Conferences related to Core dumps

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2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2020 ACM/IEEE 47th Annual International Symposium on Computer Architecture (ISCA)

Computer Architecture


2020 IEEE 29th International Symposium on Industrial Electronics (ISIE)

ISIE focuses on advancements in knowledge, new methods, and technologies relevant to industrial electronics, along with their applications and future developments.


2020 IEEE International Power Modulator and High Voltage Conference (IPMHVC)

This conference provides an exchange of technical topics in the fields of Solid State Modulators and Switches, Breakdown and Insulation, Compact Pulsed Power Systems, High Voltage Design, High Power Microwaves, Biological Applications, Analytical Methods and Modeling, and Accelerators.


2020 IEEE International Test Conference (ITC)

International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards, and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis, and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2019 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems – covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers

  • 2018 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification and validation, test (DFT, ATPG, and BIST), diagnosis, failure analysis and back to process, yield, reliability and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2017 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2016 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world's premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2015 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek

  • 2014 IEEE International Test Conference (ITC)

    ITC is the world's premier conference dedicated to electronic test technology, covering the complete cycle from design verification, test, diagnosis, failure analysis back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges have been addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2013 IEEE International Test Conference (ITC)

    International Test Conference is the world

  • 2012 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, des

  • 2011 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers.

  • 2010 IEEE International Test Conference (ITC)

    ITC is the world's premier conference dedicated to electronic test technology, covering the complete cycle from design verification,test, diagnosis, failure analysis back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges have been addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2009 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm) events, is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers,

  • 2008 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm), is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

  • 2007 IEEE International Test Conference (ITC)

  • 2006 IEEE International Test Conference (ITC)

  • 2005 IEEE International Test Conference (ITC)

  • 2004 IEEE International Test Conference (ITC)

  • 2003 IEEE International Test Conference (ITC)

  • 2002 IEEE International Test Conference (ITC)

  • 2001 IEEE International Test Conference (ITC)

  • 2000 IEEE International Test Conference (ITC)

  • 1999 IEEE International Test Conference (ITC)

  • 1998 IEEE International Test Conference (ITC)

  • 1997 IEEE International Test Conference (ITC)

  • 1996 IEEE International Test Conference (ITC)


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Periodicals related to Core dumps

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Computer

Computer, the flagship publication of the IEEE Computer Society, publishes peer-reviewed technical content that covers all aspects of computer science, computer engineering, technology, and applications. Computer is a resource that practitioners, researchers, and managers can rely on to provide timely information about current research developments, trends, best practices, and changes in the profession.


Electron Devices, IEEE Transactions on

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronics devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


Magnetics, IEEE Transactions on

Science and technology related to the basic physics and engineering of magnetism, magnetic materials, applied magnetics, magnetic devices, and magnetic data storage. The Transactions publishes scholarly articles of archival value as well as tutorial expositions and critical reviews of classical subjects and topics of current interest.


Nuclear Science, IEEE Transactions on

All aspects of the theory and applications of nuclear science and engineering, including instrumentation for the detection and measurement of ionizing radiation; particle accelerators and their controls; nuclear medicine and its application; effects of radiation on materials, components, and systems; reactor instrumentation and controls; and measurement of radiation in space.


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Most published Xplore authors for Core dumps

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Xplore Articles related to Core dumps

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Adaptive Checkpointing for Master-Worker Style Parallelism

2005 IEEE International Conference on Cluster Computing, 2005

We present a transparent, system-level checkpointing solution for master- worker parallelism that automatically adapts, upon restore, to the number of processor nodes available. We call this adaptive checkpointing. This is important, since nodes in a cluster fail. It also allows one to adapt to using mutliple cluster partitions, as they become available. Checkpointing a master- worker computation has the additional ...


The New Internal Beam Dump at the SPS. Temperature and Stress Calculations and Its Design

IEEE Transactions on Nuclear Science, 1981

A method of calculation of the temperature distribution and the thermal stress distribution in an internal beam dump is described. The calculation results and the stress limits are discussed for the new SPS beam dump designed for high proton intensities.


A Large Diameter Entrance Window for the LHC Beam Dump Line

Proceedings of the 2005 Particle Accelerator Conference, 2005

The graphite LHC beam dump block TDE has to absorb the full LHC beam intensity at 7 TeV. The TDE vessel will be filled with inert gas at atmospheric pressure, and requires a large diameter entrance window for vacuum separation from the beam dumping transfer line. The swept LHC beam must traverse this window without damage for regular operation of ...


Real programmers do use Delphi

IEEE Software, 1995

The author describes a career-journey that began with the maintenance of obsolete, poorly structured programs that came with almost no documentation. But he survived and moved on to work with and observe "real" programming practices in several companies. He describes how the "real" programming profession evolved and expanded into the mainstream of the software industry. E. Post's article "Real Programmers ...


Cobol: perception and reality

Computer, 1997

The authors list the perceptions they have uncovered and counter them with the reality of Cobol. Some of the perceptions are: Cobol is a mainframe language- it has been available on PCs since their inception; Cobol stopped evolving in the 1970s, stopped growing in popularity in the 1980s, and stopped being used to develop client-server and Web-based applications in the ...


