Conferences related to Integrated circuit noise

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2020 IEEE 70th Electronic Components and Technology Conference (ECTC)

ECTC is the premier international conference sponsored by the IEEE Components, Packaging and Manufacturing Society. ECTC paper comprise a wide spectrum of topics, including 3D packaging, electronic components, materials, assembly, interconnections, device and system packaging, optoelectronics, reliability, and simulation.


2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science andtechnology research development and applications. The list of program topics includes but isnot limited to: Measurement Science & Education, Measurement Systems, Measurement DataAcquisition, Measurements of Physical Quantities, and Measurement Applications.


2020 IEEE International Symposium on Circuits and Systems (ISCAS)

The International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems (CAS) Society and the world’s premier networking and exchange forum for researchers in the highly active fields of theory, design and implementation of circuits and systems. ISCAS2020 focuses on the deployment of CASS knowledge towards Society Grand Challenges and highlights the strong foundation in methodology and the integration of multidisciplinary approaches which are the distinctive features of CAS contributions. The worldwide CAS community is exploiting such CASS knowledge to change the way in which devices and circuits are understood, optimized, and leveraged in a variety of systems and applications.


2020 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

All areas of ionizing radiation detection - detectors, signal processing, analysis of results, PET development, PET results, medical imaging using ionizing radiation


2020 IEEE/MTT-S International Microwave Symposium (IMS)

The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2036 IEEE/MTT-S International Microwave Symposium - IMS 2036

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2031 IEEE/MTT-S International Microwave Symposium - IMS 2031

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2029 IEEE/MTT-S International Microwave Symposium - IMS 2029

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2026 IEEE/MTT-S International Microwave Symposium - IMS 2026

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2025 IEEE/MTT-S International Microwave Symposium - IMS 2025

    The IEEE International Microwave Symposium (IMS) is the world s foremost conferencecovering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies;encompassing everything from basic technologies to components to systems including thelatest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulationand more. The IMS includes technical and interactive sessions, exhibits, student competitions,panels, workshops, tutorials, and networking events.

  • 2024 IEEE/MTT-S International Microwave Symposium - IMS 2024

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2021 IEEE/MTT-S International Microwave Symposium - IMS 2021

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019

    Comprehensive symposium on microwave theory and techniques including active and passive circuit components, theory and microwave systems.

  • 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018

    Microwave theory and techniques, RF/microwave/millimeter-wave/terahertz circuit design and fabrication technology, radio/wireless communication.

  • 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2016 IEEE/MTT-S International Microwave Symposium - IMS 2016

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2015 IEEE/MTT-S International Microwave Symposium - MTT 2015

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics. The IMS includes technical sessions, both oral and interactive, worksh

  • 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014

    IMS2014 will cover developments in microwave technology from nano devices to system applications. Technical paper sessions, interactive forums, plenary and panel sessions, workshops, short courses, industrial exhibits, and a wide array of other technical activities will be offered.

  • 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter -wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010

    Reports of research and development at the state-of-the-art of the theory and techniques related to the technology and applications of devices, components, circuits, modules and systems in the RF, microwave, millimeter-wave, submillimeter-wave and Terahertz ranges of the electromagnetic spectrum.

  • 2009 IEEE/MTT-S International Microwave Symposium - MTT 2009

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2008 IEEE/MTT-S International Microwave Symposium - MTT 2008

  • 2007 IEEE/MTT-S International Microwave Symposium - MTT 2007

  • 2006 IEEE/MTT-S International Microwave Symposium - MTT 2006

  • 2005 IEEE/MTT-S International Microwave Symposium - MTT 2005

  • 2004 IEEE/MTT-S International Microwave Symposium - MTT 2004

  • 2003 IEEE/MTT-S International Microwave Symposium - MTT 2003

  • 2002 IEEE/MTT-S International Microwave Symposium - MTT 2002

  • 2001 IEEE/MTT-S International Microwave Symposium - MTT 2001

  • 2000 IEEE/MTT-S International Microwave Symposium - MTT 2000

  • 1999 IEEE/MTT-S International Microwave Symposium - MTT '99

  • 1998 IEEE/MTT-S International Microwave Symposium - MTT '98

  • 1997 IEEE/MTT-S International Microwave Symposium - MTT '97

  • 1996 IEEE/MTT-S International Microwave Symposium - MTT '96


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Periodicals related to Integrated circuit noise

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Biomedical Circuits and Systems, IEEE Transactions on

The Transactions on Biomedical Circuits and Systems addresses areas at the crossroads of Circuits and Systems and Life Sciences. The main emphasis is on microelectronic issues in a wide range of applications found in life sciences, physical sciences and engineering. The primary goal of the journal is to bridge the unique scientific and technical activities of the Circuits and Systems ...


