Exponential distribution

View this topic in
Exponential parameters: λ > 0 rate, or inverse scale support: x ∈ [0, ∞] pdf: λ e cdf: 1 − e mean: λ median: λ ln 2 mode: 0 variance: λ skewness: 2 kurtosis: 6 entropy: 1 − ln(λ) mgf: cf: In probability theory and statistics, the exponential distribution (a.k.a. (Wikipedia.org)






Conferences related to Exponential distribution

Back to Top

2020 IEEE 23rd International Conference on Information Fusion (FUSION)

The International Conference on Information Fusion is the premier forum for interchange of the latest research in data and information fusion, and its impacts on our society. The conference brings together researchers and practitioners from academia and industry to report on the latest scientific and technical advances.


2020 IEEE International Conference on Plasma Science (ICOPS)

IEEE International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society.


2020 IEEE Radar Conference (RadarConf20)

Annual IEEE Radar Conference

  • 2018 IEEE Radar Conference (RadarConf18)

    This conference will be a continuation of the annual IEEE radar series (formerly the IEEE National Radar conference). These conferences cover the many disciplines that span the applications of modern radar systems, including systems-level through subsystem and component technologies, antennas, and signal processing (deterministic and adaptive). The scope includes systems architectures of monostatic, bistatic and multistatic, and ground-based, airborne, shipborne, and spaceborne realizations.

  • 2017 IEEE Radar Conference (RadarCon)

    This conference will be a continuation of the annual IEEE radar series (formerly the IEEE National Radar conference). These conferences cover the many disciplines that span the applications of modern radar systems. This includes systems-level through subsystem and component technologies, antennas, and signal processing (deterministic and adaptive). The scope includes systems architectures of monostatic, bistatic and multistatic, and ground-based, airborne, and spaceborn realizations.

  • 2016 IEEE Radar Conference (RadarCon)

    A continuing series of annual RADAR Conferences IEEE-AESS

  • 2015 IEEE Radar Conference (RadarCon)

    The scope of the IEEE 2015 International Radar Conference includes all aspects of civil and military radar. Topics range from fundamental theory to cutting-edge applications, from signal processing, modeling, simulation to hardware implementation and experimental results.

  • 2014 IEEE Radar Conference (RadarCon)

    The 2014 IEEE Radar Conference will showcase innovations and developments in radar technology. Topics will include presentations describing developments in radar systems and their implementations, phenomenology, target and clutter modeling, signal processing, component advances, etc.

  • 2013 IEEE Radar Conference (RadarCon)

    The conference theme is The Arctic The New Frontier as it presents a vast and challenging environment for which radar systems operating in a multi-sensor environment are currently being developed for deployment on space, air, ship and ground platforms and for both remote sensing of the environment and for the monitoring of human activity. It is one of the major challenges and applications being pursued in the field of radar development in Canada.

  • 2012 IEEE Radar Conference (RadarCon)

    The 2012 IEEE Radar Conference will host 400 to 600 attendees interested in innovations and developments in radar technology. The radar related topics will include presentations describing developments in radar systems and their implementations, phenomenology, target and clutter modeling, component advances, signal processing and data processing utilizing advanced algorithms. The conference will also include exhibits by vendors of radar systems, radar components, instrumentation, related software and publ

  • 2011 IEEE Radar Conference (RadarCon)

    RadarCon11 will feature topics in radar systems, technology, applications, phenomenology,modeling, & signal processing. The conference theme, In the Eye of the Storm, highlights the strong regional interest in radar for severe weather analysis and tracking. Broader implications of the theme reflect global interests such as radar's role in assessing climate change, supporting myriad defense applications, as well as issues with spectrum allocation and management.

  • 2010 IEEE International Radar Conference

    RADAR Systems, RADAR technology

  • 2009 IEEE Radar Conference

    The conference's scope is civil and military radar, including science, technology, and systems. The theme for RADAR '09 is "Radar: From Science to Systems," emphasizing scientific or observational requirements and phenomenology that lead to the systems that we in the radar community develop.

