Sensitivity analysis

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Sensitivity analysis (SA) is the study of how the variation (uncertainty) in the output of a statistical model can be attributed to different variations in the inputs of the model. (Wikipedia.org)






Conferences related to Sensitivity analysis

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2023 Annual International Conference of the IEEE Engineering in Medicine & Biology Conference (EMBC)

The conference program will consist of plenary lectures, symposia, workshops and invitedsessions of the latest significant findings and developments in all the major fields of biomedical engineering.Submitted full papers will be peer reviewed. Accepted high quality papers will be presented in oral and poster sessions,will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE.


2021 IEEE/MTT-S International Microwave Symposium - IMS 2021

The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2029 IEEE/MTT-S International Microwave Symposium - IMS 2029

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019

    Comprehensive symposium on microwave theory and techniques including active and passive circuit components, theory and microwave systems.

  • 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018

    Microwave theory and techniques, RF/microwave/millimeter-wave/terahertz circuit design and fabrication technology, radio/wireless communication.

  • 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2016 IEEE/MTT-S International Microwave Symposium - IMS 2016

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2015 IEEE/MTT-S International Microwave Symposium - MTT 2015

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics. The IMS includes technical sessions, both oral and interactive, worksh

  • 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014

    IMS2014 will cover developments in microwave technology from nano devices to system applications. Technical paper sessions, interactive forums, plenary and panel sessions, workshops, short courses, industrial exhibits, and a wide array of other technical activities will be offered.

  • 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter -wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010

    Reports of research and development at the state-of-the-art of the theory and techniques related to the technology and applications of devices, components, circuits, modules and systems in the RF, microwave, millimeter-wave, submillimeter-wave and Terahertz ranges of the electromagnetic spectrum.

  • 2009 IEEE/MTT-S International Microwave Symposium - MTT 2009

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.


2021 IEEE Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology


ICC 2021 - IEEE International Conference on Communications

IEEE ICC is one of the two flagship IEEE conferences in the field of communications; Montreal is to host this conference in 2021. Each annual IEEE ICC conference typically attracts approximately 1,500-2,000 attendees, and will present over 1,000 research works over its duration. As well as being an opportunity to share pioneering research ideas and developments, the conference is also an excellent networking and publicity event, giving the opportunity for businesses and clients to link together, and presenting the scope for companies to publicize themselves and their products among the leaders of communications industries from all over the world.


2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting

The joint meeting is intended to provide an international forum for the exchange of information on state of the art research in the area of antennas and propagation, electromagnetic engineering and radio science


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Periodicals related to Sensitivity analysis

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Broadcasting, IEEE Transactions on

Broadcast technology, including devices, equipment, techniques, and systems related to broadcast technology, including the production, distribution, transmission, and propagation aspects.


Circuits and Systems I: Regular Papers, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


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Most published Xplore authors for Sensitivity analysis

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Xplore Articles related to Sensitivity analysis

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Sensitivity analysis of similarity metrices for image matching

Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation, 1994

This paper presents simulation results on the performance of similarity metrices for image matching. Specifically, matching and determining the transformation between slightly rotated images are addressed. The use of a correlation function and an error function as similarity metrices is reexamined when there is a coupling between translation and rotation. Sensitivity of these two metrices in the above context is ...


A sensitivity-driven parametric electromagnetic design environment

IEEE Transactions on Magnetics, 2006

The paper describes a design environment for electromagnetic devices and systems which links the concepts of variational geometry with sensitivity analysis. The goal is to allow a designer to explore a potential set of solutions to a design problem which has been posed through a rough, parameterized geometric sketch of the desired device


Advanced fault analysis techniques on AES

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC), 2015

Fault analysis research on symmetric-key cipher has been intensively discussed since differential fault analysis (DFA) was proposed in 1997. Output masking for wrong ciphertexts was believed to be the most effective countermeasure of the DFA attacks. However, fault sensitive analysis (FSA), proposed in 2010, can bypass the output-masking countermeasure. Both DFA and FSA require a strict fault injection control with ...


