Conferences related to Extraterrestrial measurements

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GLOBECOM 2020 - 2020 IEEE Global Communications Conference

IEEE Global Communications Conference (GLOBECOM) is one of the IEEE Communications Society’s two flagship conferences dedicated to driving innovation in nearly every aspect of communications. Each year, more than 2,900 scientific researchers and their management submit proposals for program sessions to be held at the annual conference. After extensive peer review, the best of the proposals are selected for the conference program, which includes technical papers, tutorials, workshops and industry sessions designed specifically to advance technologies, systems and infrastructure that are continuing to reshape the world and provide all users with access to an unprecedented spectrum of high-speed, seamless and cost-effective global telecommunications services.


Oceans 2020 MTS/IEEE GULF COAST

To promote awareness, understanding, advancement and application of ocean engineering and marine technology. This includes all aspects of science, engineering, and technology that address research, development, and operations pertaining to all bodies of water. This includes the creation of new capabilities and technologies from concept design through prototypes, testing, and operational systems to sense, explore, understand, develop, use, and responsibly manage natural resources.

  • OCEANS '96

  • OCEANS '97

  • OCEANS '98

  • OCEANS '99

  • OCEANS 2000

  • OCEANS 2001

  • OCEANS 2002

  • OCEANS 2003

  • OCEANS 2004

  • OCEANS 2005

  • OCEANS 2006

  • OCEANS 2007

  • OCEANS 2008

    The Marine Technology Society (MTS) and the Oceanic Engineering Society (OES) of the Institute of Electrical and Electronic Engineers (IEEE) cosponsor a joint conference and exposition on ocean science, engineering, education, and policy. Held annually in the fall, it has become a focal point for the ocean and marine community to meet, learn, and exhibit products and services. The conference includes technical sessions, workshops, student poster sessions, job fairs, tutorials and a large exhibit.

  • OCEANS 2009

  • OCEANS 2010

    The Marine Technology Society and the Oceanic Engineering Scociety of the IEEE cosponsor a joint annual conference and exposition on ocean science engineering, and policy.

  • OCEANS 2011

    The Marine Technology Society and the Oceanic Engineering Scociety of the IEEE cosponsor a joint annual conference and exposition on ocean science engineering, and policy.

  • OCEANS 2012

    Ocean related technology. Tutorials and three days of technical sessions and exhibits. 8-12 parallel technical tracks.

  • OCEANS 2013

    Three days of 8-10 tracks of technical sessions (400-450 papers) and concurent exhibition (150-250 exhibitors)

  • OCEANS 2014

    The OCEANS conference covers four days. One day for tutorials and three for approx. 450 technical papers and 150-200 exhibits.

  • OCEANS 2015

    The Marine Technology Scociety and the Oceanic Engineering Society of the IEEE cosponor a joint annual conference and exposition on ocean science, engineering, and policy. The OCEANS conference covers four days. One day for tutorials and three for approx. 450 technical papers and 150-200 exhibits.

  • OCEANS 2016

    The Marine Technology Scociety and the Oceanic Engineering Society of the IEEE cosponor a joint annual conference and exposition on ocean science, engineering, and policy. The OCEANS conference covers four days. One day for tutorials and three for approx. 500 technical papers and 150 -200 exhibits.

  • OCEANS 2017 - Anchorage

    Papers on ocean technology, exhibits from ocean equipment and service suppliers, student posters and student poster competition, tutorials on ocean technology, workshops and town meetings on policy and governmental process.

  • OCEANS 2018 MTS/IEEE Charleston

    Ocean, coastal, and atmospheric science and technology advances and applications


2020 IEEE International Conference on Image Processing (ICIP)

The International Conference on Image Processing (ICIP), sponsored by the IEEE SignalProcessing Society, is the premier forum for the presentation of technological advances andresearch results in the fields of theoretical, experimental, and applied image and videoprocessing. ICIP 2020, the 27th in the series that has been held annually since 1994, bringstogether leading engineers and scientists in image and video processing from around the world.


