Conferences related to Voltage Fluctuations

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2021 IEEE Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology


2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2020 57th ACM/ESDA/IEEE Design Automation Conference (DAC)

The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2022 59th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2021 58th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2019 56th ACM/ESDA/IEEE Design Automation Conference (DAC)

    EDA (Electronics Design Automation) is becoming ever more important with the continuous scaling of semiconductor devices and the growing complexities of their use in circuits and systems. Demands for lower-power, higher-reliability and more agile electronic systems raise new challenges to both design and design automation of such systems. For the past five decades, the primary focus of research track at DAC has been to showcase leading-edge research and practice in tools and methodologies for the design of circuits and systems.

  • 2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2017 54th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2016 53nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2015 52nd ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC Description for TMRF The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 sessions on design methodologies and EDA tool developments, keynotes, panels, plus the NEW User Track presentations. A diverse worldwide community representing more than 1,000 organizations attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading

  • 2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The world's premier EDA and semiconductor design conference and exhibition. DAC features over 60 session on design methodologies and EDA tool developments, keynotes, panels, plus User Track presentations. A diverse worldwide community representing more than 1,000 organization attends each year, from system designers and architects, logic and circuit designers, validation engineers, CAD managers, senior managers and executives to researchers and academicians from leading universities.

  • 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers

  • 2011 48th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference is the world s leading technical conference and tradeshow on electronic design and design automation. DAC is where the IC Design and EDA ecosystem learns, networks, and does business.

  • 2010 47th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 200 of the leading electronics design suppliers.

  • 2009 46th ACM/EDAC/IEEE Design Automation Conference (DAC)

    DAC is the premier event for the electronic design community. DAC offers the industry s most prestigious technical conference in combination with the biggest exhibition, bringing together design, design automation and manufacturing market influencers.

  • 2008 45th ACM/EDAC/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier event for the design of electronic circuits and systems, and for EDA and silicon solutions. DAC features a wide array of technical presentations plus over 250 of the leading electronics design suppliers.

  • 2007 44th ACM/IEEE Design Automation Conference (DAC)

    The Design Automation Conference (DAC) is the premier Electronic Design Automation (EDA) and silicon solution event. DAC features over 50 technical sessions covering the latest in design methodologies and EDA tool developments and an Exhibition and Demo Suite area with over 250 of the leading EDA, silicon and IP Providers.

  • 2006 43rd ACM/IEEE Design Automation Conference (DAC)

  • 2005 42nd ACM/IEEE Design Automation Conference (DAC)

  • 2004 41st ACM/IEEE Design Automation Conference (DAC)

  • 2003 40th ACM/IEEE Design Automation Conference (DAC)

  • 2002 39th ACM/IEEE Design Automation Conference (DAC)

  • 2001 38th ACM/IEEE Design Automation Conference (DAC)

  • 2000 37th ACM/IEEE Design Automation Conference (DAC)

  • 1999 36th ACM/IEEE Design Automation Conference (DAC)

  • 1998 35th ACM/IEEE Design Automation Conference (DAC)

  • 1997 34th ACM/IEEE Design Automation Conference (DAC)

  • 1996 33rd ACM/IEEE Design Automation Conference (DAC)


2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science andtechnology research development and applications. The list of program topics includes but isnot limited to: Measurement Science & Education, Measurement Systems, Measurement DataAcquisition, Measurements of Physical Quantities, and Measurement Applications.


2020 IEEE Power & Energy Society General Meeting (PESGM)

The Annual IEEE PES General Meeting will bring together over 2900 attendees for technical sessions, administrative sessions, super sessions, poster sessions, student programs, awards ceremonies, committee meetings, tutorials and more


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Periodicals related to Voltage Fluctuations

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Automation Science and Engineering, IEEE Transactions on

The IEEE Transactions on Automation Sciences and Engineering (T-ASE) publishes fundamental papers on Automation, emphasizing scientific results that advance efficiency, quality, productivity, and reliability. T-ASE encourages interdisciplinary approaches from computer science, control systems, electrical engineering, mathematics, mechanical engineering, operations research, and other fields. We welcome results relevant to industries such as agriculture, biotechnology, healthcare, home automation, maintenance, manufacturing, pharmaceuticals, retail, ...


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Device and Materials Reliability, IEEE Transactions on

Provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the ...


