Conferences related to Conductors

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2020 IEEE/PES Transmission and Distribution Conference and Exposition (T&D)

Bi-Annual IEEE PES T&D conference. Largest T&D conference in North America.


2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2020 IEEE Power & Energy Society General Meeting (PESGM)

The Annual IEEE PES General Meeting will bring together over 2900 attendees for technical sessions, administrative sessions, super sessions, poster sessions, student programs, awards ceremonies, committee meetings, tutorials and more


2020 IEEE International Conference on Plasma Science (ICOPS)

IEEE International Conference on Plasma Science (ICOPS) is an annual conference coordinated by the Plasma Science and Application Committee (PSAC) of the IEEE Nuclear & Plasma Sciences Society.


2020 IEEE/MTT-S International Microwave Symposium (IMS)

The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 1996 IEEE/MTT-S International Microwave Symposium - MTT '96

  • 1997 IEEE/MTT-S International Microwave Symposium - MTT '97

  • 1998 IEEE/MTT-S International Microwave Symposium - MTT '98

  • 1999 IEEE/MTT-S International Microwave Symposium - MTT '99

  • 2000 IEEE/MTT-S International Microwave Symposium - MTT 2000

  • 2001 IEEE/MTT-S International Microwave Symposium - MTT 2001

  • 2002 IEEE/MTT-S International Microwave Symposium - MTT 2002

  • 2003 IEEE/MTT-S International Microwave Symposium - MTT 2003

  • 2004 IEEE/MTT-S International Microwave Symposium - MTT 2004

  • 2005 IEEE/MTT-S International Microwave Symposium - MTT 2005

  • 2006 IEEE/MTT-S International Microwave Symposium - MTT 2006

  • 2007 IEEE/MTT-S International Microwave Symposium - MTT 2007

  • 2008 IEEE/MTT-S International Microwave Symposium - MTT 2008

  • 2009 IEEE/MTT-S International Microwave Symposium - MTT 2009

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010

    Reports of research and development at the state-of-the-art of the theory and techniques related to the technology and applications of devices, components, circuits, modules and systems in the RF, microwave, millimeter-wave, submillimeter-wave and Terahertz ranges of the electromagnetic spectrum.

  • 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter -wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014

    IMS2014 will cover developments in microwave technology from nano devices to system applications. Technical paper sessions, interactive forums, plenary and panel sessions, workshops, short courses, industrial exhibits, and a wide array of other technical activities will be offered.

  • 2015 IEEE/MTT-S International Microwave Symposium - MTT 2015

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics. The IMS includes technical sessions, both oral and interactive, worksh

  • 2016 IEEE/MTT-S International Microwave Symposium - IMS 2016

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018

    Microwave theory and techniques, RF/microwave/millimeter-wave/terahertz circuit design and fabrication technology, radio/wireless communication.

  • 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019

    Comprehensive symposium on microwave theory and techniques including active and passive circuit components, theory and microwave systems.

  • 2021 IEEE/MTT-S International Microwave Symposium - IMS 2021

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2022 IEEE/MTT-S International Microwave Symposium - IMS 2022

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2024 IEEE/MTT-S International Microwave Symposium - IMS 2024

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2025 IEEE/MTT-S International Microwave Symposium - IMS 2025

    The IEEE International Microwave Symposium (IMS) is the world s foremost conferencecovering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies;encompassing everything from basic technologies to components to systems including thelatest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulationand more. The IMS includes technical and interactive sessions, exhibits, student competitions,panels, workshops, tutorials, and networking events.

  • 2026 IEEE/MTT-S International Microwave Symposium - IMS 2026

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2029 IEEE/MTT-S International Microwave Symposium - IMS 2029

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2031 IEEE/MTT-S International Microwave Symposium - IMS 2031

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2036 IEEE/MTT-S International Microwave Symposium - IMS 2036

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.



Periodicals related to Conductors

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Methods, algorithms, and human-machine interfaces for physical and logical design, including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, and documentation of integrated-circuit and systems designs of all complexities. Practical applications of aids resulting in producible analog, digital, optical, or microwave integrated circuits are emphasized.



Most published Xplore authors for Conductors

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Xplore Articles related to Conductors

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IEEE Test Procedure for Impulse Voltage Tests on Insulated Conductors

IEEE Std 82-1963, 1963

This test procedure is intended as a guide for impulse testing of insulated conductors. It is intended only for use as a design or development test, and not as a routine production or specification test. Special needs may require deviations from this test procedure. A uniform procedure, however, is desirable in most cases. This test procedure applies only to impulse ...


AC Loss Characteristics of Stacked Conductors Composed of HTS Coated Conductors With Magnetic Substrates

IEEE Transactions on Applied Superconductivity, 2007

HTS coated conductors (CC's) with substrates of magnetic materials such as Ni- alloys are expected to be promising for practical applications because Ni- alloys are well-texturized by simple processes and production costs of the conductors are significantly reduced. In the former works, it was shown by experiments that HoBaCuO-123 CC's with Ni-alloy substrates exhibit higher AC transport current losses than ...


