Debugging

Debugging is a methodical process of finding and reducing the number of bugs, or defects, in a computer program or a piece of electronic hardware, thus making it behave as expected. (Wikipedia.org)






Conferences related to Debugging

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2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE)

ICSE is the premier forum for researchers to present and discuss the most recent innovations,trends, outcomes, experiences, and challenges in the field of software engineering. The scopeis broad and includes all original and unpublished results of empirical, conceptual, experimental,and theoretical software engineering research.


2020 IEEE Symposium on Security and Privacy (SP)

Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2005 IEEE Symposium on Security and Privacy (SRSP)

  • 2006 IEEE Symposium on Security and Privacy (SP)

  • 2007 IEEE Symposium on Security and Privacy (SP)

    Research contributions in any aspect of computer security and electronic privacy including advances in the theory, design, implementation, analysis of empirical evaluation of secure systems.

  • 2008 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2009 IEEE Symposium on Security and Privacy (SP)

    The IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2010 IEEE Symposium on Security and Privacy (SP)

    S&P is interested in all aspects of computer security and privacy.

  • 2011 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2012 IEEE Symposium on Security and Privacy (SP) Conference dates subject to change

    IEEE Symposium on Security and Privacy has been the premier forum for computer security research, presenting the latest developments and bringing together researchers and practitioners.

  • 2013 IEEE Symposium on Security and Privacy (SP) Conference dates subject to change

    IEEE Symposium on Security and Privacy has been the premier forum for computer security research, presenting the latest developments and bringing together researchers and practitioners.

  • 2014 IEEE Symposium on Security and Privacy (SP)

    IEEE Symposium on Security and Privacy has been the premier forum for computer security research, presenting the latest developments and bringing together researchers and practitioners.

  • 2015 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for the presentation of developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.Papers offer novel research contributions in any aspect of computer security or electronic privacy. Papers may represent advances in the theory, design, implementation, analysis, or empirical evaluation of secure systems, either for general use or for specific application domains.

  • 2016 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for the presentation of developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.Papers offer novel research contributions in any aspect of computer security or electronic privacy. Papers may represent advances in the theory, design, implementation, analysis, or empirical evaluation of secure systems, either for general use or for specific application domains.

  • 2017 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for the presentation of developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.Papers offer novel research contributions in any aspect of computer security or electronic privacy. Papers may represent advances in the theory, design, implementation, analysis, or empirical evaluation of secure systems, either for general use or for specific application domains.

  • 2018 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2019 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2021 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.


2020 IEEE Applied Power Electronics Conference and Exposition (APEC)

APEC focuses on the practical and applied aspects of the power electronics business. Not just a power designer’s conference, APEC has something of interest for anyone involved in power electronics including:- Equipment OEMs that use power supplies and converters in their equipment- Designers of power supplies, dc-dc converters, motor drives, uninterruptable power supplies, inverters and any other power electronic circuits, equipments and systems- Manufacturers and suppliers of components and assemblies used in power electronics- Manufacturing, quality and test engineers involved with power electronics equipment- Marketing, sales and anyone involved in the business of power electronic- Compliance engineers testing and qualifying power electronics equipment or equipment that uses power electronics


2020 IEEE International Symposium on Circuits and Systems (ISCAS)

The International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems (CAS) Society and the world’s premier networking and exchange forum for researchers in the highly active fields of theory, design and implementation of circuits and systems. ISCAS2020 focuses on the deployment of CASS knowledge towards Society Grand Challenges and highlights the strong foundation in methodology and the integration of multidisciplinary approaches which are the distinctive features of CAS contributions. The worldwide CAS community is exploiting such CASS knowledge to change the way in which devices and circuits are understood, optimized, and leveraged in a variety of systems and applications.


2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2019 56th ACM/ESDA/IEEE Design Automation Conference (DAC)

    EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.



Periodicals related to Debugging

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Communications Magazine, IEEE

IEEE Communications Magazine was the number three most-cited journal in telecommunications and the number eighteen cited journal in electrical and electronics engineering in 2004, according to the annual Journal Citation Report (2004 edition) published by the Institute for Scientific Information. Read more at http://www.ieee.org/products/citations.html. This magazine covers all areas of communications such as lightwave telecommunications, high-speed data communications, personal communications ...


Computer

Computer, the flagship publication of the IEEE Computer Society, publishes peer-reviewed technical content that covers all aspects of computer science, computer engineering, technology, and applications. Computer is a resource that practitioners, researchers, and managers can rely on to provide timely information about current research developments, trends, best practices, and changes in the profession.


Computer Graphics and Applications, IEEE

IEEE Computer Graphics and Applications (CG&A) bridges the theory and practice of computer graphics. From specific algorithms to full system implementations, CG&A offers a strong combination of peer-reviewed feature articles and refereed departments, including news and product announcements. Special Applications sidebars relate research stories to commercial development. Cover stories focus on creative applications of the technology by an artist or ...


Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Methods, algorithms, and human-machine interfaces for physical and logical design, including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, and documentation of integrated-circuit and systems designs of all complexities. Practical applications of aids resulting in producible analog, digital, optical, or microwave integrated circuits are emphasized.


Computers, IEEE Transactions on

Design and analysis of algorithms, computer systems, and digital networks; methods for specifying, measuring, and modeling the performance of computers and computer systems; design of computer components, such as arithmetic units, data storage devices, and interface devices; design of reliable and testable digital devices and systems; computer networks and distributed computer systems; new computer organizations and architectures; applications of VLSI ...



Most published Xplore authors for Debugging

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Xplore Articles related to Debugging

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Enlightened Debugging

2018 IEEE/ACM 40th International Conference on Software Engineering (ICSE), 2018

Numerous automated techniques have been proposed to reduce the cost of software debugging, a notoriously time-consuming and human-intensive activity. Among these techniques, Statistical Fault Localization (SFL) is particularly popular. One issue with SFL is that it is based on strong, often unrealistic assumptions on how developers behave when debugging. To address this problem, we propose Enlighten, an interactive, feedback-driven fault ...


Automated Debugging: Are We There Yet?

2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops, 2011

Summary form only given. Software debugging is a notoriously difficult, extremely time consuming, and human-intensive activity. For this reason, researchers have invested a great deal of effort in developing automated techniques and tools for supporting various debugging tasks. Although potentially useful, most of these techniques have yet to fully demonstrate their practical effectiveness. Moreover, many current debugging approaches suffer from ...


Residential Lighting System

2018 IEEE 3rd Advanced Information Technology, Electronic and Automation Control Conference (IAEAC), 2018

This paper introduces a general residential lighting system of various components. Mainly have a machine of the upper part and lower part and hardware part. PC using kingview 6.55 composition control and monitor screen, as well as complete and the next bit machine communication function. Under a machine adopts PLC control, PLC from PC to accept the command output. Hardware ...


Isolating and Understanding Program Errors Using Probabilistic Dispute Model

2013 IEEE 37th Annual Computer Software and Applications Conference, 2013

Automated software debugging can have a signifi-cant impact on the cost and quality of software development and maintenance. In recent years, researchers have invested a considerable amount of effort in developing automated techniques, and have demonstrated their effectiveness in helping developers in certain debugging tasks by pinpointing faulty statements. But there is still a gap between examining a faulty statement ...


Fault Localization Guided Execution Comparison for Failure Comprehension

2016 IEEE International Conference on Software Quality, Reliability and Security Companion (QRS-C), 2016

Fault Localization has been the research focus in past decades. However, recent studies have shown that automated fault localization is not fit for realistic software debugging progresses, thus an attractive idea is how to employ the results of fault localization techniques to assist software debugging. During software debugging processes, programmers always need to re- execute several test cases after confirming ...



Educational Resources on Debugging

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IEEE.tv Videos

No IEEE.tv Videos are currently tagged "Debugging"

IEEE-USA E-Books

  • Enlightened Debugging

    Numerous automated techniques have been proposed to reduce the cost of software debugging, a notoriously time-consuming and human-intensive activity. Among these techniques, Statistical Fault Localization (SFL) is particularly popular. One issue with SFL is that it is based on strong, often unrealistic assumptions on how developers behave when debugging. To address this problem, we propose Enlighten, an interactive, feedback-driven fault localization technique. Given a failing test, Enlighten (1) leverages SFL and dynamic dependence analysis to identify suspicious method invocations and corresponding data values, (2) presents the developer with a query about the most suspicious invocation expressed in terms of inputs and outputs, (3) encodes the developer feedback on the correctness of individual data values as extra program specifications, and (4) repeats these steps until the fault is found. We evaluated Enlighten in two ways. First, we applied Enlighten to 1,807 real and seeded faults in 3 open source programs using an automated oracle as a simulated user; for over 96% of these faults, Enlighten required less than 10 interactions with the simulated user to localize the fault, and a sensitivity analysis showed that the results were robust to erroneous responses. Second, we performed an actual user study on 4 faults with 24 participants and found that participants who used Enlighten performed significantly better than those not using our tool, in terms of both number of faults localized and time needed to localize the faults.

  • Automated Debugging: Are We There Yet?

