IEEE Organizations related to C Languages

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2020 IEEE Frontiers in Education Conference (FIE)

The Frontiers in Education (FIE) Conference is a major international conference focusing on educational innovations and research in engineering and computing education. FIE 2019 continues a long tradition of disseminating results in engineering and computing education. It is an ideal forum for sharing ideas, learning about developments and interacting with colleagues inthese fields.


2020 IEEE/ACM 42nd International Conference on Software Engineering (ICSE)

ICSE is the premier forum for researchers to present and discuss the most recent innovations,trends, outcomes, experiences, and challenges in the field of software engineering. The scopeis broad and includes all original and unpublished results of empirical, conceptual, experimental,and theoretical software engineering research.


ICASSP 2020 - 2020 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)

The ICASSP meeting is the world's largest and most comprehensive technical conference focused on signal processing and its applications. The conference will feature world-class speakers, tutorials, exhibits, and over 50 lecture and poster sessions.


2019 20th International Symposium on Quality Electronic Design (ISQED)

20th International Symposium on Quality Electronic Design (ISQED 2019) is the premier interdisciplinary and multidisciplinary Electronic Design conference?bridges the gap among Electronic/Semiconductor ecosystem members providing electronic design tools, integrated circuit technologies, semiconductor technology,packaging, assembly & test to achieve design quality.


2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)

The DATE conference addresses all aspects of research into technologies for electronic andembedded system engineering. It covers the design process, test, and automation tools forelectronics ranging from integrated circuits to distributed embedded systems. This includes bothhardware and embedded software design issues. The conference scope also includes theelaboration of design requirements and new architectures for challenging application fields suchas telecoms, wireless communications, multimedia, healthcare, smart energy and automotivesystems. Companies also present innovative industrial designs to foster the feedback fromrealworld design to research. DATE also hosts a number of special sessions, events within themain technical programme such as panels, hot-topic sessions, tutorials and workshopstechnical programme such as panels, hot-topic sessions, tutorials and workshops.

  • 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)

    The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering. It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems. This includes both hardware and embedded software design issues. The conference scope also includes the elaboration of design requirements and new architectures for challenging application fields such as telecoms, wireless communications, multimedia, healthcare, smart energy and automotive systems. Companies also present innovative industrial designs to foster the feedback fromrealworld design to research. DATE also hosts a number of special sessions, events within the main technical programme such as panels, hot-topic sessions, tutorials and workshops technical programme such as panels, hot-topic sessions, tutorials and workshops.

  • 2017 Design, Automation & Test in Europe Conference & Exhibition (DATE)

    The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering. It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems. This includes both hardware and embedded software design issues. The conference scope also includes the elaboration of design requirements and new architectures for challenging application fields such as telecoms, wireless communications, multimedia, healthcare, smart energy and automotive systems. Companies also present innovative industrial designs to foster the feedback fromrealworld design to research. DATE also hosts a number of special sessions, events within the main technical programme such as panels, hot-topic sessions, tutorials and workshops technical programme such as panels, hot-topic sessions, tutorials and workshops.

  • 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)

    The DATE conference addresses all aspects of research into technologies for electronic andembedded system engineering. It covers the design process, test, and automation tools forelectronics ranging from integrated circuits to distributed embedded systems. This includes bothhardware and embedded software design issues. The conference scope also includes theelaboration of design requirements and new architectures for challenging application fields suchas telecoms, wireless communications, multimedia, healthcare, smart energy and automotivesystems. Companies also present innovative industrial designs to foster the feedback from realworlddesign to research. DATE also hosts a number of special sessions, events within the maintechnical programme such as panels, hot-topic sessions, tutorials and workshops technical programme such as panels, hot-topic sessions, tutorials and workshops

  • 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE)

    The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering. It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems. This includes both hardware and embedded software design issues. The conference scope also includes the elaboration of design requirements and new architectures for challenging application fields such as telecoms, wireless communications, multimedia, healthcare, smart energy and automotive systems. Companies also present innovative industrial designs to foster the feedback from realworld design to research. DATE also hosts a number of special sessions, events within the main technical programme such as panels, hot-topic sessions, tutorials and workshops.

