Conferences related to Separable Connectors

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2020 IEEE/PES Transmission and Distribution Conference and Exposition (T&D)

Bi-Annual IEEE PES T&D conference. Largest T&D conference in North America.


2019 IEEE SENSORS

The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2018 IEEE SENSORS

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their relatedfields. It brings together researchers, developers, and practitioners from diverse fields includinginternational scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.

  • 2017 IEEE SENSORS

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their relatedfields. It brings together researchers, developers, and practitioners from diverse fields includinginternational scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.

  • 2016 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2015 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fieldsincluding international scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.

  • 2014 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, andexchange of state -of-the art information including the latest research and development in sensors andtheir related fields. It brings together researchers, developers, and practitioners from diverse fieldsincluding international scientists and engineers from academia, research institutes, and companies topresent and discuss the latest results in the general field of sensors.

  • 2013 IEEE Sensors

    The IEEE SENSORS Conference is a forum for presentation, discussion, and exchange of state -of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2012 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors.

  • 2011 IEEE Sensors

    The IEEE Sensors Conference is a forum for presentation, discussion, and exchange of state-of-the art information including the latest research and development in sensors and their related fields. It brings together researchers, developers, and practitioners from diverse fields including international scientists and engineers from academia, research institutes, and companies to present and discuss the latest results in the general field of sensors. IEEE SENSORS 2011 will include keynote addresses by eminen

  • 2010 IEEE Sensors

    The IEEE SENSORS 2010 Conference is a forum for state-of-the-art presentations on sensors and related topics covering from theory to application, device to system, modeling to implementation and from macro/nano to scale.

  • 2009 IEEE Sensors

    IEEE Sensors Conference 2009 is intended to provide a common forum for researchers, scientists, engineers and practitioners throughout the world to present their latest research findings, ideas, developments and applications in the area of sensors and sensing technology. IEEE Sensors Conference 2009 will include keynote addresses by eminent scientists as well as special, regular and poster sessions.

  • 2008 IEEE Sensors

    IEEE SENSORS 2008 solicits original and state-of-the-art contributions to sensors and related topics, covering from theory to application, from device to system, from modeling to implementation, and from macro to micro/nano in scale. Topics of interest include,but are not limitid to: Phenomena, Modeling, and Evaluation (Novel Sensing Principles, Theory and Modeling, Sensors Characterization, Evaluation and Testing, Data Handling and Mining) Chemical and Gas Sensors (Materials, Devices, Electronics N

  • 2007 IEEE Sensors

    IEEE SENSORS 2007 solicits original and state-of-the-art contributions to sensors and related topics, covering from theory to application, from device to system, from modeling to implementation, and from macro to micro/nano in scale.

  • 2006 IEEE Sensors

  • 2005 IEEE Sensors

  • 2004 IEEE Sensors

  • 2003 IEEE Sensors

  • 2002 IEEE Sensors


2018 IEEE Holm Conference on Electrical Contacts

The Holm conference provides a forum for the presentation and discussion of the latest developments in the field of electric contacts and the application of recent advances in materials and processes in electric, electronic and telecommunication equipment.


2017 IEEE Conference on Electrical Insulation and Dielectric Phenomenon (CEIDP)

The Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) is sponsored by the IEEE Dielectrics and Electrical Insulation Society to provide an international forum for the discussion of research on dielectric phenomena and measurements. The conference provides an opportunity for specialists from around the world to meet and exchange their experience.Topics of interest to the Conference include:•Aging •Biodielectrics •Outdoor insulation •Surface flashover •Polarization phenomena •Measurement techniques •Partial discharge measurements •Flow electrification •Charge storage and transport •Electrohydrodynamics •High-field effects •Charge and field mapping •Treeing •Prebreakdown and breakdown in solids, liquids, gases, and vacuum


2017 IEEE International Conference on Information and Automation (ICIA)

Information and automation science, engineering and applications



Periodicals related to Separable Connectors

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Components and Packaging Technologies, IEEE Transactions on

Component parts, hybrid microelectronics, materials, packaging techniques, and manufacturing technology.