Electron Device Letters, IEEE

Publishes original and significant contributions relating to the theory, design, performance and reliability of electron devices, including optoelectronic devices, nanoscale devices, solid-state devices, integrated electronic devices, energy sources, power devices, displays, sensors, electro-mechanical devices, quantum devices and electron tubes.


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Most published Xplore authors for Voltage Fluctuations

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Xplore Articles related to Voltage Fluctuations

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Analysing grid impact of voltage fluctuations from multiple sources with/without STATCOM

2017 IEEE International Conference on Environment and Electrical Engineering and 2017 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe), 2017

This paper investigates the voltage fluctuations determined by industry perturbing loads in a power system, with and without a STATCOM device in operation. The monitoring campaign was carried on by simultaneously measuring the voltage fluctuations in various points of the supplying power system, for revealing each perturbing customer contribution, and the background flicker. During the measuring campaign, the STATCOM was ...


Applications of neural networks for the power quality factors measurement - i.e. voltage fluctuations

2009 10th International Conference on Electrical Power Quality and Utilisation, 2009

It can be shown, that many flickermeters do not yield credible output readings although the manufacturers declare their compliance with the requirements of standard IEC 61000-4-15. Modifications or revisions to the standard and increasing the number of requirements, what is currently taking place, seem to be interim actions, whose results are dubious. On the other hand, it should be acknowledged ...


Description of Voltage Fluctuations in LV Power Network with The Use of P<sub><i>st</i></sub> Indicator And Voltage Fluctuation Indices

2008 13th International Conference on Harmonics and Quality of Power, 2008

The paper presents two measures of voltage variations in a power network: Pst indicator and voltage fluctuations indices. A differences between the two measures are revealed by the comparison. Also, an obnoxious voltage fluctuations in LV circuit are described. It is displayed that the measures used to characterize voltage fluctuations should enable identification of noxious receivers. The analysis of circuit ...


Analysis of Voltage Fluctuations in Power Networks

IEEE Transactions on Instrumentation and Measurement, 2008

Voltage fluctuations analysis is one of the basic elements of power quality assessment in the power network. Presently, two voltage fluctuations measures are used-voltage fluctuations indexes and short-term <i>Pst</i> and long-term <i>Plt</i> flicker severity indicators. The voltage fluctuations indexes describe the variability of the root-mean-square (rms) value by means of the amplitude and the frequency. <i>Pst</i> and <i>Plt</i> indicators are ...


Development of SVC control for suppressing voltage fluctuations

8th International Conference on Power Electronics - ECCE Asia, 2011

This paper describes control methods for a line-commutated static var compensator (SVC) and a self-commutated SVC to suppress voltage fluctuations of electric arc furnaces (EAFs) for steel making. In these control methods, the line-commutated SVC and the self-commutated SVC compensate for the fluctuations of the reactive power effectively within their respective rated capacities. This paper also presents practical examples of ...


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Educational Resources on Voltage Fluctuations

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IEEE.tv Videos

Voltage Metrology with Superconductive Electronics
APEC 2011-Intersil Promo Apec 2011
Infineon Technologies: Power Efficiency from Generation to Consumption
26th Annual MTT-AP Symposium and Mini Show - Dr. Ajay Poddar
IEEE Milestone S&C Electric company
Overview of UC Berkeley Resistance Grounded Campus Power System
ON-CHIP VOLTAGE AND TIMING DIAGNOSTIC CIRCUITS
ISEC 2013 Special Gordon Donaldson Session: Remembering Gordon Donaldson - 6 of 7 - A high sensitive magnetometer system for natural magnetic field measurements
The Josephson Effect: The Josephson Volt
Agilent: Test up to 1500 amps and 10,000 volts!
On the Characterization of Thermal Coupling Resistance in a Current Mirror: RFIC Industry Showcase 2016
Multi-Standard 5Gbps to 28.2Gbps Adaptive, Single Voltage SerDes Transceiver with Analog FIR and 2-Tap Unrolled DFE in 28nm CMOS: RFIC Interactive Forum 2017
High Efficiency Supply-Modulated RF Power Amplifier for Handset Applications
A 32GHz 20dBm-PSAT Transformer-Based Doherty Power Amplifier for MultiGb/s 5G Applications in 28nm Bulk CMOS: RFIC Interactive Forum 2017
A 12-b, 1-GS/s 6.1mW Current-Steering DAC in 14nm FinFET with 80dB SFDR for 2G/3G/4G Cellular Application: RFIC Industry Showcase 2017
IEEE Day Future Milestones: 100% Renewable Energy penetration Is Possible
A Fully-Integrated SOI CMOS Complex-Impedance Detector for Matching Network Tuning in LTE Power Amplifier: RFIC Interactive Forum
A Low Power High Performance PLL with Temperature Compensated VCO in 65nm CMOS: RFIC Interactive Forum
ASC-2014 SQUIDs 50th Anniversary: 2 of 6 - John Clarke - The Ubiquitous SQUID
CIRCUIT DESIGN USING FINFETS