Circuits and Systems I: Regular Papers, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Communications Magazine, IEEE

IEEE Communications Magazine was the number three most-cited journal in telecommunications and the number eighteen cited journal in electrical and electronics engineering in 2004, according to the annual Journal Citation Report (2004 edition) published by the Institute for Scientific Information. Read more at http://www.ieee.org/products/citations.html. This magazine covers all areas of communications such as lightwave telecommunications, high-speed data communications, personal communications ...


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Most published Xplore authors for Integrated circuit noise

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Xplore Articles related to Integrated circuit noise

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Noise in interconecction lines for submicrometer CMOS integrated circuits

IEEE Latin America Transactions, 2005

The growing use of high performance portable systems is the main driving force for the significant advance in the technology of VLSI-CMOS integrated circuits. This advance has been carried out through scaling the transistor and interconnection sizes. However, as the transistor's size and interconnections are getting smaller, the signal integrity is becoming a critical issue. Therefore it is required to ...


Harmony: static noise analysis of deep submicron digital integrated circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1999

As technology scales into the deep submicron regime, noise immunity is becoming a metric of comparable importance to area, timing, and power for the analysis and design of very large scale integrated (VLSI) systems. A metric for noise immunity is defined, and a static noise analysis methodology based on this noise-stability metric is introduced to demonstrate how noise can be ...


An X-band balanced-mixer integrated circuit

1966 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1966

None


Proceedings Fourth International Symposium on Quality Electronic Design

Fourth International Symposium on Quality Electronic Design, 2003. Proceedings., 2003

The following topics are dealt with: VLSI design, modeling, simulation; IC packages; interconnected systems; noise analysis; system on chip; submicron technology; high speed circuits; reliability; IC testing; leakage currents; testing measurements.


An integrated expandor circuit

1976 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1976

This paper will describe an IC compandor that provides improved noise performance in high quality telephone systems. An accuracy Of 0.2 dB has been achieved over 60-dB dynamic and10-55°C temperature ranges.


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Educational Resources on Integrated circuit noise

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IEEE.tv Videos

ON-CHIP VOLTAGE AND TIMING DIAGNOSTIC CIRCUITS
Maker Faire 2008: Spectrum's Digital Clock Contest Winner
26th Annual MTT-AP Symposium and Mini Show - Dr. Ajay Poddar
A 28GHz CMOS Direct Conversion Transceiver with Packaged Antenna Arrays for 5G Cellular Systems: RFIC Industry Showcase 2017
A Low Power High Performance PLL with Temperature Compensated VCO in 65nm CMOS: RFIC Interactive Forum
A 40GHz PLL with -92.5dBc/Hz In-Band Phase Noise and 104fs-RMS-Jitter: RFIC Interactive Forum 2017
IMS 2012 Microapps - Integrated Electrothermal Solution Delivers Thermally Aware Circuit Simulation Rick Poore, Agilent EEsof
IMS 2014: A 600 GHz Low-Noise Amplifier Module
A Fully Integrated 75-83GHz FMCW Synthesizer for Automotive Radar Applications with -97dBc/Hz Phase Noise at 1MHz Offset and 100GHz/mSec Maximal Chirp Rate: RFIC Industry Showcase 2017
Sources of Innovation
Micro-Apps 2013: Optimizing Chip, Module, Board Transitions Using Integrated EM and Circuit Design Simulation Software
Non-Volatile Memory Array Based Quantization - Wen Ma - ICRC San Mateo, 2019
Noise-Shaped Active SAR Analog-to-Digital Converter - IEEE Circuits and Systems Society (CAS) Distinguished Lecture
An Integrated Optical Parallel Multiplier Exploiting Approximate Binary Logarithms - Jun Shiomi - ICRC 2018
ASC-2014 SQUIDs 50th Anniversary: 1 of 6 Arnold Silver
IMS 2014: LNA Modules for the WR4 (170-260 GHz) Frequency Range
BSIM Spice Model Enables FinFET and UTB IC Design
Micro-Apps 2013: Integrated Electro-Thermal Design of a SiGe PA
An IEEE IPC Special Session with Kasia Balakier of UCL
A Low-Power Fully Integrated 76-81GHz ADPLL for Automotive Applications - Ahmed R. Fridi - RFIC 2019 Showcase

