Conferences related to MOS devices

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2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2019 56th ACM/ESDA/IEEE Design Automation Conference (DAC)

    EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)


2020 IEEE International Electron Devices Meeting (IEDM)

the IEEE/IEDM has been the world's main forum for reporting breakthroughs in technology, design, manufacturing, physics and the modeling of semiconductors and other electronic devices. Topics range from deep submicron CMOS transistors and memories to novel displays and imagers, from compound semiconductor materials to nanotechnology devices and architectures, from micromachined devices to smart -power technologies, etc.


2020 IEEE International Magnetic Conference (INTERMAG)

INTERMAG is the premier conference on all aspects of applied magnetism and provides a range of oral and poster presentations, invited talks and symposia, a tutorial session, and exhibits reviewing the latest developments in magnetism.


2020 IEEE International Reliability Physics Symposium (IRPS)

Meeting of academia and research professionals to discuss reliability challenges


2020 IEEE International Solid- State Circuits Conference - (ISSCC)

ISSCC is the foremost global forum for solid-state circuits and systems-on-a-chip. The Conference offers 5 days of technical papers and educational events related to integrated circuits, including analog, digital, data converters, memory, RF, communications, imagers, medical and MEMS ICs.


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Periodicals related to MOS devices

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Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Computer

Computer, the flagship publication of the IEEE Computer Society, publishes peer-reviewed technical content that covers all aspects of computer science, computer engineering, technology, and applications. Computer is a resource that practitioners, researchers, and managers can rely on to provide timely information about current research developments, trends, best practices, and changes in the profession.


Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Methods, algorithms, and human-machine interfaces for physical and logical design, including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, and documentation of integrated-circuit and systems designs of all complexities. Practical applications of aids resulting in producible analog, digital, optical, or microwave integrated circuits are emphasized.


Computers, IEEE Transactions on

Design and analysis of algorithms, computer systems, and digital networks; methods for specifying, measuring, and modeling the performance of computers and computer systems; design of computer components, such as arithmetic units, data storage devices, and interface devices; design of reliable and testable digital devices and systems; computer networks and distributed computer systems; new computer organizations and architectures; applications of VLSI ...


Consumer Electronics, IEEE Transactions on

The design and manufacture of consumer electronics products, components, and related activities, particularly those used for entertainment, leisure, and educational purposes


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Most published Xplore authors for MOS devices

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No authors for "MOS devices"


Xplore Articles related to MOS devices

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Computer architecture using NMOS technology

1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1980

A family of NMOS devices for a CPU chip which executes 16-bit register-to- register operations in a single 400ns microcycle, and memory-to-register moves in 2 microcycles, will be described.


Limits of VLSI

1980 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1980

The industry is continuing to shrink devices and increase integration levels. The panel will discuss the fundamental limits and practical barriers to the on-going development of VLSI, including reliability and yield effects of scaling, hot electron trapping, soft errors, current density limitations, leakage and circuit design tradeoffs. The focus will be on technology, device and circuit considerations.


Erratum

IEEE Transactions on Nuclear Science, 1982

None


Low-level MOS transistor amplifier using storage techniques

1973 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1973

A fully integrated analog amplifier which can be used in a variety of applications either as a single element or as a cell in a LSI circuit has been developed for such applications as temperature measurements associated with thermocouples, biomedicine, low-level measurements and A/D converters.


An NMOS DRAM controller

1982 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1982

An NMOS controller, generating control signals for a DRAM, with programmable interfaces, dual-port configurations and error correction support, will be discussed. The chip has a worst case delay of 35ns and can drive 500pF loads.


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Educational Resources on MOS devices

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IEEE-USA E-Books

  • Computer architecture using NMOS technology

    A family of NMOS devices for a CPU chip which executes 16-bit register-to- register operations in a single 400ns microcycle, and memory-to-register moves in 2 microcycles, will be described.

  • Limits of VLSI

    The industry is continuing to shrink devices and increase integration levels. The panel will discuss the fundamental limits and practical barriers to the on-going development of VLSI, including reliability and yield effects of scaling, hot electron trapping, soft errors, current density limitations, leakage and circuit design tradeoffs. The focus will be on technology, device and circuit considerations.

  • Erratum

    None

  • Low-level MOS transistor amplifier using storage techniques

    A fully integrated analog amplifier which can be used in a variety of applications either as a single element or as a cell in a LSI circuit has been developed for such applications as temperature measurements associated with thermocouples, biomedicine, low-level measurements and A/D converters.

  • An NMOS DRAM controller

    An NMOS controller, generating control signals for a DRAM, with programmable interfaces, dual-port configurations and error correction support, will be discussed. The chip has a worst case delay of 35ns and can drive 500pF loads.

  • A 8 × 8b parallel multiplier in submicron technology

    This paper will describe a 16ns 8×8b amplifier fabricated with an 0.85μ gatelength NMOS process. The chip (0.61mm× 0.85mm) containes 1427 transistors, dissipates 600mW and has a 420ps average gate delay.

  • C<sup>2</sup>MOS 4K static RAM

    None

  • A multichannel CODEC and filter subsystem

    An eight-channel CODEC and related sampled-data CCD filters will be described. The filters use sample and hold to achieve an analog multiplexing function on- chip, leading to a CODEC subsystem using but five chips.

  • IEEE Draft Standard for Metal-Oxide Surge Arresters for AC Power Circuits (&gt; 1 kV)

    This standard applies to metal-oxide surge arresters (MOSAs) designed to repeatedly limit the voltage surges on 48 Hz to 62 Hz power circuits (> 1000 V) by passing surge discharge current and automatically limiting the flow of system power current. This standard applies to devices for separate mounting and to devices supplied integrally with other equipment. The tests demonstrate that an arrester is able to survive the rigors of reasonable environmental conditions and system phenomena while protecting equipment and/or the system from damaging overvoltages caused by lightning, switching, and other undesirable surges.

  • An ECL compatible 4K CMOS RAM

    This paper will discuss a 4K&#215;1 ECL compatible static RAM using a HMOSII/CMOS process and speed-optimized CMOS circuits. Input and output levels have been found to meet specifications of the ECL 10K logic family. Address access time is 20ns and current drain is 150mA under nominal conditions.



Standards related to MOS devices

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No standards are currently tagged "MOS devices"


Jobs related to MOS devices

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