IEEE Approved Draft Guide for Determining the Effects of High Temperature Operation on Conductors, Connectors, and Accessories

IEEE P1283/D8, April 2013, 2013

Possible adverse impacts to an operating overhead transmission line which might occur whenoperating the line at high temperatures are discussed. Specifically, the transmission lines conductor, connectors, and attached accessories in terms of degradation in mechanical properties due to annealing elastic and in-elastic elongation, and accelerated aging are explored along with limited mitigation recommendations. Additionally, predictor equations for accelerated creep and ...


An investigation on line loadability increase with high temperature conductors

2017 6th International Conference on Clean Electrical Power (ICCEP), 2017

This paper investigates the loadability increase of overhead transmission lines (OHLs) equipped with high-temperature low-sag (HTLS) conductors. Compared with traditional ACSR conductors, HTLS conductors allows to get a large increase of the thermal limit, maintaining the same weight and size of the conductors. Of course, the loadability curves increase only in the thermal limit region and, thus, this measure provides ...


Voltage withstand properties of the insulation of different types of medium voltage covered overhead line conductors

2018 19th International Scientific Conference on Electric Power Engineering (EPE), 2018

Using covered conductors in overhead lines has become a widespread practice for increasing the reliability of distribution grids. To determine the ability to withstand prolonged voltage stress of different insulating materials, 10 different types of covered conductors with a rated voltage of 20 kV were tested by placing grounded copper wire electrodes on the outer surface of the conductor. In ...



Educational Resources on Conductors

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IEEE-USA E-Books

  • IEEE Test Procedure for Impulse Voltage Tests on Insulated Conductors

    This test procedure is intended as a guide for impulse testing of insulated conductors. It is intended only for use as a design or development test, and not as a routine production or specification test. Special needs may require deviations from this test procedure. A uniform procedure, however, is desirable in most cases. This test procedure applies only to impulse tests on insulated conductors. This test procedure is not intended to replace any existing or future standards covering impulse generators, impulse testing or voltage measurements. It is intended to supplement such standards by indicating specific procedures for a specific type of system component.

  • AC Loss Characteristics of Stacked Conductors Composed of HTS Coated Conductors With Magnetic Substrates

    HTS coated conductors (CC's) with substrates of magnetic materials such as Ni- alloys are expected to be promising for practical applications because Ni- alloys are well-texturized by simple processes and production costs of the conductors are significantly reduced. In the former works, it was shown by experiments that HoBaCuO-123 CC's with Ni-alloy substrates exhibit higher AC transport current losses than CC's with non-magnetic Hastelloy substrates. In this work, the AC transport current loss characteristics of stacked conductors composed of a pair of HoBCO CC's with Ni-alloy substrates are experimentally investigated to study a method to suppress the AC transport current losses. It is found that AC transport current losses can be reduced in the stack arrangement by the minimization of influence of the magnetism of the substrates canceling self-fields in the substrates.

  • IEEE Approved Draft Guide for Determining the Effects of High Temperature Operation on Conductors, Connectors, and Accessories

    Possible adverse impacts to an operating overhead transmission line which might occur whenoperating the line at high temperatures are discussed. Specifically, the transmission lines conductor, connectors, and attached accessories in terms of degradation in mechanical properties due to annealing elastic and in-elastic elongation, and accelerated aging are explored along with limited mitigation recommendations. Additionally, predictor equations for accelerated creep and conductor loss of strength are detailed in annexes with limited example calculations.

  • An investigation on line loadability increase with high temperature conductors

    This paper investigates the loadability increase of overhead transmission lines (OHLs) equipped with high-temperature low-sag (HTLS) conductors. Compared with traditional ACSR conductors, HTLS conductors allows to get a large increase of the thermal limit, maintaining the same weight and size of the conductors. Of course, the loadability curves increase only in the thermal limit region and, thus, this measure provides a significant advantage only for short lines. However, the advantage provided by HTLS conductors can be extended to longer lines if the voltage drop across the line can be controlled. This can be done injecting reactive power at the receiving end of the line by means of synchronous condensers or static var compensators (SVC). This paper highlights the loadability increase that can be obtained this way in the voltage drop region over a wide range of lengths. Accordingly, HTLS conductors can be better exploited up to much longer line lenghts.

  • Voltage withstand properties of the insulation of different types of medium voltage covered overhead line conductors

    Using covered conductors in overhead lines has become a widespread practice for increasing the reliability of distribution grids. To determine the ability to withstand prolonged voltage stress of different insulating materials, 10 different types of covered conductors with a rated voltage of 20 kV were tested by placing grounded copper wire electrodes on the outer surface of the conductor. In the tests, 3 grounding points were applied to each tested conductor. The conductors were energized to a standard testing voltage of 14 kV and the accumulative time until puncture of the insulation was measured. Some conductors showed a high variability of withstand times, possibly due to presence of weak spots in the insulation. On average, conductors insulated with PE performed best in the tests, PE/XLPE combined insulation was second best and XLPE insulated conductors exhibited the shortest withstand times.