Fuzzy Systems, IEEE Transactions on

Theory and application of fuzzy systems with emphasis on engineering systems and scientific applications. (6) (IEEE Guide for Authors) Representative applications areas include:fuzzy estimation, prediction and control; approximate reasoning; intelligent systems design; machine learning; image processing and machine vision;pattern recognition, fuzzy neurocomputing; electronic and photonic implementation; medical computing applications; robotics and motion control; constraint propagation and optimization; civil, chemical and ...


Industry Applications, IEEE Transactions on

The development and application of electric systems, apparatus, devices, and controls to the processes and equipment of industry and commerce; the promotion of safe, reliable, and economic installations; the encouragement of energy conservation; the creation of voluntary engineering standards and recommended practices.


Microelectromechanical Systems, Journal of

A journal covering Microsensing, Microactuation, Micromechanics, Microdynamics, and Microelectromechanical Systems (MEMS). Contains articles on devices with dimensions that typically range from macrometers to millimeters, microfabrication techniques, microphenomena; microbearings, and microsystems; theoretical, computational, modeling and control results; new materials and designs; tribology; microtelemanipulation; and applications to biomedical engineering, optics, fluidics, etc. The Journal is jointly sponsored by the IEEE Electron Devices ...


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Most published Xplore authors for Separable Connectors

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No authors for "Separable Connectors"


Xplore Articles related to Separable Connectors

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Mating mechanics and stubbing of separable connectors

1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206), 1998

This paper presents a theory of mating mechanics for separable connectors based mainly on the assumption that the force-deflection relationship of a contact spring is linear-elastic. With this assumption, the force-deflection relationship of the contact can be expressed in terms of the flexibility influence coefficients. By establishing a so called contact compatibility condition and by using Taylor's expansion, the expression ...


Low-power voltage transformers for use with separable connectors in MV secondary gas-insulated switchgear: new challenge for standardisation

CIRED - Open Access Proceedings Journal, 2017

This study deals with low-power voltage transformers (LPVT) installed together with a separable connector inside medium-voltage (MV), gas-insulated switchgear (GIS). It describes tests defined by existing standards for each of these components and points out issues the user might be facing when testing only according to these standards. The authors recommend extending LPVT type tests to additional tests specific to ...


IEEE Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors

IEEE Std 592-2018 (Revision of IEEE Std 592-2007), 2018

Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifi cally 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.


IEEE Draft Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors

IEEE P592/D2, March 2018, 2018

Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifi cally 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.


IEEE Draft Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors

IEEE P592/D1, December 2017, 2018

Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifi cally 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.


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Educational Resources on Separable Connectors

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IEEE-USA E-Books

  • Mating mechanics and stubbing of separable connectors

    This paper presents a theory of mating mechanics for separable connectors based mainly on the assumption that the force-deflection relationship of a contact spring is linear-elastic. With this assumption, the force-deflection relationship of the contact can be expressed in terms of the flexibility influence coefficients. By establishing a so called contact compatibility condition and by using Taylor's expansion, the expression for the insertion force can be explicitly given as a function of the flexibility influence coefficients, friction coefficient, and angle of slope at the contact point. This explicit expression for the insertion force allows the establishment of a stubbing criterion. The theory developed does not require an iterative process to calculate the insertion force and it drastically simplifies the analyses of connector mating. Both analytical and numerical examples will be presented.

  • Low-power voltage transformers for use with separable connectors in MV secondary gas-insulated switchgear: new challenge for standardisation

    This study deals with low-power voltage transformers (LPVT) installed together with a separable connector inside medium-voltage (MV), gas-insulated switchgear (GIS). It describes tests defined by existing standards for each of these components and points out issues the user might be facing when testing only according to these standards. The authors recommend extending LPVT type tests to additional tests specific to separable connectors and to perform all type tests on LPVTs mated with a separable connector. The study proposes a specific set of tests to be included in a future standard for LPVTs. The authors propose this set of tests to make sure the separable connector is not affected by the LPVT installation and that it will work properly in this environment, without safety risks or effecting the performance of the LPVT and the separable connector.

  • IEEE Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors

    Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifi cally 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.

