Conferences related to Clock Generation Circuitry

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2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)

The conference program will consist of plenary lectures, symposia, workshops and invitedsessions of the latest significant findings and developments in all the major fields of biomedical engineering.Submitted papers will be peer reviewed. Accepted high quality papers will be presented in oral and postersessions, will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE


2020 IEEE 70th Electronic Components and Technology Conference (ECTC)

ECTC is the premier international conference sponsored by the IEEE Components, Packaging and Manufacturing Society. ECTC paper comprise a wide spectrum of topics, including 3D packaging, electronic components, materials, assembly, interconnections, device and system packaging, optoelectronics, reliability, and simulation.


2020 IEEE International Solid- State Circuits Conference - (ISSCC)

ISSCC is the foremost global forum for solid-state circuits and systems-on-a-chip. The Conference offers 5 days of technical papers and educational events related to integrated circuits, including analog, digital, data converters, memory, RF, communications, imagers, medical and MEMS ICs.


2020 IEEE International Symposium on Circuits and Systems (ISCAS)

The International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems (CAS) Society and the world’s premier networking and exchange forum for researchers in the highly active fields of theory, design and implementation of circuits and systems. ISCAS2020 focuses on the deployment of CASS knowledge towards Society Grand Challenges and highlights the strong foundation in methodology and the integration of multidisciplinary approaches which are the distinctive features of CAS contributions. The worldwide CAS community is exploiting such CASS knowledge to change the way in which devices and circuits are understood, optimized, and leveraged in a variety of systems and applications.


2020 IEEE International Test Conference (ITC)

International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards, and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis, and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2019 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems – covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers

  • 2018 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification and validation, test (DFT, ATPG, and BIST), diagnosis, failure analysis and back to process, yield, reliability and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2017 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2016 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world's premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2015 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek

  • 2014 IEEE International Test Conference (ITC)

    ITC is the world's premier conference dedicated to electronic test technology, covering the complete cycle from design verification, test, diagnosis, failure analysis back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges have been addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2013 IEEE International Test Conference (ITC)

    International Test Conference is the world

  • 2012 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, des

  • 2011 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers.

  • 2010 IEEE International Test Conference (ITC)

    ITC is the world's premier conference dedicated to electronic test technology, covering the complete cycle from design verification,test, diagnosis, failure analysis back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges have been addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2009 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm) events, is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers,

  • 2008 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm), is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

  • 2007 IEEE International Test Conference (ITC)

  • 2006 IEEE International Test Conference (ITC)

  • 2005 IEEE International Test Conference (ITC)

  • 2004 IEEE International Test Conference (ITC)

  • 2003 IEEE International Test Conference (ITC)

  • 2002 IEEE International Test Conference (ITC)

  • 2001 IEEE International Test Conference (ITC)

  • 2000 IEEE International Test Conference (ITC)

  • 1999 IEEE International Test Conference (ITC)

  • 1998 IEEE International Test Conference (ITC)

  • 1997 IEEE International Test Conference (ITC)

  • 1996 IEEE International Test Conference (ITC)


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Periodicals related to Clock Generation Circuitry

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Biomedical Circuits and Systems, IEEE Transactions on

The Transactions on Biomedical Circuits and Systems addresses areas at the crossroads of Circuits and Systems and Life Sciences. The main emphasis is on microelectronic issues in a wide range of applications found in life sciences, physical sciences and engineering. The primary goal of the journal is to bridge the unique scientific and technical activities of the Circuits and Systems ...


Biomedical Engineering, IEEE Transactions on

Broad coverage of concepts and methods of the physical and engineering sciences applied in biology and medicine, ranging from formalized mathematical theory through experimental science and technological development to practical clinical applications.


Circuits and Systems Magazine, IEEE


Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on

Methods, algorithms, and human-machine interfaces for physical and logical design, including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, and documentation of integrated-circuit and systems designs of all complexities. Practical applications of aids resulting in producible analog, digital, optical, or microwave integrated circuits are emphasized.