Comparison of effectiveness of Current Ratio and Delta-I/sub DDQ/ tests

17th International Conference on VLSI Design. Proceedings., 2004

I/sub DDQ/ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. Current two test methods that promise to extend the life of I/sub DDQ/ test are Current Ratio and Delta-I/sub DDQ/. Although several studies have been reported on these methods, their effectiveness in detecting defects ...


Sensitivity analysis of region landslide vegetation factor based on the remote sensing and geography information system

2011 International Conference on Remote Sensing, Environment and Transportation Engineering, 2011

Influence factors sensitivity analysis is a key problem for region landslide field, vegetation coverage is an important one of all factors. The type of vegetation coverage was classified by remote sensing supervised classification technology, and landslides were interpreted by the three dimension image of remote sensing. The internal relation between landslides and the type of vegetation coverage was revealed by ...


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Educational Resources on Sensitivity analysis

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IEEE.tv Videos

IMS 2012 Microapps - Improve Microwave Circuit Design Flow Through Passive Model Yield and Sensitivity Analysis
95uW 802.11g/n compliant fully-integrated wake-up receiver with -72dBm sensitivity in 14nm FinFET CMOS: RFIC Industry Showcase 2017
An 802.11ba 495μW -92.6dBm-Sensitivity Blocker-Tolerant Wake-up Radio Receiver - Renzhi Liu - RFIC 2019 Showcase
Robotics History: Narratives and Networks Oral Histories: Petar Kokotovic
IMS 2011 Microapps - Yield Analysis During EM Simulation
IMS 2011 Microapps - A Practical Approach to Verifying RFICs with Fast Mismatch Analysis
IMS MicroApps: Multi-Rate Harmonic Balance Analysis
Similarity and Fuzzy Logic in Cluster Analysis
New Approach of Vehicle Electrification: Analysis of Performance and Implementation Issue
A Flexible Testbed for 5G Waveform Generation and Analysis: MicroApps 2015 - Keysight Technologies
Spectrum Analysis: RF Boot Camp
Surgical Robotics: Analysis and Control Architecture for Semiautonomous Robotic Surgery
IMS 2012 Microapps - Generation and Analysis Techniques for Cost-efficient SATCOM Measurements Richard Overdorf, Agilent
IMS 2011 Microapps - Tools for Creating FET and MMIC Thermal Profiles
Zohara Cohen AMA EMBS Individualized Health
IMS 2011 Microapps - Remcom's XFdtd and Wireless InSite: Advanced Tools for Advanced Communication Systems Analysis
IMS 2011 Microapps - STAN Tool: A New Method for Linear and Nonlinear Stability Analysis of Microwave Circuits
Network Analysis: RF Boot Camp
A 4x4x4 mm³ Fully Integrated Sensor-to-Sensor Radio - Li-Xuan Chuo - RFIC 2019 Showcase
Micro-Apps 2013: Power Added Efficiency (PAE) Analysis with 8990B Peak Power Analyzer

IEEE-USA E-Books

  • Sensitivity analysis of similarity metrices for image matching

    This paper presents simulation results on the performance of similarity metrices for image matching. Specifically, matching and determining the transformation between slightly rotated images are addressed. The use of a correlation function and an error function as similarity metrices is reexamined when there is a coupling between translation and rotation. Sensitivity of these two metrices in the above context is compared. A hybrid iterative strategy is proposed based on the sensitivity analysis to enhance the matching accuracy.<<ETX>>

  • A sensitivity-driven parametric electromagnetic design environment

    The paper describes a design environment for electromagnetic devices and systems which links the concepts of variational geometry with sensitivity analysis. The goal is to allow a designer to explore a potential set of solutions to a design problem which has been posed through a rough, parameterized geometric sketch of the desired device

  • Advanced fault analysis techniques on AES

    Fault analysis research on symmetric-key cipher has been intensively discussed since differential fault analysis (DFA) was proposed in 1997. Output masking for wrong ciphertexts was believed to be the most effective countermeasure of the DFA attacks. However, fault sensitive analysis (FSA), proposed in 2010, can bypass the output-masking countermeasure. Both DFA and FSA require a strict fault injection control with the same plaintext, which is often difficul to realize under a circumstance where faults are randomly injected, e.g., in the case of electromagnetic (EM) fault injections. Although it requires the distribution of faulty ciphertexts, an extended fault analysis technique called NU-FVA, proposed in 2013, can avoid the hardness of the fault injection control. This article reviews the previous fault attacks and discusses their merits and demerits especially focusing on the power of the NU-FVA attack.

