Observability

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Observability, in control theory, is a measure for how well internal states of a system can be inferred by knowledge of its external outputs. (Wikipedia.org)






Conferences related to Observability

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2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2019 56th ACM/ESDA/IEEE Design Automation Conference (DAC)

    EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)


2020 59th IEEE Conference on Decision and Control (CDC)

The CDC is the premier conference dedicated to the advancement of the theory and practice of systems and control. The CDC annually brings together an international community of researchers and practitioners in the field of automatic control to discuss new research results, perspectives on future developments, and innovative applications relevant to decision making, automatic control, and related areas.


2020 American Control Conference (ACC)

The ACC is the annual conference of the American Automatic Control Council (AACC, the U.S. national member organization of the International Federation for Automatic Control (IFAC)). The ACC is internationally recognized as a premier scientific and engineering conference dedicated to the advancement of control theory and practice. The ACC brings together an international community of researchers and practitioners to discuss the latest findings in automatic control. The 2020 ACC technical program will

  • 2019 American Control Conference (ACC)

    Technical topics include biological systems, vehicle dynamics and control, adaptive control, consensus control, cooperative control, control of communication networks, control of networked systems, control of distributed parameter systems, decentralized control, delay systems, discrete-event systems, fault detection, fault-tolerant systems, flexible structures, flight control, formation flying, fuzzy systems, hybrid systems, system identification, iterative learning control, model predictive control, linear parameter-varying systems, linear matrix inequalities, machine learning, manufacturing systems, robotics, multi-agent systems, neural networks, nonlinear control, observers, optimal control, optimization, path planning, navigation, robust control, sensor fusion, sliding mode control, stochastic systems, switched systems, uncertain systems, game theory.

  • 2018 Annual American Control Conference (ACC)

    Technical topics include biological systems, vehicle dynamics and control, adaptive control, consensus control, cooperative control, control of communication networks, control of networked systems, control of distributed parameter systems, decentralized control, delay systems, discrete-event systems, fault detection, fault-tolerant systems, flexible structures, flight control, formation flying, fuzzy systems, hybrid systems, system identification, iterative learning control, model predictive control, linear parameter-varying systems, linear matrix inequalities, machine learning, manufacturing systems, robotics, multi-agent systems, neural networks, nonlinear control, observers, optimal control, optimization, path planning, navigation, robust control, sensor fusion, sliding mode control, stochastic systems, switched systems, uncertain systems, game theory.

  • 2017 American Control Conference (ACC)

    Technical topics include biological systems, vehicle dynamics and control, adaptive control, consensus control, cooperative control, control of communication networks, control of networked systems, control of distributed parameter systems, decentralized control, delay systems, discrete-event systems, fault detection, fault-tolerant systems, flexible structures, flight control, formation flying, fuzzy systems, hybrid systems, system identification, iterative learning control, model predictive control, linear parameter-varying systems, linear matrix inequalities, machine learning, manufacturing systems, robotics, multi-agent systems, neural networks, nonlinear control, observers, optimal control, optimization, path planning, navigation, robust control, sensor fusion, sliding mode control, stochastic systems, switched systems, uncertain systems, game theory.

  • 2016 American Control Conference (ACC)

    Control systems theory and practice. Conference topics include biological systems, vehicle dynamics and control, consensus control, cooperative control, control of communication networks, control of networked systems, control of distributed parameter systems, decentralized control, delay systems, discrete-event systems, fault detection, fault-tolerant systems, flexible structures, flight control, formation flying, fuzzy systems, hybrid systems, system identification, iterative learning control, model predictive control, linear parameter-varying systems, linear matrix inequalities, machine learning, manufacturing systems, robotics, multi-agent systems, neural networks, nonlinear control, observers, optimal control, optimization, path planning, navigation, robust control, sensor fusion, sliding mode control, stochastic systems, switched systems, uncertain systems, game theory.