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Most published Xplore authors for Clock Generation Circuitry

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Xplore Articles related to Clock Generation Circuitry

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A 500 Mb/s 10/32 channel, 0.5 /spl mu/m CMOS VCSEL driver with built-in self-test and clock generation circuitry

Conference Proceedings. LEOS'98. 11th Annual Meeting. IEEE Lasers and Electro-Optics Society 1998 Annual Meeting (Cat. No.98CH36243), 1998

We have designed and fabricated 10 and 32 channel CMOS VCSEL driver ICs with built-in self-test and clock generation circuitry. The circuit design and silicon parts are available to the research community through the Optoelectronics Industry Association (OIDA).


A high-speed 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry

IEEE Journal of Selected Topics in Quantum Electronics, 1999

This paper describes the design, electrical, and optical test results for a high-speed 32-channel CMOS vertical-cavity surface emitting laser (VCSEL) driver integrated circuits with built-in self-test and clock generation circuitry. The circuit design and silicon parts are available to the research community through the Consortium for Optical and Optoelectronic Technologies in Computing (CO-OP) and the Optoelectronics Industry Association (OIDA). This ...


Formulation and validation of an energy dissipation model for the clock generation circuitry and distribution networks

VLSI Design 2001. Fourteenth International Conference on VLSI Design, 2001

Proliferation of mobile devices and increasing design complexity have made low power consumption one of the major factors guiding digital design. The clock distribution and generation circuitry forms a critical component of current synchronous digital systems and is known to consume around a quarter of the power budget of current microprocessors. We propose and validate a high level model for ...


Design of clock generation circuitry for high-speed subranging time-interleaved ADCs

2017 IEEE International Symposium on Circuits and Systems (ISCAS), 2017

A clock generation system for a 1GS/s 8-bit subranging time-interleaved analog-to-digital converter (ADC) is introduced. General timing considerations for time-interleaved ADCs are reviewed prior to describing the design methodology for a prototype ADC. This hybrid ADC architecture contains four time-interleaved combined sample-and-hold and capacitive digital-to-analog converter (SHDAC) circuits as front-end sample-and-hold for a flash stage and for a time-interleaved successive ...


A /spl Delta//spl Sigma/ DAC with reduced activity data weighted averaging and anti-jitter digital filter

Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005., 2005

A CMOS DAC with a 4th order digital DeltaSigma modulator achieves more than 94dB SFDR and 84dB SNDR for a conversion bandwidth of 2.2MHz and an over- sampling ratio of eight. A post modulator digital FIR filter increases jitter immunity and a reduced activity data-weighted-averaging (RADWA) scheme improves SFDR without any noticeable degradation in the SNDR. The prototype chip that ...


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Educational Resources on Clock Generation Circuitry

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IEEE.tv Videos

ON-CHIP VOLTAGE AND TIMING DIAGNOSTIC CIRCUITS
Silicon THz: an Opportunity for Innovation
A Precision 140MHz Relaxation Oscillator in 40nm CMOS with 28ppm/C Frequency Stability for Automotive SoC Applications: RFIC Interactive Forum 2017
SOC DESIGN METHODOLOGY FOR IMPROVED ROBUSTNESS
Maker Faire 2008: Spectrum's Digital Clock Contest Winner
Neuromorphic Mixed-Signal Circuitry for Asynchronous Pulse Processing Neuromorphic Mixed-Signal Circuitry for Asynchronous Pulse Processing - Peter Petre: 2016 International Conference on Rebooting Computing
High-Bandwidth Memory Interface Design
Synchronised 4-Phase Resonant Power Clock Supply for Energy Efficient Adiabatic Logic: IEEE Rebooting Computing 2017
Analog Devices SP4T RF MEMS Switch with Integrated Driver Circuitry for RF Instrumentation: MicroApps 2015 - Analog Devices
Robotic Governance Paving the Way for Generation 'R'
Co-design of Power Amplifier and Dynamic Power Supplies for Radar and Communications Transmitters
A Flexible Testbed for 5G Waveform Generation and Analysis: MicroApps 2015 - Keysight Technologies
IMS 2012 Microapps - The Next Generation of Communications Design, Validate, and Test Dr. Mark Pierpoint
IMS 2011 Microapps - Simulation and Evaluation of Communications Systems in Conformance With Third- and Fourth-Generation Wireless Standards
ITEC 2014: Next Generation Combat Vehicle Electrical Power Architecture Development
APEC 2015: KeyTalks - Solid State Lighting
The NESC: Engaging the Next Generation
IMS 2012 Microapps - Phase Noise Choices in Signal Generation: Understanding Needs and Tradeoffs Riadh Said, Agilent
IMS 2012 Microapps - Generation and Analysis Techniques for Cost-efficient SATCOM Measurements Richard Overdorf, Agilent
IMS 2014:Active 600GHz Frequency Multiplier-by-Six S-MMICs for Submillimeter-Wave Generation