2020 IEEE International Reliability Physics Symposium (IRPS)

Meeting of academia and research professionals to discuss reliability challenges


2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2019 56th ACM/ESDA/IEEE Design Automation Conference (DAC)

    EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.



Periodicals related to Extraterrestrial measurements

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Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Broadcasting, IEEE Transactions on

Broadcast technology, including devices, equipment, techniques, and systems related to broadcast technology, including the production, distribution, transmission, and propagation aspects.


Communications Letters, IEEE

Covers topics in the scope of IEEE Transactions on Communications but in the form of very brief publication (maximum of 6column lengths, including all diagrams and tables.)



Most published Xplore authors for Extraterrestrial measurements

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Xplore Articles related to Extraterrestrial measurements

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Non‐GNSS Positioning Systems and Techniques for Outdoors

Global Positioning: Technologies and Performance, None

This chapter contains sections titled:Introduction (Large Area Without Contact or Wireless Systems)The Optical SystemsThe Terrestrial Radio SystemsThe Satellite Radio SystemsNon‐Radio‐Based SystemsExercisesBibliography


A framework for next-generation radiation belt models

Space Weather, 2005

The trapped radiation specifications, such as AE-8 and AP-8, are based upon a simple and reasonable framework that happens to be insufficient to the modern demands placed upon them. This manuscript outlines an improved framework for the next generation of radiation models. While existing radiation specifications tend to provide mean fluxes on a grid in magnetic coordinates, scientific and engineering ...


User Equipment Positioning

LTE - The UMTS Long Term Evolution: From Theory to Practice, None

None


Space Antennas for Radio Astronomy

Space Antenna Handbook, None

None


Trusted Cognitive Radio Networks

Cognitive Radio Networks, None

This chapter contains sections titled:Framework of Trust in CRNTrusted Association and RoutingTrust with LearningSecurity in CRNReferences



Educational Resources on Extraterrestrial measurements

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IEEE.tv Videos

IMS 2011 Microapps - Panel Session: Nonlinear Measurements
IMS 2012 Microapps - Use of FPGAs for Faster Test Times and Repeatability on Cellular Measurements
IMS 2011 Microapps - Time Domain Measurements in Waveguide
IMS 2011 Microapps - Pulsed S-Parameter Measurements Using PXI Instruments
IMS 2011 Microapps - IQ Mixer Measurements: Techniques for Complete Characterization of IQ Mixers Using a Multi-Port Vector Network Analyzer
Brooklyn 5G - 2015 - Andreas F. Molisch - Channel Measurements for Massive MIMO
IMS 2012 Microapps - Basic Amplifier Measurements with the RF Vector Network Analyzer (VNA) Taku Hirato, Agilent
IMS 2012 Microapps - Generation and Analysis Techniques for Cost-efficient SATCOM Measurements Richard Overdorf, Agilent
Panel Session: 5G Test and Measurements - 5G Summit at IMS 2017
ISEC 2013 Special Gordon Donaldson Session: Remembering Gordon Donaldson - 6 of 7 - A high sensitive magnetometer system for natural magnetic field measurements
IMS MicroApps: Nonlinear Co-Simulation with Real-Time Channel Measurements
Introducing the Kalman Filter
Micro-Apps 2013: Determining Circuit Material Dielectric Constant from Phase Measurements
Brooklyn 5G Summit 2014: Channel Measurements Summary by Ted Rappaport
Phase Retrieval with Application to Optical Imaging
Spectrum Analysis: RF Boot Camp
Brooklyn 5G Summit 2014: Jonas Medbo on 5G Channel Modeling Challenges
Micro-Apps Keynote 2013: Modern RF Measurements and How They Drive Spectrum Analyzer Digital IF Processor Design
ISEC 2013 Special Gordon Donaldson Session: Remembering Gordon Donaldson - 7 of 7 - SQUID-based noise thermometers for sub-Kelvin thermometry
MicroApps: New Calibration Method Simplifes Measurements of Fixtured Devices (Agilent Technologies)

