Conferences related to Error probability

Back to Top

ICC 2021 - IEEE International Conference on Communications

IEEE ICC is one of the two flagship IEEE conferences in the field of communications; Montreal is to host this conference in 2021. Each annual IEEE ICC conference typically attracts approximately 1,500-2,000 attendees, and will present over 1,000 research works over its duration. As well as being an opportunity to share pioneering research ideas and developments, the conference is also an excellent networking and publicity event, giving the opportunity for businesses and clients to link together, and presenting the scope for companies to publicize themselves and their products among the leaders of communications industries from all over the world.


2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2019 56th ACM/ESDA/IEEE Design Automation Conference (DAC)

    EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)


2020 59th IEEE Conference on Decision and Control (CDC)

The CDC is the premier conference dedicated to the advancement of the theory and practice of systems and control. The CDC annually brings together an international community of researchers and practitioners in the field of automatic control to discuss new research results, perspectives on future developments, and innovative applications relevant to decision making, automatic control, and related areas.


2020 IEEE International Conference on Image Processing (ICIP)

The International Conference on Image Processing (ICIP), sponsored by the IEEE SignalProcessing Society, is the premier forum for the presentation of technological advances andresearch results in the fields of theoretical, experimental, and applied image and videoprocessing. ICIP 2020, the 27th in the series that has been held annually since 1994, bringstogether leading engineers and scientists in image and video processing from around the world.


2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC)

The 2020 IEEE International Conference on Systems, Man, and Cybernetics (SMC 2020) will be held in Metro Toronto Convention Centre (MTCC), Toronto, Ontario, Canada. SMC 2020 is the flagship conference of the IEEE Systems, Man, and Cybernetics Society. It provides an international forum for researchers and practitioners to report most recent innovations and developments, summarize state-of-the-art, and exchange ideas and advances in all aspects of systems science and engineering, human machine systems, and cybernetics. Advances in these fields have increasing importance in the creation of intelligent environments involving technologies interacting with humans to provide an enriching experience and thereby improve quality of life. Papers related to the conference theme are solicited, including theories, methodologies, and emerging applications. Contributions to theory and practice, including but not limited to the following technical areas, are invited.


More Conferences

Periodicals related to Error probability

Back to Top

Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Broadcasting, IEEE Transactions on

Broadcast technology, including devices, equipment, techniques, and systems related to broadcast technology, including the production, distribution, transmission, and propagation aspects.


Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Communications Letters, IEEE

Covers topics in the scope of IEEE Transactions on Communications but in the form of very brief publication (maximum of 6column lengths, including all diagrams and tables.)


More Periodicals

Most published Xplore authors for Error probability

Back to Top

Xplore Articles related to Error probability

Back to Top

Comment on "Pairwise error probability of space-time codes in frequency selective Rician channels"

IEEE Communications Letters, 2006

A simpler explicit expression is derived for pairwise error probability (PEP) considered by Dharmawansa and Rajatheva (IEEE Commun. Lett., vol.9, p.894-6, October 2005). The computational efficiency of this expression is established.


Performance of Joint Equalization and Trellis-Coded on Multipath Fading Channels

Proceedings. IEEE International Symposium on Information Theory, 1993

In this paper an upper bound on bit error probability of a maximum-likelihood sequence estimation (MLSE) equalizer for trellis-coded modulation (TCM) systems with diversity reception is derived for multipath Rayleigh fading channels. Analytical and simulation results show that our bound is good for all cases considered especially when diversity reception is used.


Error Probability Bounds for Bit-Interleaved Space–Time Trellis Coding Over Block-Fading Channels

IEEE Transactions on Information Theory, 2007

In this correspondence, we investigate the error probability bounds of a bit- interleaved space-time trellis coding (BISTTC) scheme, which concatenates bit- interleaved coded modulation (BICM) with a space-time trellis code (STTC). We focus on general block-fading channels, wherein each data packet or frame spans a number of independent fading blocks. BICM applied to such channel environments can effectively exploit both ...


On the error probability of convolutionally encoded spread spectrum BPSK in frequency selective Rayleigh fading

Proceedings. 1998 IEEE International Symposium on Information Theory (Cat. No.98CH36252), 1998

An exact expression for the pairwise error probability of convolutionally encoded spread spectrum BPSK with ideal interleaving and RAKE reception over frequency selective Rayleigh fading channels is presented. This expression is used to find a tight upper bound on the bit error probability using the transfer function approach.