  • 2015 American Control Conference (ACC)

    control theory, technology, and practice

  • 2014 American Control Conference - ACC 2014

    All areas of the theory and practice of automatic control, including but not limited to network control systems, model predictive control, systems analysis in biology and medicine, hybrid and switched systems, aerospace systems, power and energy systems and control of nano- and micro-systems.

  • 2013 American Control Conference (ACC)

    Control systems theory and practice. Conference themes on sustainability, societal challenges for control, smart healthcare systems. Conference topics include biological systems, vehicle dynamics and control, consensus control, cooperative control, control of communication networks, control of networked systems, control of distributed parameter systems, decentralized control, delay systems, discrete-event systems, fault detection, fault-tolerant systems, flexible structures, flight control, formation flying, fuzzy systems, hybrid systems, system identification, iterative learning control, model predictive control, linear parameter-varying systems, linear matrix inequalities, machine learning, manufacturing systems, robotics, multi-agent systems, neural networks, nonlinear control, observers, optimal control, optimization, path planning, navigation, robust control, sensor fusion, sliding mode control, stochastic systems, switched systems, uncertain systems, game theory.

  • 2012 American Control Conference - ACC 2012

    All areas of control engineering and science.

  • 2011 American Control Conference - ACC 2011

    ACC provides a forum for bringing industry and academia together to discuss the latest developments in the area of Automatic Control Systems, from new control theories, to the advances in sensors and actuator technologies, and to new applications areas for automation.

  • 2010 American Control Conference - ACC 2010

    Theory and practice of automatic control

  • 2009 American Control Conference - ACC 2009

    The 2009 ACC technical program will cover new developments related to theory, application, and education in control science and engineering. In addition to regular technical sessions the program will also feature interactive and tutorial sessions and preconference workshops.

  • 2008 American Control Conference - ACC 2008

  • 2007 American Control Conference - ACC 2007

  • 2006 American Control Conference - ACC 2006 (Silver Anniversary)

  • 2005 American Control Conference - ACC 2005

  • 2004 American Control Conference - ACC 2004

  • 2003 American Control Conference - ACC 2003

  • 2002 American Control Conference - ACC 2002

  • 2001 American Control Conference - ACC 2001

  • 2000 American Control Conference - ACC 2000

  • 1999 American Control Conference - ACC '99

  • 1998 American Control Conference - ACC '98

  • 1997 American Control Conference - ACC '97

  • 1996 13th Triennial World Congress of the International Federation of Automatic Control (IFAC)


2020 IEEE Power & Energy Society General Meeting (PESGM)

The Annual IEEE PES General Meeting will bring together over 2900 attendees for technical sessions, administrative sessions, super sessions, poster sessions, student programs, awards ceremonies, committee meetings, tutorials and more


2020 IEEE/ION Position, Location and Navigation Symposium (PLANS)

Inertial Sensing and Technology; GNSS; Connected, Integrated, Alternative Sensing; Application to Automated, Semi-Autonomous and Fully Autonomous Systems


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Periodicals related to Observability

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Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Communications Magazine, IEEE

IEEE Communications Magazine was the number three most-cited journal in telecommunications and the number eighteen cited journal in electrical and electronics engineering in 2004, according to the annual Journal Citation Report (2004 edition) published by the Institute for Scientific Information. Read more at http://www.ieee.org/products/citations.html. This magazine covers all areas of communications such as lightwave telecommunications, high-speed data communications, personal communications ...


Communications, IEEE Transactions on

Telephone, telegraphy, facsimile, and point-to-point television, by electromagnetic propagation, including radio; wire; aerial, underground, coaxial, and submarine cables; waveguides, communication satellites, and lasers; in marine, aeronautical, space and fixed station services; repeaters, radio relaying, signal storage, and regeneration; telecommunication error detection and correction; multiplexing and carrier techniques; communication switching systems; data communications; and communication theory. In addition to the above, ...


