Conferences related to Control charts

Back to Top

2023 Annual International Conference of the IEEE Engineering in Medicine & Biology Conference (EMBC)

The conference program will consist of plenary lectures, symposia, workshops and invitedsessions of the latest significant findings and developments in all the major fields of biomedical engineering.Submitted full papers will be peer reviewed. Accepted high quality papers will be presented in oral and poster sessions,will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE.


2021 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE)

FUZZ-IEEE 2021 will represent a unique meeting point for scientists and engineers, both from academia and industry, to interact and discuss the latest enhancements and innovations in the field. The topics of the conference will cover all the aspects of theory and applications of fuzzy sets, fuzzy logic and associated approaches (e.g. aggregation operators such as the Fuzzy Integral), as well as their hybridizations with other artificial and computational intelligence techniques.


2020 IEEE 18th International Conference on Industrial Informatics (INDIN)

INDIN focuses on recent developments, deployments, technology trends, and research results in Industrial Informatics-related fields from both industry and academia


2020 IEEE Industry Applications Society Annual Meeting

The Annual Meeting is a gathering of experts who work and conduct research in the industrial applications of electrical systems.


2020 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)

All topics related to engineering and technology management, including applicable analytical methods and economical/social/human issues to be considered in making engineering decisions.


More Conferences

Periodicals related to Control charts

Back to Top

Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Automation Science and Engineering, IEEE Transactions on

The IEEE Transactions on Automation Sciences and Engineering (T-ASE) publishes fundamental papers on Automation, emphasizing scientific results that advance efficiency, quality, productivity, and reliability. T-ASE encourages interdisciplinary approaches from computer science, control systems, electrical engineering, mathematics, mechanical engineering, operations research, and other fields. We welcome results relevant to industries such as agriculture, biotechnology, healthcare, home automation, maintenance, manufacturing, pharmaceuticals, retail, ...


Circuits and Systems I: Regular Papers, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Communications, IEEE Transactions on

Telephone, telegraphy, facsimile, and point-to-point television, by electromagnetic propagation, including radio; wire; aerial, underground, coaxial, and submarine cables; waveguides, communication satellites, and lasers; in marine, aeronautical, space and fixed station services; repeaters, radio relaying, signal storage, and regeneration; telecommunication error detection and correction; multiplexing and carrier techniques; communication switching systems; data communications; and communication theory. In addition to the above, ...


More Periodicals

Most published Xplore authors for Control charts

Back to Top

Xplore Articles related to Control charts

Back to Top

A fuzzy logic application in SPC evaluation and control

1999 7th IEEE International Conference on Emerging Technologies and Factory Automation. Proceedings ETFA '99 (Cat. No.99TH8467), 1999

Control chart pattern identification is an important aspect of statistical process control (SPC). In the conventional use of SPC, the user may just need to know whether or not the process is out of control. What actions should be taken to adjust the process is uncertain. This is a major drawback of control charts and, as a consequence, the user ...


The Study of Early Warning System of Reverse Logistics' Cost Control

2010 International Conference on E-Product E-Service and E-Entertainment, 2010

In order to develop the third profit resource and improve the management efficiency of reverse logistics, this article considered that small medium manufacturers could use their own information system platforms and choose activity-based costing to hackle the procedure of their reverse logistics. Then towards their reverse logistics, we could take the tertiary administrative measures and set up a transfer subsystem ...


Statistical Process Control Based on Multi-scale Wavelets Analysis

2008 IEEE International Symposium on Knowledge Acquisition and Modeling Workshop, 2008

Conventional control charts are based on the statistical assumption that measurements are independent and identically distributed. In industry applications, however, observations are autocorrelated due to the inherent cause of the process. Thus traditional methods will be inappropriate for autocorrelated process monitoring. In this paper, multi-scale wavelets analysis is introduced to autocorrelated processes. Process monitoring is reached by integrating Shewhart control ...


Low-yield flier wafer analysis strategies

IEEE/SEMI Conference and Workshop on Advanced Semiconductor Manufacturing 2005., 2005

This paper discusses several techniques for identifying, classifying, and analyzing low yielding flier wafers. Low yielding wafers in otherwise normal yielding lots can have significant impacts on yield variability and wafer costs. In addition, these unique instances can often mask and convolute larger baseline issues that have more significant impacts on die yield. Control charts using different statistical parameters can ...


A Study on Implementing Six-Sigma in Banking Service

2007 International Conference on Wireless Communications, Networking and Mobile Computing, 2007

On the basis of the characteristics of services in banking, implementing six- sigma has become a challenge in this financial area. This paper introduced the status of six-sigma implementation in service in the past and present, and then overviewed some studies of implementing six-sigma in service, especially in banking. There are some factors that influence the results of implementation which ...


More Xplore Articles

Educational Resources on Control charts

Back to Top

IEEE-USA E-Books

  • A fuzzy logic application in SPC evaluation and control

    Control chart pattern identification is an important aspect of statistical process control (SPC). In the conventional use of SPC, the user may just need to know whether or not the process is out of control. What actions should be taken to adjust the process is uncertain. This is a major drawback of control charts and, as a consequence, the user cannot employ SPC technique to automatically control the process. This paper provides a new fuzzy-SPC evaluation and control method. Fuzzy logic is applied to control charts to create a fuzzy inference system using the fuzzy logic toolbox in MATLAB. Different membership functions were chosen and their fuzzy control bases were generated as outputs of a fuzzy inference system based on zone rules. They are executed in a simulation system written in Visual C++. Results of the adjusted and controlled SPC charts are displayed on the screen. Analysis of the effect of changing the membership function is presented.

