Conferences related to Cutting tools

Back to Top

2021 IEEE Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology


2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2019 56th ACM/ESDA/IEEE Design Automation Conference (DAC)

    EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)


2020 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

All topics related to engineering and technology management, including applicable analytical methods and economical/social/human issues to be considered in making engineering decisions.


2020 IEEE International Conference on Industrial Technology (ICIT)

ICIT focuses on industrial and manufacturing applications of electronics, controls, communications, instrumentation, and computational intelligence.


2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science andtechnology research development and applications. The list of program topics includes but isnot limited to: Measurement Science & Education, Measurement Systems, Measurement DataAcquisition, Measurements of Physical Quantities, and Measurement Applications.


More Conferences

Periodicals related to Cutting tools

Back to Top

Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Automation Science and Engineering, IEEE Transactions on

The IEEE Transactions on Automation Sciences and Engineering (T-ASE) publishes fundamental papers on Automation, emphasizing scientific results that advance efficiency, quality, productivity, and reliability. T-ASE encourages interdisciplinary approaches from computer science, control systems, electrical engineering, mathematics, mechanical engineering, operations research, and other fields. We welcome results relevant to industries such as agriculture, biotechnology, healthcare, home automation, maintenance, manufacturing, pharmaceuticals, retail, ...


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Broadcasting, IEEE Transactions on

Broadcast technology, including devices, equipment, techniques, and systems related to broadcast technology, including the production, distribution, transmission, and propagation aspects.


Circuits and Systems for Video Technology, IEEE Transactions on

Video A/D and D/A, display technology, image analysis and processing, video signal characterization and representation, video compression techniques and signal processing, multidimensional filters and transforms, analog video signal processing, neural networks for video applications, nonlinear video signal processing, video storage and retrieval, computer vision, packet video, high-speed real-time circuits, VLSI architecture and implementation for video technology, multiprocessor systems--hardware and software-- ...


More Periodicals

Most published Xplore authors for Cutting tools

Back to Top

Xplore Articles related to Cutting tools

Back to Top

Analysis of the Relationship between the Wear and the Thermoelectric Potential of YT30 Cemented Carbide

2010 International Conference on Measuring Technology and Mechatronics Automation, 2010

The thermoelectric potential is the one of the major physical properties of material, and it is easy to be measured without damaging the material. The analysis and the test about the relationship between the wear and the thermoelectric potential of YT30 cemented carbide inserts have been finished in this paper. The influence rules and the influence extent of thermoelectric potential ...


Wear condition monitoring of cuting tool using image processing

Proceedings of the IEEE 13th Signal Processing and Communications Applications Conference, 2005., 2005

None


Recognizing a chip on edge of a cutting tool by Hough transform

2009 ICCAS-SICE, 2009

Conventionally, finished cutting tools are checked by human eyes. Most of the defects are minute and it is needed to be checked with a microscope. Therefore, it is a very labourous work. To lighten human load, the automatic testing system is required. The aim of this research is the development of a recognizing system for a chip on the edge ...


Concurrent tolerancing based on process factors and signal-noise ratio quality loss

2006 7th International Conference on Computer-Aided Industrial Design and Conceptual Design, 2006

Modern manufacturing industries require balancing products' tolerances and manufacturing cost. In terms of different given process planning, there are always exist different process factors which correspond to different manufacturing cost. A number of papers have been published in the general area of tolerance models, but little work has been carried out for the research of process factors in tolerance allocation. ...


The design, development and use of pipe cutting tools for remote handling in JET

[Proceedings] The 14th IEEE/NPSS Symposium Fusion Engineering, 1991

The authors report on remote handling tools which have been specifically designed to meet requirements for pipe cutting at JET (Joint European Torus). The principal requirements were the quality of cut necessary for rewelding, effective swarf removal, and compactness for remote handling. The designs of tools had to be compatible with the severe access restrictions imposed by the JET machine. ...


More Xplore Articles

Educational Resources on Cutting tools

Back to Top

IEEE-USA E-Books

  • Analysis of the Relationship between the Wear and the Thermoelectric Potential of YT30 Cemented Carbide

    The thermoelectric potential is the one of the major physical properties of material, and it is easy to be measured without damaging the material. The analysis and the test about the relationship between the wear and the thermoelectric potential of YT30 cemented carbide inserts have been finished in this paper. The influence rules and the influence extent of thermoelectric potential to the wear have been emphasized. Then the new method of forecasting the life of cemented carbide has been also discussed.

  • Wear condition monitoring of cuting tool using image processing

    None

  • Recognizing a chip on edge of a cutting tool by Hough transform

    Conventionally, finished cutting tools are checked by human eyes. Most of the defects are minute and it is needed to be checked with a microscope. Therefore, it is a very labourous work. To lighten human load, the automatic testing system is required. The aim of this research is the development of a recognizing system for a chip on the edge by using image processing. As the preprocessing methods, a color image of the edge is analyzed through grayscaling, binarization, extraction of the outline by Prewitt-filter and Hough transformation. These procedures are developed and realized in the developed testing system to make the edge detection.To ascertain the effect, estimation of the amount of a chip on the edge is made not only the judgement if it has a chip or not. And using neural network, an abnormal chip, a broken edge and a surface defect are recognized.