IEEE-USA E-Books

  • Noise in interconecction lines for submicrometer CMOS integrated circuits

    The growing use of high performance portable systems is the main driving force for the significant advance in the technology of VLSI-CMOS integrated circuits. This advance has been carried out through scaling the transistor and interconnection sizes. However, as the transistor's size and interconnections are getting smaller, the signal integrity is becoming a critical issue. Therefore it is required to develop noise tolerant design circuit techniques in order to enhance the noise tolerance. In addition, these techniques should have a minimum impact on the circuit performance. In this paper, the noise immunity of dynamic logical circuits as the technology scales down is analyzed by using a reliable scaling scenario, and a new noise tolerant design technique is proposed. Prototype circuits implementing the proposed technique have been designed and fabricated. A one-bit carry look-ahead adder was designed using 0.35 mm CMOS-AMS technology. The experimental results show that the design technique here presented, results in an improvement of the ANTE by a factor of 3.4X when compared with the conventional TSPC, and an improvement by a factor of 1.7X when compared with the best noise tolerant technique currently published.

  • Harmony: static noise analysis of deep submicron digital integrated circuits

    As technology scales into the deep submicron regime, noise immunity is becoming a metric of comparable importance to area, timing, and power for the analysis and design of very large scale integrated (VLSI) systems. A metric for noise immunity is defined, and a static noise analysis methodology based on this noise-stability metric is introduced to demonstrate how noise can be analyzed systematically on a full-chip basis using simulation-based transistor-level analysis. We then describe Harmony, a two-level (macro and global) hierarchical implementation of static noise analysis. At the macro level, simplified interconnect models and timing assumptions guide efficient analysis. The global level involves a careful combination of static noise analysis, static timing analysis, and detailed interconnect macromodels based on reduced-order modeling techniques. We describe how the interconnect macromodels are practically employed to perform coupling analysis and how timing constraints can be used to limit pessimism in the analysis.

  • An X-band balanced-mixer integrated circuit

    None

  • Proceedings Fourth International Symposium on Quality Electronic Design

    The following topics are dealt with: VLSI design, modeling, simulation; IC packages; interconnected systems; noise analysis; system on chip; submicron technology; high speed circuits; reliability; IC testing; leakage currents; testing measurements.

  • An integrated expandor circuit

    This paper will describe an IC compandor that provides improved noise performance in high quality telephone systems. An accuracy Of 0.2 dB has been achieved over 60-dB dynamic and10-55°C temperature ranges.

  • A bipolar opamp with a noise resistance of less than 50 ω

    This paper will cover the design of an opamp with input noise resistance of less than 50Ω. The offset voltage and bias current are internally trimmed to 50μV and 15nA, respectively. The slew rate is 13V/μs.

  • A new calculation approach of transistor noise parameters as a function of gatewidth and bias current

    In this paper a new method to calculate the noise parameters of transistors T/sub i/ (MESFET or HEMT) as a function of gatewidth and drain-bias current is presented. This method needs the knowledge of the R, P, and C coefficients. It is based on the measurement of the noise parameters of a reference transistor T,/sub r/ at two bias points (I/sub ds1/ and I/sub ds2/), and the equivalent circuit elements' values of all transistors T/sub i/. Using this method, the noise parameters (F/sub min/, /spl Gamma//sub opt/, R/sub n/) for two MESFET's T/sub i/ biased at another current I/sub ds3/ are obtained. Good agreement between the predicted and measured noise parameters' values is obtained for a broad frequency range (4-20 GHz).

  • A scalable substrate noise coupling model for design of mixed-signal IC's

    This paper describes a design-oriented scalable macromodel for substrate noise coupling in heavily-doped substrates. The model requires only four parameters which can be readily extracted from a small number of device simulations or measurements. Once these parameters have been determined, the model can be used in design for any spacing between the injection and sensing contacts and for different contact geometries. The scalability of the model with separation and width provides insight into substrate coupling and optimization issues prior to and during the layout phase. The model is validated with measurements from test structures fabricated in a 0.5 /spl mu/m CMOS process. Applications of the model to circuit design are demonstrated with simulation results.

  • Correction to "Voltage-Comparator-Based Measurement of Equivalentiy Samlpled Substrate Noise Wavefor

    None

  • NOISY: an electrical noise checker for ULSI

    NOISY is a part of an electrical rule checker with emphasis on noise computation. NOISY analyzes all types of noise, computes worst-case conditions using a relaxation algorithm, and draws a map of noise distribution in a chip. Its hierarchical organization allows verification of a high-complexity chip (more than 100000 transistors). Developed for CMOS circuitry, both static and dynamic, it can be extended to other types of technology.<<ETX>>



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