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Educational Resources on Core dumps

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IEEE-USA E-Books

  • Adaptive Checkpointing for Master-Worker Style Parallelism

    We present a transparent, system-level checkpointing solution for master- worker parallelism that automatically adapts, upon restore, to the number of processor nodes available. We call this adaptive checkpointing. This is important, since nodes in a cluster fail. It also allows one to adapt to using mutliple cluster partitions, as they become available. Checkpointing a master- worker computation has the additional advantage of needing to checkpoint only the master process. This is both fast (0.05 s in our case), and more economical of disk space. We describe a system-level solution. The application writer does not declare what data structures to checkpoint. Furthermore, the solution is transparent. The application writer need not add code to request a checkpoint at appropriate locations. The system-level strategy avoids the labor-intensive and error-prone work of explicitly checkpointing the many data structures of a large program

  • The New Internal Beam Dump at the SPS. Temperature and Stress Calculations and Its Design

    A method of calculation of the temperature distribution and the thermal stress distribution in an internal beam dump is described. The calculation results and the stress limits are discussed for the new SPS beam dump designed for high proton intensities.

  • A Large Diameter Entrance Window for the LHC Beam Dump Line

    The graphite LHC beam dump block TDE has to absorb the full LHC beam intensity at 7 TeV. The TDE vessel will be filled with inert gas at atmospheric pressure, and requires a large diameter entrance window for vacuum separation from the beam dumping transfer line. The swept LHC beam must traverse this window without damage for regular operation of the beam dump dilution system. For dilution failures, the entrance window must survive most of the accident cases, and must not fail catastrophically in the event of damage. The conceptual design of the entrance window is presented, together with the load conditions and performance criteria. The FLUKA energy deposition simulations and ANSYS stress calculations are described, and the results discussed.

  • Real programmers do use Delphi

    The author describes a career-journey that began with the maintenance of obsolete, poorly structured programs that came with almost no documentation. But he survived and moved on to work with and observe "real" programming practices in several companies. He describes how the "real" programming profession evolved and expanded into the mainstream of the software industry. E. Post's article "Real Programmers Don't Use Pascal" (Datamation, 1983) sent the overriding message that, despite the efforts of that day's quiche-eating programmers, real programming took real talent and, if done correctly, led to fun, wealth, and job security. Borland recently released a new, object- oriented version of Pascal called Delphi. It's far removed from the simplistic language Niklaus Wirth conceived; it's a pleasure to use, and it commands good contracting rates.<<ETX>>

  • Cobol: perception and reality

    The authors list the perceptions they have uncovered and counter them with the reality of Cobol. Some of the perceptions are: Cobol is a mainframe language- it has been available on PCs since their inception; Cobol stopped evolving in the 1970s, stopped growing in popularity in the 1980s, and stopped being used to develop client-server and Web-based applications in the 1990s; and Cobol is not an object-oriented language, when, in fact, it has objects galore.

  • The new database imperatives

    The market for database systems as well as the science of creating database systems is shifting. The purpose of the paper and presentation is to outline some non conventional perspectives and to derive imperatives. Some of these perspectives will be shared by some, and some will be controversial: SQL as a language; SQL for business; SQL for scientific analysis; distributed computing; database storage; and Microsoft SQL Server.

  • Inspecting the History of Inspections: An Example of Evidence-Based Technology Diffusion

    If we're going to have a column about evidence in software engineering, we're going to need to talk about inspections sooner or later. Inspections are among the most mature and perhaps best-studied practices in software engineering. In short, software inspection was one of those rare software engineering innovations that had the ability to effect real process change.

  • CATCH-compiler-assisted techniques for checkpointing

    A compiler-based approach to generating efficient checkpoints for process recovery is described. The presented approach to checkpointing is programmer, operating system, and hardware transparent. Compile-time information is exploited to maintain the desired checkpoint interval and to reduce the size of checkpoints. Compiler-generated sparse potential checkpoint code is used to maintain the desired checkpoint interval. Adaptive checkpointing has been developed to reduce the size of checkpoints by exploiting potentially large variations in memory usage. A training technique is used in selecting the low- cost, high-coverage potential checkpoints. Since the potential checkpoint selection problem is NP-complete, a heuristic algorithm has been developed to obtain a quick suboptimal solution. These compiler-assisted checkpointing techniques have been implemented in a modified version of the GNU C (GCC) compiler version of 1.34. Experiments utilizing the CATCH GCC compiler on SUN workstations are described.<<ETX>>

  • On reducing of core dump file size

    In this paper a solution to minimize the size of core dump in computing machinery with limited resources is proposed. The proposed technique describes how to reduce some sections in core dump and yet still keeps the ability to debug with this reduced information on embedded systems.

  • Cloud-based approach to increase the performance of execution of binary by using the separate debug file

    A developer after developing the software transfer the binary to customers. When the program crashes and core dumps, the program needs to be debugged. For debugging using the debugger like GDB, requires the binary to have debug information in it. There are methods to embed the debug information to the binary. But this will increase the size of the binary. Sometimes the size of the debug information is more than the size of the binary. So we are separating the debug information from the binary and storing it in the separate debug file. And debug file name is added to the binary. But this debug file needs to be stored in the safer and easily accessible place to the debugger. So we are using the cloud as a storage space and providing the authorization to the debuggers. By making some modifications to the linker and debugger GDB we can make debuggers to easily access the debug file and debug the file. By separating the debug information from the binary, the size of the executable is reduced, thereby increasing the performance of program execution.



Standards related to Core dumps

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No standards are currently tagged "Core dumps"