Conferences related to System Level Testing

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2021 IEEE/MTT-S International Microwave Symposium - IMS 2021

The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2006 IEEE/MTT-S International Microwave Symposium - MTT 2006

  • 2007 IEEE/MTT-S International Microwave Symposium - MTT 2007

  • 2008 IEEE/MTT-S International Microwave Symposium - MTT 2008

  • 2009 IEEE/MTT-S International Microwave Symposium - MTT 2009

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010

    Reports of research and development at the state-of-the-art of the theory and techniques related to the technology and applications of devices, components, circuits, modules and systems in the RF, microwave, millimeter-wave, submillimeter-wave and Terahertz ranges of the electromagnetic spectrum.

  • 2011 IEEE/MTT-S International Microwave Symposium - MTT 2011

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2012 IEEE/MTT-S International Microwave Symposium - MTT 2012

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2013 IEEE/MTT-S International Microwave Symposium - MTT 2013

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter -wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014

    IMS2014 will cover developments in microwave technology from nano devices to system applications. Technical paper sessions, interactive forums, plenary and panel sessions, workshops, short courses, industrial exhibits, and a wide array of other technical activities will be offered.

  • 2015 IEEE/MTT-S International Microwave Symposium - MTT 2015

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics. The IMS includes technical sessions, both oral and interactive, worksh

  • 2016 IEEE/MTT-S International Microwave Symposium - IMS 2016

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.

  • 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017

    The IEEE MTT-S International Microwave Symposium (IMS) is the premier conference covering basic technologies, to passives and actives components to system over a wide range of frequencies including VHF, UHF, RF, microwave, millimeter-wave, terahertz, and optical. The conference will encompass the latest in RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation, wireless systems, RFID and related topics.

  • 2018 IEEE/MTT-S International Microwave Symposium - IMS 2018

    Microwave theory and techniques, RF/microwave/millimeter-wave/terahertz circuit design and fabrication technology, radio/wireless communication.

  • 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019

    Comprehensive symposium on microwave theory and techniques including active and passive circuit components, theory and microwave systems.

  • 2029 IEEE/MTT-S International Microwave Symposium - IMS 2029

    The IEEE International Microwave Symposium (IMS) is the world s foremost conference covering the UHF, RF, wireless, microwave, millimeter-wave, terahertz, and optical frequencies; encompassing everything from basic technologies to components to systems including the latest RFIC, MIC, MEMS and filter technologies, advances in CAD, modeling, EM simulation and more. The IMS includes technical and interactive sessions, exhibits, student competitions, panels, workshops, tutorials, and networking events.


Oceans 2020 MTS/IEEE GULF COAST

To promote awareness, understanding, advancement and application of ocean engineering and marine technology. This includes all aspects of science, engineering, and technology that address research, development, and operations pertaining to all bodies of water. This includes the creation of new capabilities and technologies from concept design through prototypes, testing, and operational systems to sense, explore, understand, develop, use, and responsibly manage natural resources.

  • OCEANS '96

  • OCEANS '97

  • OCEANS '98

  • OCEANS '99

  • OCEANS 2000

  • OCEANS 2001

  • OCEANS 2002

  • OCEANS 2003

  • OCEANS 2004

  • OCEANS 2005

  • OCEANS 2006

  • OCEANS 2007

  • OCEANS 2008

    The Marine Technology Society (MTS) and the Oceanic Engineering Society (OES) of the Institute of Electrical and Electronic Engineers (IEEE) cosponsor a joint conference and exposition on ocean science, engineering, education, and policy. Held annually in the fall, it has become a focal point for the ocean and marine community to meet, learn, and exhibit products and services. The conference includes technical sessions, workshops, student poster sessions, job fairs, tutorials and a large exhibit.

  • OCEANS 2009

  • OCEANS 2010

    The Marine Technology Society and the Oceanic Engineering Scociety of the IEEE cosponsor a joint annual conference and exposition on ocean science engineering, and policy.