Distance spectra of space-time trellis coded modulations

Proceedings. 2001 IEEE International Symposium on Information Theory (IEEE Cat. No.01CH37252), 2001

The expurgated union bounds on frame and bit error probabilities of a space- time trellis coded modulation (ST-TCM) in quasi-static fading channel are derived. These bounds are computed using the truncated "distance spectrum" of the code. A method to compute the truncated spectrum is proposed.


More Xplore Articles

Educational Resources on Error probability

Back to Top

IEEE.tv Videos

An Energy-Efficient Mixed-Signal Neuron for Inherently Error Resilient Neuromorphic Systems - IEEE Rebooting Computing 2017
Micro-Apps 2013: Understanding Probability of Intercept for Intermittent Signals
Introduction: Emerging Technology for Probabilistic Inference - Pierre Bessiere at INC 2019
Mario Milicevic - IEEE Theodore W. Hissey Outstanding Young Professional Award, 2019 IEEE Honors Ceremony
The Prospects for Scalable Quantum Computing with Superconducting Circuits - Applied Superconductivity Conference 2018
Robust Qubit Manipulation with Integrated Circuits: Optical Computing - Pérola Milman at INC 2019
Demonstrating Scalable Benchmarking for Quantum Computing - Timothy Proctor - ICRC San Mateo, 2019
Quantum Computation - ASC-2014 Plenary series - 4 of 13 - Tuesday 2014/8/12
Micro-Apps 2013: Frequency Planning Synthesis for Wireless Systems Design
Hybrid Computing for Near-term Quantum Computing Systems - Alex McCaskey - ICRC 2018
A Wideband SiGe BiCMOS Transceiver Chip-Set for High-Performance Microwave Links in the 5.643.5GHz Range: RFIC Industry Showcase 2017
Micro-Apps 2013: Environment Simulation for Counter-IED Jammer Test
IEEE Themes - Distance-Dependent Kronecker Graphs For Modeling Social Networks
Intelligent Systems for Deep Space Exploration: Solutions and Challenges - Roberto Furfaro
Network Analysis: RF Boot Camp
Electronic Systems for Quantum Computation - David DiVincenzo: 2016 International Conference on Rebooting Computing
The Josephson Effect: Brian Josephson Debates John Bardeen
Envelope Time-Domain Characterizations to Assess In-Band Linearity Performances of Pre-Matched MASMOS Power Amplifier: RFIC Interactive Forum 2017
Quadrotor Trajectory Tracking with L1 Optimal control
Validating Cyber-Physical Energy Systems, Part 1: IECON 2018

IEEE-USA E-Books

  • Comment on "Pairwise error probability of space-time codes in frequency selective Rician channels"

    A simpler explicit expression is derived for pairwise error probability (PEP) considered by Dharmawansa and Rajatheva (IEEE Commun. Lett., vol.9, p.894-6, October 2005). The computational efficiency of this expression is established.

  • Performance of Joint Equalization and Trellis-Coded on Multipath Fading Channels

    In this paper an upper bound on bit error probability of a maximum-likelihood sequence estimation (MLSE) equalizer for trellis-coded modulation (TCM) systems with diversity reception is derived for multipath Rayleigh fading channels. Analytical and simulation results show that our bound is good for all cases considered especially when diversity reception is used.

  • Error Probability Bounds for Bit-Interleaved Space–Time Trellis Coding Over Block-Fading Channels

    In this correspondence, we investigate the error probability bounds of a bit- interleaved space-time trellis coding (BISTTC) scheme, which concatenates bit- interleaved coded modulation (BICM) with a space-time trellis code (STTC). We focus on general block-fading channels, wherein each data packet or frame spans a number of independent fading blocks. BICM applied to such channel environments can effectively exploit both time and frequency selectivity, while a STTC maximizes the spacial diversity order. The exact pairwise error probability (PEP) and weight enumeration function (WEF) of BISTTC are used to evaluate the error bound. Due to the concatenation of an outer error correction code (ECC) and a STTC, the overall WEF of BISTTC is obtained by combining the WEF of the outer code with that of the STTC through an uniform interleaver. The main challenge here is to compute the WEF of a STTC for block-fading channels with reasonable complexity. We rely on constructing a composite state transition matrix based on a number of single-step virtual trellises, each corresponding to an independent fading block within a frame. We discuss how this approach reduces storage and computational requirements in the bound analysis, compared to the existing method of obtaining the state transition matrix through accumulation of single-step transition matrices. The derived bound is applicable to both spatially uncorrelated and correlated channels as well as to both flat and frequency-selective block-fading channels. The bound is shown to provide a reasonably close estimate of the simulated performance based on the turbo equalizer-like iterative processing of soft information between the STTC decoder and the ECC decoder.

