Conferences related to Electrical fault detection

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2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2020 59th IEEE Conference on Decision and Control (CDC)

The CDC is the premier conference dedicated to the advancement of the theory and practice of systems and control. The CDC annually brings together an international community of researchers and practitioners in the field of automatic control to discuss new research results, perspectives on future developments, and innovative applications relevant to decision making, automatic control, and related areas.


2020 IEEE IAS Petroleum and Chemical Industry Committee (PCIC)

The PCIC provides an international forum for the exchange of electrical applications technology related to the petroleum and chemical industry. The PCIC annual conference is rotated across North American locations of industry strength to attract national and international participation. User, manufacturer, consultant, and contractor participation is encouraged to strengthen the conference technical base. Success of the PCIC is built upon high quality papers, individual recognition, valued standards activities, mentoring, tutorials, networking and conference sites that appeal to all.


2020 IEEE Industry Applications Society Annual Meeting

The Annual Meeting is a gathering of experts who work and conduct research in the industrial applications of electrical systems.


2020 IEEE International Conference on Industrial Technology (ICIT)

ICIT focuses on industrial and manufacturing applications of electronics, controls, communications, instrumentation, and computational intelligence.


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Periodicals related to Electrical fault detection

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Communications Letters, IEEE

Covers topics in the scope of IEEE Transactions on Communications but in the form of very brief publication (maximum of 6column lengths, including all diagrams and tables.)


Communications Magazine, IEEE

IEEE Communications Magazine was the number three most-cited journal in telecommunications and the number eighteen cited journal in electrical and electronics engineering in 2004, according to the annual Journal Citation Report (2004 edition) published by the Institute for Scientific Information. Read more at http://www.ieee.org/products/citations.html. This magazine covers all areas of communications such as lightwave telecommunications, high-speed data communications, personal communications ...


Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Methods, algorithms, and human-machine interfaces for physical and logical design, including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, and documentation of integrated-circuit and systems designs of all complexities. Practical applications of aids resulting in producible analog, digital, optical, or microwave integrated circuits are emphasized.


Computers, IEEE Transactions on

Design and analysis of algorithms, computer systems, and digital networks; methods for specifying, measuring, and modeling the performance of computers and computer systems; design of computer components, such as arithmetic units, data storage devices, and interface devices; design of reliable and testable digital devices and systems; computer networks and distributed computer systems; new computer organizations and architectures; applications of VLSI ...


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Most published Xplore authors for Electrical fault detection

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Xplore Articles related to Electrical fault detection

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High impedance fault detection utilizing incremental varianc

IEEE Power Engineering Review, 1991

None


Biomedical microprocessor with analog I/O

1981 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1981

Two sense amplifiers capable of sensing 0.5mV haversine waves and two output amplifiers with 1-12mA outputs, combined with a 4b microprocessor on a CMOS 35,600 square mil chip, to produce a single chip, implantable pacer, with eight programmable modes, will be reported.


An Investigation into a Method of Detecting the Fault Induced High Frequency Voltage Signals of EHV Transmission lines for Protection Applications

IEEE Power Engineering Review, 1991

None


Development of a current detection type cable fault locater

IEEE Power Engineering Review, 1991

None


On-chip monitors for system fault isolation

1978 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1978

On-chip circuits providing automatic, remote, and complete monitoring of all interconnects exterior to the die will be covered in this report. Proper monitor/logic sensitivity ratio assures detection of incipient faults and simplifies device testing, monitoring of on-chip functionality and final fault isolation.


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Educational Resources on Electrical fault detection

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IEEE.tv Videos

Multiple Sensor Fault Detection and Isolation in Complex Distributed Dynamical Systems
APEC 2012 - Dr. Babak Fahimi Plenary
Fragility of Interconnected Cyber-Physical Systems - Marios M. Polycarpou - WCCI 2016
Multi-Function VCO Chip for Materials Sensing and More - Jens Reinstaedt - RFIC Showcase 2018
Quantum Computation - ASC-2014 Plenary series - 4 of 13 - Tuesday 2014/8/12
New Paradigm for Fault-Tolerant Computing with Interconnect Crosstalks - Naveen Kumar Macha - ICRC 2018
IMS 2011-100 Years of Superconductivity (1911-2011) - Existing and Emerging RF Applications of Superconductivity
Geoffrey Hinton receives the IEEE/RSE James Clerk Maxwell Medal - Honors Ceremony 2016
Lighting the Way: Optical Sensors in the Life Sciences
An FPGA-Quantum Annealer Hybrid System for Wide-Band RF Detection - IEEE Rebooting Computing 2017
IEEE, IEEE-HKN and Public Service
Interview with Brian Randell
High-Resolution Earthquake Simulations
HKN Member Changzhi Li Receives an Award at the 2014 EAB Award Ceremony
Light Our Future - IEEE Photonics Society
ISEC 2013 Special Gordon Donaldson Session: Remembering Gordon Donaldson - 5 of 7 - SQUID Instrumentation for Early Cancer Diagnostics
Innovative Transmission Line Measurement and Characterization Reduce Time to Repair for Complex Communication Systems: MicroApps 2015 - Keysight Technologies
Implantable, Insertable and Wearable Micro-optical Devices for Early Detection of Cancer - Plenary Speaker, Christopher Contag - IPC 2018
Critical use cases for video capturing systems in autonomous driving applications
Interview with Brian Randell and Michael Woodger

