Conferences related to Computer bugs

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2023 Annual International Conference of the IEEE Engineering in Medicine & Biology Conference (EMBC)

The conference program will consist of plenary lectures, symposia, workshops and invitedsessions of the latest significant findings and developments in all the major fields of biomedical engineering.Submitted full papers will be peer reviewed. Accepted high quality papers will be presented in oral and poster sessions,will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE.


2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2019 56th ACM/ESDA/IEEE Design Automation Conference (DAC)

    EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)


2020 IEEE Symposium on Security and Privacy (SP)

Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2021 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2019 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2018 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2017 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for the presentation of developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.Papers offer novel research contributions in any aspect of computer security or electronic privacy. Papers may represent advances in the theory, design, implementation, analysis, or empirical evaluation of secure systems, either for general use or for specific application domains.

  • 2016 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for the presentation of developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.Papers offer novel research contributions in any aspect of computer security or electronic privacy. Papers may represent advances in the theory, design, implementation, analysis, or empirical evaluation of secure systems, either for general use or for specific application domains.

  • 2015 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for the presentation of developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.Papers offer novel research contributions in any aspect of computer security or electronic privacy. Papers may represent advances in the theory, design, implementation, analysis, or empirical evaluation of secure systems, either for general use or for specific application domains.

  • 2014 IEEE Symposium on Security and Privacy (SP)

    IEEE Symposium on Security and Privacy has been the premier forum for computer security research, presenting the latest developments and bringing together researchers and practitioners.

  • 2013 IEEE Symposium on Security and Privacy (SP) Conference dates subject to change

    IEEE Symposium on Security and Privacy has been the premier forum for computer security research, presenting the latest developments and bringing together researchers and practitioners.

  • 2012 IEEE Symposium on Security and Privacy (SP) Conference dates subject to change

    IEEE Symposium on Security and Privacy has been the premier forum for computer security research, presenting the latest developments and bringing together researchers and practitioners.

  • 2011 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2010 IEEE Symposium on Security and Privacy (SP)

    S&P is interested in all aspects of computer security and privacy.

  • 2009 IEEE Symposium on Security and Privacy (SP)

    The IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2008 IEEE Symposium on Security and Privacy (SP)

    Since 1980, the IEEE Symposium on Security and Privacy has been the premier forum for presenting developments in computer security and electronic privacy, and for bringing together researchers and practitioners in the field.

  • 2007 IEEE Symposium on Security and Privacy (SP)

    Research contributions in any aspect of computer security and electronic privacy including advances in the theory, design, implementation, analysis of empirical evaluation of secure systems.

  • 2006 IEEE Symposium on Security and Privacy (SP)

  • 2005 IEEE Symposium on Security and Privacy (SRSP)


2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE)

ICSE is the premier forum for researchers to present and discuss the most recent innovations,trends, outcomes, experiences, and challenges in the field of software engineering. The scopeis broad and includes all original and unpublished results of empirical, conceptual, experimental,and theoretical software engineering research.


2019 12th IEEE Conference on Software Testing, Validation and Verification (ICST)

ICST 2019 is intended to provide a common forum for researchers, scientists, engineers and practitioners throughout the world to present their latest research findings, ideas, developments and applications in the area of Software Testing, Verification and Validation. Topics of interest include, but are not limited to:Testing theory and practice, Testing in globally-distributed organizations, Model-based testing, Model-driven engineering and testing, Domain specific testing, Quality assurance, Model checking, Formal verification, Fuzzing, Inspections, Testing and analysis tools, Design for testability, Testing education, Technology transfer in testing, Testing of open source, etc. Besides research track papers, the conference also include doctoral forum, software testing contest and various workshops.

  • 2018 IEEE International Conference on Software Testing, Verification and Validation (ICST)

    The (IEEE) International Conference on Software Testing Verification and Validation (ICST) offers an open forum for software testing, verification and validation research and its transfer to practice. One of the main goals of ICST is to bridge research and practice in software testing, verification, and validation. Furthermore, it aims at stimulating scientific research on model-based software testing, domain specific testing, empirical studies of testing techniques, and the technology transfer of research results to software development practices.

  • 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST)

    The 10th edition of the IEEE International Conference on Software Testing, Verification, and Validation (ICST) is the premier conference for research in all areas related to software quality. The ever increasing complexity, ubiquity, and dynamism of modern software systems is making software quality assurance activities, and in particular software testing and analysis, more challenging. ICST 2017 provides an ideal forum where academics, industrial researchers, and practitioners can present their latest approaches for ensuring the quality of today's complex software systems, exchange and discuss ideas, and compare experiences. In this spirit, ICST welcomes both research papers that present high quality original work and industry reports from practitioners that present real world experiences from which others can benefit.

  • 2016 IEEE International Conference on Software Testing, Verification and Validation (ICST)

    ICST brings together researchers and practitioners for a conference that includes all aspects of software testing, verification, and validation. ICST includes research papers, industrial experience reports and presentations, tool demonstrations, and tutorials. For the research papers, ICST seeks high quality original work that has never been published and that advances the state of the art in software testing, verification and validation. For the industrial experience reports, ICST seeks papers and presentations that present real world experience from which others can benefit. Tool demonstrations are also welcome, especially those openly available for others to use. Finally, we are seeking tutorials that are relevant to both practitioners and researchers. See the specific calls for more details. Extended versions of the best papers from ICST conferences are regularly published in special editions of JSTVR.