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Most published Xplore authors for Observability

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Xplore Articles related to Observability

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State space behavior in time-varying biorthogonal filter banks

1996 8th European Signal Processing Conference (EUSIPCO 1996), 1996

Using state space representations of biorthogonal filter banks, it is possible to come up with a compact theory for the transition between two time-invariant filter banks. The transition interval depends on the sizes of the common subspaces spanned by the controllability operators of the decomposition filters and by the observability operators of the reconstruction filters. When the respective operators span ...


How assertions can increase test effectiveness

IEEE Software, 1997

Novel views of mature ideas on software and quality productivity are presented. The author investigates the nature of object oriented development and what it says about the nature of testing techniques. Specifically, he explores an approach to assertion placement based on error masking. As expected, he found that information hiding and encapsulation can be detrimental to system level and integration ...


Transcription of algorithms used for fault-diagnosis of digital systems into computer programs

2013 Proceedings of IEEE Southeastcon, 2013

There are several algorithms for fault diagnosis of digital systems which are used throughout academic and industrial environments. Among those algorithms, TMEAS and SCOAP find particular appeal because of their simplicity in calculating testability of a given digital circuit and in imparting useful information to test engineers regarding the test-locations most vulnerable to occurrence of stuck-at-zero and stuck-at-one faults. In ...


Automated signal selection maximizing circuit coverage for efficient debug

2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia), 2016

As the complexity of chip increases, the importance of post silicon verification is escalated. Trace buffer is a commonly used hardware architecture to achieve an efficient debug process. It is advantageous since it is able to store internal values which are captured during system operation at-speed. However, it cannot store a vast number of signals due to its limited storage. ...


BDD FTEST: fast, backtrack-free test generator based on binary decision diagram representation

Proceedings of ISCAS'95 - International Symposium on Circuits and Systems, 1995

This paper presents a new approach for generating test vectors for combinational circuits. In the approach presented here, the automatic test generator, called BDD FTEST, uses an algebraic method to find a set of test vectors for single stuck lines. For all the circuits analyzed, the algorithm is faster than previously algebraic methods. Experimental results demonstrate that, for most circuits, ...


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Educational Resources on Observability

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IEEE.tv Videos

No IEEE.tv Videos are currently tagged "Observability"

IEEE-USA E-Books

  • State space behavior in time-varying biorthogonal filter banks

    Using state space representations of biorthogonal filter banks, it is possible to come up with a compact theory for the transition between two time-invariant filter banks. The transition interval depends on the sizes of the common subspaces spanned by the controllability operators of the decomposition filters and by the observability operators of the reconstruction filters. When the respective operators span the same space, the transition can be made arbitrarily short. If it is zero, then the special case of instantaneous transition is reached.

  • How assertions can increase test effectiveness

    Novel views of mature ideas on software and quality productivity are presented. The author investigates the nature of object oriented development and what it says about the nature of testing techniques. Specifically, he explores an approach to assertion placement based on error masking. As expected, he found that information hiding and encapsulation can be detrimental to system level and integration testing, but not always.

  • Transcription of algorithms used for fault-diagnosis of digital systems into computer programs

    There are several algorithms for fault diagnosis of digital systems which are used throughout academic and industrial environments. Among those algorithms, TMEAS and SCOAP find particular appeal because of their simplicity in calculating testability of a given digital circuit and in imparting useful information to test engineers regarding the test-locations most vulnerable to occurrence of stuck-at-zero and stuck-at-one faults. In this paper, we have presented summary of TMEAS and SCOAP techniques and then presented results of simulations based on these techniques using a software developed by us. Testability calculations, using the developed software, for a few test circuits are also outlined.

  • Automated signal selection maximizing circuit coverage for efficient debug

    As the complexity of chip increases, the importance of post silicon verification is escalated. Trace buffer is a commonly used hardware architecture to achieve an efficient debug process. It is advantageous since it is able to store internal values which are captured during system operation at-speed. However, it cannot store a vast number of signals due to its limited storage. Therefore, it is very important to select appropriate internal signals for efficient debug. In this paper, we propose a new signal selection scheme to detect errors as close as its occurrence cycle.