  • 2008 IEEE Radar Conference

    The 2008 IEEE Radar Conference will focus on the key aspects of radar theory and applications as listed below. Exploration of new avenues and methodologies of radar signal processing will also be encouraged. Tutorials will be held in a number of fields of radar technology. The Conference will cover all aspects of radar systems for civil, security and defense applications.

  • 2007 IEEE Radar Conference

  • 2006 IEEE Radar Conference

  • 2005 IEEE International Radar Conference

  • 2004 IEEE Radar Conference

  • 2003 IEEE Radar Conference

  • 2002 IEEE Radar Conference

  • 2001 IEEE Radar Conference

  • 2000 IEEE International Radar Conference

  • 1999 IEEE Radar Conference

  • 1998 IEEE Radar Conference

  • 1997 IEEE Radar Conference

  • 1996 IEEE Radar Conference


2019 14th IEEE Conference on Industrial Electronics and Applications (ICIEA)

Artificial Intelligence, Control and Systems, Cyber-physical Systems, Energy and Environment, Industrial Informatics and Computational Intelligence, Robotics, Network and Communication Technologies, Power Electronics, Signal and Information Processing


2019 56th ACM/ESDA/IEEE Design Automation Conference (DAC)

EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)


More Conferences

Periodicals related to Exponential distribution

Back to Top

Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Broadcasting, IEEE Transactions on

Broadcast technology, including devices, equipment, techniques, and systems related to broadcast technology, including the production, distribution, transmission, and propagation aspects.


More Periodicals

Most published Xplore authors for Exponential distribution

Back to Top

Xplore Articles related to Exponential distribution

Back to Top

Scale‐Free Networks

Network Science: Theory and Applications, None

This chapter contains sections titled:Generating a Scale‐Free NetworkProperties of Scale‐Free NetworksNavigation in Scale‐Free NetworksAnalysisExercises


Product Life and Reliability Assessment

3D IC and RF SiPs: Advanced Stacking and Planar Solutions for 5G Mobility, None

In this chapter, the authors devote themselves to discussions of product life estimation and reliability assessment. Estimating a product's life is a necessity and a challenging task for a company. A product's life is also product's time to fail (TTF). The authors illustrate how average mean time‐to‐fail (MTTF) can be obtained from a failure rate density function, and how MTTF ...


Continuous Random Variables

Designing High Availability Systems: DFSS and Classical Reliability Techniques with Practical Real Life Examples, None

This chapter provides a brief introduction to the continuous random variables in particular and contrasting this concept with discrete random variables. Several important continuous random variables are applicable to reliability theory. We will see in later chapters how these concepts are applied to more practical reliability problems.


BERa performance of coherent DPSK free-space optical systems with APD over turbulence channels

2009 14th OptoElectronics and Communications Conference, 2009

We investigate the average bit error rate (BER) performance of coherent DPSK free space optical systems with APD over atmospheric turbulence channels. For validation of the average BER performance, we use Gauss-Hermite quadrature formula.


Maintenance mission oriented number determination method of maintenance equipment for aircraft

2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, 2012

Number identification of maintenance equipment is an emergent problem of support resources deployment for aircraft in design and development phase. Taking maintenance mission requirements as input, queuing model of batch arrival LRU (Line Replaceable Units) based on Queuing Theory is constructed. Effects of maintenance equipment failure on queuing model are analyzed. Being subjected to the constraint of average waiting time ...


More Xplore Articles

Educational Resources on Exponential distribution

Back to Top

IEEE-USA E-Books

  • Scale‐Free Networks

    This chapter contains sections titled:Generating a Scale‐Free NetworkProperties of Scale‐Free NetworksNavigation in Scale‐Free NetworksAnalysisExercises

  • Product Life and Reliability Assessment

    In this chapter, the authors devote themselves to discussions of product life estimation and reliability assessment. Estimating a product's life is a necessity and a challenging task for a company. A product's life is also product's time to fail (TTF). The authors illustrate how average mean time‐to‐fail (MTTF) can be obtained from a failure rate density function, and how MTTF can be modeled as a function environmental or current density variables. From the model, the results from harsher test conditions are then used to predict the MTTF (or the product's Life) of products at normal operating conditions. Reliability assessments are necessary to remove the potential failure modes, in addition to product life prediction. Many trades groups are interested in establishing reliability assessment standards for obvious reason: reliability is a vital part of their industry.

