Conferences related to Capacitance measurement

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2023 Annual International Conference of the IEEE Engineering in Medicine & Biology Conference (EMBC)

The conference program will consist of plenary lectures, symposia, workshops and invitedsessions of the latest significant findings and developments in all the major fields of biomedical engineering.Submitted full papers will be peer reviewed. Accepted high quality papers will be presented in oral and poster sessions,will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE.


2021 IEEE Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology


2020 IEEE International Symposium on Antennas and Propagation and North American Radio Science Meeting

The joint meeting is intended to provide an international forum for the exchange of information on state of the art research in the area of antennas and propagation, electromagnetic engineering and radio science


2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2020 IEEE 16th International Workshop on Advanced Motion Control (AMC)

AMC2020 is the 16th in a series of biennial international workshops on Advanced Motion Control which aims to bring together researchers from both academia and industry and to promote omnipresent motion control technologies and applications.


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Periodicals related to Capacitance measurement

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Biomedical Circuits and Systems, IEEE Transactions on

The Transactions on Biomedical Circuits and Systems addresses areas at the crossroads of Circuits and Systems and Life Sciences. The main emphasis is on microelectronic issues in a wide range of applications found in life sciences, physical sciences and engineering. The primary goal of the journal is to bridge the unique scientific and technical activities of the Circuits and Systems ...


Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


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Most published Xplore authors for Capacitance measurement

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Xplore Articles related to Capacitance measurement

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Induction of internal capacitance effect of organic photovoltaic device (OPV) by Real-Time One-Sweep Method (RTOSM) in I–V measurement

2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), 2014

The characterization related features in measuring I-V curves of DSSC are having different error compare to the conventional crystalline Si (c-Si) or amorphous silicon devices. These error sources include the sample area, spectral errors, temperature fluctuations, current and voltage response time, contacting, and degradation during testing. In addition to OPV characteristics requires additional considering the forward/backward sweep in I-V curves, ...


The NIM Inertial Mass Measurement Project

IEEE Transactions on Instrumentation and Measurement, 2015

An inertial mass measurement project, which is expected to precisely measure the Planck constant, h, for possible comparisons with known gravitational mass measurement projects, e.g., the watt balance and the Avogadro project, is being carried out at the National Institute of Metrology, China. The principle, apparatus, and experimental investigations of the inertial mass measurement are presented. The prototype of the ...


A 5-GHz fTmonolithic IC process for high-speed digital circuits

1975 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1975

A junction-isolated monolithic IC circuit process with an fTof 5 GHz, affording substantially faster E2L circuits than previously available, will be discussed. A monolithic binary chip has been fabricated successfully with a maximum toggle rate of 1.8 GHz.


An Electron Beam Modulator And Microwave Source Based On A Split Cavity

IEEE Conference Record - Abstracts. 1991 IEEE International Conference on Plasma Science, 1991

None


A PMOS eight-channel monolithic instrumentation amplifier and signal processing circuit

1974 IEEE International Solid-State Circuits Conference. Digest of Technical Papers, 1974

An all-PMOS monolithic 8-channel instrumentation system will be described. Each channel contains a linear amplifier, trigger, stable delay memory and control logic, and is optimized for processing signals from multiwire proportional chambers.


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Educational Resources on Capacitance measurement

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IEEE.tv Videos

IMS 2011 Microapps - A Comparison of Noise Parameter Measurement Techniques
IMS 2011 Microapps - Ultra Low Phase Noise Measurement Technique Using Innovative Optical Delay Lines
IMS 2011 Microapps - Waveguide Characteristics and Measurement Errors
IMS 2011 Microapps - Vector-Receiver Load Pull - Measurement Accuracy at its Best
IMS 2012 Microapps - Passive Intermodulation (PIM) measurement using vector network analyzer Osamu Kusano, Agilent CTD-Kobe
I2MTC 2014 Conference Preview
Steep Slope Devices: Advanced Nanodevices - Nicolo Oliva at INC 2019
Advanced Capacitive Sensing for Consumer, Industrial, and Automotive Applications - Lecture by Dr. Hans Klein
APEC 2012 - Thomas S. Buzak Plenary
5G Wireless A Measurement and Metrology Perspective: MicroApps 2015 - Keysight Technologies
MicroApps: Recent Improvement on Y-Factor Noise Figure Measurement Uncertainty (Agilent Technologies)
Micro-Apps Keynote 2013: Modern RF Measurements and How They Drive Spectrum Analyzer Digital IF Processor Design
MicroApps: Measurement Advances for Differential and I/Q Devices (Agilent Technologies)
IMS 2014: Out-of-Plane and Inline RF Switches based on Ge2Sb2Te5 Phase-Change Material
Innovative Transmission Line Measurement and Characterization Reduce Time to Repair for Complex Communication Systems: MicroApps 2015 - Keysight Technologies
Voltage Metrology with Superconductive Electronics
National Strategic Computing Initiative - Carl Williams: 2016 International Conference on Rebooting Computing
Inspiring Brilliance: Maxwell, field theory and the road to relativity and quantum theory
Brooklyn 5G Summit 2014: Channel Measurement and Modeling with Dr. Andy Nix and Dr. Mark Beach
Brooklyn 5G Summit 2014: Channel Measurements Summary by Ted Rappaport