  • Comparison of effectiveness of Current Ratio and Delta-I/sub DDQ/ tests

    I/sub DDQ/ test is a valuable test method for semiconductor manufacturers. However, its effectiveness is reduced for deep sub-micron technology chips due to rising background leakage. Current two test methods that promise to extend the life of I/sub DDQ/ test are Current Ratio and Delta-I/sub DDQ/. Although several studies have been reported on these methods, their effectiveness in detecting defects has not been contrasted. In this work, we compare these two methods using industrial test data.

  • Sensitivity analysis of region landslide vegetation factor based on the remote sensing and geography information system

    Influence factors sensitivity analysis is a key problem for region landslide field, vegetation coverage is an important one of all factors. The type of vegetation coverage was classified by remote sensing supervised classification technology, and landslides were interpreted by the three dimension image of remote sensing. The internal relation between landslides and the type of vegetation coverage was revealed by spatial analysis method of geography information system. Contribution rate of every coverage factor for the landslide was obtained. The conclusion gives the support for the policy of conversion of cropland to forest, and lays a foundation for the research of region landslides prediction. It shows that the technology of remote sensing and geography information system have a special advantage for the sensitivity analysis of region landslides influence factors.

  • Process Stabilization and Sensitivity Analyses of a Single Recess GaAs pHEMT Process using Device Simulations

    In this work we investigate device simulations for a sensitivity analyses on the PH25 single recess pHEMT process. The relation of the most critical process and epitaxial parameters on the electrical DC parameters are presented and discussed. The control of the recess etching is an important process module in stabilizing the electrical parameters. Improving the recess etching resulted in a significant reduced spread of the electrical parameters.

  • A two-stage method for truss beam damage identification using modal strain energy and frequency sensitivity

    A two-stage method for truss beam damage identification using modal strain energy(MSE) and frequency sensitivity is presented in this paper. In the first stage, the changes of modal strain energy before and after the occurrence of damage are employed to locate the suspected elements; In the second stage, the frequency sensitivity method is used to determine the exact damage position further and quantify the damage extent. Finally, a numerical example of a simply supported truss beam model is given to verify the proposed method. Results show that the proposed method can effectively identify the structural damage location and describe the damage extent.

  • Sensitivity Analysis Attacks Against Randomized Detectors

    Sensitivity analysis attacks present a serious threat to the security of popular spread spectrum watermarking schemes. Randomization of the detector is thought to increase the immunity of such schemes against cryptanalysis. In this paper, we introduce a new attack against randomized detectors. This attack is successful, which implies that spread spectrum schemes still lack security.

  • Wavelet transform for determination of state and trajectory sensitivity of a singular control system

    In this paper wavelet transform is used to determine the state and trajectory sensitivity of homogeneous and non-homogeneous systems. The differential- algebraic equation describing a system is converted via wavelet transform to an algebraic generalized Lyapunov equation which is solved for the coefficients of the state variables in terms of Haar basis. Further, problems of trajectory sensitivity analysis for singular as well as nonsingular systems have also been explored using the same orthogonal basis. Finally, using Kronecker product method, a generalized program is developed to determine the state and sensitivity for any number of basis function in Haar domain.

  • Sensitivity Analysis of Some Flux and Torque Estimators for Vector Control of Wide Speed Range Induction Motors

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Standards related to Sensitivity analysis

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(Replaced) IEEE Standard VHDL Language Reference Manual

his standard revises and enhances the VHDL language reference manual (LRM) by including a standard C language interface specification; specifications from previously separate, but related, standards IEEE Std 1164 -1993,1 IEEE Std 1076.2 -1996, and IEEE Std 1076.3-1997; and general language enhancements in the areas of design and verification of electronic systems.



Jobs related to Sensitivity analysis

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