IEEE-USA E-Books

  • Analysing grid impact of voltage fluctuations from multiple sources with/without STATCOM

    This paper investigates the voltage fluctuations determined by industry perturbing loads in a power system, with and without a STATCOM device in operation. The monitoring campaign was carried on by simultaneously measuring the voltage fluctuations in various points of the supplying power system, for revealing each perturbing customer contribution, and the background flicker. During the measuring campaign, the STATCOM was in/out of operation for revealing its influence on flicker reduction. Mitigation equipments are considered for reducing flicker level, each perturbing load contribution to the total investment function of the perturbing level.

  • Applications of neural networks for the power quality factors measurement - i.e. voltage fluctuations

    It can be shown, that many flickermeters do not yield credible output readings although the manufacturers declare their compliance with the requirements of standard IEC 61000-4-15. Modifications or revisions to the standard and increasing the number of requirements, what is currently taking place, seem to be interim actions, whose results are dubious. On the other hand, it should be acknowledged that since over ten years the standardization of voltage fluctuations is based on the UIE flickermeter. The author idea is to treat a flickermeter - from its analogue input to the output of block 4 - as a black box, filled in by a designer accordingly to its decision, while maintaining the IN/OUT characteristics in conformity with those of the flickermeter regarded as a standard one. These instructions give you basic guidelines for preparing camera-ready papers for conference proceedings.

  • Description of Voltage Fluctuations in LV Power Network with The Use of P<sub><i>st</i></sub> Indicator And Voltage Fluctuation Indices

    The paper presents two measures of voltage variations in a power network: Pst indicator and voltage fluctuations indices. A differences between the two measures are revealed by the comparison. Also, an obnoxious voltage fluctuations in LV circuit are described. It is displayed that the measures used to characterize voltage fluctuations should enable identification of noxious receivers. The analysis of circuit properties is performed using exemplary measuring results. A periodic increases of Pst indicator value are observed (that evident the increase of obnoxiousness of voltage fluctuations). On the basis of the analysis of voltage fluctuations indices it is showed that the increases of Pst indicator value may be caused by different factors: increase of the amplitude or the frequency of voltage fluctuations. The time plots of Pst, amplitude and frequency of voltage fluctuations are compared with a time plots of maximal and minimal values of phase currents. On this basis it is proved that sources of obnoxious voltage fluctuations are supplied by the analyzed LV circuit. Moreover, a data that specify the receivers that cause the voltage variations (current variations and frequency of voltage fluctuations) are obtained.

  • Analysis of Voltage Fluctuations in Power Networks

    Voltage fluctuations analysis is one of the basic elements of power quality assessment in the power network. Presently, two voltage fluctuations measures are used-voltage fluctuations indexes and short-term <i>Pst</i> and long-term <i>Plt</i> flicker severity indicators. The voltage fluctuations indexes describe the variability of the root-mean-square (rms) value by means of the amplitude and the frequency. <i>Pst</i> and <i>Plt</i> indicators are used for the assessment of flicker obnoxiousness. This paper includes the comparison of both measures showing, beside definition differences, various diagnostic possibilities.

  • Development of SVC control for suppressing voltage fluctuations

    This paper describes control methods for a line-commutated static var compensator (SVC) and a self-commutated SVC to suppress voltage fluctuations of electric arc furnaces (EAFs) for steel making. In these control methods, the line-commutated SVC and the self-commutated SVC compensate for the fluctuations of the reactive power effectively within their respective rated capacities. This paper also presents practical examples of both SVCs for suppressing voltage fluctuations. In the actual operation of EAFs and SVCs, the authors verified that each SVC effectively suppressed the voltage fluctuations at the point of common coupling.

  • Probability density calculation of step pulse responses at a 3-D IC channel with supply voltage fluctuations

    Causal transient step responses at a silicon interposer channel and at a wire- bond channel are calculated from the channel transfer functions obtained in frequency domain. Also, the probability densities of the step response with supply voltage fluctuations are analytically calculated.