  • OCEANS 2011

    The Marine Technology Society and the Oceanic Engineering Scociety of the IEEE cosponsor a joint annual conference and exposition on ocean science engineering, and policy.

  • OCEANS 2012

    Ocean related technology. Tutorials and three days of technical sessions and exhibits. 8-12 parallel technical tracks.

  • OCEANS 2013

    Three days of 8-10 tracks of technical sessions (400-450 papers) and concurent exhibition (150-250 exhibitors)

  • OCEANS 2014

    The OCEANS conference covers four days. One day for tutorials and three for approx. 450 technical papers and 150-200 exhibits.

  • OCEANS 2015

    The Marine Technology Scociety and the Oceanic Engineering Society of the IEEE cosponor a joint annual conference and exposition on ocean science, engineering, and policy. The OCEANS conference covers four days. One day for tutorials and three for approx. 450 technical papers and 150-200 exhibits.

  • OCEANS 2016

    The Marine Technology Scociety and the Oceanic Engineering Society of the IEEE cosponor a joint annual conference and exposition on ocean science, engineering, and policy. The OCEANS conference covers four days. One day for tutorials and three for approx. 500 technical papers and 150 -200 exhibits.

  • OCEANS 2017 - Anchorage

    Papers on ocean technology, exhibits from ocean equipment and service suppliers, student posters and student poster competition, tutorials on ocean technology, workshops and town meetings on policy and governmental process.

  • OCEANS 2018 MTS/IEEE Charleston

    Ocean, coastal, and atmospheric science and technology advances and applications


2020 IEEE International Conference on Image Processing (ICIP)

The International Conference on Image Processing (ICIP), sponsored by the IEEE SignalProcessing Society, is the premier forum for the presentation of technological advances andresearch results in the fields of theoretical, experimental, and applied image and videoprocessing. ICIP 2020, the 27th in the series that has been held annually since 1994, bringstogether leading engineers and scientists in image and video processing from around the world.


2020 22nd European Conference on Power Electronics and Applications (EPE'20 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2020 IEEE International Conference on Robotics and Automation (ICRA)

The International Conference on Robotics and Automation (ICRA) is the IEEE Robotics and Automation Society’s biggest conference and one of the leading international forums for robotics researchers to present their work.



Periodicals related to System Level Testing

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Aerospace and Electronic Systems Magazine, IEEE

The IEEE Aerospace and Electronic Systems Magazine publishes articles concerned with the various aspects of systems for space, air, ocean, or ground environments.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Audio, Speech, and Language Processing, IEEE Transactions on

Speech analysis, synthesis, coding speech recognition, speaker recognition, language modeling, speech production and perception, speech enhancement. In audio, transducers, room acoustics, active sound control, human audition, analysis/synthesis/coding of music, and consumer audio. (8) (IEEE Guide for Authors) The scope for the proposed transactions includes SPEECH PROCESSING - Transmission and storage of Speech signals; speech coding; speech enhancement and noise reduction; ...


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...



Most published Xplore authors for System Level Testing

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Xplore Articles related to System Level Testing

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Design verification techniques for system level testing using ASIC level BIST implementations

Sixth Annual IEEE International ASIC Conference and Exhibit, 1993

Requirements and design verification techniques for system level testing using BIST implementations in ASICs are discussed. A logic simulation technique is presented which determines whether reproducable BIST results can be obtained during system level testing. Using this approach, problems which could lead to nonreproducible BIST results during system level testing can be easily identified and corrected during device level of ...


EMC mobile facility for system level testing of an aircraft

Proceedings of the International Conference on Electromagnetic Interference and Compatibility, 1999

An Integrated EMC Mobile Test Facility (IEMTF) has been designed and developed for system level testing of an aircraft in lieu of dedicated Anechoic Test Facility (ATF). This facility essentially consists of Radiated Emission (RE), Radiated Susceptibility (RS), Bulk Current Injection (BCI), and Ground Plane Interference (GPI) test systems, housed in a mobile shielded shelter. In this paper the system ...


