Conferences related to Optical variables measurement

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2023 Annual International Conference of the IEEE Engineering in Medicine & Biology Conference (EMBC)

The conference program will consist of plenary lectures, symposia, workshops and invitedsessions of the latest significant findings and developments in all the major fields of biomedical engineering.Submitted full papers will be peer reviewed. Accepted high quality papers will be presented in oral and poster sessions,will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE.


2021 IEEE Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology


2020 IEEE International Conference on Plasma Science (ICOPS)

IEEE International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society.


2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science andtechnology research development and applications. The list of program topics includes but isnot limited to: Measurement Science & Education, Measurement Systems, Measurement DataAcquisition, Measurements of Physical Quantities, and Measurement Applications.


2020 Optical Fiber Communications Conference and Exhibition (OFC)

The Optical Fiber Communication Conference and Exhibition (OFC) is the largest global conference and exhibition for optical communications and networking professionals. For over 40 years, OFC has drawn attendees from all corners of the globe to meet and greet, teach and learn, make connections and move business forward.OFC attracts the biggest names in the field, offers key networking and partnering opportunities, and provides insights and inspiration on the major trends and technology advances affecting the industry. From technical presentations to the latest market trends and predictions, OFC is a one-stop-shop.


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Periodicals related to Optical variables measurement

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Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Methods, algorithms, and human-machine interfaces for physical and logical design, including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, and documentation of integrated-circuit and systems designs of all complexities. Practical applications of aids resulting in producible analog, digital, optical, or microwave integrated circuits are emphasized.


Dielectrics and Electrical Insulation, IEEE Transactions on

Electrical insulation common to the design and construction of components and equipment for use in electric and electronic circuits and distribution systems at all frequencies.


Display Technology, Journal of

This publication covers the theory, design, fabrication, manufacturing and application of information displays and aspects of display technology that emphasize the progress in device engineering, device design, materials, electronics, physics and reliabilityaspects of displays and the application of displays.


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Most published Xplore authors for Optical variables measurement

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Xplore Articles related to Optical variables measurement

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Complete Waveform Characterization of Mid-Infrared Ultrashort Pulses

2018 2nd URSI Atlantic Radio Science Meeting (AT-RASC), 2018

Development of ultrafast mid-infrared (MIR) pulse lasers has been in rapid progress over the past decade. Since a number of molecular vibrations have resonance in the MIR region, the ultrafast MIR pulse lasers are very useful for advanced molecular spectroscopies, such as frequency comb spectroscopy for the molecular fingerprint region, pump-probe spectroscopy to trace ultrafast structural dynamics, and control of ...


Optical Properties of Reflected Light From Leaves: A Case Study From One Species

IEEE Transactions on Geoscience and Remote Sensing, None

The reflection property of targets is the fundamental signal for applications of optical remote sensing of the earth's surface. In this paper, we measured the photometric and polarimetric characteristics of 15 leaves with different properties from one plant species (i.e., Pachira aquatica) using a laboratory goniospectrometer system and used the bidirectional reflectance factor (BRF) and the bidirectional polarized reflectance factor ...


Electron beam spectrum diagnostics with optical transition radiation on the beijing free-electron laser

Tsinghua Science and Technology, 2004

A measurement system was developed to measure the electron beam spectrum of the Beijing free-electron laser based on the optical transition radiation (OTR). This paper describes the system, which consists of a 32-channel high resolution of 0.02% OTR detector, especially the spectrometer. The OTR angular-distribution pattern at the focal plane has two apexes, but the two apexes are smoothed out ...


IEE Colloquium on 'Recent Advances in Broadcast TV Cameras - Optics, Sensors and Processing' (Digest No.040)

IEE Colloquium on Recent Advances in Broadcast TV Cameras - Optics, Sensors and Processing, 1991

None


Challenges of CMP Consumables Metrology

ICPT 2012 - International Conference on Planarization/CMP Technology, 2012

Chemical Mechanical Planarization (CMP) has become a method of choice for planarization of metal and oxide layers in microelectronics industry. CMP is a complex chemical and mechanical process that depends heavily on multiple consumable properties and process parameters, in particularly, on the properties of CMP slurries, pads and conditioning disks. This paper describes current gaps in CMP consumable metrologies and ...


