Conferences related to Non-linear Analog Circuits

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2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)

The conference program will consist of plenary lectures, symposia, workshops and invitedsessions of the latest significant findings and developments in all the major fields of biomedical engineering.Submitted papers will be peer reviewed. Accepted high quality papers will be presented in oral and postersessions, will appear in the Conference Proceedings and will be indexed in PubMed/MEDLINE


2020 IEEE Applied Power Electronics Conference and Exposition (APEC)

APEC focuses on the practical and applied aspects of the power electronics business. Not just a power designer’s conference, APEC has something of interest for anyone involved in power electronics including:- Equipment OEMs that use power supplies and converters in their equipment- Designers of power supplies, dc-dc converters, motor drives, uninterruptable power supplies, inverters and any other power electronic circuits, equipments and systems- Manufacturers and suppliers of components and assemblies used in power electronics- Manufacturing, quality and test engineers involved with power electronics equipment- Marketing, sales and anyone involved in the business of power electronic- Compliance engineers testing and qualifying power electronics equipment or equipment that uses power electronics


2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

The Conference focuses on all aspects of instrumentation and measurement science andtechnology research development and applications. The list of program topics includes but isnot limited to: Measurement Science & Education, Measurement Systems, Measurement DataAcquisition, Measurements of Physical Quantities, and Measurement Applications.


2020 IEEE International Solid- State Circuits Conference - (ISSCC)

ISSCC is the foremost global forum for solid-state circuits and systems-on-a-chip. The Conference offers 5 days of technical papers and educational events related to integrated circuits, including analog, digital, data converters, memory, RF, communications, imagers, medical and MEMS ICs.


2020 IEEE International Symposium on Circuits and Systems (ISCAS)

The International Symposium on Circuits and Systems (ISCAS) is the flagship conference of the IEEE Circuits and Systems (CAS) Society and the world’s premier networking and exchange forum for researchers in the highly active fields of theory, design and implementation of circuits and systems. ISCAS2020 focuses on the deployment of CASS knowledge towards Society Grand Challenges and highlights the strong foundation in methodology and the integration of multidisciplinary approaches which are the distinctive features of CAS contributions. The worldwide CAS community is exploiting such CASS knowledge to change the way in which devices and circuits are understood, optimized, and leveraged in a variety of systems and applications.


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Periodicals related to Non-linear Analog Circuits

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Biomedical Circuits and Systems, IEEE Transactions on

The Transactions on Biomedical Circuits and Systems addresses areas at the crossroads of Circuits and Systems and Life Sciences. The main emphasis is on microelectronic issues in a wide range of applications found in life sciences, physical sciences and engineering. The primary goal of the journal is to bridge the unique scientific and technical activities of the Circuits and Systems ...


Circuits and Systems II: Express Briefs, IEEE Transactions on

Part I will now contain regular papers focusing on all matters related to fundamental theory, applications, analog and digital signal processing. Part II will report on the latest significant results across all of these topic areas.


Communications, IEEE Transactions on

Telephone, telegraphy, facsimile, and point-to-point television, by electromagnetic propagation, including radio; wire; aerial, underground, coaxial, and submarine cables; waveguides, communication satellites, and lasers; in marine, aeronautical, space and fixed station services; repeaters, radio relaying, signal storage, and regeneration; telecommunication error detection and correction; multiplexing and carrier techniques; communication switching systems; data communications; and communication theory. In addition to the above, ...


Consumer Electronics, IEEE Transactions on

The design and manufacture of consumer electronics products, components, and related activities, particularly those used for entertainment, leisure, and educational purposes


Dielectrics and Electrical Insulation, IEEE Transactions on

Electrical insulation common to the design and construction of components and equipment for use in electric and electronic circuits and distribution systems at all frequencies.


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Most published Xplore authors for Non-linear Analog Circuits

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Xplore Articles related to Non-linear Analog Circuits

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Fault diagnosis method of non-linear analog circuits based on Volterra series and SVM

The 26th Chinese Control and Decision Conference (2014 CCDC), 2014

A new fault diagnosis method of analog circuits is proposed in this paper. The method is based on Volterra series and SVM. This paper introduces the basic theory of Volterra series and SVM and deduces the proposed identification method in detail. The identification method is applied to the fault diagnosis of a non-linear analog circuit. The simulation result shows that ...


Distortion contribution analysis of strongly non-linear analog circuits

2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2016

A Distortion Contribution Analysis (DCA) determines the contributions of each sub-circuit to the total distortion generated by an electronic circuit in a simulation. The results of the DCA allow the designer of the circuit to effectively reduce the distortion. Recently, a DCA based on the Best Linear Approximation (BLA) was introduced. In this approach, the non-linear subcircuits are modelled using ...