IEEE-USA E-Books

  • Non‐GNSS Positioning Systems and Techniques for Outdoors

    This chapter contains sections titled:Introduction (Large Area Without Contact or Wireless Systems)The Optical SystemsThe Terrestrial Radio SystemsThe Satellite Radio SystemsNon‐Radio‐Based SystemsExercisesBibliography

  • A framework for next-generation radiation belt models

    The trapped radiation specifications, such as AE-8 and AP-8, are based upon a simple and reasonable framework that happens to be insufficient to the modern demands placed upon them. This manuscript outlines an improved framework for the next generation of radiation models. While existing radiation specifications tend to provide mean fluxes on a grid in magnetic coordinates, scientific and engineering users are starting to demand capabilities that are far beyond this simple framework, such as error bars on total mission dose and real-time data assimilation. One framework that can provide these added capabilities while still remaining fairly simple is the joint probability distribution, described here. The joint distribution can describe the behavior of individual fluxes on a grid in magnetic coordinates while also describing how those fluxes vary together. This covariance is a crucial ingredient for data assimilation and for proper error bars and percentiles on composite quantities like dose or fluence to a shielded device. This manuscript describes the core math of the proposed framework, an approach to building the model from in situ observations and/or numerical simulations, how to use the model to calculate error bars and percentiles on composite quantities, how to use the model in data assimilation, and how to make a first estimate of the dependence of worst case fluences on aggregation time.

  • User Equipment Positioning

    None

  • Space Antennas for Radio Astronomy

    None

  • Trusted Cognitive Radio Networks

    This chapter contains sections titled:Framework of Trust in CRNTrusted Association and RoutingTrust with LearningSecurity in CRNReferences

  • Ionosphere geomagnetic field: Comparison of IGRF model prediction and satellite measurements 1991–2010

    The geomagnetic field is an important parameter in space physics. The International Geomagnetic Reference Field (IGRF) is a model of the Earth's main field. Current sources in the ionosphere, the interplanetary magnetic field, annual and diurnal variation, and other sporadic and unmodeled effects may alter the actual B field distribution. We investigate whether the model is nevertheless sufficiently accurate for computing ionospheric effects on radio frequency signals. Detailed analysis of scalar intensity is presented based on direct measurements of the magnetic field taken from UARS, SAC-C, Ørsted, and CHAMP, all satellites with magnetometers orbiting between 200 and 1000 km altitude. Our results indicate that the IGRF model is within 1% accuracy of the measured ionosphere B field, 92.80% of the time. Quality control issues associated with the scalar data are also discussed.

  • Discussion on “primary standard of light.” Atlantic city, N. J., July 2, 1908

    W. S. Franklin (by letter): The establishment of a reliable and reproducible light standard is of very great importance, and we naturally look to our Bureau of Standards to carry out such researches as may be necessary for its realization. I therefore move that the Bureau of Standards be requested by the Institute of Electrical Engineers to undertake such researches as may be necessary to determine the practicability of the light standard suggested by Dr. Steinmetz, and, to develop such a primary standard of light if it be found practicable.

  • One NJ Electric Gun Facility

    None

  • Frontispiece

    Presented is an image of contours of radio emission from the Great Nebula in Andromeda (M31) measured with The Ohio State University 260-foot radio telescope at 1415 Mc. The radio contours are superimposed on a Perkins Observatory photograph. This galaxy is at a distance of some two million light years and is believed to be quite similar to our own galaxy. The contour interval is 0.05° Kelvin of antenna temperature. The cross indicates the optical center and the small white circle the approximate radio center (Nature, vol. 202, p. 1202; 1964). The figure is about 3.5° wide by 4° high; the antenna beam size is shown at the top. This radio-optical presentation exemplifies the growing trend of combining radio and optical results in astronomical research.

  • Transfer Impedance Measurements of EMP Shielding Components

    None



Standards related to Extraterrestrial measurements

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No standards are currently tagged "Extraterrestrial measurements"