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Educational Resources on Optical variables measurement

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IEEE.tv Videos

Robust Qubit Manipulation with Integrated Circuits: Optical Computing - Pérola Milman at INC 2019
IMS 2011 Microapps - Ultra Low Phase Noise Measurement Technique Using Innovative Optical Delay Lines
Testing 5G: OTA and the Connectorless World - IMS 2017
IMS 2011 Microapps - A Comparison of Noise Parameter Measurement Techniques
Multi-Level Optimization for Large Fan-In Optical Logic Circuits - Takumi Egawa - ICRC 2018
"Big-p" Data: Large Number of Variables "P"
IMS 2011 Microapps - Waveguide Characteristics and Measurement Errors
IMS 2012 Microapps - Passive Intermodulation (PIM) measurement using vector network analyzer Osamu Kusano, Agilent CTD-Kobe
IMS 2011 Microapps - Vector-Receiver Load Pull - Measurement Accuracy at its Best
An Energy-efficient Reconfigurable Nanophotonic Computing Architecture Design: Optical Lookup Table - IEEE Rebooting Computing 2017
ASC-2014 SQUIDs 50th Anniversary: 4 of 6 - Keiji Enpuku
On-chip Passive Photonic Reservoir Computing with Integrated Optical Readout - IEEE Rebooting Computing 2017
Multi-Level Optical Weights in Integrated Circuits - IEEE Rebooting Computing 2017
Spatial-Spectral Materials for High Performance Optical Processing - IEEE Rebooting Computing 2017
Demonstration of a Coherent Tunable Amplifier for All-Optical Ising Machines: IEEE Rebooting Computing 2017
Towards On-Chip Optical FFTs for Convolutional Neural Networks - IEEE Rebooting Computing 2017
I2MTC 2014 Conference Preview
APEC 2012 - Thomas S. Buzak Plenary
Combinatorial Sleeping Bandits with Fairness Constraints - Bo Ji - IEEE Sarnoff Symposium, 2019
5G Wireless A Measurement and Metrology Perspective: MicroApps 2015 - Keysight Technologies

IEEE-USA E-Books

  • Complete Waveform Characterization of Mid-Infrared Ultrashort Pulses

    Development of ultrafast mid-infrared (MIR) pulse lasers has been in rapid progress over the past decade. Since a number of molecular vibrations have resonance in the MIR region, the ultrafast MIR pulse lasers are very useful for advanced molecular spectroscopies, such as frequency comb spectroscopy for the molecular fingerprint region, pump-probe spectroscopy to trace ultrafast structural dynamics, and control of photodissociation by selective excitation of vibrational states. The development of such a light source is also attracting more attention in the high field laser physics. The cutoff extension of high harmonic generation (HHG) driven by a long wavelength few- cycle pulse has been carried out, and generation of shorter attosecond pulses is predicted. Since it is a process within the single optical cycle of the driver electric field, it is very important to have a few-, single-, or sub- cycle pulse with a precisely controlled field oscillation, namely the phase control of the laser field within at least a few tenth of the oscillation period. In such an experiment, field-revolved detection of the ultrashort MIR pulses is essential since the cutoff of high harmonic generation is sensitive to the field strength of the driver laser pulse.

  • Optical Properties of Reflected Light From Leaves: A Case Study From One Species

    The reflection property of targets is the fundamental signal for applications of optical remote sensing of the earth's surface. In this paper, we measured the photometric and polarimetric characteristics of 15 leaves with different properties from one plant species (i.e., Pachira aquatica) using a laboratory goniospectrometer system and used the bidirectional reflectance factor (BRF) and the bidirectional polarized reflectance factor (BPRF) to describe the reflection of these leaf samples. The results illustrated that the BRF can be replaced by the I parameter reflectance factor (IpRF) when the extinction of the polarizer is considered. Subsequently, the BRF model was fit to the IpRF measurements at selected wavelengths, and the inverted refractive index was used in a BPRF model, which has been proposed to simulate the polarization of surfaces. We found that the modeled photometric results of all the leaves matched well with our measurement results over all the measurement directions, while the modeled polarimetric results of the leaves gave a good agreement with the measurements at the forward scattering directions. Moreover, the degree of linear polarization (Dolp) of the leaf, which is derived from the ratio between BPRF and IpRF, can also be effectively computed by the combination of BPRF and BRF models in the forward scattering directions. These findings suggested that more attention should be dedicated to the combination of BRF and BPRF of leaves in the future because we can completely describe the essential optical properties of the light reflected by leaves via the polarimetric measurement. This paper indicates that the polarimetric measurement is a beneficial method for optical remote sensing applications and helps us deepen the understanding of the optical properties of leaves.