Testing linear and non-linear analog circuits using moment generating functions

2011 12th Latin American Test Workshop (LATW), 2011

Circuit under test (CUT) is treated as a transformation on the probability density function of its input excitation, which is, a continuous random variable (RV) of gaussian probability distribution. Probability moments of the output, which is now the transformed RV, is used as a metric for testing catastrophic and parametric faults in circuit components that make up the CUT. Use ...


Soft fault detection in analog circuits from probability density function

2018 International Symposium on Devices, Circuits and Systems (ISDCS), 2018

A new parametric fault detection scheme for linear and weakly non-linear analog circuits is proposed from probability density function (PDF) of the output. Non-parametric kernel density estimation (KDE) technique is used to estimate the PDF from the random output of the circuit excited with random input stimuli. Two benchmark circuits viz. Continuous-time low pass State Variable Filter circuit and Cascade ...


An embedded automatic SBT diagnosis system for analog circuits

Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.04CH37510), 2004

In this paper the realization of an automatic fault diagnosis system assembled by using inexpensive components is suggested The system implements a Simulation Before Test fault diagnosis method based on sensitivity inspection and an artificial neural network classifier to detect and localize the presence of faults. The method can be successfully applied both to linear and non-linear analog circuits.


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Educational Resources on Non-linear Analog Circuits

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IEEE-USA E-Books

  • Fault diagnosis method of non-linear analog circuits based on Volterra series and SVM

    A new fault diagnosis method of analog circuits is proposed in this paper. The method is based on Volterra series and SVM. This paper introduces the basic theory of Volterra series and SVM and deduces the proposed identification method in detail. The identification method is applied to the fault diagnosis of a non-linear analog circuit. The simulation result shows that the proposed method can obviously improve the fault diagnosis rate compared with the traditional method.

  • Distortion contribution analysis of strongly non-linear analog circuits

    A Distortion Contribution Analysis (DCA) determines the contributions of each sub-circuit to the total distortion generated by an electronic circuit in a simulation. The results of the DCA allow the designer of the circuit to effectively reduce the distortion. Recently, a DCA based on the Best Linear Approximation (BLA) was introduced. In this approach, the non-linear subcircuits are modelled using a linear approximation. The nonlinear distortion is represented as an additive noise source. Combining the BLA with the concepts of a noise analysis yields a DCA that works with realistic, modulated excitation signals instead of a one or two-tone excitation. Up till now, BLA-based DCA has only been applied to weakly non-linear circuits. In this paper, it is extended and applied to a strongly non-linear circuit.

  • Testing linear and non-linear analog circuits using moment generating functions

    Circuit under test (CUT) is treated as a transformation on the probability density function of its input excitation, which is, a continuous random variable (RV) of gaussian probability distribution. Probability moments of the output, which is now the transformed RV, is used as a metric for testing catastrophic and parametric faults in circuit components that make up the CUT. Use of probability moments as circuit test metric with white noise excitation as input addresses three important problems faced in analog circuit test, namely: 1) Reduces complexity of input signal design, 2) Increases resolution of fault detection, and 3) Reduces production test cost as it has no area overhead and marginally reduces test time. We develop the theory, test procedure and report SPICE simulation results of the proposed scheme on a benchmark elliptic filter. With the proposed scheme, we are able to detect all catastrophic faults and single parametric faults that are off from their nominal value by just over 10%. Method reported in this paper paves way for future research in circuit diagnosis, leveraging moments of the output to diagnose parametric faults in analog circuits.

  • Soft fault detection in analog circuits from probability density function

    A new parametric fault detection scheme for linear and weakly non-linear analog circuits is proposed from probability density function (PDF) of the output. Non-parametric kernel density estimation (KDE) technique is used to estimate the PDF from the random output of the circuit excited with random input stimuli. Two benchmark circuits viz. Continuous-time low pass State Variable Filter circuit and Cascade Amplifier are tested to validate the proposed framework. All the circuits are simulated with CADENCE Virtuoso using UMC-180nm technology. Detectability of the proposed method of soft fault detection is appreciably higher than that of functional test method.

  • An embedded automatic SBT diagnosis system for analog circuits

    In this paper the realization of an automatic fault diagnosis system assembled by using inexpensive components is suggested The system implements a Simulation Before Test fault diagnosis method based on sensitivity inspection and an artificial neural network classifier to detect and localize the presence of faults. The method can be successfully applied both to linear and non-linear analog circuits.

