Conferences related to Nyquist-rate Converter

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ICC 2021 - IEEE International Conference on Communications

IEEE ICC is one of the two flagship IEEE conferences in the field of communications; Montreal is to host this conference in 2021. Each annual IEEE ICC conference typically attracts approximately 1,500-2,000 attendees, and will present over 1,000 research works over its duration. As well as being an opportunity to share pioneering research ideas and developments, the conference is also an excellent networking and publicity event, giving the opportunity for businesses and clients to link together, and presenting the scope for companies to publicize themselves and their products among the leaders of communications industries from all over the world.


2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science andtechnology research development and applications. The list of program topics includes but isnot limited to: Measurement Science & Education, Measurement Systems, Measurement DataAcquisition, Measurements of Physical Quantities, and Measurement Applications.


2020 IEEE International Solid- State Circuits Conference - (ISSCC)

ISSCC is the foremost global forum for solid-state circuits and systems-on-a-chip. The Conference offers 5 days of technical papers and educational events related to integrated circuits, including analog, digital, data converters, memory, RF, communications, imagers, medical and MEMS ICs.


2020 IEEE International Symposium on Circuits and Systems (ISCAS)

The International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems (CAS) Society and the world’s premier networking and exchange forum for researchers in the highly active fields of theory, design and implementation of circuits and systems. ISCAS2020 focuses on the deployment of CASS knowledge towards Society Grand Challenges and highlights the strong foundation in methodology and the integration of multidisciplinary approaches which are the distinctive features of CAS contributions. The worldwide CAS community is exploiting such CASS knowledge to change the way in which devices and circuits are understood, optimized, and leveraged in a variety of systems and applications.


2020 IEEE International Test Conference (ITC)

International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards, and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis, and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2019 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems – covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers

  • 2018 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification and validation, test (DFT, ATPG, and BIST), diagnosis, failure analysis and back to process, yield, reliability and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2017 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2016 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world's premier conference dedicated to the electronic test of devices, boards and systems -- covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment designers, and test engineers.

  • 2015 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek

  • 2014 IEEE International Test Conference (ITC)

    ITC is the world's premier conference dedicated to electronic test technology, covering the complete cycle from design verification, test, diagnosis, failure analysis back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges have been addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2013 IEEE International Test Conference (ITC)

    International Test Conference is the world

  • 2012 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, des

  • 2011 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek events, is the world s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers.

  • 2010 IEEE International Test Conference (ITC)

    ITC is the world's premier conference dedicated to electronic test technology, covering the complete cycle from design verification,test, diagnosis, failure analysis back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces and learn how these challenges have been addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.

  • 2009 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm) events, is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers,

  • 2008 IEEE International Test Conference (ITC)

    International Test Conference, the cornerstone of TestWeek(tm), is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement.

  • 2007 IEEE International Test Conference (ITC)

  • 2006 IEEE International Test Conference (ITC)

  • 2005 IEEE International Test Conference (ITC)

  • 2004 IEEE International Test Conference (ITC)

  • 2003 IEEE International Test Conference (ITC)

  • 2002 IEEE International Test Conference (ITC)

  • 2001 IEEE International Test Conference (ITC)

  • 2000 IEEE International Test Conference (ITC)

  • 1999 IEEE International Test Conference (ITC)

  • 1998 IEEE International Test Conference (ITC)

  • 1997 IEEE International Test Conference (ITC)

  • 1996 IEEE International Test Conference (ITC)


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Periodicals related to Nyquist-rate Converter

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Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Biomedical Circuits and Systems, IEEE Transactions on

The Transactions on Biomedical Circuits and Systems addresses areas at the crossroads of Circuits and Systems and Life Sciences. The main emphasis is on microelectronic issues in a wide range of applications found in life sciences, physical sciences and engineering. The primary goal of the journal is to bridge the unique scientific and technical activities of the Circuits and Systems ...


Circuits and Systems I: Regular Papers, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Communications Letters, IEEE

Covers topics in the scope of IEEE Transactions on Communications but in the form of very brief publication (maximum of 6column lengths, including all diagrams and tables.)


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Most published Xplore authors for Nyquist-rate Converter

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Xplore Articles related to Nyquist-rate Converter

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6-bit Flash ADC with Dynamic Element Matching

2006 NORCHIP, 2006

Previous work have suggested approaches to introduce dynamic element matching (DEM) into the reference net of a flash analog-to-digital converter. No implementations of such circuits have however been reported. In this work the authors evaluate the suitability and estimate the performance enhancements of a recently proposed DEM architecture by using this in the design of a 6-bit Nyquist rate converter. ...