  • 2015 IEEE 8th International Conference on Software Testing, Verification and Validation (ICST)

    The 8th edition of the IEEE International Conference on Software Testing, Verification, and Validation (ICST) is the premier conference for research in all areas related to software quality. The ever increasing complexity, ubiquity, and dynamism of modern software systems is making software quality assurance activities, and in particular software testing and analysis, more challenging. ICST 2015 provides an ideal forum where academics, industrial researchers, and practitioners can present their latest approaches for ensuring the quality of today

  • 2014 IEEE Seventh International Conference on Software Testing, Verification and Validation (ICST)

    This conference is a premier conference in all areas related to software quality, including testing, inspection

  • 2013 IEEE Sixth International Conference on Software Testing, Verification and Validation (ICST)

    ICST seeks to address the problems in verification and validation, by bringing together researchers and practitioners for a conference that includes all aspects of software testing, as it is most widely construed. Thus, ICST welcomes research papers as well as industrial experience reports from software development and testing practitioners.

  • 2012 IEEE Fifth International Conference on Software Testing, Verification and Validation (ICST)

    ICST is the premier conference in all areas related to software quality, software quality assurance, software validation and verification, and software testing.

  • 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation (ICST)

    Testing, verification and validation activities are already flourishing areas with an active participation of a large community of researchers, experts, and industrialists. This community is highly aware of the importance and impact of testing on the future deployment and use of software and software intensive systems. As a leading software testing and verification&validation conference ICST has been very successful in bringing industry and research together to help shape the future of testing.

  • 2010 3rd IEEE International Conference on Software Testing, Verification and Validation (ICST)

    ICST bring industry and research together to help shape the future of software testing

  • 2009 2nd IEEE International Conference on Software Testing, Verification and Validation (ICST)

    ICST is the premier conference in all areas related to software quality. ICST bridges research and practice with tracks for research and industry papers, student papers, fast abstracts, and specilaized workshops.

  • 2008 1st IEEE International Conference on Software Testing, Verification and Validation (ICST)

    The new IEEE International Conference on Software Testing Verification and Validation (ICST) will offer an open forum for software testing, verification and validation research and its transfer to practice. Among other things, it aims at stimulating scientific research on model-based software testing, domain specific testing, empirical studies of testing techniques, and the technology transfer of research results to software development practices.


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Periodicals related to Computer bugs

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Antennas and Wireless Propagation Letters, IEEE

IEEE Antennas and Wireless Propagation Letters (AWP Letters) will be devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation.


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Communications Magazine, IEEE

IEEE Communications Magazine was the number three most-cited journal in telecommunications and the number eighteen cited journal in electrical and electronics engineering in 2004, according to the annual Journal Citation Report (2004 edition) published by the Institute for Scientific Information. Read more at http://www.ieee.org/products/citations.html. This magazine covers all areas of communications such as lightwave telecommunications, high-speed data communications, personal communications ...


Computer

Computer, the flagship publication of the IEEE Computer Society, publishes peer-reviewed technical content that covers all aspects of computer science, computer engineering, technology, and applications. Computer is a resource that practitioners, researchers, and managers can rely on to provide timely information about current research developments, trends, best practices, and changes in the profession.


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Most published Xplore authors for Computer bugs

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Xplore Articles related to Computer bugs

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Fitting Formal Methods into the Design Cycle

31st Design Automation Conference, 1994

This tutorial introduces several methods of formal hardware verification that could potentially have a practical impact on the design process. The measure of success in integrating these methods into a design methodology is arguably not the ability to provide formal guarantees of correctness, but rather to detect design errors in a timely manner, as the design evolves. Based on this ...


Corrigendum: complete type interference for simple objects

[1988] Proceedings. Third Annual Symposium on Logic in Computer Science, 1988

An error has been pointed out in the author's paper (see Proc. 2nd IEEE Symp. on Logic in Computer Science, p.37-44 (1987)). It appears that there are programs without principal type schemes in the system in that paper.<<ETX>>


Improving bug reporting and testing for mobile applications

2016 IEEE International Conference on Software Maintenance and Evolution (ICSME), 2016

The document was not made available for publication as part of the conference proceedings.


Debugging post-silicon fails in the IBM POWER8 bring-up lab

IBM Journal of Research and Development, 2015

Debugging post-silicon fails continues to be a difficult problem that is becoming even more challenging as chips integrate more functionality and implement increasingly complicated functions. Additionally, the complexity of hardware systems, coupled with the difficulty in observing the state of the system that led to the failure, make the debugging effort a unique challenge. In this paper, we review the ...