  • Electron beam spectrum diagnostics with optical transition radiation on the beijing free-electron laser

    A measurement system was developed to measure the electron beam spectrum of the Beijing free-electron laser based on the optical transition radiation (OTR). This paper describes the system, which consists of a 32-channel high resolution of 0.02% OTR detector, especially the spectrometer. The OTR angular-distribution pattern at the focal plane has two apexes, but the two apexes are smoothed out due to the electron beam energy distribution. The energy spectrum can be measured if the magnet energy resolution is higher than 0.7% to distinguish the electron beam energy distribution.

  • IEE Colloquium on 'Recent Advances in Broadcast TV Cameras - Optics, Sensors and Processing' (Digest No.040)

    None

  • Challenges of CMP Consumables Metrology

    Chemical Mechanical Planarization (CMP) has become a method of choice for planarization of metal and oxide layers in microelectronics industry. CMP is a complex chemical and mechanical process that depends heavily on multiple consumable properties and process parameters, in particularly, on the properties of CMP slurries, pads and conditioning disks. This paper describes current gaps in CMP consumable metrologies and explains approaches to the gaps closure.

  • Multimode Polarization Sensors

    None

  • IEE Colloquium on 'Measurements on Optical Devices' (Digest No.210)

    None

  • Single-shot measurement of the electric field of optical sources using time magnification and heterodyning

    By combining time magnification and heterodyning, the electric field of optical sources is temporally characterized in a single shot. This principle is used to characterize various sources at 1.5 micron, including data-encoded telecommunication sources.

  • Keynote talk — Review of AC loss measuring methods for HTS tape and unit

    AC loss measuring methods of high-temperature superconducting (HTS) tapes and unit, generally consisting of electronic and magnetic as well as calorimetric techniques, have been mature and made great contributions to AC characteristics of HTS materials, research and development of HTS applications. This paper briefly introduces and summarizes the principles of AC loss measurement techniques, focusing especially on electric and calorimetric method for measuring AC losses of HTS tapes. A novel developed calorimetric method for measuring AC loss based on optical Fiber Bragg Grating (FBG) was introduced in detail. After comparing the sensitivities of various measuring methods, AC loss measuring methods available for HTS tapes and units are suggested.

  • Three dimensional pressure field measurement of focused ultrasound by optical phase contrast method

    A hydrophone scanning method is gold standard for the ultrasound filed measurement. However, the hydrophone scanning is time consuming especially for the three-dimensional measurement. On the other hand, two-dimensional data can be acquired simultaneously by an optical measurement method using a camera. In this study, the optical phase contrast method was used to measure a three- dimensional pressure filed generated by a focused transducer.



Standards related to Optical variables measurement

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(Replaced) IEEE Standard VHDL Language Reference Manual

his standard revises and enhances the VHDL language reference manual (LRM) by including a standard C language interface specification; specifications from previously separate, but related, standards IEEE Std 1164 -1993,1 IEEE Std 1076.2 -1996, and IEEE Std 1076.3-1997; and general language enhancements in the areas of design and verification of electronic systems.


IEEE Guide for the Interpretation of Gases Generated in Oil-Immersed Transformers


IEEE Recommended Practice for Precipitator and Baghouse Hopper Heating Systems


IEEE Standard for Information Technology - POSIX Ada Language Interfaces - Part 1: Binding for System Application Program Interface (API)

This document is part of the POSIX series of standards for applications and user interfaces to open systems. It defines the Ada language bindings as package specifications and accompanying textual descriptions of the applications program interface (API). This standard supports application portability at the source code level through the binding between ISO 8652:1995 (Ada) and ISO/IEC 9945-1:1990 (IEEE Std 1003.1-1990 ...



Jobs related to Optical variables measurement

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