  • The Study of Early Warning System of Reverse Logistics' Cost Control

    In order to develop the third profit resource and improve the management efficiency of reverse logistics, this article considered that small medium manufacturers could use their own information system platforms and choose activity-based costing to hackle the procedure of their reverse logistics. Then towards their reverse logistics, we could take the tertiary administrative measures and set up a transfer subsystem of the reverse logistics. At last, use the control chart method and select the proper control method according to manufacturers' feature to set up an early warning system of cost control of reverse logistics. As a method of early warning, this subsystem is used to supervise each item of the reverse logistics so as to reduce the management blindness of the reverse logistics also to improve the early warning ability of the reverse logistics' cost control.

  • Statistical Process Control Based on Multi-scale Wavelets Analysis

    Conventional control charts are based on the statistical assumption that measurements are independent and identically distributed. In industry applications, however, observations are autocorrelated due to the inherent cause of the process. Thus traditional methods will be inappropriate for autocorrelated process monitoring. In this paper, multi-scale wavelets analysis is introduced to autocorrelated processes. Process monitoring is reached by integrating Shewhart control chart with multi-scale wavelets analysis. Finally, Take ARMA (1,1) process for example. Monte carlo simulations about step-type or trend-type fault in autocorrelated processes are performed to explain the ARL property of the multi-scale SPC monitoring method. In addition, we also consider the performance of control charts and the relationship between the average run length (ARL) performance and wavelet decomposition depth.

  • Low-yield flier wafer analysis strategies

    This paper discusses several techniques for identifying, classifying, and analyzing low yielding flier wafers. Low yielding wafers in otherwise normal yielding lots can have significant impacts on yield variability and wafer costs. In addition, these unique instances can often mask and convolute larger baseline issues that have more significant impacts on die yield. Control charts using different statistical parameters can help identify these wafers. Once known, they can be classified by failure type, with that data then being stored in a database. These wafers can be analyzed for root cause with a number of techniques, which include in-line metrology correlations, wafer positional analysis, electrical bitmapping and failure analysis. The techniques in this paper are employed by the Product Engineering Department at the Spansion Fab25 facility, which manufactures 200 mm 0.11 micron Flash memory technologies

  • A Study on Implementing Six-Sigma in Banking Service

    On the basis of the characteristics of services in banking, implementing six- sigma has become a challenge in this financial area. This paper introduced the status of six-sigma implementation in service in the past and present, and then overviewed some studies of implementing six-sigma in service, especially in banking. There are some factors that influence the results of implementation which we should take notice of; and also some limitations and new ways of implementing six-sigma. To apply six-sigma is not an easy job, and the measurement of service quality is not easy as that of the quality in manufacturing, so a choice of service quality models is quite important. This study tries to give an example by using the DMAIC model in dealing one short process. In this case, we use control chart to show how to identify special variations in a process so that we can improve it. It will be helpful for future researchers and the implementers of the six-sigma methodology.

  • Effects of sample sizes in phases I and II on p control chart performance

    This study expands on the work of Braun (1999) to study the effects of the initial reference sample size, m, in Phase I and the on-line sampling size, ni, in Phase II on the statistical performance of a conventional p chart. The conditional and marginal distributions of run length are derived. The oscillation of ARL with known pοis investigated. The recommended values of sample sizes to achieve required control chart performance are provided.

  • Modeling autocorrelated process control with industrial application

    In past literature, a primary solution to deal with autocorrelated process data consists of two steps, namely (i) time series model building and (ii) control charting based on the residuals. However, it requires some sophisticated statistical skills to build a satisfactory model during the first step. This has motivated us to propose a new procedure of time series model building. If traditionally time series model building is based on autoregressive integrated moving average (ARIMA) models, in this paper we show that a great number of time series data are governed by geometric Brownian motion (GBM) law. If the process is governed by GBM law, the appropriate model is directly derived from the properties of that law. Otherwise, the model is constructed by using the standard practice. An industrial example is presented to illustrate the advantages of the proposed method.

  • Optimal X~ chart for concentrated sampling inspection

    This article presents an optimal algorithm for the design of the X~ control chart. The objective is to search the optimal sample size and sampling interval which maximize the effectiveness of the X~ control chart in detecting the process mean shifts, on condition that the false alarm rate is held at a specified level. The design of this chart is applicable for the concentrated sampling inspection, where the allowed number of inspections within a given period is predefined. The effectiveness of the X~ chart is measured by the out-of-control average time to signal (ATS). The results from the numerical studies have shown that the optimal X~ chart is able to reduce the out-of- control ATS for the process mean shifts of any size compared to the conventional Shewhart X~ chart.

  • Statistical process control with vary- parameter based on average product length

    Aimed at the limitation that current statistical process control method are effective to only one fixed extend shift, a kind of robust control chart is proposed and the average product length calculating method of control chart is also discussed in this paper. Then, an optimal design scheme of the robust control chart is discussed. Comparisons of average product length of the robust optimal design with those of different charts show that the method proposed in our paper is effective to shifts of different sizes.

  • Quality Control Scheme with Learning Effect Consideration

    This work identifies a link between quality control scheme and the learning effect caused by the quality improvement program. The reduction rate of process standard deviation may be large during the initial stage of the quality improvement program, and influences the construction of control chart. Simulation is used to evaluate the performance of the control charts. The EWMA mean control chart with consideration of learning curve performs best. The Shewhart mean control chart without learning curve consideration has almost no detection ability when the shift magnitude of the process mean is small.




Jobs related to Control charts

Back to Top