IEEE-USA E-Books

  • Induction of internal capacitance effect of organic photovoltaic device (OPV) by Real-Time One-Sweep Method (RTOSM) in I–V measurement

    The characterization related features in measuring I-V curves of DSSC are having different error compare to the conventional crystalline Si (c-Si) or amorphous silicon devices. These error sources include the sample area, spectral errors, temperature fluctuations, current and voltage response time, contacting, and degradation during testing. In addition to OPV characteristics requires additional considering the forward/backward sweep in I-V curves, but the related features in measuring I-V curves are more sensitive to temperature due to non-linear issue. Therefore, in this study, we aimed to develop a new real time one sweep method (RTOSM) and applied in I-V measurement to analysis different OPV materials, which are independent on setting delay time and the forward(F)/backward(B) sweep in I-V curves. A brief discussion of photovoltaic efficiency measurements and procedures was presented, and result showed final performance data of Pmax(Iscand Voc) having deviations 0.2 % or less.

  • The NIM Inertial Mass Measurement Project

    An inertial mass measurement project, which is expected to precisely measure the Planck constant, h, for possible comparisons with known gravitational mass measurement projects, e.g., the watt balance and the Avogadro project, is being carried out at the National Institute of Metrology, China. The principle, apparatus, and experimental investigations of the inertial mass measurement are presented. The prototype of the experiment and the Planck constant with a relative uncertainty of several parts in 10<sup>4</sup> have been achieved for principle testing.

  • A 5-GHz fTmonolithic IC process for high-speed digital circuits

    A junction-isolated monolithic IC circuit process with an fTof 5 GHz, affording substantially faster E2L circuits than previously available, will be discussed. A monolithic binary chip has been fabricated successfully with a maximum toggle rate of 1.8 GHz.

  • An Electron Beam Modulator And Microwave Source Based On A Split Cavity

    None

  • A PMOS eight-channel monolithic instrumentation amplifier and signal processing circuit

    An all-PMOS monolithic 8-channel instrumentation system will be described. Each channel contains a linear amplifier, trigger, stable delay memory and control logic, and is optimized for processing signals from multiwire proportional chambers.

  • IEEE Draft Standard for Common Requirements for Testing of AC Capacitance Current Switching Devices over 1000V

    Common requirements for testing of AC capacitive current switching devices with nominal system voltage above 1000 V are provided in this standard

  • An improved automatic measurement setup for inner diameter of outer conductor in coaxial air lines

    An improved automatic measurement setup for measuring inner diameter of outer conductor (IDOC) in coaxial air lines with precision connectors, including N, 7 mm, 3.5 mm, 2.92 mm, 2.4 mm, and 1.85mm, is introduced. The improved setup can accurately measure the straightness and the position of measured cross- section of IDOC. Multi-gauge calibration method and orthogonal regression algorithm are used to achieve measurement uncertainty smaller than 0.3μm. As an example, the measurement results of air lines with precision 2.92 mm and type N connectors are shown.

  • High-frequency oscillations n high-pin-count ECL devices

    Examines high-frequency oscillations experimentally observed in high-pin-count ECL ASIC (emitter-coupled-logic application-specific integrated-circuit) devices on high-speed testers. A special test chip was designed to determine experimentally the conditions that create such oscillations. Analytical studies agree closely with the experimental results. Design guidelines are established for the ECL chips and packages to use them, as well as means to eliminate oscillation on the tester. Results confirm that stable operation of the ECL chips can be maintained without speed limitations, as long as certain conditions are met by chip and package designers.<<ETX>>

  • A multi-frequency quadrature bridge

    A quadrature bridge has been developed with the aim of determining capacitance values at several frequencies in terms of a resistance ultimately derived from the QHR. The bridge is evaluated by comparing a 1 nF capacitor with a 100 k/spl Omega/ resistor at six frequencies from 3/8/spl times/10/2/spl pi/ kHz to 10/2/spl pi/ kHz.

  • A physically based parameter extraction scheme for SCR models

    This paper presents a physically based parameter extraction scheme for SCR models. The methods are discussed and demonstrated with an example. The comparison between simulated and measured device behaviour shows agreement within 15% tolerance.



Standards related to Capacitance measurement

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IEEE Application Guide for Capacitance Current Switching for AC High-Voltage Circuit Breakers

This project will revise the application guide for capacitance current switching for high-voltage circuit breakers rated in accordance with IEEE C37.04 and listed in C37.06. It is intended to supplement C37.010.


IEEE Standard for Backplane Electrical Performance


IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers


Standard Requirements, Terminology, and Test Code for Bushings for DC Applications Rated 110 kV BIL and Above

This standard applies to outdoor and indoor power apparatus dc bushings of condenser type that have basic impulse insulation levels of 110 kV and above for use as components of oil-filled converter transformers and smoothing reactors, as well as air-to-air dc bushings. This standard does not apply to the following: a) High-voltage cable terminations (potheads) b) Bushings for instrument transformers ...



Jobs related to Capacitance measurement

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