Adaptive test method on production system-level testing (SLT) to optimize test cost, resources and defect parts per million (DPPM)

2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), 2018

As monolithic SOCs keep adding more and more IPs, the resultant test cost to augment overall coverage to be within committed outgoing defect parts per million (DPPM) becomes a challenge. The reliance on system-level testing (SLT) for additional coverage to keep outgoing DPPM within acceptable level is now becoming a norm. The challenge is always on how to keep SLT ...


Thermal design considerations in system level testing of electronic devices

2010 11th International Conference on Electronic Packaging Technology & High Density Packaging, 2010

System level testing requires precise thermal control of electronic devices under dynamic loads at prescribed test temperatures. Thermal design considerations for all the thermal components, including liquid cooler, thermoelectric module (TEM), solid thermal interface material and TEM holder, are presented and discussed. Whereas the nominal power has been mostly used for initial selection of the TEM, a system approach should ...


System level testing of analog functions in a mixed-signal circuit

ICECS 2000. 7th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.00EX445), 2000

This paper outlines the problems of testing analog circuits in general and those in a mixed-signal integrated circuit in particular. It proposes a system level testing technique based on the excitation of the circuit-under-test with a pseudo-random binary sequence and subsequent estimation of its impulse response. The fault detection capability of the test and data analysis methods are demonstrated by ...



Educational Resources on System Level Testing

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IEEE-USA E-Books

  • Design verification techniques for system level testing using ASIC level BIST implementations

    Requirements and design verification techniques for system level testing using BIST implementations in ASICs are discussed. A logic simulation technique is presented which determines whether reproducable BIST results can be obtained during system level testing. Using this approach, problems which could lead to nonreproducible BIST results during system level testing can be easily identified and corrected during device level of design,.<<ETX>>

  • EMC mobile facility for system level testing of an aircraft

    An Integrated EMC Mobile Test Facility (IEMTF) has been designed and developed for system level testing of an aircraft in lieu of dedicated Anechoic Test Facility (ATF). This facility essentially consists of Radiated Emission (RE), Radiated Susceptibility (RS), Bulk Current Injection (BCI), and Ground Plane Interference (GPI) test systems, housed in a mobile shielded shelter. In this paper the system level EMC requirements for aircraft testing have been derived from MIL-STD 464 and related documents. Accordingly the IEMTF has been designed to meet these requirements in the absence of a sophisticated ATF. The details of various test systems with their performance and calibration procedures required in the Open Air Test Site (OATS) for aircraft level EMC testing has been critically discussed in this paper.

  • Adaptive test method on production system-level testing (SLT) to optimize test cost, resources and defect parts per million (DPPM)

    As monolithic SOCs keep adding more and more IPs, the resultant test cost to augment overall coverage to be within committed outgoing defect parts per million (DPPM) becomes a challenge. The reliance on system-level testing (SLT) for additional coverage to keep outgoing DPPM within acceptable level is now becoming a norm. The challenge is always on how to keep SLT within a minimal test time budget to keep test cost low. This paper explains how an adaptive test method was successfully implemented on a SLT platform which intelligently applies different test contents per part based on its DPPM risk tag.

  • Thermal design considerations in system level testing of electronic devices

    System level testing requires precise thermal control of electronic devices under dynamic loads at prescribed test temperatures. Thermal design considerations for all the thermal components, including liquid cooler, thermoelectric module (TEM), solid thermal interface material and TEM holder, are presented and discussed. Whereas the nominal power has been mostly used for initial selection of the TEM, a system approach should be utilized in the design analysis and optimization of the thermal control unit. Based on computational and analytical approaches, the test hardware can be improved through the adoption of better TEM cooling capacity, more compact liquid cooler, thermally enhanced solid thermal interface material, and tapering TEM holder.