  • Concurrent tolerancing based on process factors and signal-noise ratio quality loss

    Modern manufacturing industries require balancing products' tolerances and manufacturing cost. In terms of different given process planning, there are always exist different process factors which correspond to different manufacturing cost. A number of papers have been published in the general area of tolerance models, but little work has been carried out for the research of process factors in tolerance allocation. In this paper, the relationships between process factors and manufacturing cost are investigated. In addition, signal-noise ratio (SNR) is employed to scale the quality loss of each machining process. Concurrent tolerancing optimization model based on process factors and SNR quality loss is then proposed. A practical example is also introduced to validate the presented method

  • The design, development and use of pipe cutting tools for remote handling in JET

    The authors report on remote handling tools which have been specifically designed to meet requirements for pipe cutting at JET (Joint European Torus). The principal requirements were the quality of cut necessary for rewelding, effective swarf removal, and compactness for remote handling. The designs of tools had to be compatible with the severe access restrictions imposed by the JET machine. The processes used by the tools are sawing from the inside and outside of pipes, and orbital lathe for larger pipes. Special features were created on the pipes to facilitate tool location. The blade and toolbit designs have evolved to optimize cutting forces and tool durability. Satisfactory reliability has been achieved by performing 200 h of cutting during the two year period of development. Subsequently, over 100 'hands-on' cutting operations have been made on the JET machine since 1988 and a further 150 cuts are planned for 1992. Using a programmable controller the feed rate can be changed throughout the cutting operation into a predetermined way, thereby optimizing the tools' efficiency.<<ETX>>

  • Time-Frequency Analysis for Cutting Tools Wear Characteristics

    To monitor the tool wear states in drilling, a new method is proposed to obtain the signal characteristics based on the wavelet transformation. The method can reflect the tool wear states by using discrete dyadic wavelet transform. The cutting force signals of cutting process are decomposed; and the values of the decomposed signals in different scales are taken as the feature vectors. The pattern identification is used to monitor the tool wear states in real time. The method can identify the tool wear states correctly by choosing the suitable standard samples. The result shows that the proposed method is suitable for real-time implementation in manufacturing application, and has good identification precision and high efficiency

  • Study on the contact and cutting edge inclination in course of three-dimensional cutting simulation

    Finite element method (FEM) has become an effective means on metal cutting mechanism research, in recent years. But the simplification of the cutting tool and work piece model is immaturity, most FEM cutting model is confined to two-dimensional sharp. Based on simplification of cutting process, the key technology of contact setting for cutting tool and work piece with general finite element analysis software ABAQUS was discussed in the present paper, especially the contact setting of internal elements after the failure of the cut element was emphasized. Through the setting of INP file, reasonable contact setting was achieved finally, meanwhile, through simulating the impact of cutting edge inclination on chip formation and cutting force, the rationality of three-dimensional finite element cutting model was verified. The results from using the model to simulate the impact of cutting edge inclination on chip formation and cutting force was in compliance with the cutting theory and realistic cutting condition. Therefore, the model's rationality was verified.

  • Vibration Features in Hard Cutting of Harden Steel Workpiece

    This article sets out the results of researches of vibration signals accompanying the process of ceramic cutters cutting in hardened surface. The paper reviews the effect of tool degradation and self-oscillations on stability of cutting process. The text examines the outcomes of experiments with thermal conductivity variation of tools.

  • Parameter estimation of cutting tool temperature nonlinear model using a novel simplified E. Coli foraging optimization algorithm

    In cutting tool temperature experiment, a large number of related data could be available. In order to define the relationship among the experiment data, the nonlinear regressive curve of cutting tool temperature must be constructed based on the data. In this paper, a simplified E. Coli foraging optimization algorithm is proposed with three main operators, which include a tumbling operator, a swimming operator and a tracing operator that at the same time records the optimal position of individual E. Coli and the location of all E. Coli swarm in order to update the locations of swarm. This paper proposes the simplified optimization algorithm for estimating the parameters such a curve to testing the effectiveness of the optimization algorithm. Comparison of simplified E. Coli foraging optimization algorithm results with those of GA and LS methods showed that the improved optimization algorithm is more effective for estimating the parameters of above curve.

  • Automatic tool selection using a fuzzy decision support system

    This paper describes a fuzzy decision support system and its application to the selection of a set of optimal cutting tools to machine a rectangular shaped pocket. The proposed method could be applied to other process planning tasks to help automate this manufacturing process.<<ETX>>



Standards related to Cutting tools

Back to Top

No standards are currently tagged "Cutting tools"


Jobs related to Cutting tools

Back to Top