IEEE-USA E-Books

  • A 500 Mb/s 10/32 channel, 0.5 /spl mu/m CMOS VCSEL driver with built-in self-test and clock generation circuitry

    We have designed and fabricated 10 and 32 channel CMOS VCSEL driver ICs with built-in self-test and clock generation circuitry. The circuit design and silicon parts are available to the research community through the Optoelectronics Industry Association (OIDA).

  • A high-speed 32-channel CMOS VCSEL driver with built-in self-test and clock generation circuitry

    This paper describes the design, electrical, and optical test results for a high-speed 32-channel CMOS vertical-cavity surface emitting laser (VCSEL) driver integrated circuits with built-in self-test and clock generation circuitry. The circuit design and silicon parts are available to the research community through the Consortium for Optical and Optoelectronic Technologies in Computing (CO-OP) and the Optoelectronics Industry Association (OIDA). This device is specifically targeted at users building VCSEL-based smart photonic system demonstrators. A ten-channel version of this driver chip is also available with the same functionality and performance.

  • Formulation and validation of an energy dissipation model for the clock generation circuitry and distribution networks

    Proliferation of mobile devices and increasing design complexity have made low power consumption one of the major factors guiding digital design. The clock distribution and generation circuitry forms a critical component of current synchronous digital systems and is known to consume around a quarter of the power budget of current microprocessors. We propose and validate a high level model for evaluating the energy dissipation of the clock distribution and generation circuitry. Our validation results show that our model is fairly accurate and will be suitable for use in architectural level energy simulators. We believe access to this model can precipitate further research at high-level design stages in optimizing the system clock power.

  • Design of clock generation circuitry for high-speed subranging time-interleaved ADCs

    A clock generation system for a 1GS/s 8-bit subranging time-interleaved analog-to-digital converter (ADC) is introduced. General timing considerations for time-interleaved ADCs are reviewed prior to describing the design methodology for a prototype ADC. This hybrid ADC architecture contains four time-interleaved combined sample-and-hold and capacitive digital-to-analog converter (SHDAC) circuits as front-end sample-and-hold for a flash stage and for a time-interleaved successive approximation stage, which minimizes the errors due to sampling time mismatches between the two stages. The associated clock signal generation techniques that enable this hybrid ADC design approach are presented in this paper, which range from particular non-overlapping clocks and extensive buffering to synchronous resetting for adjusting the order of the clock signals in each time-interleaved channel. The transistor- level and layout-level clock generation circuits were designed and simulated in 130nm CMOS technology, and consume 3.88mW from a 1.2V supply. The standard deviation of the timing skews between time-interleaved channels is less than 1ps based on Monte Carlo simulations. To evaluate the feasibility of the clock generation approach, post-layout simulations were conducted with the interconnected ADC core layout and routed clock generation circuits. The hybrid ADC achieved an effective number of bits (ENOB) of 7.39 with a sampling frequency of 1GHz and an input frequency close to the Nyquist rate.