  • IEEE Draft Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors

    Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifi cally 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.

  • IEEE Draft Standard for Insulation Shields on Medium-Voltage (15 kV - 35 kV) Cable Joints and Separable Connectors

    Design tests for shield resistance, simulated touch current, and a simulated fault-current initiation for insulation shields used on cable accessories, specifi cally 15 kV through 35 kV class joints, and separable insulated connectors are covered in this standard.

  • Conflict between IEEE 386 and ASTM F855, the connector manufacturer's perspective-separable connectors used as grounding devices

    The apparent conflict between the requirements in IEEE 386 and ASTM F855 may not be easy to resolve in terms of providing a separable connector product that meets the requirements of both standards in their current form. The separable connector interface provides interchangeability between products from different manufacturers, a feature that has lead to the successful application of the device. Design constraints placed by the interface and the need for easy operability under typical field conditions will not allow the separable connector to achieve the ratings required in ASTM F855, the technology is currently not available. A solution will have to come from changes in the standards that take into consideration what is technologically feasible.

  • Effects Of Electrical And Thermal Aging On Separable Connectors

    To date the majority of the aging tests performed on separable connectors consisted of aging samples at a voltage much higher than its rated voltage. This information was used to calculate the equivalent life of the samples at rated voltage. This paper discusses improvements to the aging test to obtain more useful information. Samples were tested at a higher than rated voltage and were subjected to an elevated temperature on the dielectric aging of the separable connector. Other tests were run to determine the effect of moisture on the separable connectors. This leads to a more complete test of the performance of separable connectors, and will allow designers to predict the field performance of separable connectors more completely.

  • Aging Characteristics of Silicone Greases in Assembled Premolded Separable Connectors

    A test method was developed for evaluating silicone greases for use with premolded separable connectors. The method involves 90°C aging of 15W loadbreak elbow-bushing insert combinations, making periodic measurements of the disassembly force, and observing any physical changes in the greases. Disassembly forces initially rise rapidly, then more slowly and may decrease somewhat thereafter. Most do not exceed a maximum allowable limit of 200 lbs. Physical changes (oil separation, caking) are more indicative of grease failure. Selection of a grease should be based on both disassembly force and physical observation of samples aged for a minimum of one year.

  • Use of anisotropically conductive elastomers in high density separable connectors

    Tests performed on a simulated high-density, separable connector that uses a flex circuit backed by a compliant elastomer as a substrate for one set of contacts and a rigid backplane as a substrate for the other set are described. A 10-mil-thick sheet of elastomeric conductive polymer interconnect (EECPI) material was placed between the pair of contact arrays. The ECPI material is an anisotropically conductive elastomer that conducts in the Z direction only. Three types of backplane were used in the tests: a flat backplane, a backplane with a bow of 12 mil across a distance of 3 in, and a backplane with a large, randomly selected portion of the contacts raised 1.5 mil above the other contacts. The properties and other advantages of the elastomer-backed flex/ECPI combination as well as some of the problems to be overcome in the design of high-density, separable connectors incorporating this approach are discussed.<<ETX>>

  • Aging Characteristics of Silicone Greases in Assembled Premolded Separable Connectors

    None



Standards related to Separable Connectors

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IEEE Guide for Investigating and Analyzing Power Cable, Joint, and Termination Failures on Systems Rated 5 kV Through 46 kV

This guide will discuss the importance of failure analysis on cable, joints and terminations used in power systems rated 5kV through 46kV. Users shoudl review the definitions, and technical papers that are listed in the References and in the Bibliography to gain an understanding of failure analysis issues. Why a cable, joint, or termination fails is an important part of ...


IEEE Guide for the Application of Separable Insulated Connectors

This guide provides general information on the application and operation of separable connectors. It is intended to be basic, and supplement the manufacturer's specific recommendations and established utility practices.


IEEE Guide for the Application of Separable Insulated Connectors

This guide provides general information on the application and operation of separable connectors. It is intended to be basic, and supplement the manufacturer's specific recommendations and established utility practices.


IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors

This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.


IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors

This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV.


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Jobs related to Separable Connectors

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