  • On the error probability of convolutionally encoded spread spectrum BPSK in frequency selective Rayleigh fading

    An exact expression for the pairwise error probability of convolutionally encoded spread spectrum BPSK with ideal interleaving and RAKE reception over frequency selective Rayleigh fading channels is presented. This expression is used to find a tight upper bound on the bit error probability using the transfer function approach.

  • Distance spectra of space-time trellis coded modulations

    The expurgated union bounds on frame and bit error probabilities of a space- time trellis coded modulation (ST-TCM) in quasi-static fading channel are derived. These bounds are computed using the truncated "distance spectrum" of the code. A method to compute the truncated spectrum is proposed.

  • Performance of high-diversity multidimensional constellations

    Following the approach introduced by Cavers and Ho (1992), the performance of component-interleaved multidimensional constellations over the Rayleigh fading channel is evaluated analytically. The error probabilities are approximated by the union bound using an exact expression of the pairwise error probability. Simulation results show that this bound can be used effectively as a design criterion for the selection of high-diversity multidimensional constellation over the Rayleigh fading channel.

  • Performance of coded modulation schemes using multiple transmit antennas

    In this paper, we evaluate the performance of coding schemes which utilize multiple transmit antennas but just one receive antenna. The pairwise error probability between sets of coded sequences in the presence of non-dispersive Rayleigh fading is evaluated. Both an exact expression and a Chernoff bound are evaluated. The Chernoff bound provides more insight into the properties of the coded sequences needed for good performance. The analytical performance is compared to simulation results.

  • Expurgating the union bound to error probability: a generalization of the Verdu-Shields theorem

    The union bound is known as the most useful tool for the computation of error probability in digital communication schemes (both coded and non-coded). Given a signal set or codebook C={x/sub 0/,x/sub 1/,...,x/sub M-1/}, the conditional error probability P(e|x/sub 0/) is upper bounded by a sum of pairwise error probabilities (PEP). Here we consider the additive white Gaussian channel, where C is a discrete and finite set of points in the N-dimensional real Euclidean space. In this case, the PEPs are the probabilities of the noise taking a signal on the other side of the hyperplane bounding the decision regions of x/sub 0/ and x/sub i/. An important step toward the reduction of the union bound to its minimal form was made by Verdu, who derived a theorem, commonly referred to as the Verdu-Shields theorem showing how terms can be removed from the upper bound to error probability in the case of binary antipodal transmission over the Gaussian channel with intersymbol interference. In this paper we derive a generalization of the Verdu-Shields theorem which provides a sufficient condition for expurgating a given error sequence x/sub k/ from the union bound.

  • Multiple-symbol trellis-coded modulation applied to noncoherent continuous-phase frequency shift keying

    This paper considers a maximum-likelihood (ML) noncoherent detection scheme for multiple full response continuous-phase frequency shift keying (CPFSK) waveforms and introduces a trellis-coded modulation (TCM) scheme for this noncoherent modulation. By utilizing a Gaussian approximation for Rician random variables, we express the pairwise error probability as a function of the equivalent normalized squared distance (ENSD). ENSD plays the same role as normalized squared Euclidean distance when evaluating error probability performance for coherent detection. We derive an analytical approximation on the bit-error probability by employing ENSD for both the coded system and the uncoded system. For the uncoded system we show that the bit-error probability of noncoherent detection approaches that of coherent symbol-by-symbol detection in the limit as the multiplicity of the symbol goes to infinity for large signal-to-noise ratio (SNR), We determine specific optimal trellis encoders for binary and 4-ary CPFSK with modulation index 1/2 and 1/4, respectively, by application of Ungerboeck's (1982) set partitioning approach.

  • Error probability Analysis in Reduced State Tcm

    None



Standards related to Error probability

Back to Top

No standards are currently tagged "Error probability"


Jobs related to Error probability

Back to Top