Conferences related to Testing

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2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe)

Energy conversion and conditioning technologies, power electronics, adjustable speed drives and their applications, power electronics for smarter grid, energy efficiency,technologies for sustainable energy systems, converters and power supplies


2019 IEEE 28th International Symposium on Industrial Electronics (ISIE)

The conference will provide a forum for discussions and presentations of advancements inknowledge, new methods and technologies relevant to industrial electronics, along with their applications and future developments.


2019 IEEE 46th Photovoltaic Specialists Conference (PVSC)

Photovoltaic materials, devices, systems and related science and technology


2019 IEEE 69th Electronic Components and Technology Conference (ECTC)

premier components, packaging and technology conference


2019 IEEE Applied Power Electronics Conference and Exposition (APEC)

APEC focuses on the practical and applied aspects of the power electronics business. The conference addresses issues of immediate and long term importance to practicing power electronics engineer.


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Periodicals related to Testing

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Advanced Packaging, IEEE Transactions on

The IEEE Transactions on Advanced Packaging has its focus on the modeling, design, and analysis of advanced electronic, photonic, sensors, and MEMS packaging.


Antennas and Propagation, IEEE Transactions on

Experimental and theoretical advances in antennas including design and development, and in the propagation of electromagnetic waves including scattering, diffraction and interaction with continuous media; and applications pertinent to antennas and propagation, such as remote sensing, applied optics, and millimeter and submillimeter wave techniques.


Antennas and Wireless Propagation Letters, IEEE

IEEE Antennas and Wireless Propagation Letters (AWP Letters) will be devoted to the rapid electronic publication of short manuscripts in the technical areas of Antennas and Wireless Propagation.


Applied Superconductivity, IEEE Transactions on

Contains articles on the applications and other relevant technology. Electronic applications include analog and digital circuits employing thin films and active devices such as Josephson junctions. Power applications include magnet design as well asmotors, generators, and power transmission


Automatic Control, IEEE Transactions on

The theory, design and application of Control Systems. It shall encompass components, and the integration of these components, as are necessary for the construction of such systems. The word `systems' as used herein shall be interpreted to include physical, biological, organizational and other entities and combinations thereof, which can be represented through a mathematical symbolism. The Field of Interest: shall ...


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Most published Xplore authors for Testing

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Xplore Articles related to Testing

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IEE Colloquium on 'Techniques for Testing and Measuring Digital Systems' (Digest No.105)

IEE Colloquium on Techniques for Testing and Measuring Digital Systems, 1988

None


Delayed Failures in Software Using High Volume Automated Testing

Testing: Academic & Industrial Conference - Practice And Research Techniques (TAIC PART'06), 2006

The research described studies delayed failures in software using high volume automated testing (HVAT) and investigates the effectiveness of different HVAT techniques; such techniques include genetic algorithms, model-based testing, penetration testing, robustness testing, and random (stochastic) testing. A delayed failure is a failure that occurs some time after the conditions that lead to the failure are applied. There appear to ...


IEE Colloquium on 'Testing-the Gordian Knot of VLSI Design' (Digest No.1993/131)

IEE Colloquium on Testing-the Gordian Knot of VLSI Design, 1993

None


IEEE Standard for High-Voltage Testing Techniques - Redline

IEEE Std 4-2013 (Revision of IEEE Std 4-1995) - Redline, 2013

Standard methods and basic techniques for high-voltage testing applicable to all types of apparatus for alternating voltages, direct voltages, lightning impulse voltages, switching impulse voltages, and impulse currents are established in this standard. Sections that deal with alternating voltage, direct voltage, and impulse testing are combined in this revision to organize the technical content for ease of use. In addition, ...


Search-Based Testing and System Testing: A Marriage in Heaven

2017 IEEE/ACM 10th International Workshop on Search-Based Software Testing (SBST), 2017

Software test generation can take place at the function level or the system level, and be driven by random, constraint-based, and/or search-based techniques. In this paper, we argue that the best way to generate tests is at the system level, as it avoids false failures due to implicit preconditions, and that for testing at the system level, search-based techniques are ...


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Educational Resources on Testing

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IEEE-USA E-Books