  • Continuous Random Variables

    This chapter provides a brief introduction to the continuous random variables in particular and contrasting this concept with discrete random variables. Several important continuous random variables are applicable to reliability theory. We will see in later chapters how these concepts are applied to more practical reliability problems.

  • BERa performance of coherent DPSK free-space optical systems with APD over turbulence channels

    We investigate the average bit error rate (BER) performance of coherent DPSK free space optical systems with APD over atmospheric turbulence channels. For validation of the average BER performance, we use Gauss-Hermite quadrature formula.

  • Maintenance mission oriented number determination method of maintenance equipment for aircraft

    Number identification of maintenance equipment is an emergent problem of support resources deployment for aircraft in design and development phase. Taking maintenance mission requirements as input, queuing model of batch arrival LRU (Line Replaceable Units) based on Queuing Theory is constructed. Effects of maintenance equipment failure on queuing model are analyzed. Being subjected to the constraint of average waiting time to repair, the number of maintenance equipment required is determined, which will provide a valid method to determine the number of maintenance equipment for aircraft being developed.

  • The failure of MTTF in availability evaluation

    In this paper, a truncated bathtub is proposed to model the failure rate of a product with perfect burn-in. We expose some counter-intuition observations, e.g., increasing the MTTF does not necessarily increase the average and instantaneous availability during the product's lifetime, and the average and instantaneous availability could be improved without changing the MTTF. The MTTF and the steady-state availability are not particularly informative and fail to evaluate the product with time-varying failure rate and short upgrading interval.

  • Recognizing Interaction Activities using Dynamic Bayesian Network

    Activity recognition is significant in intelligent surveillance. In this paper, we present a novel approach to the recognition of interacting activities based on dynamic Bayesian network (DBN). In this approach the features representing the object motion are divided into two classes: global features and local features, which are at two different spatial scales. Global features describe object motion at a large spatial scale and relations between objects or between the object and environment, and local ones represent the motion details of objects of interest. We propose a new DBN model structure with state duration to model human interacting activities. This DBN model structure combines the global features with local ones harmoniously. The effectiveness of this novel approach is demonstrated by experiment

  • Effects of Mobility on Mean Packet Delay Over Integrated Services Wireless Networks

    Next generation cellular networks are based on packet switching and has QoS support based on architectures such as integrated services. To calculate the QoS parameters such as packet delay will be very important. In order reach to this goal, in this paper we propose a model for an integrated services wireless access router. Our model describes the user mobility effect on the mean packet delay over such routers under two different CAC schemes. Besides, we apply this model to evaluate the mobility effect over two QoS support approaches, the standard IntServ and a new proposal for QoS support based on integrated services named IntServ6

  • Approximating blocking probabilities for multiservice network link with unicast and multicast connections

    In this paper we consider a multiservice network link accepting both multicast and unicast connections. We model the link as a multi-stream loss system and study an approximate method for computing blocking probabilities for traffic streams. A case study is represented to show the accuracy of the approximation.

  • The Independence Assumption for a Series or Parallel System When Component Lifetimes Are Exponential

    A common assumption made In modeling system life from series and parallel systems is that the component lives are independent. This study investigates the magnitude of the errors one may incur by erroneously asuming the component lifetimes have independent exponential distributions when in fact the lifetimes follow the bivariate exponential distribution of Marshall & Olkin (series or parallel systems) or that of Freund (parallel systems).



Standards related to Exponential distribution

Back to Top

No standards are currently tagged "Exponential distribution"


Jobs related to Exponential distribution

Back to Top