  • End-of-life phenomena of splices and conductors, including copper conductors

    When conductors and splices are operated beyond their intended service life and under conditions substantially different from original design objectives, care must be exercised in judging the reliability and potential service problems. Old conductors and splices successfully for long periods increasing and unexpected temperatures are increased. Properties of old copper conductors are difficult to ascertain. Substantial care and caution should be exercised when copper conductors are operated at high temperatures. In the operation of old lines, one may encounter phenomena which are specific only to very old conductors. It is very hard to extrapolate such performance. The only practical solution is recognition that lines with old conductors require increased inspection frequency.

  • Detection of Critical Current Distribution of YBCO-Coated Conductors Using Permanent Magnet Method

    We developed a non-destructive and contactless system for measuring the critical current (Ic) in YBa2Cu3O7-δ(YBCO)-coated conductors by using a permanent magnet (Sm2Co17). This Icmeasurement method is based on the repulsive force (Fr) between the magnet and the shielding current in high- temperature superconductor-coated conductors. We measured Frusing a high- resolution load sensor and found that accurate Frcould be determined without the effect of thick copper film on the YBCO thin film and Hastelloy tape of the substrate. We can determine Icfrom Fr0, which is the maximum repulsive force determined from an extrapolated value of the Frvs. L curve for L = 0 mm, described in our previous paper. We show that the permanent magnet method can be used to determine the longitudinal Icdistribution and large-scale defects in YBCO-coated conductors. In addition, it turned out from this experiment that the permanent magnet method was effective to rapidly measure the longitudinal Icdistribution of long-scale coated conductors.

  • Heating Effects of Short-Circuit Current Impulses on Contacts and Conductors—Part II

    An analytical description combined with the finite-element calculations of the current displacement caused by short-circuit current impulses in 1-D and 2-D conductor models is presented. It is shown that in many cases, the Joule integral used in the technical practice gives a false representation of the thermal stress in the conductors and contacts. A simplified method is given for determining the degree of current displacement caused by different current impulses, hence, the nonuniformity of the losses and the heating within the conductors.

  • FEM-DBCI Solution of Open-Boundary Electrostatic Problems in the Presence of Floating Potential Conductors

    This paper extends the hybrid finite-element method-Dirichlet boundary condition iteration method for the solution of open-boundary electrostatic problems to the case, in which some floating potential conductors are present in the system. The iterative solution scheme of the basic method is modified in order to deal with the unknown values of the potential of these conductors.

  • Impacts of Heat Treatment on Properties and Microstructure of Cu16at%Ag Conductors

    CuAg in situ composite conductors are used as conductors for Florida Bitter magnets and potential candidates for pulsed magnets in the National High Magnetic Field Laboratory, and are likely exposed to temperatures higher than ambient during operations in magnets. The conductors are fabricated by cold rolling that introduces lattice distortions and high densities of interfaces in a unit volume. High temperature exposure by the conductors may affect the characteristics of the lattice distortions and the interfaces. The lattice distortion and density of the interface affects the mechanical properties of the conductors, such as the tensile and yield strength, as well as the electrical conductivity of the composites. Understanding the performance of the conductors after they are exposed to high temperature heat treatments helps one to make good use of them for magnets and to manufacture conductors to meet the requirements of the magnets, particularly when the magnetic stress reaches the limit of the mechanical strength of the conductors. The goal of this research is to understand the microstructure evolution of the Cu16at%Ag after the high temperature heat treatment and to relate such microstructural features to mechanical tensile strength and electrical conductivities.



Standards related to Conductors

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IEEE Guide for Determining the Effects of High Temperature Operation on Conductors, Connectors, and Accessories

Prepare an IEEE guide describing the effects of high temperature operation on conductors, connectors, and conductor hardware. The guide will no only identify what constitutes elevated temperature operation and its effects on the above overhead line components, but will also suggest some mitigation techniques for consideration.


IEEE Guide for Laboratory Measurement of the Power Dissipation Characteristics of Aeolian Vibration Dampers for Single Conductors

Abstract: The current methodologies, including apparatus, procedures, and measurement accuracies, for determining the dynamic characteristics of vibration dampers and damping systems are described. Some basic guidance is provided regarding a given method's strengths and weaknesses. The methodologies and procedures described are applicable to indoor testing only.


IEEE Guide on Conductor Self-Damping Measurements


IEEE Guide to the Installation of Overhead Transmission Line Conductors

This guide provides general recommendations for the selection of methods, equipment, and tools that have been found to be practical for the stringing and grounding of overhead transmission line conductors, overhead groundwires and fiber optic cables. The guide also includes a comprehensive list of definitions for equipment and tools used in stringing and for stringing terms commonly employed. This guide ...


IEEE Recommended Practice for Maintenance of DC Overhead Contact Systems for Transit Systems

This recommended practice provides overhead contact system maintenance practices and procedures including maintenance techniques, site inspection and test procedures, and maintenance tolerances, for heavy rail, light rail, and trolley bus systems.