  • Evaluating voltage fluctuations and flicker using half-cycle RMS values

    Evaluating voltage fluctuations and flicker using simulated or recorded data is an important part of the planning process related to power quality. Simulation tools perform calculations using sinusoidal steady-state models and methods and numerous power quality recorders save RMS values on a cycle by cycle basis. Previous work has shown the feasibility of using cycle-by-cycle RMS values as inputs to the standard flickermeter as long as the fluctuation frequency was below 10 Hz. The work in this paper is based on the same concept of using full-cycle RMS values as flickermeter inputs, but the RMS values are updated every half-cycle in accordance with IEC Std 61000-4-30. Using RMS inputs which are updated every half-cycle is shown to offer an increase in performance such that satisfactory results are obtained for fluctuation frequencies up to 22 Hz. This improvement is demonstrated using analytical, simulated, and field measurements results.

  • Measurement analysis about the impact of electrified railway on grid voltage fluctuations and countermeasure research

    As the electrified railway is put into operation, the train has to frequently switch operating conditions among starting, accelerating, idle running and braking. As a result, the traction load would fluctuate greatly, which might cause grid voltage fluctuations and affect the operation of adjacent voltage- sensitive load. In this paper, based on the electrical railway traction load model, simulation analysis of the voltage fluctuation characteristics caused by electrified railway traction load is carried out. Moreover, a large amount of power quality measured data is available for model validation. The dynamic reactive power compensation strategy is proposed. Besides, according to the power quality monitoring data, some power quality problems caused by Long-Hai traction load to some sensitive loads are analyzed in detailed and a quantitative analysis of the impact of Long-hai Electric Railway operating on the grid voltage fluctuation is conducted. Furthermore, the traction load two- phase SVG for power quality compensation is proposed and the corresponding simulation results are given out. Finally, the grid operation mode adjustment suggestion is presented, including cutting sensitive load, the pollution load dispersion, load adjustment in maintenance mode and so forth.

  • Random dopant induced threshold voltage fluctuations in double gate MOSFETs

    A study by means of analytical modeling and simulation analysis on random dopant induced double gate MOSFET threshold voltage fluctuations is presented. Analytical models describing the standard deviation of threshold voltage distribution associated with dopant fluctuation are derived. The effects of various double gate MOSFET design parameters, including the doping concentration, oxide thickness, silicon thickness on the threshold voltage fluctuations arc studied. The analytical models predict the general trends in threshold voltage fluctuations. The effect of dopant position fluctuation is also studied. Analytical models and simulations show that double gate MOSFET can suppress the impact of random dopant fluctuation on threshold voltage variations compared with single gate MOSFET.

  • Flicker attenuation - Part I: Response of three-phase induction motors to regular voltage fluctuations

    Voltage fluctuations leading to lamp flicker that originate in one place in a power system tend to propagate to other parts of the network with some level of attenuation depending on the network impedances and the loads connected. Numerous sub synchronous type frequency components exist in these voltage fluctuations that are responsible for lamp flicker. The rudimentary theory and the experimental measurements support the idea that industrial load bases which contain a large percentage of mains connected induction motors tend to attenuate flicker better compared to residential load bases having mainly passive loads. This paper reports on the response of three phase induction motors of several sizes when subjected to low frequency voltage fluctuations, firstly the case where a balanced single frequency component is superimposed on the mains voltage and secondly the case where the mains voltage is sinusoidally amplitude modulated, a scheme that is frequently used in flicker related work. Small signal models are presented that will enable systematic understanding of the behaviour which is verified using large signal models.



Standards related to Voltage Fluctuations

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IEEE Guide for the Functional Specification of Medium Voltage (1- 35kV) Electronic Series Devices for Compensation of Voltage Fluctuations

This document provides general guidelines for the preparation of a functional specification for solid state electronic devices used mainly for compensation of voltage fluctuation. The guide covers devices rated to medium voltage (1 kV-35 kV). This device contains in general :an inverter, rectifier or dc to dc converter, energy storage device, injection transformer connected in series with the load and ...


IEEE Recommended Practice for Measurement and Limits of Voltage Fluctuations and Associated Light Flicker on AC Power Systems

The scope of this project is to develop a recommended practice for measuring voltage fluctuations on AC power systems including a measurement protocol. Recommend limits for the voltage fluctuations using the recommended protocol.



Jobs related to Voltage Fluctuations

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