IEEE-USA E-Books

  • High impedance fault detection utilizing incremental varianc

    None

  • Biomedical microprocessor with analog I/O

    Two sense amplifiers capable of sensing 0.5mV haversine waves and two output amplifiers with 1-12mA outputs, combined with a 4b microprocessor on a CMOS 35,600 square mil chip, to produce a single chip, implantable pacer, with eight programmable modes, will be reported.

  • An Investigation into a Method of Detecting the Fault Induced High Frequency Voltage Signals of EHV Transmission lines for Protection Applications

    None

  • Development of a current detection type cable fault locater

    None

  • On-chip monitors for system fault isolation

    On-chip circuits providing automatic, remote, and complete monitoring of all interconnects exterior to the die will be covered in this report. Proper monitor/logic sensitivity ratio assures detection of incipient faults and simplifies device testing, monitoring of on-chip functionality and final fault isolation.

  • A study on the utility of using expected quality level as a design for testability metric

    This paper develops a Physical Design for Test (PDFT) metric that is directly related to the expected quality level (QL) contribution of a cell to a circuit, and it details experimental results showing the usefulness of this metric in predicting the quality level contribution of a cell to circuits that have yet to be designed. The PDFT metric shows what QL increase can be expected for the circuit by changing the physical design of a component of the circuit.

  • Fault detection and diagnosis of k-UCP circuits under totally observable condition

    A method is presented for detecting stuck-open faults, as well as stuck-at faults, in CMOS combinational circuits by short test sequences of fixed length. The discussion is based on the assumption that outputs of all the gates in a circuit are observable. This assumption will become reasonable when a new testability solution called CrossCheck, or a new test equipment, called on electron-beam tester, is used. The concept of k-UCP (uniform, having a (k+1)-Color solution and compatible polarity) circuits is introduced, and it is shown that 2(k+1) kinds of test sequences of length k(k+1)+1 are sufficient to detect stuck-open faults, as well as stuck-at faults in a k-UCP circuit. Furthermore, it is shown that single stuck-open faults can be located by using a fault diagnosis table. A method which can speed up the generation of a fault diagnosis table is also proposed.<<ETX>>

  • Efficient Technique to Reduce Gate Evaluations and Speed up Fault Simulation

    None

  • Fault detection and automated fault diagnosis for embedded integrated electrical passives

    In this paper, we propose a novel test technique for fault detection and automated fault diagnosis using pole/zero analysis of embedded integrated passive. For pole/zero analysis, an ensemble of circuits obtained by perturbing the circuit under test parameters using their known statistical distributions is generated. The poles and zeros of every circuit in this ensemble are extracted. From knowledge of the passive circuit specifications, pass and fail regions for the critical poles and zeros are computed in the real-imaginary plane. The proposed test technique uses a region-matching algorithm to detect faults and perform automated diagnosis of catastrophic and parametric faults using frequency domain 2-port measurements.

  • A new cross-differential protection scheme for parallel transmission lines including UPFC

    This paper proposes a new cross-differential protection scheme for a parallel transmission system in the presence of a unified power-flow controller (UPFC) in one line. A cumulative summation technique using three-phase current signals at the sending end is used for fault detection. The faulty phases are then identified by computing the spectral energies of the phasecurrents. The spectral energy of the phase currents is computed by applying a omputationally fast efficient powerful tool known as first Discrete S-Transform (FDST), suitable for analyzing power system signals. The proposed scheme has been extensively tested on different fault conditions with a wide variation in operating parameters. The test results indicate that it can accurately detect and classify the faults with clear discrimination between internal and external faults on a transmission line with a response time of a maximum one cycle from fault inception.



Standards related to Electrical fault detection

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Jobs related to Electrical fault detection

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