    Summary form only given. Software debugging is a notoriously difficult, extremely time consuming, and human-intensive activity. For this reason, researchers have invested a great deal of effort in developing automated techniques and tools for supporting various debugging tasks. Although potentially useful, most of these techniques have yet to fully demonstrate their practical effectiveness. Moreover, many current debugging approaches suffer from some common limitations. In particular, many techniques rely on a set of strong assumptions on how developers behave when debugging, fail to leverage the rich source of information represented by the user population, and focus mainly on trying to reduce the number of statements to examine, mostly ignoring the importance of identifying relevant inputs. This talk will provide an overview of the state of the art in the area of software debugging, discuss strengths and weaknesses of the main existing techniques, present a set of open challenges in the area of debugging, and sketch future research directions that may help address these challenges.

  • Residential Lighting System

    This paper introduces a general residential lighting system of various components. Mainly have a machine of the upper part and lower part and hardware part. PC using kingview 6.55 composition control and monitor screen, as well as complete and the next bit machine communication function. Under a machine adopts PLC control, PLC from PC to accept the command output. Hardware part adopted by controlling thyristor conduction cycle method of the light bulb brightness control circuit. The upper computer part includes the control and monitoring screen of the lower computer, and the report interface of various data can control and monitor the lighting switches in the residential area in real time. Using PLC communication and output safe and reliable, the lower computer ensures the reliability of the system to a certain extent. The part of the hardware circuit adopts the mechanism of controlling the brightness through the photoresistor, so that the illumination brightness can change with the change of the natural light intensity, which plays the role of energy saving and brightness adjustment.

  • Isolating and Understanding Program Errors Using Probabilistic Dispute Model

    Automated software debugging can have a signifi-cant impact on the cost and quality of software development and maintenance. In recent years, researchers have invested a considerable amount of effort in developing automated techniques, and have demonstrated their effectiveness in helping developers in certain debugging tasks by pinpointing faulty statements. But there is still a gap between examining a faulty statement and understanding root causes of the cor-responding bug. As a step in this direction, we believe good developers have defensive programming in minds and software debugging is a process in search of arguments about why a statement is faulty. Therefore, a fault localization problem is rephrased as a dispute game between statements involved in successful runs and failing runs. A statement is OK if it can always provide arguments against other's blames, whereas a less defensive statement is thought to be faulty. In doing so, we propose a probabilistic dispute graph which is built upon dynamic dependencies between statements and statistics of program runs. Using such a graph, we put executed statements in dispute, compute acceptable statements, and thus figure out faulty statements if they have not strong arguments about their correctness. For empirical purpose, we carry out experiments on the well-known Siemens benchmark, and conclude that our approach not only casts new light on the causes of bugs in various cases, but also is statistically more effective in fault localization than competitors like Tarantula, SOBER, CT and PPDG.

  • Fault Localization Guided Execution Comparison for Failure Comprehension

    Fault Localization has been the research focus in past decades. However, recent studies have shown that automated fault localization is not fit for realistic software debugging progresses, thus an attractive idea is how to employ the results of fault localization techniques to assist software debugging. During software debugging processes, programmers always need to re- execute several test cases after confirming the fault and then diagnose the fault by means of analyzing and comparing the context. Therefore, the crux of fault diagnosis is how to select test cases. In other words, how to choose test cases that could reveal the fault from a big test suite, which is more helpful for the programmers to understand and fix the fault more quickly and effectively? In this paper, we intend to integrate the result of fault localization to characterize the ability of revealing fault of test cases and provide two test case selection strategies, which will assist the programmers with understanding the fault more pointedly.

  • A microprocessor development system for ROV CUDA

    A Microprocessor Development System for the ROV CUDA (Computerized Underwater Data Acquisition) system is described. The Development System is an integrated collection of hardware and software components used to develop, test, and debug the CUDA WE 32100 microprocessor control system.

  • In-system debug support for a processor core

    None

  • Disqover: Debugging via code sequence covers

    Automated model-based test generation has seen an undeniable trend towards obtaining large numbers of test cases. However, the full benefits of this trend have not yet percolated to downstream activities, such as debugging. We present Disqover for automated software debugging based on code sequence covers that leverages execution traces, or alternatively, sequence covers of large numbers of failing test cases to quickly identify causes of test failures, thereby aiding debugging. We develop a new algorithm that efficiently extracts commonalities between sequence covers in the form of ordered subsequences and values of variables contained in these subsequences that contribute to each failure. The results of our experimental evaluation suggest that users of Disqover need only 30% of the time needed to identify faults compared to the baseline in a user study. Furthermore, we show that the number of inspected statements using our approach is smaller than that of other state-of-the-art systems by multiple orders of magnitude. Additionally, we show that increasing the number and diversity of test cases improves our results by further decreasing the length of output subsequences to be examined.

  • Configurable POS and UTOPIA Level - II interface

    None

  • Hardware-Software Co-Design and ESDA

    Provides an abstract of the tutorial presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings.



Standards related to Debugging

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No standards are currently tagged "Debugging"