Conferences related to Iemi

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2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)

This symposium pertains to the field of electromagnetic compatibility.


2020 IEEE Power & Energy Society General Meeting (PESGM)

The Annual IEEE PES General Meeting will bring together over 2900 attendees for technical sessions, administrative sessions, super sessions, poster sessions, student programs, awards ceremonies, committee meetings, tutorials and more


2020 IEEE/MTT-S International Microwave Symposium (IMS)

The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2036 IEEE/MTT-S International Microwave Symposium - IMS 2036

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2031 IEEE/MTT-S International Microwave Symposium - IMS 2031

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2029 IEEE/MTT-S International Microwave Symposium - IMS 2029

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2026 IEEE/MTT-S International Microwave Symposium - IMS 2026

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2025 IEEE/MTT-S International Microwave Symposium - IMS 2025

    The IEEE International Microwave Symposium (IMS) is the world s foremost conferencecovering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies;encompassing everything from basic technologies to components to systems including thelatest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulationand more. The IMS includes technical and interactive sessions, exhibits, student competitions,panels, workshops, tutorials, and networking events.

  • 2024 IEEE/MTT-S International Microwave Symposium - IMS 2024

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2021 IEEE/MTT-S International Microwave Symposium - IMS 2021

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019

    Comprehensive symposium on microwave theory and techniques including active and passive circuit components, theory and microwave systems.

  • 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018

    Microwave theory and techniques, RF/microwave/millimeter-wave/terahertz circuit design and fabrication technology, radio/wireless communication.

  • 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2016 IEEE/MTT-S International Microwave Symposium - IMS 2016

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2015 IEEE/MTT-S International Microwave Symposium - MTT 2015

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics. The IMS includes technical sessions, both oral and interactive, worksh

  • 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014

    IMS2014 will cover developments in microwave technology from nano devices to system applications. Technical paper sessions, interactive forums, plenary and panel sessions, workshops, short courses, industrial exhibits, and a wide array of other technical activities will be offered.

  • 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter -wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010

    Reports of research and development at the state-of-the-art of the theory and techniques related to the technology and applications of devices, components, circuits, modules and systems in the RF, microwave, millimeter-wave, submillimeter-wave and Terahertz ranges of the electromagnetic spectrum.

  • 2009 IEEE/MTT-S International Microwave Symposium - MTT 2009

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2008 IEEE/MTT-S International Microwave Symposium - MTT 2008

  • 2007 IEEE/MTT-S International Microwave Symposium - MTT 2007

  • 2006 IEEE/MTT-S International Microwave Symposium - MTT 2006

  • 2005 IEEE/MTT-S International Microwave Symposium - MTT 2005

  • 2004 IEEE/MTT-S International Microwave Symposium - MTT 2004

  • 2003 IEEE/MTT-S International Microwave Symposium - MTT 2003

  • 2002 IEEE/MTT-S International Microwave Symposium - MTT 2002

  • 2001 IEEE/MTT-S International Microwave Symposium - MTT 2001

  • 2000 IEEE/MTT-S International Microwave Symposium - MTT 2000

  • 1999 IEEE/MTT-S International Microwave Symposium - MTT '99

  • 1998 IEEE/MTT-S International Microwave Symposium - MTT '98

  • 1997 IEEE/MTT-S International Microwave Symposium - MTT '97

  • 1996 IEEE/MTT-S International Microwave Symposium - MTT '96


2019 International Conference on Electromagnetics in Advanced Applications (ICEAA)

The 21th edition of the ICEAA is coupled to the 9th edition of the IEEE-APWC. The two conferences consist of invited and contributed papers, and share a commonorganization, registration fee, submission site, workshops and short courses, and social events.The proceedings of both conferences will be published on IEEE Xplore


2018 15th International Conference on ElectroMagnetic Interference & Compatibility (INCEMIC)

The Conference & Workshop of INCEMIC 2018 will cover the entire scope of Electromagnetic Interference & Compatibility.


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Periodicals related to Iemi

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Electromagnetic Compatibility, IEEE Transactions on

EMC standards; measurement technology; undesired sources; cable/grounding; filters/shielding; equipment EMC; systems EMC; antennas and propagation; spectrum utilization; electromagnetic pulses; lightning; radiation hazards; and Walsh functions


Microwave Theory and Techniques, IEEE Transactions on

Microwave theory, techniques, and applications as they relate to components, devices, circuits, and systems involving the generation, transmission, and detection of microwaves.


Plasma Science, IEEE Transactions on

Plasma science and engineering, including: magnetofluid dynamics and thermionics; plasma dynamics; gaseous electronics and arc technology; controlled thermonuclear fusion; electron, ion, and plasma sources; space plasmas; high-current relativistic electron beams; laser-plasma interactions; diagnostics; plasma chemistry and colloidal and solid-state plasmas.


Semiconductor Manufacturing, IEEE Transactions on

Addresses innovations of interest to the integrated circuit manufacturing researcher and professional. Includes advanced process control, equipment modeling and control, yield analysis and optimization, defect control, and manufacturability improvement. It also addresses factory modelling and simulation, production planning and scheduling, as well as environmental issues in semiconductor manufacturing.




