Nondestructive testing

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Nondestructive testing or Non-destructive testing (NDT) is a wide group of analysis techniques used in science and industry to evaluate the properties of a material, component or system without causing damage. The terms Nondestructive examination (NDE), Nondestructive inspection (NDI), and Nondestructive evaluation (NDE) are also commonly used to describe this technology. (

Conferences related to Nondestructive testing

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2020 IEEE International Conference on Industrial Technology (ICIT)

ICIT focuses on industrial and manufacturing applications of electronics, controls, communications, instrumentation, and computational intelligence.

2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC)

The 2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC 2020) will be held in Metro Toronto Convention Centre (MTCC), Toronto, Ontario, Canada. SMC 2020 is the flagship conference of the IEEE Systems, Man, and Cybernetics Society. It provides an international forum for researchers and practitioners to report most recent innovations and developments, summarize state-of-the-art, and exchange ideas and advances in all aspects of systems science and engineering, human machine systems, and cybernetics. Advances in these fields have increasing importance in the creation of intelligent environments involving technologies interacting with humans to provide an enriching experience and thereby improve quality of life. Papers related to the conference theme are solicited, including theories, methodologies, and emerging applications. Contributions to theory and practice, including but not limited to the following technical areas, are invited.

2020 IEEE International Electron Devices Meeting (IEDM)

the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.

2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science andtechnology research development and applications. The list of program topics includes but isnot limited to: Measurement Science & Education, Measurement Systems, Measurement DataAcquisition, Measurements of Physical Quantities, and Measurement Applications.

2020 IEEE International Magnetic Conference (INTERMAG)

INTERMAG is the premier conference on all aspects of applied magnetism and provides a range of oral and poster presentations, invited talks and symposia, a tutorial session, and exhibits reviewing the latest developments in magnetism.

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Periodicals related to Nondestructive testing

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Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.

Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.

Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission

Components and Packaging Technologies, IEEE Transactions on

Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.

Dielectrics and Electrical Insulation, IEEE Transactions on

Electrical insulation common to the design and construction of components and equipment for use in electric and electronic circuits and distribution systems at all frequencies.

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Most published Xplore authors for Nondestructive testing

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Xplore Articles related to Nondestructive testing

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IEE Colloquium on 'NDT Technology in Aerospace' (Digest No.10)

IEE Colloquium on NDT Technology in Aerospace, 1990


IEE Colloquium on 'Digital Signal Processing and Display Techniques for Ultrasonics' (Digest No.31)

IEE Colloquium onDigital Signal Processing and Display Techniques for Ultrasonics, 1988


IEE Colloquium on 'Measurements, Modelling and Imaging for Non-Destructive Testing' (Digest No.054)

IEE Colloquium on Measurements, Modelling and Imaging for Non-Destructive Testing, 1991


IEE Colloquium on 'Mathematical Modelling for NDT' (Digest No.39)

IEE Colloquium on Mathematical Modelling for NDT, 1989


IEE Colloquium on 'NMR/MRI used in NDT' (Digest No.1994/033)

IEE Colloquium on NMR/MRI used in NDT, 1994


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Educational Resources on Nondestructive testing

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Standards related to Nondestructive testing

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No standards are currently tagged "Nondestructive testing"

Jobs related to Nondestructive testing

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