  • System level testing of analog functions in a mixed-signal circuit

    This paper outlines the problems of testing analog circuits in general and those in a mixed-signal integrated circuit in particular. It proposes a system level testing technique based on the excitation of the circuit-under-test with a pseudo-random binary sequence and subsequent estimation of its impulse response. The fault detection capability of the test and data analysis methods are demonstrated by simulation results. It also shows a feasible test structure that can be incorporated on chip to test the analog functions.

  • An ASIC level BIST implementation for system level testing

    The architecture and operation of a built-in self-test (BIST) implementation at the ASIC level for use at manufacturing unit level testing and system diagnostics is described. Analysis of this BIST approach is given in terms of area overhead, fault coverage, reduction in manufacturing testing costs, and reduction in system diagnostic execution time.<<ETX>>

  • ESD event receiver for system level testing

    We have developed a new test method for capturing discharge parameters. Discharges are measured from quasi static sources such as sensitive products or other charged objects in contrast to producing ESD pulses. By this test method protective actions can be based on discharge parameters of the case specific sources.

  • System-level testing assignment for hypercubes with lower fault bounds

    The maximum allowed number of faulty processors in an n-dimensional hypercube system is n under PMC model for diagnosis. When the n fault bound is adopted, all links will be used to perform diagnosis. However, if the fault bound is lower than n, many links can be freed from the task of performing diagnosis. In this paper, we show that each drop of the fault bound by 1 can free 2/sup n-1/ links from diagnosis. We present an algorithm that selects, in a systematic way, the to-be-freed links. For a fault-bound-drop by k, the proposed algorithm will produce an (n-k)-diagnosable system that remains connected and symmetrically structured. The freed links will never be used for the purpose of diagnosis, so that the diagnosis and some normal computation can be carried out simultaneously, improving the performance of the system as a whole.<<ETX>>

  • Some aspects of bulk cable current injection (BCCI) test method at system level testing of an aircraft

    The Bulk Cable Current Injection (BCCI) testing, at equipment/subsystems/system level has been recognised as a promising technique in lieu of radiated susceptibility testing upto few hundreds of MHz. Although it is an efficient technique for the evaluation of electromagnetic susceptibility (EMS) of the system, but at the same time due to its instrumentation particularly bulky and heavy current injection and monitoring probes, put a restriction to the use of BCCI, in the integrated system testing. In this paper, the use of BCCI test facility for integrated aircraft testing has been critically analysed and discussed. Problems which may arise due to the generation of strong harmonic products up to HF band in BCCI testing also have been discussed with their solutions.

  • System Level Testing via TLM 2.0 Debug Transport Interface

    With the rapid increase in the complexity of digital circuits, the design abstraction level has to grow to face the new needs of system designers in the early phases of the design process. Along with this evolution, testing and test facilities should be improved in the early stages of the design to provide the architecture with functional test facilities to be later synthesized testing infrastructures according to designer's requirements. These test infrastructures could be translated, into testing facilities at lower levels of abstraction, from which automatic synthesis tools are available. Starting from the increasing use of TLM in hardware design industry, the paper aims at providing a mechanism to fill the gap between the design abstraction level and the level in which testing methodologies are applied. To do the job, the TLM 2.0 ¿debug transport interface¿ is used and methods are introduced to synthesize it into known test access methods at RTL.



Standards related to System Level Testing

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IEEE Guide for Synthetic Fault Testing of AC High-Voltage Circuit Breakers Rated on a Symmetrical Current Basis


IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information

The scope of this trial-use standard is the definition of an exchange format, using eXtensible Markup Language (XML), for identifying all of the hardware, software, and documentation that may be used to test and diagnose a UUT on an automatic test system (ATS).


IEEE Standard for Metal-Oxide Surge Arresters for AC Power Circuits (>1 kV) Amendment 1: Short-Circuit Tests for Station, Intermediate, and Distribution Arresters


IEEE Standard for Software Unit Testing


IEEE Standard for the Testing of Overhead Transmission and Distribution Line Hardware

This standard will cover the testing and acceptance requirements for overhead transmission and distribution line hardware.