Xplore Articles related to Iemi

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Overview of IEMI conducted and radiated sources: Characteristics and trends

2013 International Symposium on Electromagnetic Compatibility, 2013

We present in this paper an overview of conducted and radiated sources that could be considered as potential intentional electromagnetic interference (IEMI) sources against critical infrastructures associated with power systems. The sources are classified according to the commonly addressed criteria in IEMI. In addition, to assess their potential risk, reported IEMI sources are classified according to their portability and availability, ...


Analysis of influence for sensitivity parameters under IEMI effects

2017 International Applied Computational Electromagnetics Society Symposium (ACES), 2017

In this paper, the effects of intentionally electromagnetic interference (lEMI) such as high power microwave (HPM) and electromagnetic pulse (EMP) on several vulnerable semiconductor devices are characterized by their different damage mechanisms of external electromagnetic power. The emphasis is on the IEMI impact on the front end circuits which are most probability affected by the external injected signals. IEMI effects ...


Analysis of LNA under multi-pulses IEMI

2017 Sixth Asia-Pacific Conference on Antennas and Propagation (APCAP), 2017

Intentionally electromagnetic interference (IEMI) such as high power microwave (HPM) and electromagnetic pulse (EMP) have been blamed for unexplained breakdowns and destructions of several vulnerable semiconductor devices. In this paper, breakdowns effects of LNA base on BJTs under IEMI are investigated numerically by device/circuit mix simulation algorithm based on drift- diffusion model (DDM) and Jacobian matrix. This paper focuses on ...


Coupling of Wideband Radiated IEMI to Wiring Harness: A Statistical Analysis of the Main Influencing Parameters

2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI), 2018

This work deals with Intentional Electromagnetic Interference (IEMI) and presents an assessment of the statistics of disturbances induced in a wiring harness by a radiated, wideband, high-power electromagnetic (HPEM) pulse. The quantity of interest is the worst-case (i.e., maximum) peak in the time-domain waveform of the common-mode (CM) voltage, that can be induced in a terminal interface of the harness ...


Protection of commercial installations from the high-frequency electromagnetic threats of HEMP and IEMI using IEC standards

2010 Asia-Pacific International Symposium on Electromagnetic Compatibility, 2010

The International Electrotechnical Commission (IEC) has been working for nearly 20 years preparing standards and other publications dealing with the threat of high-altitude electromagnetic pulse (HEMP) from a high-altitude nuclear detonation and the threat of intentional electromagnetic interference (IEMI) produced by electromagnetic weapons used by criminals or terrorists. In addition to establishing the electromagnetic environments for each threat, the IEC ...


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Educational Resources on Iemi

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IEEE.tv Videos

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IEEE-USA E-Books

  • Overview of IEMI conducted and radiated sources: Characteristics and trends

    We present in this paper an overview of conducted and radiated sources that could be considered as potential intentional electromagnetic interference (IEMI) sources against critical infrastructures associated with power systems. The sources are classified according to the commonly addressed criteria in IEMI. In addition, to assess their potential risk, reported IEMI sources are classified according to their portability and availability, from which general trends are identified.

  • Analysis of influence for sensitivity parameters under IEMI effects

    In this paper, the effects of intentionally electromagnetic interference (lEMI) such as high power microwave (HPM) and electromagnetic pulse (EMP) on several vulnerable semiconductor devices are characterized by their different damage mechanisms of external electromagnetic power. The emphasis is on the IEMI impact on the front end circuits which are most probability affected by the external injected signals. IEMI effects of PIN diode limiter and LNA base on BJTs are investigated numerically by our semiconductor simulator which is based on drift-diffusion model (DDM). The influences of rise time, amplitude and frequency of the interference signal are important for the IEMI effects according to the numerical results. Simulation result can be applied in damage mechanism analysis and harden design of circuit against the IEMI and other external electromagnetic interference.

  • Analysis of LNA under multi-pulses IEMI

    Intentionally electromagnetic interference (IEMI) such as high power microwave (HPM) and electromagnetic pulse (EMP) have been blamed for unexplained breakdowns and destructions of several vulnerable semiconductor devices. In this paper, breakdowns effects of LNA base on BJTs under IEMI are investigated numerically by device/circuit mix simulation algorithm based on drift- diffusion model (DDM) and Jacobian matrix. This paper focuses on the multi- pulses interference. Influence of recurrent interference pulses signals and assembled pulses of LNA are numerical studied. The influences of the sensitive parameters of multi-pulses IEMI are compared by the recovery time and leak voltages. The simulation results can be applied in damage mechanism analysis and harden designs of circuits against the IEMI and other external electromagnetic interferences.