Embedded Analog-to-Digital Converters

2009 Proceedings of the European Solid State Device Research Conference, 2009

Systems-on-Chips (SoCs) have become a reality in the past decade. Several dozens of different functional blocks are being integrated on a single die, reaching transistor counts of up to half a billion. From the analog portion of an SoC the data converters are probably among the most challenging blocks, often limiting system performance and dominating power dissipation. However, requirements regarding ...


Implementation of an area efficient data converter with increased effective number of bits

2012 12th International Conference on Intelligent Systems Design and Applications (ISDA), 2012

Data converters, ADCs and DACs, interface the real world of analog signals to the digital domain. They can be classified as `Nyquist rate converters' and `Over sampled converters'. Former operates at a sampling rate of twice the input signal frequency. They do not make use of the advantages of exceptional high speeds achieved in the current VLSI technology. Also the ...


On the Signal Filtering Property of CT Incremental Sigma-Delta ADCs

IEEE Transactions on Circuits and Systems II: Express Briefs, None

In this paper the calculation of the signal behavior and the achievable signal-to-quantization-noise ratio of continuous-time (CT) incremental Sigma- Delta (I-SD) ADCs is described. The presented method allows for the analysis of I-SD ADCs in frequency domain including the specific non-idealities of the CT modulator. In the state of the art, it is described that the omission of the preceding ...


A very compact 1MS/s Nyquist-rate A/D-converter with 12 effective bits

2012 Proceedings of the ESSCIRC (ESSCIRC), 2012

We present a very compact analog-to-digital convertor (ADC) for use as a standard cell. To achieve an inherent accuracy of at least 12-bits without trimming or calibration, extended counting A/D-conversion is used. Here, the circuit performs a conversion by passing through two modes of operation: first it works as a 1st-order incremental convertor and then it is reconfigured to operate ...


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Educational Resources on Nyquist-rate Converter

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IEEE.tv Videos

A 6GS/s 9.5 Bit Pipelined Folding-Interpolating ADC with 7.3 ENOB and 52.7dBc SFDR in the 2nd Nyquist Band in 0.25μm SiGe-BiCMOS: RFIC Interactive Forum
8-Element, 1-3GHz Direct Space-to-Information Converter - Matthew Bajor - RFIC Showcase 2018
IMS 2014: Super High Bit Rate Radio Access Technologies for Small Cells Using Higher Frequency Bands
International Future Energy Challenge 2018
KeyTalk with Ljubisa Stevanovic: From SiC MOSFET Devices to MW-scale Power Converters - APEC 2017
IMS MicroApps: Multi-Rate Harmonic Balance Analysis
Noise-Shaped Active SAR Analog-to-Digital Converter - IEEE Circuits and Systems Society (CAS) Distinguished Lecture
International Future Energy Challenge (IFEC) 2017
IEEE Entrepreneurship @ #CollisionConf: NeuroTrainer
SIMULATION TECHNIQUES FOR DATA CONVERTER DESIGN
2012 IEEE Honors Ceremony
An Ultra-Wideband Low-Power ADPLL Chirp Synthesizer with Adaptive Loop Bandwidth in 65nm CMOS: RFIC Interactive Forum
APEC Exhibitor Showcase - Texas Instruments Power Management
The Fundamentals of Battery Charger Design
Prospects and Challenges for GHz to THz Technologies/Architectures for Future Wireless Communications pt.2
2011 IEEE Richard W. Hamming Medal - Toby Berger
A Fully Integrated 75-83GHz FMCW Synthesizer for Automotive Radar Applications with -97dBc/Hz Phase Noise at 1MHz Offset and 100GHz/mSec Maximal Chirp Rate: RFIC Industry Showcase 2017
ISEC 2013 Special Gordon Donaldson Session: Remembering Gordon Donaldson - 7 of 7 - SQUID-based noise thermometers for sub-Kelvin thermometry
Prospects and Challenges for GHz to THz Technologies/Architectures for Future Wireless Communications pt.1
Skillful Manipulation Based on High-Speed Sensory-Motor Fusion

IEEE-USA E-Books

  • 6-bit Flash ADC with Dynamic Element Matching

    Previous work have suggested approaches to introduce dynamic element matching (DEM) into the reference net of a flash analog-to-digital converter. No implementations of such circuits have however been reported. In this work the authors evaluate the suitability and estimate the performance enhancements of a recently proposed DEM architecture by using this in the design of a 6-bit Nyquist rate converter. The converter is sent for manufacturing in a 130 nm partially depleted silicon-on-insulator CMOS technology. It was simulated at transistor level in Cadence using the foundry provided BSIM3SOI Eldo models. These simulations yield a maximum sampling frequency of at least 350 MHz. The simulations also indicate a performance improvement in terms of spurious free dynamic range when using dynamic element matching