  • Partial simulation-driven ATPG for detection and diagnosis of faults in analog circuits

    In this paper, we propose a novel fault-oriented test generation methodology for detection and isolation of faults in analog circuits. Given the description of the circuit-under-test, the proposed test generator computes the optimal transient test stimuli in order to detect and isolate a given set of faults. It also computes the optimal set of test nodes to probe at, and the time instants to make measurements. The test generation program accommodates the effects introduced by component tolerances and measurement inaccuracy, and can be tailored to fit the signal generation capabilities of a hardware tester. Experimental results show that the proposed technique can be applied to generate transient tests for both linear and non-linear analog circuits of moderate complexity in reasonably less CPU time. This will significantly impact the test development costs for an analog circuit and will decrease the time-to-market of a product. Finally, the short duration and the easy-to-apply feature of the test stimuli will lead to significant reduction in production test costs.

  • ABCD-NL: Approximating Continuous non-linear dynamical systems using purely Boolean models for analog/mixed-signal verification

    We present ABCD-NL, a technique that approximates non-linear analog circuits using purely Boolean models, to high accuracy. Given an analog/mixed-signal (AMS) system (e.g., a SPICE netlist), ABCD-NL produces a Boolean circuit representation (e.g., an And Inverter Graph, Finite State Machine, or Binary Decision Diagram) that captures the I/O behaviour of the given system, to near SPICE-level accuracy, without making any apriori simplifications. The Boolean models produced by ABCD-NL can be used for high-speed simulation and formal verification of AMS designs, by leveraging existing tools developed for Boolean/hybrid systems analysis (e.g., ABC [1]). We apply ABCD-NL to a number of SPICE-level AMS circuits, including data converters, charge pumps, comparators, non-linear signaling/communications sub-systems, etc. Also, we formally verify the throughput of an AMS signaling system - modelled in SPICE using 22nm BSIM4 transistors, Booleanized with high accuracy using ABCD-NL, and property-checked using ABC.

  • A DSP testing approach by modeling the circuit response as a Markov chain

    An approach based on signal processing and time domain analysis is proposed to test linear and non-linear analog circuits. A step signal is applied as an input stimulus and the response is measured at the output. A stochastic model is used to represent the response of a DUT to the step input. The process itself is modeled as a monodesmic, ergodic Markov chain. Different metrics are computed for the faulty and non-faulty circuit in order to detect the faulty components and to estimate noise. Because there exists a relationship between the measured metrics and the functionality of the DUT (Device Under Test), we can characterize the response of the circuit and compact it as a signature. This signature serves to differentiate between the faulty and non-faulty circuit. Different signatures can be obtained for different injected faults and a fault dictionary can be constructed. A comparative study, between a TMS 320C40X DSP processor and a Sparc10 Sun Station, is done in order to evaluate the computation time of the proposed algorithm.

  • Non-linear analog circuit test and diagnosis under process variation using V-Transform coefficients

    Parametric fault testing of non-linear analog circuits based on a new mathematical transform is presented. The V-Transform acts on the polynomial expansion of the circuit's function. Its main properties are: 1) to make the polynomial coefficients monotonic, 2) to reduce masking of parametric faults due to process variation, and 3) to increase the sensitivity of polynomial coefficients to the circuit parameter variation, thus enhancing diagnostic resolution. We show that the sensitivity of V-Transform Coefficients (VTC) with respect to circuit parameter variation is up to 3 to 5 times greater than the sensitivity of polynomial coefficients. Fault diagnosis of parametric faults under process variation using VTC is then presented. We also propose a scheme to distinguish between circuit specifications failures due to process variation versus manufacturing defects which manifest as parametric faults. To validate our approach, we apply the test and diagnosis procedures to a benchmark fifth order elliptic filter. We use SPICE program for fault injection, with about 50,000 Monte Carlo simulation runs to demonstrate fault detection-diagnosis under process variation. The test scheme uncovers 95% of all injected single parametric faults whose sizes deviate 5% from the nominal values of circuit components corrected for process variation, while the procedure successfully diagnosed all component faults under ±3σ process variation with 88% confidence level.

  • Parametric Fault Detection in Analog Circuits: A Statistical Approach

    A statistical approach is proposed to detect parametric fault in linear and weakly non-linear analog circuits by mapping faults to a statistical metric, Bhattacharyya distance which is measured from the Probability Density Function (PDF) of the outputs. The non-Gaussian Auto-regressive (AR) model is used to estimate the PDF. To validate the proposed statistical approach, we have simulated two benchmark circuits, Sallenkey band pass filter and cascade amplifier with CADENCE Virtuoso using umc-180nm technology. Defect screening is also measured with linear regression analysis. Detectability of the proposed method for parametric fault is reasonably large compared to the functional test method.



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