  • 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE)

    The DATE conference addresses all aspects of research into technologies for electronic and embedded system engineering. It covers the design process, test, and automation tools for electronics ranging from integrated circuits to distributed embedded systems. This includes both hardware and embedded software design issues. The conference scope also includes the elaboration of design requirements and new architectures for challenging application fields such as telecoms, wireless communications, multimedia, healthcare, smart energy and automotive systems. Companies also present innovative industrial designs to foster the feedback from real-world design to research. DATE also hosts a number of special sessions, events within the main technical programme such as panels, hot-topic sessions, tutorials and workshops

  • 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE 2013)

    DATE is the complete event for the European electronic and test community. A leading world conference and exhibition, DATE unites 2,000 professionals with approximately 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)

    DATE is the complete event for the European electronic system and test community. A leading world conference and exhibition, DATE unites 2,000 professionals with some 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2011 Design, Automation & Test in Europe Conference & Exhibition (DATE 2011)

    DATE is the complete event for the European electronic system and test community. A world leading conference and exhibition, DATE unites 2,000 professionals with some 60 exhibiting companies, cutting edge R&D, industrial designers and technical managers from around the world.

  • 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)

    All aspects of research into technologies for electronic and (embedded) systems engineering. It covers the design process, test, and tools for design automation of electronic products ranging from integrated circuits to distributed large-scale systems.

  • 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE 2009)

    The Design, Automation, and Test in Europe (DATE) conference is the world's premier conference dedicated to electronics system design & test. The technical programme features: Four distinctive and integrated themes, covering all aspects of systems design and engineering. Two special days are focusing on SoC Development Strategies and Multicore Applications.

  • 2008 Design, Automation & Test in Europe Conference & Exhibition (DATE 2008)

    The 11th DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. It puts strong emphasis on ICs/SoCs, reconfigurable hardware and embedded systems, including embedded software. The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials.

  • 2007 Design, Automation & Test in Europe Conference & Exhibition (DATE 2007)

    DATE is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. It puts strong emphasis on both ICs/SoCs, reconfigurable hardware and embedded systems, including embedded software.

  • 2006 Design, Automation & Test in Europe Conference & Exhibition (DATE 2006)

  • 2005 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 2004 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 2003 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 2002 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 2001 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 2000 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  • 1999 Design, Automation & Test in Europe Conference & Exhibition (DATE)


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Xplore Articles related to C Languages

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Towards reverse engineering of intermediate code for documentation generators

2017 IEEE 24th International Conference on Software Analysis, Evolution and Reengineering (SANER), 2017

We describe the motivation, approach and first experience from reverse engineering Common Intermediate Language (CIL) for the purpose of documentation generation. Instead of parsing source code implemented in different programming languages, we reverse engineer CIL code and thereby enable documentation generation for all programming languages that can be compiled into CIL code. Initial results show that we are able to ...


[Engineering Paper] SCC: Automatic Classification of Code Snippets

2018 IEEE 18th International Working Conference on Source Code Analysis and Manipulation (SCAM), 2018

The following topics are dealt with: public domain software; software maintenance; Java; program diagnostics; learning (artificial intelligence); program compilers; C language; software reusability; source code (software); software engineering.


Generated code in studies on clone rates

2018 IEEE 12th International Workshop on Software Clones (IWSC), 2018

Various earlier studies have measured clone rates for diverse projects. One of the reasons for exceptionally high clone rates for individual source files was found to be auto-generated code. Automatically generated code is generally not maintained and, hence, should be excluded from clone-rate measurements. This kind of code might even introduce a bias to clone rates of projects when there ...