  • Coupling of Wideband Radiated IEMI to Wiring Harness: A Statistical Analysis of the Main Influencing Parameters

    This work deals with Intentional Electromagnetic Interference (IEMI) and presents an assessment of the statistics of disturbances induced in a wiring harness by a radiated, wideband, high-power electromagnetic (HPEM) pulse. The quantity of interest is the worst-case (i.e., maximum) peak in the time-domain waveform of the common-mode (CM) voltage, that can be induced in a terminal interface of the harness by an HPEM pulse with specified bandwidth and energy density. Statistics is needed to account for the lack of knowledge on the direction of incidence and polarization of the impinging plane-wave field, which are treated as random variables. Consequently, the worst-case induced- voltage peak is characterized, in probabilistic terms, by a cumulative distribution function (cdf). The proposed analysis puts into evidence the different influence exerted by the three most important parameters (namely, harness length, height above ground, and CM impedance of terminal loads) on the aforementioned cdf, that is, on the susceptibility of a wiring harness to IEMI.

  • Protection of commercial installations from the high-frequency electromagnetic threats of HEMP and IEMI using IEC standards

    The International Electrotechnical Commission (IEC) has been working for nearly 20 years preparing standards and other publications dealing with the threat of high-altitude electromagnetic pulse (HEMP) from a high-altitude nuclear detonation and the threat of intentional electromagnetic interference (IEMI) produced by electromagnetic weapons used by criminals or terrorists. In addition to establishing the electromagnetic environments for each threat, the IEC has also developed generalized protection and test methods to be used for commercial installations. This paper examines the specific problem of a hypothetical commercial building with external power and communications entering the building; in addition the building is assumed to contain a computer server room that is crucial to the operation of the business. The paper applies the IEC standards for these two threats to illustrate how one could design protection for the building and how one would test to ensure that the protection is adequate.

  • On dealing with low frequency problems using MoM and dielectrics in a simplified IEMI scenario

    Some preliminary results are shown about the application to the case of dielectric and metallic object of a multiresolution change of basis to deal with the low-frequency breakdown appearing in the surface integral equation formulation of electromagnetic modelling. The main effect of the change of basis is to allow a simple diagonal preconditioner to become very effective, with respect to the analogous application without the change of basis. The idea, developed for the case of impenetrable objects treated with the Electric Field Integral Equation, is here applied to the case of penetrable objects as well, treated with the standard Poggio-Miller-Chang-Harrington-Wu-Tsai formulation. The effects on the condition number of the system resulting to the application of the Method of Moments, on the convergence path of an iterative solver, on the global error and on the error on the induced current in a simplified IEMI scenario are presented.

  • Uncertainty analysis in system-level vulnerability assessment for IEMI

    As an integrity of numbers of equipments and links, the system-level vulnerability assessment for the intentional electromagnetic interferences (IEMI) involves massive activities, such as analysis, computation and tests. The uncertainties of the systems and environments will influence the assessment results. So it is necessary to find out and limit the sources of uncertainty in order to guarantee and promote the reliability and accuracy of the assessment. This paper, based on the assessment formulation of Bayesian Networks (BN), analyzes the uncertainty from the two aspects: the data processing and acquisition. Both of them are illuminated with two typical cases. The further study needed to be done is suggested finally.

  • Experimental Characterization of the Response of an Electrical and Communication Raceway to IEMI

    This paper reports the results of two experimental campaigns aimed at studying the high-frequency response of a raceway containing low voltage power, telephone, and Ethernet cables, to external electromagnetic field illumination. The raceway was tested against HPEM transients inside a gigahertz transverse electromagnetic (GTEM) cell and low-power fields inside a reverberation chamber (RC). The high-power electromagnetic (HPEM) tests revealed that the low-voltage power cables have the greatest coupling under a hyperband illumination, compared to telephone and Ethernet cables. The RC tests allowed the determination of statistical transfer functions from random incident field configurations into DM voltage in cable loads. The responses were found to be governed by the raceway under test at the lower frequencies (below 1 GHz). Between 0.2 and 1 GHz, the raceway gives about 10 dB higher coupling than a short patch cable. The difference is even greater at lower frequencies and for shielded cables. In the frequency band 1-3 GHz, little difference was observed between short patch cables and the full raceway, but both were still significantly higher than direct coupling to the measurement card. Beyond 3 GHz, the coupling is clearly dominated by the terminal equipment. The experiments performed in this paper provide a better understanding of the expected induced voltages and currents in commercial cable systems when exposed to intentional electromagnetic interference (IEMI)-like signals.

  • Functional susceptibility of COTS devices to IEMI at local and large-scale levels

    Electromagnetic Security refers to the compliance of electronic devices with Information Security requirements with regards to EMC/EMI issues. In this study, the resilience and the integrity of electronic devices are the topics of interests. Many studies were devoted to the analysis and the classification of failures and damages by electromagnetic interferences induced on commercial off-the-shelf devices. Specific health monitoring software is highly recommended to get a fine-grain classification of effects induced by intentional or unintentional parasitic fields. We propose here to demonstrate the pertinence of the proposed approach for detecting potential failures induced on computers by parasitic fields.

  • Parametric interpolation of IEMI effects in a simplified scenario

    A short introduction is given about how to interpolate on the parameter space using custom basis functions obtained from simulations, also referred to as physics-based interpolation. Examples on a simplified structure are shown, encompassing from simpler to more challenging scenarios.



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