A method for testing data aspects of protocol implementation and its applications to the OSI session layer

[1988] Proceedings. Computer Networking Symposium, 1988

A method is presented to design conformance tests especially for data. Test cases are defined in a systematic way. The method was applied to design tests for the connection phase of the OSI (Open System Interconnection) session protocol. The tests that were designed revealed bugs in implementations.<<ETX>>


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Educational Resources on Computer bugs

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IEEE-USA E-Books

  • Fitting Formal Methods into the Design Cycle

    This tutorial introduces several methods of formal hardware verification that could potentially have a practical impact on the design process. The measure of success in integrating these methods into a design methodology is arguably not the ability to provide formal guarantees of correctness, but rather to detect design errors in a timely manner, as the design evolves. Based on this criterion, and some limited practical experience, we consider where the various methods might fit into the life cycle of a design, what their capabilities and shortcomings are, and how the design process might change in order to accommodate formal methods.

  • Corrigendum: complete type interference for simple objects

    An error has been pointed out in the author's paper (see Proc. 2nd IEEE Symp. on Logic in Computer Science, p.37-44 (1987)). It appears that there are programs without principal type schemes in the system in that paper.<<ETX>>

  • Improving bug reporting and testing for mobile applications

    The document was not made available for publication as part of the conference proceedings.

  • Debugging post-silicon fails in the IBM POWER8 bring-up lab

    Debugging post-silicon fails continues to be a difficult problem that is becoming even more challenging as chips integrate more functionality and implement increasingly complicated functions. Additionally, the complexity of hardware systems, coupled with the difficulty in observing the state of the system that led to the failure, make the debugging effort a unique challenge. In this paper, we review the techniques and mechanisms used to facilitate effective debugging in the POWER8™ processor post-silicon validation phase. We further describe several functional bugs and describe the debugging process that drove the identification of their root cause.

  • A method for testing data aspects of protocol implementation and its applications to the OSI session layer

    A method is presented to design conformance tests especially for data. Test cases are defined in a systematic way. The method was applied to design tests for the connection phase of the OSI (Open System Interconnection) session protocol. The tests that were designed revealed bugs in implementations.<<ETX>>

  • 6 Limits: Imperfect Programs

    Up until now, we've considered only small ideal programs and processes. Starting in this chapter, we take the first step toward a more realistic view by understanding some of the limits the universe imposes on the construction and running of processes. In this chapter we take up various ways in which processes are flawed, while in the next chapter we consider the limits even when processes are perfect. However, both chapters assume only a single process running on correctly functioning step-taking machinery. In later chapters we'll encounter still another set of problems caused by multiple processes (chapter 8) or by failures (chapter 16).

  • A formal verification methodology for checking data integrity

    Formal verification techniques have been playing an important role in pre- silicon validation processes. One of the most important points considered in performing formal verification is to define good verification scopes; we should define clearly what to be verified formally upon designs under test. We considered the following three practical requirements when we defined the scope of formal verification. It should be: (a) hard to verify; (b) small to handle; and (c) easy to understand. Our novel approach is to break down generic properties for the system into stereotype properties in block level and to define requirements for Verifiable RTL. Consequently, each designer instead of verification experts can describe properties of the design easily, and formal model checking can be applied systematically and thoroughly to all the leaf modules. During the development of a component chip for server platforms, we focused on RAS (reliability availability and serviceability) features and described more than 2000 properties in PSL. As a result of the formal verification, we found several critical logic bugs in a short time with limited resources, and successfully verified all of them. This paper presents a study of the functional verification methodology.

  • Poster: Memory and Resource Leak Defects in Java Projects: An Empirical Study

    Despite many software engineering efforts and programming language support, resource and memory leaks remain a troublesome issue in managed languages such as Java. Understanding the properties of leak-related issues, such as their type distribution, how they are found, and which defects induce them is an essential prerequisite for designing better approaches for avoidance, diagnosis, and repair of leak-related bugs. To answer these questions, we conduct an empirical study on 452 issues found in repositories of 10 mature Apache Java projects.

  • An eye on India: outsourcing debate continues

    US companies increasingly began outsourcing software development work to countries such as India, which touts low personnel costs and plentiful technical expertise, during the dotcom shakeout. Today, the trend shows no sign of stopping. It has changed the landscape for US software professionals, reshaping how companies plan projects and choose employees. US software developers will not be going the way of the dinosaurs, analysts say, but they will need to cleverly manage their careers and thoroughly understand the new environment. At the same time, businesses are learning more about offshore outsourcing's challenges. The author discusses the growing debate about its merits.

  • Differential Debugging

    Finding yourself in a situation with a working and a buggy system is quite common. Differential debugging methodically can help by comparing a known good system with a buggy one, working toward the problem source. Some simple steps include applying differential debugging by looking at log files and increasing a system's log verbosity when needed. If the system doesn't offer a sufficiently detailed logging mechanism, you can tease out its runtime behavior with tools that trace calls to the operating system or that trace network packets. You can also compare carefully the two environments where the systems operate. The Web extra at http://youtu.be/qnXS6b4hakg is an audio podcast of author Diomidis Spinellis reading his Tools of the Trade column, in which he discusses how comparing a good system with a buggy one can help locate the source of the problem.



Standards related to Computer bugs

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