  • Embedded Analog-to-Digital Converters

    Systems-on-Chips (SoCs) have become a reality in the past decade. Several dozens of different functional blocks are being integrated on a single die, reaching transistor counts of up to half a billion. From the analog portion of an SoC the data converters are probably among the most challenging blocks, often limiting system performance and dominating power dissipation. However, requirements regarding yield, die-size, scalability, noise immunity, power and the fact that logic is almost for free, cause distinct differences between embedded data converters and their stand-alone, usually general purpose, counterparts. This paper describes these differences and provides an overview of the state-of-the art in analog-to-digital conversion.

  • Implementation of an area efficient data converter with increased effective number of bits

    Data converters, ADCs and DACs, interface the real world of analog signals to the digital domain. They can be classified as `Nyquist rate converters' and `Over sampled converters'. Former operates at a sampling rate of twice the input signal frequency. They do not make use of the advantages of exceptional high speeds achieved in the current VLSI technology. Also the limitations in matching accuracy of the analog circuits needed in this type, limits their accuracy to an effective number of bits (ENOB) of 12 to 14 bits for various implementations. Over sampling data converters uses sampling rate much higher than Nyquist rate, typically higher by a factor between 8 and 512 or higher. They can achieve over 20 ENOB resolution at reasonably high conversion speeds. The engine behind this over sampling converter is a delta-sigma modulator. The main advantage of delta sigma modulator is that they offer a very good separation of input signal from the quantisation noise due to the over sampling process and noise shaping. The Signal to noise ratio (SNR) for a Nyquist rate converter depends on the number of bits of the converter. In this type SNR can be increased by approximately 6dB per bit. In over sampling converters the SNR depends on the depth of oversampling also, which is specified as `Oversampling ratio' (OSR). Theoretically, for each doubling in sampling rate SNR can be be improved by a factor of 3dB, which corresponds to a half bit increment in Nyquist rate converters. Thus without increasing chip area SNR is increased. In this paper a 10 bit delta sigma DAC is implemented and SNR was measured with various sinusoids at different over sampling ratios. To reduce the number of transistors in the implementation, Minimal energy dual bit adder (MEDB adder) is used.

  • On the Signal Filtering Property of CT Incremental Sigma-Delta ADCs

    In this paper the calculation of the signal behavior and the achievable signal-to-quantization-noise ratio of continuous-time (CT) incremental Sigma- Delta (I-SD) ADCs is described. The presented method allows for the analysis of I-SD ADCs in frequency domain including the specific non-idealities of the CT modulator. In the state of the art, it is described that the omission of the preceding sample-and-hold for the I-SD ADC alters the transfer characteristic compared to a Nyquist-rate converter. So far, for CT I-SD ADCs this behavior is only investigated via simulations. In this work the model of a discrete-time I-SD ADC is generalized and adapted for the CT case. This allows to analytically obtain the signal and noise transfer function of the I-SD ADC in frequency domain in combination with arbitrary reconstruction filters due to the utilization of the lifting method in a fast and accurate way.

  • A very compact 1MS/s Nyquist-rate A/D-converter with 12 effective bits

    We present a very compact analog-to-digital convertor (ADC) for use as a standard cell. To achieve an inherent accuracy of at least 12-bits without trimming or calibration, extended counting A/D-conversion is used. Here, the circuit performs a conversion by passing through two modes of operation: first it works as a 1st-order incremental convertor and then it is reconfigured to operate as a conventional algorithmic converter. This way, we obtain a Nyquist-rate converter that requires only 1 operational amplifier and achieves 12-bit accuracy performance in 13 clock cycles with 9 bit capacitor matching. The circuit is designed in 0.18 μm CMOS with a thick oxide option. The resulting analog core occupies a chip area of only 0.011 mm2and the complete digital control and reconstruction logic (including additional test features and storage registers) is 0.02 mm2. The analog blocks of the circuit consume 1.2mW and the digital 0.4mW. At a sample rate of 1 MS/s, the peak SNDR is 74.5dB and the dynamic range is 78dB, constant over the Nyquist band. The worst-case integral non-lineairity (INL) is within ±0.55 LSB.

  • The Principles of Delta-Sigma Data Converters

    This course provides a clear understanding of the principles of delta-sigma converter operation - analog to digital and digital to analog. It introduces the best computer-aided analysis and design techniques available. The course uses simplified methods to illustrate complicated concepts such as spectral estimation and switched noise.



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