  • BDD FTEST: fast, backtrack-free test generator based on binary decision diagram representation

    This paper presents a new approach for generating test vectors for combinational circuits. In the approach presented here, the automatic test generator, called BDD FTEST, uses an algebraic method to find a set of test vectors for single stuck lines. For all the circuits analyzed, the algorithm is faster than previously algebraic methods. Experimental results demonstrate that, for most circuits, our algorithm can generate test vectors for all faults in a very short time, particularly for large circuits like the c7552.

  • A Note on Delay Coordinates for Locally Observable Analytic Systems

    In this short note, the problem of locally reconstructing the state of a nonlinear system is studied. To avoid computational difficulties arising in the numerical differentiation of the output, the so-called delay coordinates are considered. The assumptions of analyticity and (local) observability of the system are shown to imply that a family of mappings, induced by the delay coordinates and parameterized by a time delay parameter, gives a local diffeomorphism for generic values of such delay parameter on a certain set. A worked-out example illustrates the result.

  • Comparison of methods for supervisory control and submodule construction

    Summary form only given. Over the last 25 years, methods for supervisory control of discrete event systems and methods for submodule construction based on state machine specifications have been developed quite independently by different research communities. The purpose of this paper is to give a summary of the results in these two areas and to point out the many similarities and certain differences between the approaches taken by these two communities. The basic problem, in both cases, is to find the behavior of a single submodule X such that combined with a given submodule C, this composition exhibits a behavior that conforms to a given specification S. In the case of supervisory control, the submodule C is an existing system that is to be controlled by the controller X in such a manner that a behavior compatible with S is obtained. We discuss the main issues that must be addressed for solving this problem, review certain conditions for the existence of a solution, and present the major solution algorithms. We also discuss the different treatment of allowed and required behavior, and the difficulties that arise in the context of different communication paradigms (for instance, distinguishing controllability, observability, input/output, synchronous and asynchronous communication) and different specification formalisms.

  • Hardware-Based Event Stream Ordering for System-Level Observation Framework

    The complexity of embedded systems presents key challenges in observing and analyzing complex hardware and software behavior. System-level observation methods provide in-situ monitoring and analysis of complex system behavior across hardware and software boundaries. Previous system-level observation methods utilized efficient pipelined hardware architectures that provide high throughput for reporting observed events but require significant area resources. Alternatively, an area-efficient round-robin priority-based event stream ordering technique significantly reduces area resources but requires tradeoffs in event stream throughput. We present a hardware-based event stream ordering technique capable of providing high throughput and flexibility in area requirements. This hardware-based event stream ordering technique reduces area requirements by 73.6% with a maximum reduction in event stream throughput of 4.6%.

  • Design of state observers from a drift-observability property

    In this paper, the problem of state observation with exponential error decay for nonlinear systems affine in the input is considered and an observer is proposed. For such an observer, the drift-observability property of the system (i.e., observability for zero input), together with an assumption on the input amplitude or on the observation relative degree, are sufficient conditions for exponential convergence of the observation error. The existence of an exponential observer is correlated to the existence of a solution for an H/sub /spl infin// Riccati-like inequality. Global and semiglobal convergence results are presented.

  • Using global control and SMES to damp inter-area oscillations: an exploratory assessment

    This paper presents results of a study whose objective is to show if there is an interest to use the superconducting magnetic storage (SMES) and the global control to improve the inter-area oscillations stability. Geometric measures of controllability and observability are used for input/output selection. The linearized model of a two areas four generators power system obtained by using SDYN software is used in this work. Effects, on the input/output pairs selection, of the excitation systems, the power how and the SMES sites on the network are highlighted. It appears that the power flow influences the measurements choice in comparison with the excitation system which has an impact on control signal selection. For all the studied cases, the results obtained show that the global control is well suited to solve the problem of inter-area oscillations stabilization.



Standards related to Observability

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