properties investigated were photoluminescence emission and excitation spectra, luminescence decay time, and X-ray conversion efficiency. The emission corresponding to the /sup 5/D/sub 0//spl rarr//sup 7/F/sub 2/ transition at 610 nm was dominant, and the Eu/sup 3+/ ions substituted well for the Gd/sup 3+/ sites. Quenching starts at an europium concentration of 8% wt, and the strongest X-ray conversion efficiency was achieved at the phosphor with 5% wt. The mean lifetime of synthesized phosphors is 2.3-2.6 ms.

  • Ultrafast X-ray diffraction and X-ray absorption spectroscopy

    Summary form only given. Recently developed ultrafast laser-driven X-ray sources enable the observation of atomic motions in crystals and in solutions on the timescale of chemical bond formation and breakage. Using such a laboratory-based X-ray source the propagation of coherent phonon wave packets through GaAs(111) crystals after photo excitation has been imaged by ultrafast X-ray difraction. While ultrafast x-ray diffraction measures the structural dynamics of crystals, ultrafast extended x-ray absorption line structure (UEXAFS) can, in principle, measure the structural dynamics of atoms during a chemical process in solution.

  • Generation and application of energetic heavy ion and x-ray via 12TW50FS laser-solid interaction

    Energetic ions and ultrashort X-rays were generated by an intense ultrashort laser interacting with a copper target. Fast ions up to 3 MeV were observed with CR-39 nuclear track detector sheets when a 7 TW laser was used. Cu/sup 12+//spl sim/Cu/sup 17+/ ions with the energy from 50 keV to 220 keV were detected with a Thomson parabola detector in the case of the laser power of 2.5 TW. Time-resolved X-ray diffraction was carried out using ultrashort X-rays generated from the copper target irradiated by the intense laser pulses. A change of diffraction patterns was observed in the X-ray diffraction from a GaAs[111] crystal irradiated by the ultrashort laser pulses.

  • Novel progress of zone plate coded imaging technique

    Summary form only given, as follows. Zone plate coded imaging (ZPCI) technique had been used in laser plasma diagnosis in early years and is still mentioned now. It takes a larger accept solid angle and higher S/N ratio than pinhole imaging for a same resolution, is a good manner for faint radiation (X-ray, particles, etc) high resolution imaging in laser plasma diagnosis. However, the point spread function (PSF) of ZPCI is not an ideal /spl delta/ function. DC component, high order diffraction of a Fresnel zone plate gives disturbances and artifacts in the coded imaging reconstruction which can not neglected and smear the reconstructed image. The side lobe of the PSF also provides serious artifacts which strongly limits that the imaging target must smaller than the first radius of the coded aperture. All the factor mention here takes important drawback for its application in laser plasma diagnosis. The work present here provides a novel way which completely cancels all the deficiencies of ZPCI and gives a throughout improvement.

  • Soft X-ray diffraction: an element sensitive tool to characterize patterned arrays of nanomagnets

    In this paper, we show that diffraction experiments, performed using elliptically polarized soft X-rays, can be used to characterize the structure as well as the magnetic behavior of these lithographically-defined arrays of nanomagnets.

  • Real-time secondary electron emission detector for high-rate X-ray crystallography

    We present the first results of the application of a novel digital X-ray imaging detector, based on secondary electron emission from a solid converter, to high-rate crystallographic studies. Results from diffraction and small- angle scattering experiments from several crystallized proteins, performed at the European Synchrotron Radiation Facility, ESRF, Grenoble, are presented and compared with a phosphor-based imaging system. Future developments of this detector system are proposed.



Standards related to X-ray diffraction

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No standards are currently tagged "X-ray diffraction"