  • A /spl Delta//spl Sigma/ DAC with reduced activity data weighted averaging and anti-jitter digital filter

    A CMOS DAC with a 4th order digital DeltaSigma modulator achieves more than 94dB SFDR and 84dB SNDR for a conversion bandwidth of 2.2MHz and an over- sampling ratio of eight. A post modulator digital FIR filter increases jitter immunity and a reduced activity data-weighted-averaging (RADWA) scheme improves SFDR without any noticeable degradation in the SNDR. The prototype chip that contains the RA-DWA circuitry, the core analog DAC, and the clock generation circuitry is built in 0.13 mum standard digital CMOS process. The analog and digital power consumptions are 70mW and 2mW respectively. The DAC area is 1times1.2 mm<sup>2</sup>

  • Asynchronous Adiabatic Logic

    Power clock generators (PCGs) are the prevalent overhead for the adiabatic systems and mutilate all the low-power advantage from the adiabatic logic part by consuming a large portion of the total power in the clock generation circuitry (Arsalan and Shams, 2005). In addition to the PCG issues, routing multiple clock phases for adiabatic circuits is not very convenient and raises a number of cost, performance and viability issues. To get rid of the problems related to clock generation and synchronous clock routing, a new solution namely asynchronous adiabatic logic (AAL) is proposed to combing the benefits of the adiabatic logic circuits with that of asynchronous logic systems. Going asynchronous not only eliminates the need of PCGs, hence all the problems associated with the generation and routing of the clocks, it also bring all the advantages intrinsically associated with an asynchronous design such as low power and reliable logical operation.

  • A 0.5-to-3 GHz software-defined radio receiver using sample domain signal processing

    A 0.5-to-3 GHz software-defined radio receiver leveraging Sampled Domain Signal Processing (SPSD) is demonstrated in a 65nm LP CMOS technology. The SDSP approach achieves band-pass filtering, harmonic rejection, and frequency translation simultaneously. Input impedance matching is achieved in an active translational loop that tracks the desired RF frequency. The chip includes a wideband frequency synthesizer, multi-phase nonoverlapping clock generation circuitry, bandgap and power supply regulators. It achieves out-of-band IIP3 &gt; 11.7 dBm, IIP2 &gt; 58 dBm, NF = 5.5 ~ 8.8 dB, and uncalibrated 3<sup>rd</sup> and 5<sup>th</sup> order harmonic rejections exceeding 47 dB and 52 dB, respectively.

  • A 0.25-to-2.25 GHz, 27 dBm IIP3, 16-Path Tunable Bandpass Filter

    A fully-differential, 16-path bandpass filter (BPF) is demonstrated with wide tuning range, high linearity for and wideband harmonic rejection. The reconfigurable filter and clock generation circuitry is fabricated in IBM 45 nm CMOS SOI. To cover a tuning range of one decade (250 MHz to 2250 MHz), a 16-path scheme eliminates harmonic aliasing component to 15th harmonic of the local oscillator. The BPF has a 3 dB bandwidth greater than 20 MHz and 0.9 dB insertion loss. The BPF also achieves high linearity with an out-of-band IIP 3 &gt; 27 dBm and P1dB &gt; 3 dBm. The BPF tolerates blockers to 9 dBm 1 dB desensitization point (B1dB).

  • Analysis of EMI dependence on signal duty and supplied voltage

    In this paper, we analyzed EMI dependence on signal duty ratio and power supplied voltage. The EMI levels of the chip-mounted modules were tested and the near-field and far-field emission levels were measured at 800 MHz frequency (the 2<sup>nd</sup> harmonic of the clock). The relation between EMI levels and line spectra of signals was analyzed for chip design quality, especially including clock generation circuitry and data paths. In addition, voltage-scaling operation and slew rate control operation which affect radiated emission levels, were tested to investigate the effect of duty ratio and slew asymmetry on EMI generation.

  • 16-channel neural pre-conditioning device

    We present the mixed-signal circuit design, layout, implementation techniques, and test data for a 16-channel neural pre-conditioning device that is used to amplify and filter signals acquired from chronically implanted electrodes in an animal's brain. Schematics and simulation data for each of the subcircuit macros are presented which include a high gain, continuous time first order bandpass filter pre-amplifier, a cascaded bandpass switch capacitor filter, a selectable gain output buffer, and a voltage controlled oscillator based clock generation circuitry. This device was implemented using AMI's, 0.5 /spl mu/m, double poly, triple level metal, 5 V, CMOS technology. The layout and floorplan, specifications and test data for this device conclude this paper.



Standards related to Clock Generation Circuitry

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No standards are currently tagged "Clock Generation Circuitry"


Jobs related to Clock Generation Circuitry

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