A demonstration of compilability for UML template instances

2016 4th International Conference on Model-Driven Engineering and Software Development (MODELSWARD), 2016

Because of the thin set of well-formedness rules associated to Templates in UML, ill-formed elements may result from bindings to templates. Although such ill-formedness is generally detected by some UML validation rule, the problem is poorly reported because it is not normally imputed to the binding. Typically, such problems are detected as non-compilable code in the template instances. A set ...


Codeflex: A Web-based Platform for Competitive Programming

2019 14th Iberian Conference on Information Systems and Technologies (CISTI), 2019

The academic environment is undoubtedly one of the main means of introduction to the field of computer programming, however, in this environment, where practice is crucial for the development of solid foundations, the number of given assignments falls short from ideal, especially because of the time it takes to evaluate the proposed solutions. To fill this gap, a web platform ...


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Educational Resources on C Languages

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IEEE-USA E-Books

  • Towards reverse engineering of intermediate code for documentation generators

    We describe the motivation, approach and first experience from reverse engineering Common Intermediate Language (CIL) for the purpose of documentation generation. Instead of parsing source code implemented in different programming languages, we reverse engineer CIL code and thereby enable documentation generation for all programming languages that can be compiled into CIL code. Initial results show that we are able to generate documents in the same quality as compared to directly analyzing source code. To overcome initial shortcomings we introduce additional preprocessing in form of AST refactoring which is not required when analyzing source code.

  • [Engineering Paper] SCC: Automatic Classification of Code Snippets

    The following topics are dealt with: public domain software; software maintenance; Java; program diagnostics; learning (artificial intelligence); program compilers; C language; software reusability; source code (software); software engineering.

  • Generated code in studies on clone rates

    Various earlier studies have measured clone rates for diverse projects. One of the reasons for exceptionally high clone rates for individual source files was found to be auto-generated code. Automatically generated code is generally not maintained and, hence, should be excluded from clone-rate measurements. This kind of code might even introduce a bias to clone rates of projects when there is a large amount of generated code and clone rates for generated files generally deviate from the average clone rate for handwritten code. While some generated files stuck out with clone rates above the average in earlier studies, we do not know whether this is generally the case and how much code is actually generated automatically. This paper investigates the amount of generated files in projects, whether clone rates for generated files really differ from handwritten code, and - overall - whether generated code in fact introduces a bias to clone rates. We heuristically detect generated files in a very large open-source project corpus of programs written in C, C++, C#, or Java and report the number of projects with generated code. For these projects, we compare clone rates of generated and handwritten files. Our results show higher clone rates for generated files. Moreover, when we aggregate clone rates from files to projects, the clone rates of projects with at least one generated file are also slightly higher than in projects for which no generated files were detected. Our results suggest that researchers should indeed take special care to exclude generated code in studies on clone rates.

  • A demonstration of compilability for UML template instances

    Because of the thin set of well-formedness rules associated to Templates in UML, ill-formed elements may result from bindings to templates. Although such ill-formedness is generally detected by some UML validation rule, the problem is poorly reported because it is not normally imputed to the binding. Typically, such problems are detected as non-compilable code in the template instances. A set of well-formedness rules, additional to those of the standard UML, was proposed as a way to ensure the compilability of instances and prevent this problem from occurring. Such set of constraints was proposed in a previous paper and named Functional Conformance, but a demonstration of its effectiveness was not yet provided. Such a demonstration is outlined in the current paper. Carrying out the demonstration revealed the need for two more rules than those previously envisioned for Functional Conformance.

  • Codeflex: A Web-based Platform for Competitive Programming

    The academic environment is undoubtedly one of the main means of introduction to the field of computer programming, however, in this environment, where practice is crucial for the development of solid foundations, the number of given assignments falls short from ideal, especially because of the time it takes to evaluate the proposed solutions. To fill this gap, a web platform has been implemented to serve as a repository of programming problems, for practice and learning, but also with a section for competitive programming. Above all things, the platform is capable of evaluating user's submissions in real time. The solution for evaluating submissions involves the use of compilers associated with their programming language and a parallel execution to bring improvements in resource usage efficiency.

  • Resurgence of Regression Test Selection for C++

    Regression testing - running available tests after each project change - is widely practiced in industry. Despite its widespread use and importance, regression testing is a costly activity. Regression test selection (RTS) optimizes regression testing by selecting only tests affected by project changes. RTS has been extensively studied and several tools have been deployed in large projects. However, work on RTS over the last decade has mostly focused on languages with abstract computing machines (e.g., JVM). Meanwhile development practices (e.g., frequency of commits, testing frameworks, compilers) in C++ projects have dramatically changed and the way we should design and implement RTS tools and the benefits of those tools is unknown. We present a design and implementation of an RTS technique, dubbed RTS++, that targets projects written in C++, which compile to LLVM IR and use the Google Test testing framework. RTS++ uses static analysis of a function call graph to select tests. RTS++ integrates with many existing build systems, including AutoMake, CMake, and Make. We evaluated RTS++ on 11 large open-source projects, totaling 3,811,916 lines of code. To the best of our knowledge, this is the largest evaluation of an RTS technique for C++. We measured the benefits of RTS++ compared to running all available tests (i.e., retest-all). Our results show that RTS++ reduces the number of executed tests and end-to- end testing time by 88% and 61% on average.

  • Formal verification of safety testing for remote controlled consumer electronics using the Petri net tool: HiPS

    The "Internet of Things" can be applied to many consumer electronic devices. The safety of such devices as microwave ovens should be ensured at all times. The hierarchical Petri net simulator (HiPS) tool is a design and verification environment for Place/Transition nets that can perform model checking for a state space. However, exhaustive model checking, which can be computationally excessive, is required to generate the complete state space. On-the-fly model checking is an approach that addresses this problem by parallelizing the search and generation processes for portions of the overall state space. In this study, we propose a model checker for a Petri net model and then verify the safety properties of the model for a microwave oven that can be controlled remotely by multiple users.

  • Spor Salonunun Verimli Isletilmesi Icin Spor Aletleri Kullanim Tahminlemesi [Turkish-only]

    No English translation of this document was provided by the conference organizers.

  • Cross-Language Optimizations in Big Data Systems: A Case Study of SCOPE

    Building scalable big data programs currently requires programmers to combine relational (SQL) with non-relational code (Java, C#, Scala). Relational code is declarative - a program describes what the computation is and the compiler decides how to distribute the program. SQL query optimization has enjoyed a rich and fruitful history, however, most research and commercial optimization engines treat non-relational code as a black-box and thus are unable to optimize it. This paper empirically studies over 3 million SCOPE programs across five data centers within Microsoft and finds programs with non- relational code take between 45-70% of data center CPU time. We further explore the potential for SCOPE optimization by generating more native code from the non-relational part. Finally, we present 6 case studies showing that triggering more generation of native code in these jobs yields significant performance improvement: optimizing just one portion resulted in as much as 25% improvement for an entire program.

  • Suppression of cross polarized radiation for circular patch antenna using different substrates and defected ground structure

    The cross-polarization (XP) radiation of probe fed circular patches is investigated. Two different designing examples are presented to analyze the cross-polarization radiation of the probe fed circular patches having conventional ground planes and different dielectric substrates. The proposed antenna experimentally demonstrates how the XP radiation of the patch with conventional ground plane increases with the dielectric constant of the substrate. It is observed that the XP radiation is minimum for optimum feed location. To improve the XP performances, the ground plane of the circular patch is defected with single and dual arc shaped defects beneath the circular patch. The defects on the ground plane are so placed that the XP field reduces without altering the resonant frequency. The impedance bandwidth and gain of the proposed structures for different dielectric constants are studied. Application of the DGS structure offers maximum suppression of the XP radiation of 14.54 dB for FR4 epoxy substrate with the highest impedance bandwidth of 0.43 GHz and maximum gain of 7.56 dB is obtained using Rogers RT/duroid® 5870 with optimized DGS structure.



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